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Semiconductor laminate layer
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CPC
G01J2003/2816
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/2816
Semiconductor laminate layer
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Patents Grants
last 30 patents
Information
Patent Grant
Optical filter and optical spectrometer including the same
Patent number
10,989,594
Issue date
Apr 27, 2021
Samsung Electronics Co., Ltd.
Weonkyu Koh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical filter and optical spectrometer including the same
Patent number
10,473,524
Issue date
Nov 12, 2019
Samsung Electronics Co., Ltd.
Weonkyu Koh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectroscopic sensor including interference filter unit having sili...
Patent number
10,168,213
Issue date
Jan 1, 2019
Hamamatsu Photonics K.K.
Katsumi Shibayama
G01 - MEASURING TESTING
Information
Patent Grant
Solid-state image sensor, and imaging system
Patent number
10,103,189
Issue date
Oct 16, 2018
Sony Corporation
Sozo Yokogawa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optical processing of multiple spectral ranges using integrated com...
Patent number
10,066,991
Issue date
Sep 4, 2018
Halliburton Energy Services, Inc.
Michael T. Pelletier
G01 - MEASURING TESTING
Information
Patent Grant
Solid-state image sensor, and imaging system
Patent number
9,960,198
Issue date
May 1, 2018
Sony Corporation
Sozo Yokogawa
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
MULTI-SPECTRAL OPTICAL SENSOR AND SYSTEM
Publication number
20230388660
Publication date
Nov 30, 2023
ams Sensors Germany GmbH
Gunter SIESS
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL FILTER AND OPTICAL SPECTROMETER INCLUDING THE SAME
Publication number
20200049559
Publication date
Feb 13, 2020
Samsung Electronics Co., Ltd.
Weonkyu KOH
G02 - OPTICS
Information
Patent Application
SPECTROSCOPIC SENSOR
Publication number
20140253923
Publication date
Sep 11, 2014
Hamamatsu Photonics K.K.
Katsumi Shibayama
G01 - MEASURING TESTING
Information
Patent Application
SOLID-STATE IMAGE SENSOR, AND IMAGING SYSTEM
Publication number
20140146207
Publication date
May 29, 2014
SONY CORPORATION
Sozo Yokogawa
G02 - OPTICS