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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
Current Industry
G01N21/47
Scattering
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-spectral scattering-matrix tomography
Patent number
12,360,039
Issue date
Jul 15, 2025
University of Southern California
Chia Wei Hsu
G01 - MEASURING TESTING
Information
Patent Grant
DUVF-MSI biophotonic analyzer device and methods for detecting path...
Patent number
12,360,042
Issue date
Jul 15, 2025
Biospection LLC
Anthony S. Ragone
G01 - MEASURING TESTING
Information
Patent Grant
Real-time multimodal radiometry for subsurface characterization dur...
Patent number
12,359,554
Issue date
Jul 15, 2025
Saudi Arabian Oil Company
Damian Pablo San Roman Alerigi
E21 - EARTH DRILLING MINING
Information
Patent Grant
Foreign matter inspection apparatus, foreign matter inspection meth...
Patent number
12,360,059
Issue date
Jul 15, 2025
Canon Kabushiki Kaisha
Yuichi Fujita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detecting plant product properties
Patent number
12,352,689
Issue date
Jul 8, 2025
RUBENS IP PTY LTD
Daniele Pelliccia
G01 - MEASURING TESTING
Information
Patent Grant
Methods and patterning devices and apparatuses for measuring focus...
Patent number
12,346,031
Issue date
Jul 1, 2025
ASML Netherlands B.V.
Fei Liu
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
12,345,661
Issue date
Jul 1, 2025
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid optical system
Patent number
12,343,113
Issue date
Jul 1, 2025
Atonarp Inc.
Lukas Brueckner
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Hybrid Raman and optical coherence tomography imaging
Patent number
12,339,114
Issue date
Jun 24, 2025
Nokia of America Corporation
Michael Eggleston
G01 - MEASURING TESTING
Information
Patent Grant
Modular photoelectric smoke sensor tube
Patent number
12,339,227
Issue date
Jun 24, 2025
KIDDE FIRE PROTECTION, LLC
Joseph Anthony Vidulich
G01 - MEASURING TESTING
Information
Patent Grant
System for detecting plastics, macro-plastics, micro-plastics, and...
Patent number
12,332,354
Issue date
Jun 17, 2025
Ladar Limited
Sverre Dokken
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectral analysis of a sample
Patent number
12,329,496
Issue date
Jun 17, 2025
Agilent Technologies LDA UK Limited
Philip Valmont Wilson
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for determining or classifying the surface col...
Patent number
12,326,362
Issue date
Jun 10, 2025
ams Sensors Germany GmbH
Gunter Siess
G01 - MEASURING TESTING
Information
Patent Grant
Linear array scanning brillouin scattering elastic imaging device
Patent number
12,326,366
Issue date
Jun 10, 2025
NANCHANG HANGKONG UNIVERSITY
Jiulin Shi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring distance
Patent number
12,320,639
Issue date
Jun 3, 2025
Loughborough University
Jonathan Huntley
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing crystallinity in amorphous pharmaceutical composi...
Patent number
12,313,613
Issue date
May 27, 2025
COLVISTEC AG
Andreas Berghaus
G01 - MEASURING TESTING
Information
Patent Grant
Method for analyzing blood coagulation characteristics of blood spe...
Patent number
12,313,638
Issue date
May 27, 2025
Sekisui Medical Co., Ltd.
Toshiki Kawabe
G01 - MEASURING TESTING
Information
Patent Grant
Imaging apparatus including sub-terahertz wave reflective member
Patent number
12,306,292
Issue date
May 20, 2025
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Kazuhiro Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Structure including grating coupler with optofluidic grating channels
Patent number
12,306,442
Issue date
May 20, 2025
GLOBALFOUNDRIES U.S. Inc.
Yusheng Bian
G01 - MEASURING TESTING
Information
Patent Grant
Optical system for measuring optical characteristics and device for...
Patent number
12,298,240
Issue date
May 13, 2025
Konica Minolta, Inc.
Takashi Kawasaki
G01 - MEASURING TESTING
Information
Patent Grant
Device for water examination
Patent number
12,298,214
Issue date
May 13, 2025
THE WAVE TALK, INC.
Young Dug Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating semiconductor wafer, method for selecting sem...
Patent number
12,300,553
Issue date
May 13, 2025
Shin-Etsu Handotai Co., Ltd.
Junya Suzuki
C30 - CRYSTAL GROWTH
Information
Patent Grant
Continuous dust accumulation monitoring system with impaired optics...
Patent number
12,298,255
Issue date
May 13, 2025
Industrial Intelligence Inc.
George T. Armbruster
B08 - CLEANING
Information
Patent Grant
Defect inspection apparatus
Patent number
12,292,389
Issue date
May 6, 2025
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Split refracting or split reflecting light received by cellulose-ba...
Patent number
12,292,379
Issue date
May 6, 2025
Teknologian tutkimuskeskus VTT Oy
Tapio Mäkelä
G01 - MEASURING TESTING
Information
Patent Grant
Foreign substance/defect inspection device, image generation device...
Patent number
12,292,386
Issue date
May 6, 2025
VIENEX CORPORATION
Yukihiro Kagawa
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining the composition of a multi-layer system show...
Patent number
12,292,378
Issue date
May 6, 2025
HUBERGROUP DEUTSCHLAND GmbH
Sylvia Klausnitzer
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
System and method for monitoring ultraviolet radiation bioremediation
Patent number
12,276,607
Issue date
Apr 15, 2025
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Yaw Samuel Obeng
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Optical microscopy
Patent number
12,276,782
Issue date
Apr 15, 2025
Cambridge Enterprise Limited
Tuomas Pertti Jonathan Knowles
G01 - MEASURING TESTING
Information
Patent Grant
Comparing gemstone signatures using angular spectrum information
Patent number
12,259,333
Issue date
Mar 25, 2025
The RealReal, Inc.
Loretta Catherine Castoro
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE
Publication number
20250224342
Publication date
Jul 10, 2025
Hitachi High-Tech Corporation
Tomoharu NAGASHIMA
G01 - MEASURING TESTING
Information
Patent Application
WHITE LIGHT SCATTERING IN OPTICAL BIOMOLECULE INTERACTION ANALYSIS
Publication number
20250216328
Publication date
Jul 3, 2025
Miltenyi Biotec B.V. & Co. KG
Heinrich SPIECKER
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MONITORING A WASTE STREAM TO INCREASE EFFICIE...
Publication number
20250213773
Publication date
Jul 3, 2025
CareFusion 2200, Inc.
Christopher MCGINLEY
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF EGG FERTILITY AND GENDER DETECTION
Publication number
20250208109
Publication date
Jun 26, 2025
MATRIXSPEC SOLUTIONS INC.
Li LIU
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD FOR CONDUCTIVE FILM, MANUFACTURING METHOD FOR...
Publication number
20250208500
Publication date
Jun 26, 2025
MITSUBISHI CHEMICAL CORPORATION
Shunsuke KANAME
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR INSPECTION APPARATUS
Publication number
20250198945
Publication date
Jun 19, 2025
Samsung Electronics Co., Ltd.
Junho Shin
G01 - MEASURING TESTING
Information
Patent Application
WHITE LIGHT SCATTERING IN OPTICAL BIOMOLECULE INTERACTION ANALYSIS
Publication number
20250198998
Publication date
Jun 19, 2025
Miltenyi Biotech B.V. & Co. KG
Heinrich SPIECKER
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
OPTICAL MICROSCOPY
Publication number
20250189776
Publication date
Jun 12, 2025
CAMBRIDGE ENTERPRISE LIMITED
Tuomas Pertti Jonathan Knowles
G01 - MEASURING TESTING
Information
Patent Application
NON-INVASIVE MEASUREMENT OF PHYSIOLOGICAL PARAMETERS OR SUBSTANCE C...
Publication number
20250180475
Publication date
Jun 5, 2025
OPSOLUTION GMBH
BJOERN MAGNUSSEN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR PREDICTING DEFECTS IN SEPARATOR COATINGS
Publication number
20250183476
Publication date
Jun 5, 2025
Millibatt, Inc.
Kyung Rak Jang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...
Publication number
20250172493
Publication date
May 29, 2025
JEDEX INC.
Jin Ho KIM
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING A SCATTERED LIGHT PARAMETER AND MEASURING AR...
Publication number
20250172494
Publication date
May 29, 2025
Endress + Hauser Conducta GmbH + Co. KG
Matthias Großmann
G01 - MEASURING TESTING
Information
Patent Application
Devices, Systems, and Methods for Digital Microscopy
Publication number
20250164774
Publication date
May 22, 2025
IDEXX Laboratories, Inc.
Jeremy Hammond
G01 - MEASURING TESTING
Information
Patent Application
UNDERWATER OPTICAL COMMUNICATION SYSTEM AND UNDERWATER OPTICAL COMM...
Publication number
20250141565
Publication date
May 1, 2025
Shimadzu Corporation
Naoki NISHIMURA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD
Publication number
20250137927
Publication date
May 1, 2025
Meta Platforms Technologies, LLC
Jian XU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MONITORING EMBRITTLEMENT OF AN INTERFACE BETWEEN A SUBST...
Publication number
20250137928
Publication date
May 1, 2025
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Frédéric MAZEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INK JET PRINTER
Publication number
20250128511
Publication date
Apr 24, 2025
KEYENCE CORPORATION
Shota Nakano
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING THE END OF A CIP PHASE
Publication number
20250128302
Publication date
Apr 24, 2025
ECOLAB USA INC.
Matt Porter
B08 - CLEANING
Information
Patent Application
OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...
Publication number
20250130175
Publication date
Apr 24, 2025
Kabushiki Kaisha Toshiba
Hideaki OKANO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DIFFUSE REFLECTANCE SPECTROSCOPY COMPRISING I...
Publication number
20250123202
Publication date
Apr 17, 2025
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Luc ANDRE
G01 - MEASURING TESTING
Information
Patent Application
COLOR DIFFRACTION TEST DEVICE AND TEST METHOD THEREOF, AND COLOR DI...
Publication number
20250123203
Publication date
Apr 17, 2025
BOE TECHNOLOGY GROUP CO., LTD.
Bo WANG
G01 - MEASURING TESTING
Information
Patent Application
Optical Coherence Tomography System for Subsurface Inspection
Publication number
20250102290
Publication date
Mar 27, 2025
Hamamatsu Photonics K. K.
Qingsong Wang
G01 - MEASURING TESTING
Information
Patent Application
LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...
Publication number
20250093261
Publication date
Mar 20, 2025
Samsung Electronics Co., Ltd.
Unjeong Kim
G01 - MEASURING TESTING
Information
Patent Application
IMAGING DEVICE FOR CORRECTING AND RECONSTRUCTING TARGET IMAGE IN SC...
Publication number
20250093262
Publication date
Mar 20, 2025
Korea University Research and Business Foundation
Won Shik CHOI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND APPARATUS OF DETERMINING A STRESS-RELATED CHARACTERISTI...
Publication number
20250085177
Publication date
Mar 13, 2025
Corning Incorporated
Ryan Claude Andrews
G01 - MEASURING TESTING
Information
Patent Application
MULTI-BEAM SMOKE DETECTOR
Publication number
20250076196
Publication date
Mar 6, 2025
Johnson Controls Tyco IP Holdings LLP
Siddhesh NAGALE
G08 - SIGNALLING
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS IN A PACKAGE
Publication number
20250076216
Publication date
Mar 6, 2025
Applied Materials, Inc.
Venkatakaushik VOLETI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR ENHANCED INSPECTION OF SURFACES WITH SPECULAR...
Publication number
20250076183
Publication date
Mar 6, 2025
ORBOTECH LTD.
Haim Chayet
G01 - MEASURING TESTING
Information
Patent Application
Method for Monitoring Ghost Image of Illumination Unit of Lithograp...
Publication number
20250076195
Publication date
Mar 6, 2025
SHANGHAI HUALI MICROELECTRONICS CORPORATION
Kaifeng Xu
G01 - MEASURING TESTING
Information
Patent Application
SMOKE DETECTOR REDUCING FALSE ALARM RATE
Publication number
20250067667
Publication date
Feb 27, 2025
PIXART IMAGING INC.
Cheng-Nan TSAI
G08 - SIGNALLING