secondary-emission detector

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CPC
G01N2223/507

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/507secondary-emission detector

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation analysis system, charged particle beam system, and radiat...
- Patent number 12,078,763
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Akira Takano
- G01 - MEASURING TESTING
Information Patent Grant
Defect characterization method and apparatus
- Patent number 12,067,704
- Issue date Aug 20, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ning Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 12,039,716
- Issue date Jul 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of using a dissolvable deployment device for the transfer of...
- Patent number 12,025,001
- Issue date Jul 2, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Grant
Material properties from two-dimensional image
- Patent number 11,982,635
- Issue date May 14, 2024
- BP Corporation North America Inc.
- Glen L. Gettemy
- G01 - MEASURING TESTING
Information Patent Grant
Portable assessment kit and method for measuring metal content of a...
- Patent number 11,965,838
- Issue date Apr 23, 2024
- 3AWater Oy
- Tuomo Nissinen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
- Patent number 11,942,303
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectrometer
- Patent number 11,898,975
- Issue date Feb 13, 2024
- Tohoku University
- Masahiko Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Material properties from two-dimensional image
- Patent number 11,885,757
- Issue date Jan 30, 2024
- BP Corporation North America Inc.
- Glen L. Gettemy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface analysis tools for process control of laser treatment of co...
- Patent number 11,885,725
- Issue date Jan 30, 2024
- The Boeing Company
- Eileen O. Kutscha
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detection and identification of foreign eleme...
- Patent number 11,867,645
- Issue date Jan 9, 2024
- Security Matters LTD.
- Yair Grof
- G01 - MEASURING TESTING
Information Patent Grant
Tube weld X-ray inspection device comprising an X-ray source, an X-...
- Patent number 11,860,113
- Issue date Jan 2, 2024
- DIGIRAY CORP.
- Sang Sub Kong
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample using a charged particle beam apparatus
- Patent number 11,815,479
- Issue date Nov 14, 2023
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,802,841
- Issue date Oct 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dislocation type and density discrimination in semiconductor materi...
- Patent number 11,782,001
- Issue date Oct 10, 2023
- ATTOLIGHT AG
- Marc Fouchier
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring damage of a substrate caused by an electron beam
- Patent number 11,774,381
- Issue date Oct 3, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,749,494
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,747,292
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G01 - MEASURING TESTING
Information Patent Grant
Verification plates with automated evaluation of melt performance
- Patent number 11,733,187
- Issue date Aug 22, 2023
- Arcam AB
- David Svensson
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
X-ray instrument with ambient temperature detector
- Patent number 11,719,654
- Issue date Aug 8, 2023
- Evident Scientific, Inc.
- Peter Hardman
- G01 - MEASURING TESTING
Information Patent Grant
Detector for X-ray fluorescence
- Patent number 11,714,204
- Issue date Aug 1, 2023
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS
- Publication number 20250102699
- Publication date Mar 27, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND SYSTEM FOR DETECTING RADIATION EMITTED BY A SAMPLE IRRAD...
- Publication number 20240418659
- Publication date Dec 19, 2024
- Politecnico Di Milano
- Carlo Ettore FIORINI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240309759
- Publication date Sep 19, 2024
- Talgat Shokanov
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...
- Publication number 20240255449
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...
- Publication number 20240183805
- Publication date Jun 6, 2024
- The Aerospace Corporation
- Rafael J. ZALDIVAR
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...
- Publication number 20240170249
- Publication date May 23, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
- Publication number 20240110880
- Publication date Apr 4, 2024
- FEI Company
- Maurice PEEMEN
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Detecting Beam Displacement
- Publication number 20240110881
- Publication date Apr 4, 2024
- FEI Company
- James B. McGinn
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240093603
- Publication date Mar 21, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Application
Scanning Electron Microscope and Map Display Method for Absorption...
- Publication number 20240085357
- Publication date Mar 14, 2024
- JEOL Ltd.
- Hideyuki Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Monitoring properties of X-ray beam during X-ray analysis
- Publication number 20240077437
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
NOISE DIAGNOSTICS FOR AN ELECTRON BEAM INSPECTION SYSTEM WITH SWATHING
- Publication number 20240068967
- Publication date Feb 29, 2024
- KLA Corporation
- Bo Xiong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20230366841
- Publication date Nov 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Wei Chean TAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER, DATA PROCESSING METHOD, AND RECORDING...
- Publication number 20230251215
- Publication date Aug 10, 2023
- SHIMADZU CORPORATION
- Yuta SAITO
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20230238227
- Publication date Jul 27, 2023
- HAMAMATSU PHOTONICS K. K.
- Masahiro HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING THE MINERALOGY OF DRILL SOLIDS
- Publication number 20230184705
- Publication date Jun 15, 2023
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Application
GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...
- Publication number 20230175992
- Publication date Jun 8, 2023
- Enersoft Inc.
- Yannai Z. R. Segal
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED ARCHITECTURE FOR HIGH-PERFORMANCE DETECTION DEVICE
- Publication number 20230170179
- Publication date Jun 1, 2023
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation Analysis System, Charged Particle Beam System, and Radiat...
- Publication number 20230161053
- Publication date May 25, 2023
- Hitachi High-Tech Corporation
- Akira TAKANO
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20230162943
- Publication date May 25, 2023
- Hitachi High-Tech Corporation
- U OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...
- Publication number 20230154723
- Publication date May 18, 2023
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIEN FILTER AND MULTIPLE ELECTRON BEAM INSPECTION APPARATUS
- Publication number 20230136198
- Publication date May 4, 2023
- NuFlare Technology, Inc.
- Toshikatsu AKIBA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
- Publication number 20230137186
- Publication date May 4, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROBABILITY-BASED DETERMINATION OF STRATIGRAP...
- Publication number 20230130034
- Publication date Apr 27, 2023
- CGG SERVICES SAS
- Joseph EMMINGS
- E21 - EARTH DRILLING MINING
Information Patent Application
X-RAY FLUORESCENCE SPECTROSCOPY ANALYSIS
- Publication number 20230128930
- Publication date Apr 27, 2023
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Sergey Mikailovich Makarychev-Mikhailov
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
- Publication number 20230112447
- Publication date Apr 13, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRON BEAM INSPECTION APPARATUS AND ADJUSTMENT METHOD FOR...
- Publication number 20230080062
- Publication date Mar 16, 2023
- NuFlare Technology, Inc.
- Koichi ISHII
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20230030651
- Publication date Feb 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi SEKIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS DEVICE
- Publication number 20230035039
- Publication date Feb 2, 2023
- KEYENCE CORPORATION
- Kenichiro HIROSE
- G06 - COMPUTING CALCULATING COUNTING

secondary-emission detector

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Imaging systems and methods of operating the same

Methods for growing crystals on QCM sensors

Charged particle beam apparatus

Serial arrangement having multiple plies of asymmetric filter media...

Systems and methods for determining the mineralogy of drill solids

Method and apparatus for monitoring beam profile and power

Measurement of metal or alloy coating

Cross-talk cancellation in multiple charged-particle beam inspection

Radiation analysis system, charged particle beam system, and radiat...

Defect characterization method and apparatus

Estimating heights of defects in a wafer by scaling a 3D model usin...

Defect inspection method and defect inspection device

Method of using a dissolvable deployment device for the transfer of...

Material properties from two-dimensional image

Portable assessment kit and method for measuring metal content of a...

Systems and methods for real time stereo imaging using multiple ele...

Electron spectrometer

Material properties from two-dimensional image

Surface analysis tools for process control of laser treatment of co...

System and method for detection and identification of foreign eleme...

Tube weld X-ray inspection device comprising an X-ray source, an X-...

Method of examining a sample using a charged particle beam apparatus

Defect detection device, defect detection method, and defect observ...

Dislocation type and density discrimination in semiconductor materi...

Method for measuring damage of a substrate caused by an electron beam

Charged particle beam apparatus

Charged particle beam apparatus

Verification plates with automated evaluation of melt performance

X-ray instrument with ambient temperature detector

Detector for X-ray fluorescence

Patents Applicationslast 30 patents

DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

DEVICE AND SYSTEM FOR DETECTING RADIATION EMITTED BY A SAMPLE IRRAD...

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...

QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...

CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...

Dynamic Data Driven Detector Tuning for Improved Investigation of S...

Systems And Methods For Detecting Beam Displacement

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

Scanning Electron Microscope and Map Display Method for Absorption...

Monitoring properties of X-ray beam during X-ray analysis

NOISE DIAGNOSTICS FOR AN ELECTRON BEAM INSPECTION SYSTEM WITH SWATHING

Charged Particle Beam Apparatus

X-RAY FLUORESCENCE ANALYZER, DATA PROCESSING METHOD, AND RECORDING...

CHARGED PARTICLE DETECTOR

SYSTEMS AND METHODS FOR DETERMINING THE MINERALOGY OF DRILL SOLIDS

GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...

ENHANCED ARCHITECTURE FOR HIGH-PERFORMANCE DETECTION DEVICE

Radiation Analysis System, Charged Particle Beam System, and Radiat...

CHARGED PARTICLE BEAM DEVICE

SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...

WIEN FILTER AND MULTIPLE ELECTRON BEAM INSPECTION APPARATUS

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

SYSTEM AND METHOD FOR PROBABILITY-BASED DETERMINATION OF STRATIGRAP...

X-RAY FLUORESCENCE SPECTROSCOPY ANALYSIS

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

MULTI-ELECTRON BEAM INSPECTION APPARATUS AND ADJUSTMENT METHOD FOR...

CHARGED PARTICLE BEAM APPARATUS

ANALYSIS DEVICE