Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position

Industry

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G01Q20/04

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q20/00Monitoring the movement or position of the probe

Current Industry

G01Q20/04Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and control unit for demodulation
- Patent number 11,946,949
- Issue date Apr 2, 2024
- Technische Universitat Wien
- Dominik Kohl
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,940,461
- Issue date Mar 26, 2024
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever with a collocated piezoelectric actuator-sensor pair
- Patent number 11,852,654
- Issue date Dec 26, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever, scanning probe microscope, and measurement method using...
- Patent number 11,733,264
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy cantilever, system and method
- Patent number 11,644,481
- Issue date May 9, 2023
- Nederlandse Organisatie voor toegepast-nataurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,635,449
- Issue date Apr 25, 2023
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope, scan head and method
- Patent number 11,592,460
- Issue date Feb 28, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,307,220
- Issue date Apr 19, 2022
- BRUKER NANO
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning sensor having a spin defect
- Patent number 11,293,940
- Issue date Apr 5, 2022
- ETH Zurich
- Christian Degen
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with case and elastic body
- Patent number 11,073,535
- Issue date Jul 27, 2021
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,029,330
- Issue date Jun 8, 2021
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,895,585
- Issue date Jan 19, 2021
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling a probe using constant command signals
- Patent number 10,895,584
- Issue date Jan 19, 2021
- CONCEPT SCIENTIFIQUE INSTRUMENTS
- Louis Pacheco
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and cantilever moving method
- Patent number 10,794,931
- Issue date Oct 6, 2020
- SHIMADZU CORPORATION
- Eiji Iida
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 10,663,483
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,613,115
- Issue date Apr 7, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Compact probe for atomic-force microscopy and atomic-force microsco...
- Patent number 10,527,645
- Issue date Jan 7, 2020
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer MEMS cantilevers
- Patent number 10,308,500
- Issue date Jun 4, 2019
- Ecole Polytechnique Federale de Lausanne (EPFL)
- Georg Ernest Fantner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Miniaturized and compact probe for atomic force microscopy
- Patent number 10,302,673
- Issue date May 28, 2019
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Photonic probe for atomic force microscopy
- Patent number 10,261,106
- Issue date Apr 16, 2019
- The United States of America, as represented by the Secretary of Commerce
- Vladimir Aksyuk
- G02 - OPTICS
Information Patent Grant
Piezoelectric actuator and method of measuring motion by using the...
- Patent number 10,126,146
- Issue date Nov 13, 2018
- Samsung Electronics Co., Ltd.
- Hwansoo Suh
- G01 - MEASURING TESTING
Information Patent Grant
Microwave impedance microscopy using a tuning fork
- Patent number 10,060,862
- Issue date Aug 28, 2018
- Board of Trustees of the Leland Stanford Junior Univers
- Yongtao Cui
- G01 - MEASURING TESTING
Information Patent Grant
Method of aligning a first article relative to a second article
- Patent number 10,025,207
- Issue date Jul 17, 2018
- Universitat Kassel
- Ivo Rangelow
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,995,765
- Issue date Jun 12, 2018
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Interface of a microfabricated scanning force sensor for combined f...
- Patent number 9,535,086
- Issue date Jan 3, 2017
- FemtoTools AG
- Felix Beyeler
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Surface force measuring method and surface force measuring apparatus
- Patent number 9,410,984
- Issue date Aug 9, 2016
- Elionix Inc.
- Hironao Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Microscope having a multimode local probe, tip-enhanced raman micro...
- Patent number 9,366,694
- Issue date Jun 14, 2016
- Ecole Polytechnique
- Marc Chaigneau
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope comprising an isothermal actuator
- Patent number 9,267,962
- Issue date Feb 23, 2016
- ICSPI Corp.
- Niladri Sarkar
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...
- Publication number 20240272196
- Publication date Aug 15, 2024
- The Research Foundation for the State University of New York
- Michael DAPOLITO
- G01 - MEASURING TESTING
Information Patent Application
FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...
- Publication number 20240210443
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
- Publication number 20240175895
- Publication date May 30, 2024
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...
- Publication number 20240168053
- Publication date May 23, 2024
- Bruker Nano, Inc.
- Martin Wagner
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
- Publication number 20240110939
- Publication date Apr 4, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20230243867
- Publication date Aug 3, 2023
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
AFM Imaging with Creep Correction
- Publication number 20220381803
- Publication date Dec 1, 2022
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...
- Publication number 20220260611
- Publication date Aug 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20220252638
- Publication date Aug 11, 2022
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...
- Publication number 20220244288
- Publication date Aug 4, 2022
- Massachusetts Institute of Technology
- Fangzhou XIA
- G01 - MEASURING TESTING
Information Patent Application
Method And Control Unit For Demodulation
- Publication number 20220120783
- Publication date Apr 21, 2022
- Technische Universitat Wien
- Dominik Kohl
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD
- Publication number 20220057430
- Publication date Feb 24, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD
- Publication number 20220026464
- Publication date Jan 27, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20210239732
- Publication date Aug 5, 2021
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Sensor Having a Spin Defect
- Publication number 20210140996
- Publication date May 13, 2021
- ETH Zurich
- Christian Degen
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope
- Publication number 20200341027
- Publication date Oct 29, 2020
- Shimadzu Corporation
- Masato HIRADE
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD
- Publication number 20200249255
- Publication date Aug 6, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20200041541
- Publication date Feb 6, 2020
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE AND CANTILEVER MOVING METHOD
- Publication number 20190317124
- Publication date Oct 17, 2019
- Shimadzu Corporation
- Eiji IIDA
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20190128919
- Publication date May 2, 2019
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONTROLLING A PROBE
- Publication number 20190094267
- Publication date Mar 28, 2019
- CONCEPT SCIENTIFIQUE INSTRUMENTS
- Louis Pacheco
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190064211
- Publication date Feb 28, 2019
- Oxford Instruments Asylum Research, Inc.
- David A. Grigg
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20190018040
- Publication date Jan 17, 2019
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...
- Publication number 20180203037
- Publication date Jul 19, 2018
- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20160274144
- Publication date Sep 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR LOW FORCE-NOISE DETECTION IN LIQUIDS
- Publication number 20140250553
- Publication date Sep 4, 2014
- The Regents of the University of California
- Dominik Ziegler
- B82 - NANO-TECHNOLOGY
Information Patent Application
AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE...
- Publication number 20140237690
- Publication date Aug 21, 2014
- Purdue Research Foundation
- Corey P. Neu
- B82 - NANO-TECHNOLOGY
Information Patent Application
ULTRA-COMPACT NANOCAVITY-ENHANCED SCANNING PROBE MICROSCOPY AND METHOD
- Publication number 20140196179
- Publication date Jul 10, 2014
- Dirk R. ENGLUND
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPY CANTILEVER COMPRISING AN ELECTROMAGNETIC...
- Publication number 20140047585
- Publication date Feb 13, 2014
- International Business Machines Corporation
- Jens Hofrichter
- B82 - NANO-TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPE PROBE, METHOD FOR PREPARING SAME, AND USES...
- Publication number 20130276176
- Publication date Oct 17, 2013
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Jérôme Polesel-Maris
- B82 - NANO-TECHNOLOGY

Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and control unit for demodulation

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Coated active cantilever probes for use in topography imaging in op...

Cantilever with a collocated piezoelectric actuator-sensor pair

Cantilever, scanning probe microscope, and measurement method using...

AFM imaging with creep correction

Atomic force microscopy cantilever, system and method

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Scanning probe microscope, scan head and method

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Scanning sensor having a spin defect

Scanning probe microscope with case and elastic body

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Multiple integrated tips scanning probe microscope

Method of controlling a probe using constant command signals

Scanning probe microscope and cantilever moving method

Method and apparatus of using peak force tapping mode to measure ph...

Multiple integrated tips scanning probe microscope

Compact probe for atomic-force microscopy and atomic-force microsco...

Multilayer MEMS cantilevers

Miniaturized and compact probe for atomic force microscopy

Photonic probe for atomic force microscopy

Piezoelectric actuator and method of measuring motion by using the...

Microwave impedance microscopy using a tuning fork

Method of aligning a first article relative to a second article

Method and apparatus of using peak force tapping mode to measure ph...

Interface of a microfabricated scanning force sensor for combined f...

Surface force measuring method and surface force measuring apparatus

Microscope having a multimode local probe, tip-enhanced raman micro...

Scanning probe microscope comprising an isothermal actuator

Patents Applicationslast 30 patents

SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...

FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...

Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...

AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

AFM Imaging with Creep Correction

CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...

Method And Control Unit For Demodulation

SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD

ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

Scanning Sensor Having a Spin Defect

Scanning Probe Microscope

ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

SCANNING PROBE MICROSCOPE AND CANTILEVER MOVING METHOD

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

METHOD OF CONTROLLING A PROBE

SCANNING PROBE MICROSCOPE

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

SENSOR FOR LOW FORCE-NOISE DETECTION IN LIQUIDS

AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE...

ULTRA-COMPACT NANOCAVITY-ENHANCED SCANNING PROBE MICROSCOPY AND METHOD

SCANNING PROBE MICROSCOPY CANTILEVER COMPRISING AN ELECTROMAGNETIC...

ATOMIC FORCE MICROSCOPE PROBE, METHOD FOR PREPARING SAME, AND USES...