Semiconductive materials

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CPC
G01N2033/0095

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2033/0095Semiconductive materials

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of evaluating cleanliness, method of determining cleaning co...
- Patent number 11,920,257
- Issue date Mar 5, 2024
- Sumco Corporation
- Takashi Muramatsu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Part, sensor, and metrology data integration
- Patent number 11,853,042
- Issue date Dec 26, 2023
- Applied Materials, Inc.
- Garrett Ho-Yee Sin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3-d printed devices formed with magnetic inks and methods of making...
- Patent number 11,845,219
- Issue date Dec 19, 2023
- Massachusetts Institute of Technology
- Theodore H. Fedynyshyn
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,804,390
- Issue date Oct 31, 2023
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Additively manufacturing fluorine-containing polymers
- Patent number 11,731,346
- Issue date Aug 22, 2023
- Honeywell Federal Manufacturing & Technologies, LLC
- Thomas Matthew Selter
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,705,351
- Issue date Jul 18, 2023
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,694,914
- Issue date Jul 4, 2023
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate carrier deterioration detection and repair
- Patent number 11,584,019
- Issue date Feb 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jen-Ti Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Selective monitoring of multiple silicon compounds
- Patent number 11,555,798
- Issue date Jan 17, 2023
- ECI Technology, Inc.
- Eugene Shalyt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanopore-forming method, nanopore-forming device and biomolecule me...
- Patent number 11,499,959
- Issue date Nov 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Yoshimitsu Yanagawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Space time electron-hole charge transport network for solid-state m...
- Patent number 11,480,608
- Issue date Oct 25, 2022
- Siemens Medical Solutions USA, Inc.
- Srutarshi Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,476,134
- Issue date Oct 18, 2022
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative analysis method for high molecular weight antioxidant
- Patent number 11,360,063
- Issue date Jun 14, 2022
- LG Chem, Ltd.
- Moon Ja Nam
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,244,841
- Issue date Feb 8, 2022
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensing sensor
- Patent number 11,181,509
- Issue date Nov 23, 2021
- Nihon Dempa Kogyo Co., Ltd.
- Hiroyuki Kukita
- G01 - MEASURING TESTING
Information Patent Grant
Rotating buffer station for a chip
- Patent number 11,143,640
- Issue date Oct 12, 2021
- CHROMA ATE INC.
- Yung-Chih Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for inspection of semiconductor samples
- Patent number 11,145,556
- Issue date Oct 12, 2021
- Carl Zeiss SMT GmbH
- Si Ping Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating cleanliness, method of determining cleaning co...
- Patent number 11,118,285
- Issue date Sep 14, 2021
- Sumco Corporation
- Takashi Muramatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flow analysis method
- Patent number 11,060,962
- Issue date Jul 13, 2021
- Hitachi, Ltd.
- Tsutomu Kono
- G01 - MEASURING TESTING
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,049,741
- Issue date Jun 29, 2021
- Elemental Scientific, Inc.
- Tyler Yost
- G01 - MEASURING TESTING
Information Patent Grant
Measuring semiconductor doping using constant surface potential cor...
- Patent number 10,969,370
- Issue date Apr 6, 2021
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Analysis pretreatment device
- Patent number 10,962,519
- Issue date Mar 30, 2021
- TOSHIBA MEMORY CORPORATION
- Jiahong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Coating tester using gas sensors
- Patent number 10,883,972
- Issue date Jan 5, 2021
- Applied Materials, Inc.
- Tasnuva Tabassum
- G01 - MEASURING TESTING
Information Patent Grant
Substrate carrier deterioration detection and repair
- Patent number 10,861,692
- Issue date Dec 8, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jen-Ti Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and a system for quantitative or qualitative determination o...
- Patent number 10,859,571
- Issue date Dec 8, 2020
- ZOETIS DENMARK ApS
- Martin Bak Heller
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis device
- Patent number 10,712,328
- Issue date Jul 14, 2020
- TOSHIBA MEMORY CORPORATION
- Yuji Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Substrate analysis nozzle and method for analyzing substrate
- Patent number 10,688,485
- Issue date Jun 23, 2020
- IAS, INC
- Katsuhiko Kawabata
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Generation and analysis of chemical compound libraries
- Patent number 10,598,644
- Issue date Mar 24, 2020
- California Institute of Technology
- John M. Gregoire
- G01 - MEASURING TESTING
Information Patent Grant
System and method of semiconductor characterization
- Patent number 10,564,215
- Issue date Feb 18, 2020
- Raja Technologies Inc.
- Ramesh Rajaduray
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 10,482,201
- Issue date Nov 19, 2019
- Sony Corporation
- Kazuhiro Hongo
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Thermal Desorption Analysis Automation System and Analysis Method U...
- Publication number 20230333036
- Publication date Oct 19, 2023
- WITHTECH Inc.
- Ho Chan Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER
- Publication number 20230037569
- Publication date Feb 9, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...
- Publication number 20220333269
- Publication date Oct 20, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
PART, SENSOR, AND METROLOGY DATA INTEGRATION
- Publication number 20220260978
- Publication date Aug 18, 2022
- Applied Materials, Inc.
- Garrett Ho-Yee Sin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT ANALYSIS METHOD AND SYSTEM, DEVICE AND MEDIUM
- Publication number 20220139744
- Publication date May 5, 2022
- Changxin Memory Technologies, Inc.
- MENG-HSUAN TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR INSPECTION OF SEMICONDUCTOR SAMPLES
- Publication number 20210159126
- Publication date May 27, 2021
- Carl Zeiss SMT GMBH
- Si Ping Zhao
- B24 - GRINDING POLISHING
Information Patent Application
METHOD AND A SYSTEM FOR QUANTITATIVE OR QUALITATIVE DETERMINATION O...
- Publication number 20210063388
- Publication date Mar 4, 2021
- Zoetis Denmark ApS
- Bent Overby
- B82 - NANO-TECHNOLOGY
Information Patent Application
SENSING SENSOR
- Publication number 20200408724
- Publication date Dec 31, 2020
- NIHON DEMPA KOGYO CO., LTD.
- Hiroyuki KUKITA
- G01 - MEASURING TESTING
Information Patent Application
SUBSURFACE INSPECTION METHOD AND SYSTEM
- Publication number 20200340953
- Publication date Oct 29, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Wouter Dick KOEK
- G01 - MEASURING TESTING
Information Patent Application
MOBILE INSPECTION SYSTEM FOR THE DETECTION OF DEFECT OCCURRENCE AND...
- Publication number 20200343116
- Publication date Oct 29, 2020
- Matan LAPIDOT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROELECTRONIC SENSOR FOR SENSING ELECTRICAL SIGNALS IN SUB-TERAHE...
- Publication number 20200300805
- Publication date Sep 24, 2020
- EPITRONIC HOLDINGS PTE LTD.
- Ayal RAM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING METHOD AND TESTING APPARATUS
- Publication number 20200209168
- Publication date Jul 2, 2020
- HKC Corporation Limited
- En-Tsung CHO
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE MONITORING OF MULTIPLE SILICON COMPOUNDS
- Publication number 20200110053
- Publication date Apr 9, 2020
- ECI Technology, Inc.
- Eugene Shalyt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Rotating buffer station for a chip
- Publication number 20200057037
- Publication date Feb 20, 2020
- CHROMA ATE INC.
- YUNG-CHIH CHEN
- G01 - MEASURING TESTING
Information Patent Application
Quantitative Analysis Method for High Molecular Weight Antioxidant
- Publication number 20200057035
- Publication date Feb 20, 2020
- LG CHEM, LTD.
- Moon Ja Nam
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
NANOPORE-FORMING METHOD, NANOPORE-FORMING DEVICE AND BIOMOLECULE ME...
- Publication number 20190369080
- Publication date Dec 5, 2019
- Hitachi High-Technologies Corporation
- Yoshimitsu YANAGAWA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Substrate Analysis Nozzle And Method For Analyzing Substrate
- Publication number 20190358622
- Publication date Nov 28, 2019
- IAS Inc.
- Katsuhiko Kawabata
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SYSTEM AND METHOD OF SEMICONDUCTOR CHARACTERIZATION
- Publication number 20190324077
- Publication date Oct 24, 2019
- Raja Technologies Inc.
- Ramesh Rajaduray
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
- Publication number 20190172729
- Publication date Jun 6, 2019
- ELEMENTAL SCIENTIFIC, INC.
- Tyler Yost
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE
- Publication number 20180088100
- Publication date Mar 29, 2018
- Toshiba Memory Corporation
- Yuji YAMADA
- G01 - MEASURING TESTING
Information Patent Application
GENERATION AND ANALYSIS OF CHEMICAL COMPOUND LIBRARIES
- Publication number 20180059078
- Publication date Mar 1, 2018
- California Institute of Technology
- John M. Gregoire
- G01 - MEASURING TESTING
Information Patent Application
Simultaneous Multi-Angle Spectroscopy
- Publication number 20170356800
- Publication date Dec 14, 2017
- KLA-Tencor Corporation
- Shankar Krishnan
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR IN SITU MONITORING AND CONTROL OF DEFECT FORMATION OR H...
- Publication number 20170299537
- Publication date Oct 19, 2017
- Lockheed Martin Corporation
- Jacob L. Swett
- G01 - MEASURING TESTING
Information Patent Application
Analysis Pretreatment Device
- Publication number 20170072378
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Jiahong WU
- G01 - MEASURING TESTING
Information Patent Application
Measuring semiconductor doping using constant surface potential cor...
- Publication number 20160356750
- Publication date Dec 8, 2016
- Semilab SDI LLC
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING A TEMPERATURE OF A TRANSISTOR
- Publication number 20160252402
- Publication date Sep 1, 2016
- Deere & Company
- Brij N. SINGH
- G01 - MEASURING TESTING
Information Patent Application
GAS SENSOR, METHOD FOR MANUFACTURING GAS SENSOR, AND METHOD FOR DET...
- Publication number 20160161443
- Publication date Jun 9, 2016
- Murata Manufacturing Co., Ltd.
- Kazutaka Nakamura
- G01 - MEASURING TESTING
Information Patent Application
DISTRIBUTED WAFER INFORMATION PROCESSING
- Publication number 20160154052
- Publication date Jun 2, 2016
- Sri Rama Prasanna Pavani
- G01 - MEASURING TESTING
Information Patent Application
Doping Profile Measurement Using Terahertz Time Domain Spectroscopy...
- Publication number 20160139044
- Publication date May 19, 2016
- ROCHESTER INSTITUTE OF TECHNOLOGY
- Christiaan Richter
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF SEMICONDUCTOR CHARACTERIZATION
- Publication number 20160003891
- Publication date Jan 7, 2016
- Ramesh Rajaduray
- G01 - MEASURING TESTING

Semiconductive materials

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of evaluating cleanliness, method of determining cleaning co...

Part, sensor, and metrology data integration

3-d printed devices formed with magnetic inks and methods of making...

Systems for integrated decomposition and scanning of a semiconducti...

Additively manufacturing fluorine-containing polymers

Systems for integrated decomposition and scanning of a semiconducti...

Systems for integrated decomposition and scanning of a semiconducti...

Substrate carrier deterioration detection and repair

Selective monitoring of multiple silicon compounds

Nanopore-forming method, nanopore-forming device and biomolecule me...

Space time electron-hole charge transport network for solid-state m...

Systems for integrated decomposition and scanning of a semiconducti...

Quantitative analysis method for high molecular weight antioxidant

Systems for integrated decomposition and scanning of a semiconducti...

Sensing sensor

Rotating buffer station for a chip

Method and device for inspection of semiconductor samples

Method of evaluating cleanliness, method of determining cleaning co...

Flow analysis method

Systems for integrated decomposition and scanning of a semiconducti...

Measuring semiconductor doping using constant surface potential cor...

Analysis pretreatment device

Coating tester using gas sensors

Substrate carrier deterioration detection and repair

Method and a system for quantitative or qualitative determination o...

Analysis device

Substrate analysis nozzle and method for analyzing substrate

Generation and analysis of chemical compound libraries

System and method of semiconductor characterization

Information processing apparatus, information processing method, an...

Patents Applicationslast 30 patents

Thermal Desorption Analysis Automation System and Analysis Method U...

METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER

METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...

PART, SENSOR, AND METROLOGY DATA INTEGRATION

WAFER DEFECT ANALYSIS METHOD AND SYSTEM, DEVICE AND MEDIUM

METHOD AND DEVICE FOR INSPECTION OF SEMICONDUCTOR SAMPLES

METHOD AND A SYSTEM FOR QUANTITATIVE OR QUALITATIVE DETERMINATION O...

SENSING SENSOR

SUBSURFACE INSPECTION METHOD AND SYSTEM

MOBILE INSPECTION SYSTEM FOR THE DETECTION OF DEFECT OCCURRENCE AND...

MICROELECTRONIC SENSOR FOR SENSING ELECTRICAL SIGNALS IN SUB-TERAHE...

SEMICONDUCTOR TESTING METHOD AND TESTING APPARATUS

SELECTIVE MONITORING OF MULTIPLE SILICON COMPOUNDS

Rotating buffer station for a chip

Quantitative Analysis Method for High Molecular Weight Antioxidant

NANOPORE-FORMING METHOD, NANOPORE-FORMING DEVICE AND BIOMOLECULE ME...

Substrate Analysis Nozzle And Method For Analyzing Substrate

SYSTEM AND METHOD OF SEMICONDUCTOR CHARACTERIZATION

SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...

ANALYSIS DEVICE

GENERATION AND ANALYSIS OF CHEMICAL COMPOUND LIBRARIES

Simultaneous Multi-Angle Spectroscopy

METHODS FOR IN SITU MONITORING AND CONTROL OF DEFECT FORMATION OR H...

Analysis Pretreatment Device

Measuring semiconductor doping using constant surface potential cor...

METHOD FOR ESTIMATING A TEMPERATURE OF A TRANSISTOR

GAS SENSOR, METHOD FOR MANUFACTURING GAS SENSOR, AND METHOD FOR DET...

DISTRIBUTED WAFER INFORMATION PROCESSING

Doping Profile Measurement Using Terahertz Time Domain Spectroscopy...

SYSTEM AND METHOD OF SEMICONDUCTOR CHARACTERIZATION