Semiconductor sample

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Y10S977/854

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/854Semiconductor sample

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Quantitative characterization of metallic and semiconductor single-...
- Patent number 8,518,711
- Issue date Aug 27, 2013
- Honda Motor Co., Ltd.
- Avetik R. Harutyunyan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods utilizing scanning probe microscope tips and products there...
- Patent number 8,187,673
- Issue date May 29, 2012
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 8,102,174
- Issue date Jan 24, 2012
- Infineon Technologies North America Corp.
- Daniel Christopher Worledge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for aligning patterns on a substrate
- Patent number 8,043,652
- Issue date Oct 25, 2011
- NanoInk, Inc.
- Raymond K. Eby
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 8,027,185
- Issue date Sep 27, 2011
- International Business Machines Corporation
- Daniel Christopher Worledge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 8,004,278
- Issue date Aug 23, 2011
- International Business Machines Corporation
- Daniel Christopher Worledge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged-particle optical system with dual loading options
- Patent number 7,989,778
- Issue date Aug 2, 2011
- FEI Company
- Johannes Antonius Maria Van Den Oetelaar
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Wafer for electrically characterizing tunnel junction film stacks w...
- Patent number 7,622,735
- Issue date Nov 24, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Grant
Methods utilizing scanning probe microscope tips and products there...
- Patent number 7,524,534
- Issue date Apr 28, 2009
- Northwestern University
- Chad A. Mirkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Methods utilizing scanning probe microscope tips and products there...
- Patent number 7,446,324
- Issue date Nov 4, 2008
- Northwestern University
- Chad A. Mirkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Scanning probe microscopy method and apparatus utilizing sample pitch
- Patent number 7,429,732
- Issue date Sep 30, 2008
- Veeco Instruments Inc.
- David A. Kneeburg
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe characterization of surfaces
- Patent number 7,420,106
- Issue date Sep 2, 2008
- The University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic variable temperature vacuum scanning tunneling microscope
- Patent number 7,414,250
- Issue date Aug 19, 2008
- Northwestern University
- Mark C. Hersam
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for aligning patterns on a substrate
- Patent number 7,279,046
- Issue date Oct 9, 2007
- Nanoink, Inc.
- Raymond K. Eby
- G01 - MEASURING TESTING
Information Patent Grant
Selective synthesis of semiconducting carbon nanotubes
- Patent number 7,038,299
- Issue date May 2, 2006
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method using conductive atomic force microscopy to measure contact...
- Patent number 6,930,502
- Issue date Aug 16, 2005
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jon C. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 6,927,569
- Issue date Aug 9, 2005
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for realtime CD microloading control
- Patent number 6,924,088
- Issue date Aug 2, 2005
- Applied Materials, Inc.
- David S. L. Mui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring dopant profile of a semiconductor
- Patent number 6,893,884
- Issue date May 17, 2005
- International Business Machines Corporation
- Li Shi
- G01 - MEASURING TESTING
Information Patent Grant
Circuit analysis using electric field-induced effects
- Patent number 6,891,390
- Issue date May 10, 2005
- Advanced Micro Devices
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Remote semiconductor microscopy
- Patent number 6,859,760
- Issue date Feb 22, 2005
- Micron Technology, Inc.
- Michael J. Dorough
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods utilizing scanning probe microscope tips and products there...
- Patent number 6,827,979
- Issue date Dec 7, 2004
- Northwestern University
- Chad A. Mirkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Method of measuring electrical capacitance
- Patent number 6,828,804
- Issue date Dec 7, 2004
- Sharp Kabushiki Kaisha
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Grant
Method of characterizing a semiconductor surface
- Patent number 6,816,806
- Issue date Nov 9, 2004
- Veeco Instruments Inc.
- Stanislaw M. Kocimski
- B24 - GRINDING POLISHING
Information Patent Grant
Scanning probe microscope
- Patent number 6,745,618
- Issue date Jun 8, 2004
- Renesas Technology Corp.
- Yukari Imai
- G01 - MEASURING TESTING
Information Patent Grant
Method for solid state genome analysis
- Patent number 6,716,578
- Issue date Apr 6, 2004
- BioForce Nanosciences, Inc.
- Eric Henderson
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Lithography method for forming semiconductor devices on a wafer uti...
- Patent number 6,620,563
- Issue date Sep 16, 2003
- Motorola, Inc.
- John George Maltabes
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Difference frequency imaging and spectroscopy to measure dopants us...
- Patent number 6,597,194
- Issue date Jul 22, 2003
- The Penn State Research Foundation
- Paul S. Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Remote semiconductor microscopy
- Patent number 6,567,770
- Issue date May 20, 2003
- Micron Technology, Inc.
- Michael J. Dorough
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Prober for electrical measurement of potentials in the interior of...
- Patent number 6,552,556
- Issue date Apr 22, 2003
- Agency of Industrial Science & Technology, Ministry of International Trade &...
- Kazushi Miki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
QUANTITATIVE CHARACTERIZATION OF METALLIC AND SEMICONDUCTOR SINGLE-...
- Publication number 20130180018
- Publication date Jul 11, 2013
- Honda Motor Co., Ltd.
- Avetik R. Harutyunyan
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THERE...
- Publication number 20100330345
- Publication date Dec 30, 2010
- Northwestern University
- Chad A MIRKIN
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE OPTICAL SYSTEM WITH DUAL LOADING OPTIONS
- Publication number 20100108907
- Publication date May 6, 2010
- FEI Company
- JOHANNES ANTONIUS MARIA VEN DEN OETELAAR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Techniques for Electrically Characterizing Tunnel Junction Film Sta...
- Publication number 20100023287
- Publication date Jan 28, 2010
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Electrically Characterizing Tunnel Junction Film Sta...
- Publication number 20090309587
- Publication date Dec 17, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Electrically Characterizing Tunnel Junction Film Sta...
- Publication number 20090267597
- Publication date Oct 29, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
WAFER FOR ELECTRICALLY CHARACTERIZING TUNNEL JUNCTION FILM STACKS W...
- Publication number 20090261820
- Publication date Oct 22, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ALIGNING PATTERNS ON A SUBSTRATE
- Publication number 20080147346
- Publication date Jun 19, 2008
- Nanolnk, Inc.
- Raymond K. Eby
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy method and apparatus utilizing sample pitch
- Publication number 20070075243
- Publication date Apr 5, 2007
- David A. Kneeburg
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe characterization of surfaces
- Publication number 20060225164
- Publication date Oct 5, 2006
- The University of Utah
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
Methods utilizing scanning probe microscope tips and products there...
- Publication number 20050181132
- Publication date Aug 18, 2005
- Northwestern University
- Chad A. Mirkin
- G01 - MEASURING TESTING
Information Patent Application
Methods utilizing scanning probe microscope tips and products there...
- Publication number 20050172704
- Publication date Aug 11, 2005
- Northwestern University
- Chad A. Mirkin
- G01 - MEASURING TESTING
Information Patent Application
METHOD USING CONDUCTIVE ATOMIC FORCE MICROSCOPY TO MEASURE CONTACT...
- Publication number 20050127926
- Publication date Jun 16, 2005
- Jon C. Lee
- G01 - MEASURING TESTING
Information Patent Application
Selective synthesis of semiconducting carbon nanotubes
- Publication number 20050130341
- Publication date Jun 16, 2005
- International Business Machines Corporation
- Toshiharu Furukawa
- C30 - CRYSTAL GROWTH
Information Patent Application
Method of measuring electrical capacitance
- Publication number 20040108864
- Publication date Jun 10, 2004
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Application
Techniques for electrically characterizing tunnel junction film sta...
- Publication number 20040051522
- Publication date Mar 18, 2004
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Method and system for realtime CD microloading control
- Publication number 20040038139
- Publication date Feb 26, 2004
- David S.L. Mui
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods utilizing scanning probe microscope tips and products there...
- Publication number 20040037959
- Publication date Feb 26, 2004
- Northwestern University
- Chad A. Mirkin
- G01 - MEASURING TESTING
Information Patent Application
Remote semiconductor microscopy
- Publication number 20030208340
- Publication date Nov 6, 2003
- Micron Technology, Inc.
- Michael J. Dorough
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for aligning patterns on a substrate
- Publication number 20030185967
- Publication date Oct 2, 2003
- Raymond K. Eby
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring dopant profile of a semiconductor
- Publication number 20030186471
- Publication date Oct 2, 2003
- International Business Machines Corporation
- Li Shi
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20030115939
- Publication date Jun 26, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yukari Imai
- G01 - MEASURING TESTING
Information Patent Application
Methods utilizing scanning probe microscope tips and products there...
- Publication number 20030049381
- Publication date Mar 13, 2003
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method of characterizing a semiconductor surface
- Publication number 20020183963
- Publication date Dec 5, 2002
- Stanislaw M. Kocimski
- B24 - GRINDING POLISHING
Information Patent Application
Lithography method for forming semiconductor devices on a wafer and...
- Publication number 20020127482
- Publication date Sep 12, 2002
- MOTOROLA, INC.
- John George Maltabes
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Remote semiconductor microscopy
- Publication number 20020111775
- Publication date Aug 15, 2002
- Micron Technology, Inc.
- Michael J. Dorough
- G02 - OPTICS
Information Patent Application
Methods utilizing scanning probe microscope tips and products there...
- Publication number 20020063212
- Publication date May 30, 2002
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Difference frequency imaging and spectroscopy to measure dopants us...
- Publication number 20020033708
- Publication date Mar 21, 2002
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method of determining the doping concentration across a surface of...
- Publication number 20010011895
- Publication date Aug 9, 2001
- Sunil N. Shabde
- H01 - BASIC ELECTRIC ELEMENTS

Semiconductor sample

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Quantitative characterization of metallic and semiconductor single-...

Methods utilizing scanning probe microscope tips and products there...

Techniques for electrically characterizing tunnel junction film sta...

Method and apparatus for aligning patterns on a substrate

Techniques for electrically characterizing tunnel junction film sta...

Techniques for electrically characterizing tunnel junction film sta...

Charged-particle optical system with dual loading options

Wafer for electrically characterizing tunnel junction film stacks w...

Methods utilizing scanning probe microscope tips and products there...

Methods utilizing scanning probe microscope tips and products there...

Scanning probe microscopy method and apparatus utilizing sample pitch

Scanning probe characterization of surfaces

Cryogenic variable temperature vacuum scanning tunneling microscope

Method and apparatus for aligning patterns on a substrate

Selective synthesis of semiconducting carbon nanotubes

Method using conductive atomic force microscopy to measure contact...

Techniques for electrically characterizing tunnel junction film sta...

Method and system for realtime CD microloading control

Method and apparatus for measuring dopant profile of a semiconductor

Circuit analysis using electric field-induced effects

Remote semiconductor microscopy

Methods utilizing scanning probe microscope tips and products there...

Method of measuring electrical capacitance

Method of characterizing a semiconductor surface

Scanning probe microscope

Method for solid state genome analysis

Lithography method for forming semiconductor devices on a wafer uti...

Difference frequency imaging and spectroscopy to measure dopants us...

Remote semiconductor microscopy

Prober for electrical measurement of potentials in the interior of...

Patents Applicationslast 30 patents

QUANTITATIVE CHARACTERIZATION OF METALLIC AND SEMICONDUCTOR SINGLE-...

METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THERE...

CHARGED-PARTICLE OPTICAL SYSTEM WITH DUAL LOADING OPTIONS

Techniques for Electrically Characterizing Tunnel Junction Film Sta...

Techniques for Electrically Characterizing Tunnel Junction Film Sta...

Techniques for Electrically Characterizing Tunnel Junction Film Sta...

WAFER FOR ELECTRICALLY CHARACTERIZING TUNNEL JUNCTION FILM STACKS W...

METHOD AND APPARATUS FOR ALIGNING PATTERNS ON A SUBSTRATE

Scanning probe microscopy method and apparatus utilizing sample pitch

Scanning probe characterization of surfaces

Methods utilizing scanning probe microscope tips and products there...

Methods utilizing scanning probe microscope tips and products there...

METHOD USING CONDUCTIVE ATOMIC FORCE MICROSCOPY TO MEASURE CONTACT...

Selective synthesis of semiconducting carbon nanotubes

Method of measuring electrical capacitance

Techniques for electrically characterizing tunnel junction film sta...

Method and system for realtime CD microloading control

Methods utilizing scanning probe microscope tips and products there...

Remote semiconductor microscopy

Method and apparatus for aligning patterns on a substrate

Method and apparatus for measuring dopant profile of a semiconductor

Scanning probe microscope

Methods utilizing scanning probe microscope tips and products there...

Method of characterizing a semiconductor surface

Lithography method for forming semiconductor devices on a wafer and...

Remote semiconductor microscopy

Methods utilizing scanning probe microscope tips and products there...

Difference frequency imaging and spectroscopy to measure dopants us...

Method of determining the doping concentration across a surface of...