Security aspects

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CPC
G01R31/318588

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/318588Security aspects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Reconfigurable JTAG architecture for implementation of programmable...
- Patent number 12,123,912
- Issue date Oct 22, 2024
- University of Florida Research Foundation, Incorporated
- Swarup Bhunia
- G01 - MEASURING TESTING
Information Patent Grant
Protection of the content of a fuse memory
- Patent number 12,117,487
- Issue date Oct 15, 2024
- STMicroelectronics (Grenoble 2) SAS
- Mark Trimmer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Invisible scan architecture for secure testing of digital designs
- Patent number 11,953,548
- Issue date Apr 9, 2024
- University of Florida Research Foundation, Incorporated
- Swarup Bhunia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secured scan access for a device including a scan chain
- Patent number 11,927,633
- Issue date Mar 12, 2024
- Texas Instruments Incorporated
- Mudasir Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Using embedded time-varying code generator to provide secure access...
- Patent number 11,693,052
- Issue date Jul 4, 2023
- Silicon Aid Solutions, Inc.
- James M. Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC device authentication using energy characterization
- Patent number 11,630,150
- Issue date Apr 18, 2023
- Science Applications International Corporation
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Side-channel signature based PCB authentication using JTAG architec...
- Patent number 11,480,614
- Issue date Oct 25, 2022
- University of Florida Research Foundation, Inc.
- Swarup Bhunia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using embedded time-varying code generator to provide secure access...
- Patent number 11,333,706
- Issue date May 17, 2022
- Silicon Aid Solutions, Inc.
- James M. Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design-for-test for asynchronous circuit elements
- Patent number 11,073,552
- Issue date Jul 27, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kuan-Yen Huang
- G01 - MEASURING TESTING
Information Patent Grant
IC device authentication using energy characterization
- Patent number 11,067,625
- Issue date Jul 20, 2021
- Science Applications International Corporation
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of pulse width tampering of signals
- Patent number 11,022,637
- Issue date Jun 1, 2021
- ARM Limited
- Subbayya Chowdary Yanamadala
- G01 - MEASURING TESTING
Information Patent Grant
Fast IJTAG
- Patent number 10,996,271
- Issue date May 4, 2021
- Apple Inc.
- Chananiel Weinraub
- G01 - MEASURING TESTING
Information Patent Grant
Secure device state apparatus and method and lifecycle management
- Patent number 10,872,154
- Issue date Dec 22, 2020
- Google LLC
- Marius Schilder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using embedded time-varying code generator to provide secure access...
- Patent number 10,690,718
- Issue date Jun 23, 2020
- SiliconAid Solutions, Inc.
- James M. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting points of failures
- Patent number 10,691,855
- Issue date Jun 23, 2020
- SECURE-IC SAS
- Sylvain Guilley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC device authentication using energy characterization
- Patent number 10,684,324
- Issue date Jun 16, 2020
- SAIC
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC device authentication using energy characterization
- Patent number 10,585,139
- Issue date Mar 10, 2020
- Science Applications International Corporation
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design-for-test for asynchronous circuit elements
- Patent number 10,429,440
- Issue date Oct 1, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kuan-Yen Huang
- G01 - MEASURING TESTING
Information Patent Grant
Test point-enhanced hardware security
- Patent number 10,361,873
- Issue date Jul 23, 2019
- Mentor Graphics Corporation
- Janusz Rajski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG lockout for embedded processors in programmable devices
- Patent number 10,267,858
- Issue date Apr 23, 2019
- Hamilton Sundstrand Corporation
- Kirk A. Lillestolen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing an electronic device with a disabled sensitive...
- Patent number 10,242,233
- Issue date Mar 26, 2019
- Gemalto SA
- Philippe Loubet Moundi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secure device state apparatus and method and lifecycle management
- Patent number 10,223,531
- Issue date Mar 5, 2019
- Google LLC
- Marius Schilder
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Securing access to integrated circuit scan mode and data
- Patent number 10,222,417
- Issue date Mar 5, 2019
- Cadence Design Systems, Inc.
- Akhil Garg
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System on chip and secure debugging method
- Patent number 10,012,693
- Issue date Jul 3, 2018
- Samsung Electronics Co., Ltd.
- Minsoo Lim
- G01 - MEASURING TESTING
Information Patent Grant
Protecting hidden content in integrated circuits
- Patent number 9,818,000
- Issue date Nov 14, 2017
- Southern Methodist University
- Jennifer L. Dworak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Protecting hidden content in integrated circuits
- Patent number 9,811,690
- Issue date Nov 7, 2017
- Southern Methodist University
- Jennifer L. Dworak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic system, system diagnostic circuit and operation method t...
- Patent number 9,810,739
- Issue date Nov 7, 2017
- Andes Technology Corporation
- Zhong-Ho Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for securing scan chain data
- Patent number 9,746,519
- Issue date Aug 29, 2017
- NXP B.V.
- Paul-Henri Pugliesi-Conti
- G01 - MEASURING TESTING
Information Patent Grant
Protecting chip settings using secured scan chains
- Patent number 9,727,754
- Issue date Aug 8, 2017
- International Business Machines Corporation
- Benedikt Geukes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-intrusive monitoring
- Patent number 9,727,722
- Issue date Aug 8, 2017
- Cisco Technology, Inc.
- Anthony H. Grieco
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES FOR INFIELD TESTING OF CRYPTOGRAPHIC CIRCUITRY
- Publication number 20240264231
- Publication date Aug 8, 2024
- Intel Corporation
- Rakesh KANDULA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURED SCAN ACCESS FOR A DEVICE INCLUDING A SCAN CHAIN
- Publication number 20240241174
- Publication date Jul 18, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir KAWOOSA
- G01 - MEASURING TESTING
Information Patent Application
SCAN FLIP-FLOP, SCAN CHAIN CIRCUIT INCLUDING THE SAME, AND CONTROL...
- Publication number 20240142521
- Publication date May 2, 2024
- Research & Business Foundation Sungkyunkwan University
- Changyoun Im
- G01 - MEASURING TESTING
Information Patent Application
PROVIDING CONFIGURABLE SECURITY FOR INTELLECTUAL PROPERTY CIRCUITS...
- Publication number 20240003973
- Publication date Jan 4, 2024
- Intel Corporation
- Ratheesh Thekke Veetil
- G01 - MEASURING TESTING
Information Patent Application
RECONFIGURABLE JTAG ARCHITECTURE FOR IMPLEMENTATION OF PROGRAMMABLE...
- Publication number 20220357394
- Publication date Nov 10, 2022
- University of Florida Research Foundation, Incorporated
- Swarup Bhunia
- G01 - MEASURING TESTING
Information Patent Application
Using Embedded Time-Varying Code Generator to Provide Secure Access...
- Publication number 20220244311
- Publication date Aug 4, 2022
- SiliconAid Solutions, Inc.
- James M. Johnson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC Device Authentication Using Energy Characterization
- Publication number 20210311113
- Publication date Oct 7, 2021
- Science Applications International Corporation
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC Device Authentication Using Energy Characterization
- Publication number 20200271719
- Publication date Aug 27, 2020
- SAIC
- David Michael Barrett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Design-For-Test for Asynchronous Circuit Elements
- Publication number 20200025826
- Publication date Jan 23, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kuan-Yen Huang
- G01 - MEASURING TESTING
Information Patent Application
Secure Device State Apparatus and Method and Lifecycle Management
- Publication number 20190163909
- Publication date May 30, 2019
- Google LLC
- Marius SCHILDER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Using Embedded Time-Varying Code Generator to Provide Secure Access...
- Publication number 20190086472
- Publication date Mar 21, 2019
- SiliconAid Solutions, Inc.
- James M. Johnson
- G01 - MEASURING TESTING
Information Patent Application
PROCESSOR SWITCHABLE BETWEEN TEST AND DEBUG MODES
- Publication number 20140108876
- Publication date Apr 17, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Akshay K. Pathak
- G01 - MEASURING TESTING
Information Patent Application
SECURE LOW PIN COUNT SCAN
- Publication number 20130166977
- Publication date Jun 27, 2013
- NXP B.V.
- Paul-Henri Pugliesi-Conti
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20120317450
- Publication date Dec 13, 2012
- FUJITSU SEMICONDUCTOR LIMITED
- Daisuke Miura
- G01 - MEASURING TESTING
Information Patent Application
Circuit for Securing Scan Chain Data
- Publication number 20120246528
- Publication date Sep 27, 2012
- Paul-Henri Pugliesi-Conti
- G01 - MEASURING TESTING
Information Patent Application
PROTECTING CHIP SETTINGS USING SECURED SCAN CHAINS
- Publication number 20120191403
- Publication date Jul 26, 2012
- International Business Machines Corporation
- Benedikt Geukes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD OF AUTHENTICATING JOINT TEST ACTION GROUP (JTAG)
- Publication number 20120060067
- Publication date Mar 8, 2012
- Samsung Electronics Co., Ltd.
- Yun-ho Youm
- G01 - MEASURING TESTING
Information Patent Application
PROTECTION OF PROPRIETARY EMBEDDED INSTRUMENTS
- Publication number 20110083195
- Publication date Apr 7, 2011
- Alfred L. Crouch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method of authenticating Joint Test Action Group (JTAG)
- Publication number 20100153797
- Publication date Jun 17, 2010
- Samsung Electronics Co., Ltd.
- Yun-ho Youm
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR TESTING AN IC USING A PLURALITY OF I/O LINES
- Publication number 20080059107
- Publication date Mar 6, 2008
- IBM
- Wayne A. Britson
- G01 - MEASURING TESTING
Information Patent Application
Method and system for blocking data in scan registers from being sh...
- Publication number 20060020864
- Publication date Jan 26, 2006
- Tony Michael Turner
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for accessing hidden data in a boundary scan t...
- Publication number 20050172190
- Publication date Aug 4, 2005
- Sunplus Technology Co., Ltd.
- Bor-Sung Liang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for transferring hidden signals in a boundary...
- Publication number 20050172191
- Publication date Aug 4, 2005
- Sunplus Technology Co. Ltd.
- Bor-Sung Liang
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor LSI circuit with scan circuit, scan circuit system, s...
- Publication number 20050160336
- Publication date Jul 21, 2005
- Masaki Oiso
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing an IC
- Publication number 20050149783
- Publication date Jul 7, 2005
- International Business Machines Corporation
- Wayne A. Britson
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for selecting an encryption integrated circuit...
- Publication number 20040080335
- Publication date Apr 29, 2004
- MOSAID Technologies, Inc.
- James Goodman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Secure scan
- Publication number 20030206627
- Publication date Nov 6, 2003
- GENERAL INSTRUMENT CORP.
- Madhusudhan R. Penugonda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for switchably selecting an integrated circuit...
- Publication number 20020175698
- Publication date Nov 28, 2002
- Mosaid Technologies, Inc.
- James Goodman
- G01 - MEASURING TESTING

Security aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Reconfigurable JTAG architecture for implementation of programmable...

Protection of the content of a fuse memory

Invisible scan architecture for secure testing of digital designs

Secured scan access for a device including a scan chain

Using embedded time-varying code generator to provide secure access...

IC device authentication using energy characterization

Side-channel signature based PCB authentication using JTAG architec...

Using embedded time-varying code generator to provide secure access...

Design-for-test for asynchronous circuit elements

IC device authentication using energy characterization

Detection of pulse width tampering of signals

Fast IJTAG

Secure device state apparatus and method and lifecycle management

Using embedded time-varying code generator to provide secure access...

Device and method for detecting points of failures

IC device authentication using energy characterization

IC device authentication using energy characterization

Design-for-test for asynchronous circuit elements

Test point-enhanced hardware security

JTAG lockout for embedded processors in programmable devices

Method for producing an electronic device with a disabled sensitive...

Secure device state apparatus and method and lifecycle management

Securing access to integrated circuit scan mode and data

System on chip and secure debugging method

Protecting hidden content in integrated circuits

Protecting hidden content in integrated circuits

Electronic system, system diagnostic circuit and operation method t...

Circuit for securing scan chain data

Protecting chip settings using secured scan chains

Non-intrusive monitoring

Patents Applicationslast 30 patents

TECHNIQUES FOR INFIELD TESTING OF CRYPTOGRAPHIC CIRCUITRY

SECURED SCAN ACCESS FOR A DEVICE INCLUDING A SCAN CHAIN

SCAN FLIP-FLOP, SCAN CHAIN CIRCUIT INCLUDING THE SAME, AND CONTROL...

PROVIDING CONFIGURABLE SECURITY FOR INTELLECTUAL PROPERTY CIRCUITS...

RECONFIGURABLE JTAG ARCHITECTURE FOR IMPLEMENTATION OF PROGRAMMABLE...

Using Embedded Time-Varying Code Generator to Provide Secure Access...

IC Device Authentication Using Energy Characterization

IC Device Authentication Using Energy Characterization

Design-For-Test for Asynchronous Circuit Elements

Secure Device State Apparatus and Method and Lifecycle Management

Using Embedded Time-Varying Code Generator to Provide Secure Access...

PROCESSOR SWITCHABLE BETWEEN TEST AND DEBUG MODES

SECURE LOW PIN COUNT SCAN

SEMICONDUCTOR DEVICE

Circuit for Securing Scan Chain Data

PROTECTING CHIP SETTINGS USING SECURED SCAN CHAINS

APPARATUS AND METHOD OF AUTHENTICATING JOINT TEST ACTION GROUP (JTAG)

PROTECTION OF PROPRIETARY EMBEDDED INSTRUMENTS

Apparatus and method of authenticating Joint Test Action Group (JTAG)

METHODS AND APPARATUS FOR TESTING AN IC USING A PLURALITY OF I/O LINES

Method and system for blocking data in scan registers from being sh...

Method and apparatus for accessing hidden data in a boundary scan t...

Method and apparatus for transferring hidden signals in a boundary...

Semiconductor LSI circuit with scan circuit, scan circuit system, s...

Methods and apparatus for testing an IC

Method and apparatus for selecting an encryption integrated circuit...

Secure scan

Method and apparatus for switchably selecting an integrated circuit...