Sequential slits; Multiple slits

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CPC
G01J2003/045

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/045Sequential slits; Multiple slits

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Patents Grantslast 30 patents

Information Patent Grant
Spectrometer and method of detecting an electromagnetic (EM) wave s...
- Patent number 12,098,950
- Issue date Sep 24, 2024
- National University of Singapore
- Guangya James Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Optical module and mobile device having same
- Patent number 11,913,837
- Issue date Feb 27, 2024
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
- Hsin-Yen Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Automated analysis device
- Patent number 11,506,534
- Issue date Nov 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeshi Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Multichannel broadband high-resolution spectrograph
- Patent number 11,268,853
- Issue date Mar 8, 2022
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Optical emission spectroscopy system, method of calibrating the sam...
- Patent number 11,092,495
- Issue date Aug 17, 2021
- Samsung Electronics Co., Ltd.
- Jeongil Mun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmissive sampling module and transmissive spectrometer
- Patent number 10,801,887
- Issue date Oct 13, 2020
- InnoSpectra Corporation
- Kuo-Sheng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Indexed multiple slit slider
- Patent number 10,739,194
- Issue date Aug 11, 2020
- FIAT LUX PHOTONICS Inc.
- David Scott Andrews
- G01 - MEASURING TESTING
Information Patent Grant
System and method for selective resolution for concave grating spec...
- Patent number 10,571,334
- Issue date Feb 25, 2020
- Horiba Instruments Incorporated
- Harry Jerome Oana
- G01 - MEASURING TESTING
Information Patent Grant
ICP emission spectrophotometer
- Patent number 10,309,903
- Issue date Jun 4, 2019
- Hitachi High-Tech Science Corporation
- Yutaka Ikku
- G01 - MEASURING TESTING
Information Patent Grant
Multi-scan optical system
- Patent number 9,958,325
- Issue date May 1, 2018
- Metal Power Analytical (I) Pvt. Ltd.
- Priyadarshan Divyadarshan Pant
- G01 - MEASURING TESTING
Information Patent Grant
Spectral characteristic acquisition device, image evaluation device...
- Patent number 9,677,938
- Issue date Jun 13, 2017
- Ricoh Company, Ltd.
- Kohei Shimbo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Gonio-spectroradiometer and measuring method thereof
- Patent number 9,587,984
- Issue date Mar 7, 2017
- Korea Research Institute of Standards and Science
- Seongchong Park
- G01 - MEASURING TESTING
Information Patent Grant
Control apparatus and control method having a slit selection based...
- Patent number 9,404,798
- Issue date Aug 2, 2016
- NEC Corporation
- Hideya Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral imaging systems and methods for imaging a remote object
- Patent number 9,341,514
- Issue date May 17, 2016
- Corning Incorporated
- Lovell Elgin Comstock
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hyperspectral imaging systems and methods for imaging a remote object
- Patent number 9,267,843
- Issue date Feb 23, 2016
- Corning Incorporated
- Lovell Elgin Comstock
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hyperspectral imaging systems and methods for imaging a remote object
- Patent number 9,200,958
- Issue date Dec 1, 2015
- Corning Incorporated
- Lovell Elgin Comstock
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hyperspectral imaging systems and methods for imaging a remote object
- Patent number 8,599,374
- Issue date Dec 3, 2013
- Corning Incorporated
- Lovell Elgin Comstock
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated 3-channel gas detection and measurement spectrometer
- Patent number 8,334,975
- Issue date Dec 18, 2012
- Raytheon Company
- Lacy G. Cook
- G01 - MEASURING TESTING
Information Patent Grant
Multi-wave-length spectrofluorometer
- Patent number 5,422,719
- Issue date Jun 6, 1995
- Auburn International, Inc.
- Jack M. Goldstein
- G01 - MEASURING TESTING
Information Patent Grant
Multi-element simultaneous analysis atomic absorption spectroscopy...
- Patent number 5,283,624
- Issue date Feb 1, 1994
- Hitachi, Ltd.
- Masamichi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer for the simultaneous measurement of intensity in vario...
- Patent number 4,993,834
- Issue date Feb 19, 1991
- Fried. Krupp GmbH
- Christoph Carlhoff
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for a multidetector array spectrograph
- Patent number 4,966,458
- Issue date Oct 30, 1990
- Milton Roy Company
- Richard Burns
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for a multidetector array spectrograph
- Patent number 4,875,773
- Issue date Oct 24, 1989
- Milton Roy Company
- Richard Burns
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
- Publication number 20240110830
- Publication date Apr 4, 2024
- OSAKA UNIVERSITY
- Katsumasa FUJITA
- G01 - MEASURING TESTING
Information Patent Application
GRATING SPECTROMETER HAVING V-SHAPED PROJECTION LIGHT AND CAPABLE O...
- Publication number 20230069726
- Publication date Mar 2, 2023
- Fudan University
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE AND MOBILE DEVICE HAVING SAME
- Publication number 20230003582
- Publication date Jan 5, 2023
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- HSIN-YEN HSU
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE DEVICE, SPECTROSCOPE, AND MICROSCOPE SYSTEM
- Publication number 20220413275
- Publication date Dec 29, 2022
- SONY GROUP CORPORATION
- TETSURO KUWAYAMA
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER AND METHOD OF DETECTING AN ELECTROMAGNETIC (EM) WAVE S...
- Publication number 20220381611
- Publication date Dec 1, 2022
- National University of Singapore
- Guangya James ZHOU
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL BROADBAND HIGH-RESOLUTION SPECTROGRAPH
- Publication number 20200348172
- Publication date Nov 5, 2020
- Fudan University
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL EMISSION SPECTROSCOPY SYSTEM, METHOD OF CALIBRATING THE SAM...
- Publication number 20200049560
- Publication date Feb 13, 2020
- Samsung Electronics Co., Ltd.
- Jeongil MUN
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYSIS DEVICE
- Publication number 20190316963
- Publication date Oct 17, 2019
- Hitachi High-Technologies Corporation
- Takeshi ISHIDA
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SAMPLING MODULE AND TRANSMISSIVE SPECTROMETER
- Publication number 20190204149
- Publication date Jul 4, 2019
- InnoSpectra Corporation
- Kuo-Sheng Huang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SELECTIVE RESOLUTION FOR CONCAVE GRATING SPEC...
- Publication number 20190186990
- Publication date Jun 20, 2019
- HORIBA INSTRUMENTS INCORPORATED
- Harry Jerome OANA
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SCAN OPTICAL SYSTEM
- Publication number 20170363471
- Publication date Dec 21, 2017
- Metal Power Analytical (I) Pvt. Ltd.
- Priyadarshan Divyadarshan PANT
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL CHARACTERISTIC ACQUISITION DEVICE, IMAGE EVALUATION DEVICE...
- Publication number 20140333927
- Publication date Nov 13, 2014
- RICOH COMPANY, LTD.
- Kohei SHIMBO
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT
- Publication number 20140132819
- Publication date May 15, 2014
- Corning Incorporated
- Lovell Elgin Comstock
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT
- Publication number 20140132811
- Publication date May 15, 2014
- Corning Incorporated
- Lovell Elgin Comstock II
- G01 - MEASURING TESTING
Information Patent Application
Micromechanical monochromator with integrated slit aperture for mic...
- Publication number 20040057049
- Publication date Mar 25, 2004
- Applied Photonics Worldwide, Inc.
- Reinhard Bruch
- G01 - MEASURING TESTING

Sequential slits; Multiple slits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectrometer and method of detecting an electromagnetic (EM) wave s...

Optical module and mobile device having same

Automated analysis device

Multichannel broadband high-resolution spectrograph

Optical emission spectroscopy system, method of calibrating the sam...

Transmissive sampling module and transmissive spectrometer

Indexed multiple slit slider

System and method for selective resolution for concave grating spec...

ICP emission spectrophotometer

Multi-scan optical system

Spectral characteristic acquisition device, image evaluation device...

Gonio-spectroradiometer and measuring method thereof

Control apparatus and control method having a slit selection based...

Hyperspectral imaging systems and methods for imaging a remote object

Hyperspectral imaging systems and methods for imaging a remote object

Hyperspectral imaging systems and methods for imaging a remote object

Hyperspectral imaging systems and methods for imaging a remote object

Integrated 3-channel gas detection and measurement spectrometer

Multi-wave-length spectrofluorometer

Multi-element simultaneous analysis atomic absorption spectroscopy...

Spectrometer for the simultaneous measurement of intensity in vario...

Optical system for a multidetector array spectrograph

Optical system for a multidetector array spectrograph

Patents Applicationslast 30 patents

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD

GRATING SPECTROMETER HAVING V-SHAPED PROJECTION LIGHT AND CAPABLE O...

OPTICAL MODULE AND MOBILE DEVICE HAVING SAME

MICROSCOPE DEVICE, SPECTROSCOPE, AND MICROSCOPE SYSTEM

SPECTROMETER AND METHOD OF DETECTING AN ELECTROMAGNETIC (EM) WAVE S...

MULTICHANNEL BROADBAND HIGH-RESOLUTION SPECTROGRAPH

OPTICAL EMISSION SPECTROSCOPY SYSTEM, METHOD OF CALIBRATING THE SAM...

AUTOMATED ANALYSIS DEVICE

TRANSMISSIVE SAMPLING MODULE AND TRANSMISSIVE SPECTROMETER

SYSTEM AND METHOD FOR SELECTIVE RESOLUTION FOR CONCAVE GRATING SPEC...

MULTI-SCAN OPTICAL SYSTEM

SPECTRAL CHARACTERISTIC ACQUISITION DEVICE, IMAGE EVALUATION DEVICE...

HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT

HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT

Micromechanical monochromator with integrated slit aperture for mic...