Signal generators

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CPC
G01R31/2841

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2841Signal generators

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Signal test
- Patent number 12,196,803
- Issue date Jan 14, 2025
- Infineon Technologies AG
- Muhammad Hassan
- G01 - MEASURING TESTING
Information Patent Grant
Cloud-based signal generator system and method for providing a signal
- Patent number 12,143,248
- Issue date Nov 12, 2024
- Rohde & Schwarz GmbH & Co. KG
- Thomas Braunstorfinger
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Two-step charge-based capacitor measurement
- Patent number 12,066,475
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sensor device for detecting electrical defects based on resonance f...
- Patent number 12,055,582
- Issue date Aug 6, 2024
- Keysight Technologies, Inc.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Test system for memory card
- Patent number 12,038,470
- Issue date Jul 16, 2024
- Huawei Technologies Co., Ltd.
- Weiwen Pang
- G01 - MEASURING TESTING
Information Patent Grant
Artificial intelligence-based constrained random verification metho...
- Patent number 12,025,653
- Issue date Jul 2, 2024
- Mediatek Inc.
- Chung-An Wang
- G01 - MEASURING TESTING
Information Patent Grant
Device for testing a group of radio-frequency (RF) chip modules and...
- Patent number 12,007,430
- Issue date Jun 11, 2024
- Ohmplus Technology Inc.
- Hsi-Tseng Chou
- G01 - MEASURING TESTING
Information Patent Grant
Ranging systems and methods for decreasing transitive effects in mu...
- Patent number 11,982,730
- Issue date May 14, 2024
- Lake Shore Cryotronics, Inc.
- Houston Fortney
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid digital and analog signal generation systems and methods
- Patent number 11,959,991
- Issue date Apr 16, 2024
- Lake Shore Cryotronics, Inc.
- Houston Fortney
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal generator utilizing a neural network
- Patent number 11,841,391
- Issue date Dec 12, 2023
- EYSIGHT TECHNOLOGIES, INC.
- Hansjoerg Haisch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated communication link testing
- Patent number 11,789,070
- Issue date Oct 17, 2023
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Grant
Integrated measurement systems and methods for synchronous, accurat...
- Patent number 11,762,050
- Issue date Sep 19, 2023
- Lake Shore Cryotronics, Inc.
- Houston Fortney
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of electronic device and electronic device
- Patent number 11,703,539
- Issue date Jul 18, 2023
- Innolux Corporation
- Ming-Jou Tai
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring waveforms from waveform generator at device under test
- Patent number 11,693,046
- Issue date Jul 4, 2023
- Tektronix, Inc.
- Yufang Li
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing an integrated circuit involving performing...
- Patent number 11,650,237
- Issue date May 16, 2023
- Samsung Electronics Co., Ltd.
- Bonggyu Kang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for a parallel measurement with multi...
- Patent number 11,619,662
- Issue date Apr 4, 2023
- Rohde & Schwarz GmbH & Co. KG
- Greg Bonaguide
- G01 - MEASURING TESTING
Information Patent Grant
Field collapse pulser
- Patent number 11,609,256
- Issue date Mar 21, 2023
- Pragma Design, Inc.
- Jeffrey C. Dunnihoo
- G01 - MEASURING TESTING
Information Patent Grant
Signal generation apparatus and attenuation amount correction metho...
- Patent number 11,609,264
- Issue date Mar 21, 2023
- Anritsu Corporation
- Koichiro Tomisaki
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing apparatus for spintronics devices
- Patent number 11,573,270
- Issue date Feb 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing electrode quality
- Patent number 11,555,846
- Issue date Jan 17, 2023
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- G01 - MEASURING TESTING
Information Patent Grant
Ranging systems and methods for decreasing transitive effects in mu...
- Patent number 11,550,015
- Issue date Jan 10, 2023
- Lake Shore Cryotronics, Inc.
- Houston Fortney
- G01 - MEASURING TESTING
Information Patent Grant
Modulating jitter frequency as switching frequency approaches jitte...
- Patent number 11,487,311
- Issue date Nov 1, 2022
- Power Integrations, Inc.
- Giao Minh Pham
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Signal injection technique for measurement and control of source re...
- Patent number 11,467,209
- Issue date Oct 11, 2022
- Anteverta-mw B.V.
- Mauro Marchetti
- G01 - MEASURING TESTING
Information Patent Grant
Signal generating device and measurement device
- Patent number 11,454,656
- Issue date Sep 27, 2022
- Lisa Draexlmaier GmbH
- Christian Zacherl
- G01 - MEASURING TESTING
Information Patent Grant
Boundary test circuit, memory and boundary test method
- Patent number 11,340,294
- Issue date May 24, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
System for position and/or line monitoring in an energy guide chain
- Patent number 11,333,563
- Issue date May 17, 2022
- Igus GmbH
- Richard Habering
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Testing device and testing method for testing a device under test
- Patent number 11,280,833
- Issue date Mar 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Stefan Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for monitoring semiconductor manufacturing equipm...
- Patent number 11,269,003
- Issue date Mar 8, 2022
- NANYA TECHNOLOGY CORPORATION
- Ching-Chih Lin
- G08 - SIGNALLING
Information Patent Grant
Test apparatus and testing method using the same
- Patent number 11,249,131
- Issue date Feb 15, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Real-time jitter impairment insertion for signal sources
- Patent number 11,237,204
- Issue date Feb 1, 2022
- Tektronix, Inc.
- Gregory A. Martin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD
- Publication number 20250020717
- Publication date Jan 16, 2025
- Anritsu Corporation
- Tatsuya IWAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING A FIGURE OF MERIT OF AT LEAST ONE COMPONENT U...
- Publication number 20240410933
- Publication date Dec 12, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Matthias RUENGELER
- G01 - MEASURING TESTING
Information Patent Application
Two-Step Charge-Based Capacitor Measurement
- Publication number 20240361370
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND TESTING METHOD OF T...
- Publication number 20240361377
- Publication date Oct 31, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Paul Gareth LLOYD
- G01 - MEASURING TESTING
Information Patent Application
REMOVING TEST EQUIPMENT NOISE FROM POWER SPECTRAL DENSITY MEASUREMENTS
- Publication number 20240361376
- Publication date Oct 31, 2024
- LitePoint Corporation
- Chen CAO
- G01 - MEASURING TESTING
Information Patent Application
INSULATION MONITORING DEVICE AND METHOD FOR CONTROLLING INSULATION...
- Publication number 20240353466
- Publication date Oct 24, 2024
- LS ELECTRIC CO., LTD.
- Jaeshik YOON
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING FAILURES IN DEVICE CORES
- Publication number 20240319261
- Publication date Sep 26, 2024
- Teradyne, Inc.
- Howard Lin
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND TESTING METHOD THEREOF
- Publication number 20240302428
- Publication date Sep 12, 2024
- WINBOND ELECTRONICS CORP.
- Kuan-Cheng Chang
- G01 - MEASURING TESTING
Information Patent Application
RANGING SYSTEMS AND METHODS FOR DECREASING TRANSITIVE EFFECTS IN MU...
- Publication number 20240255599
- Publication date Aug 1, 2024
- Lake Shore Cryotronics, Inc.
- Houston Fortney
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HYBRID DIGITAL AND ANALOG SIGNAL GENERATION SYSTEMS AND METHODS
- Publication number 20240219505
- Publication date Jul 4, 2024
- Lake Shore Cryotronics, Inc.
- Houston Fortney
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE
- Publication number 20240219453
- Publication date Jul 4, 2024
- NXP B.V.
- Jan-Peter Schat
- G01 - MEASURING TESTING
Information Patent Application
DIRECT DIGITAL SYNTHESIZER CIRCUIT, MEASUREMENT SYSTEM, AND METHOD...
- Publication number 20240210985
- Publication date Jun 27, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Julius SEEGER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20240175914
- Publication date May 30, 2024
- InnoLux Corporation
- Ming-Jou Tai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INTEGRATED COMMUNICATION LINK TESTING
- Publication number 20240044975
- Publication date Feb 8, 2024
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED MEASUREMENT SYSTEMS AND METHODS FOR SYNCHRONOUS, ACCURAT...
- Publication number 20240019517
- Publication date Jan 18, 2024
- Lake Shore Cryotronics, Inc.
- Houston Fortney
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL ABNORMALITY DETECTION SYSTEM AND METHOD THEREOF
- Publication number 20230341464
- Publication date Oct 26, 2023
- ASUSTEK COMPUTER INC.
- Hung-Ju Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR FOR A VEHICLE ELECTRICAL SYSTEM
- Publication number 20230288485
- Publication date Sep 14, 2023
- ISABELLENHUETTE HEUSLER GMBH & CO. KG
- Jan MARIEN
- G01 - MEASURING TESTING
Information Patent Application
AUTHENTICATING ELECTRONIC DEVICES VIA MULTI TONE ANALYSIS
- Publication number 20230176119
- Publication date Jun 8, 2023
- Government of the United States as Represented by the Secretary of the Air Force
- Carl Bohman
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR TESTING A GROUP OF RADIO-FREQUENCY (RF) CHIP MODULES AND...
- Publication number 20230160948
- Publication date May 25, 2023
- OHMPLUS TECHNOLOGY INC.
- HSI-TSENG CHOU
- G01 - MEASURING TESTING
Information Patent Application
ARTIFICIAL INTELLIGENCE-BASED CONSTRAINED RANDOM VERIFICATION METHO...
- Publication number 20230144389
- Publication date May 11, 2023
- MEDIATEK INC.
- Chung-An Wang
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE FOR DETECTING ELECTRICAL DEFECTS BASED ON RESONANCE F...
- Publication number 20230136914
- Publication date May 4, 2023
- KEYSIGHT TECHNOLOGIES, INC.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR A PARALLEL MEASUREMENT WITH MULTI...
- Publication number 20230092327
- Publication date Mar 23, 2023
- Greg BONAGUIDE
- G01 - MEASURING TESTING
Information Patent Application
RANGING SYSTEMS AND METHODS FOR DECREASING TRANSITIVE EFFECTS IN MU...
- Publication number 20230039369
- Publication date Feb 9, 2023
- Lake Shore Cryotronics, Inc.
- Houston Fortney
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
- Publication number 20220373598
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Kan TAN
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL TEST
- Publication number 20220326298
- Publication date Oct 13, 2022
- INFINEON TECHNOLOGIES AG
- Muhammad Hassan
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL GENERATION APPARATUS AND ATTENUATION AMOUNT CORRECTION METHO...
- Publication number 20220260629
- Publication date Aug 18, 2022
- Anritsu Corporation
- Koichiro TOMISAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT INVOLVING PERFORMING...
- Publication number 20220091171
- Publication date Mar 24, 2022
- Samsung Electronics Co., Ltd.
- Bonggyu Kang
- G01 - MEASURING TESTING
Information Patent Application
Test System for Memory Card
- Publication number 20220074986
- Publication date Mar 10, 2022
- Huawei Technologies Co., Ltd
- Weiwen Pang
- G01 - MEASURING TESTING
Information Patent Application
Two-Step Charge-Based Capacitor Measurement
- Publication number 20210373059
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING ELECTRODE QUALITY
- Publication number 20210356513
- Publication date Nov 18, 2021
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Signal generators

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Signal test

Cloud-based signal generator system and method for providing a signal

Two-step charge-based capacitor measurement

Sensor device for detecting electrical defects based on resonance f...

Test system for memory card

Artificial intelligence-based constrained random verification metho...

Device for testing a group of radio-frequency (RF) chip modules and...

Ranging systems and methods for decreasing transitive effects in mu...

Hybrid digital and analog signal generation systems and methods

Signal generator utilizing a neural network

Integrated communication link testing

Integrated measurement systems and methods for synchronous, accurat...

Manufacturing method of electronic device and electronic device

Monitoring waveforms from waveform generator at device under test

Method of manufacturing an integrated circuit involving performing...

Measurement system and method for a parallel measurement with multi...

Field collapse pulser

Signal generation apparatus and attenuation amount correction metho...

Electrical testing apparatus for spintronics devices

Testing electrode quality

Ranging systems and methods for decreasing transitive effects in mu...

Modulating jitter frequency as switching frequency approaches jitte...

Signal injection technique for measurement and control of source re...

Signal generating device and measurement device

Boundary test circuit, memory and boundary test method

System for position and/or line monitoring in an energy guide chain

Testing device and testing method for testing a device under test

System and method for monitoring semiconductor manufacturing equipm...

Test apparatus and testing method using the same

Real-time jitter impairment insertion for signal sources

Patents Applicationslast 30 patents

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

METHOD OF DETERMINING A FIGURE OF MERIT OF AT LEAST ONE COMPONENT U...

Two-Step Charge-Based Capacitor Measurement

MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND TESTING METHOD OF T...

REMOVING TEST EQUIPMENT NOISE FROM POWER SPECTRAL DENSITY MEASUREMENTS

INSULATION MONITORING DEVICE AND METHOD FOR CONTROLLING INSULATION...

IDENTIFYING FAILURES IN DEVICE CORES

TESTING DEVICE AND TESTING METHOD THEREOF

RANGING SYSTEMS AND METHODS FOR DECREASING TRANSITIVE EFFECTS IN MU...

HYBRID DIGITAL AND ANALOG SIGNAL GENERATION SYSTEMS AND METHODS

TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE

DIRECT DIGITAL SYNTHESIZER CIRCUIT, MEASUREMENT SYSTEM, AND METHOD...

ELECTRONIC DEVICE

INTEGRATED COMMUNICATION LINK TESTING

INTEGRATED MEASUREMENT SYSTEMS AND METHODS FOR SYNCHRONOUS, ACCURAT...

SIGNAL ABNORMALITY DETECTION SYSTEM AND METHOD THEREOF

SENSOR FOR A VEHICLE ELECTRICAL SYSTEM

AUTHENTICATING ELECTRONIC DEVICES VIA MULTI TONE ANALYSIS

DEVICE FOR TESTING A GROUP OF RADIO-FREQUENCY (RF) CHIP MODULES AND...

ARTIFICIAL INTELLIGENCE-BASED CONSTRAINED RANDOM VERIFICATION METHO...

SENSOR DEVICE FOR DETECTING ELECTRICAL DEFECTS BASED ON RESONANCE F...

MEASUREMENT SYSTEM AND METHOD FOR A PARALLEL MEASUREMENT WITH MULTI...

RANGING SYSTEMS AND METHODS FOR DECREASING TRANSITIVE EFFECTS IN MU...

SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT

SIGNAL TEST

SIGNAL GENERATION APPARATUS AND ATTENUATION AMOUNT CORRECTION METHO...

METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT INVOLVING PERFORMING...

Test System for Memory Card

Two-Step Charge-Based Capacitor Measurement

TESTING ELECTRODE QUALITY