Simulation

Industry

CPC
G01R31/318357

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/318357Simulation

Industries

Patents Grantslast 30 patents

Information Patent Grant
System and method for predicting compatibility of a new unit for an...
- Patent number 12,153,092
- Issue date Nov 26, 2024
- Rohde & Schwarz GmbH & Co. KG
- Chow Han Ding
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrating machine learning delay estimation in FPGA-based emulati...
- Patent number 12,140,628
- Issue date Nov 12, 2024
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for device under test (DUT) validation reuse acro...
- Patent number 12,078,676
- Issue date Sep 3, 2024
- MARVELL ASIA PTE. LTD.
- Nimalan Siva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tests for integrated circuit (IC) chips
- Patent number 11,994,559
- Issue date May 28, 2024
- Texas Instruments Incorporated
- Lakshmanan Balasubramanian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Connecting random variables to coverage targets using an ensemble o...
- Patent number 11,983,474
- Issue date May 14, 2024
- Synopsys, Inc.
- Parijat Biswas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods of testing adverse device conditions
- Patent number 11,965,927
- Issue date Apr 23, 2024
- Apple Inc.
- Jay Mayur Khandhar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simulation method and system of verifying operation of semiconducto...
- Patent number 11,906,584
- Issue date Feb 20, 2024
- Samsung Electronics Co., Ltd.
- Seaeun Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning delay estimation for emulation systems
- Patent number 11,860,227
- Issue date Jan 2, 2024
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit simulation test method and apparatus, device, and medium
- Patent number 11,846,674
- Issue date Dec 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Feng Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus and non-transitory computer-readable storage m...
- Patent number 11,841,398
- Issue date Dec 12, 2023
- Silicon Motion, Inc.
- Yu-Lin Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Single-pass diagnosis for multiple chain defects
- Patent number 11,789,077
- Issue date Oct 17, 2023
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Parameter space reduction for device testing
- Patent number 11,789,074
- Issue date Oct 17, 2023
- National Instruments Corporation
- James C. Nagle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-rate sampling for hierarchical system analysis
- Patent number 11,774,498
- Issue date Oct 3, 2023
- International Business Machines Corporation
- David Wells Winston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Converting formal verification testbench drivers with nondeterminis...
- Patent number 11,675,009
- Issue date Jun 13, 2023
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Verification of hardware design for data transformation pipeline
- Patent number 11,663,385
- Issue date May 30, 2023
- Imagination Technologies Limited
- Sam Elliott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination and correction of physical circuit event related erro...
- Patent number 11,630,152
- Issue date Apr 18, 2023
- International Business Machines Corporation
- Pradip Bose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trajectory-optimized test pattern generation for built-in self-test
- Patent number 11,585,853
- Issue date Feb 21, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Grant
Automated assisted circuit validation
- Patent number 11,520,966
- Issue date Dec 6, 2022
- Tektronix, Inc.
- David Everett Burgess
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for efficient testing of digital integrated circuits
- Patent number 11,494,537
- Issue date Nov 8, 2022
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Emulation system supporting computation of four-state combinational...
- Patent number 11,461,522
- Issue date Oct 4, 2022
- Cadence Design Systems, Inc.
- Mitchell G. Poplack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Activity coverage assessment of circuit designs under test stimuli
- Patent number 11,455,447
- Issue date Sep 27, 2022
- SIEMENS INDUSTRY SOFTWARE INC.
- Stephen Kenneth Sunter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timed transition cell-aware ATPG using fault rule files and SDF for...
- Patent number 11,435,401
- Issue date Sep 6, 2022
- Cadence Design Systems, Inc.
- Arvind Chokhani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Suspect resolution for scan chain defect diagnosis
- Patent number 11,423,202
- Issue date Aug 23, 2022
- SIEMENS INDUSTRY SOFTWARE INC.
- Grzegorz Mrugalski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Per-shift X-tolerant logic built-in self-test
- Patent number 11,422,186
- Issue date Aug 23, 2022
- Synopsys, Inc.
- John A. Waicukauski
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for configurable switches for verification IP
- Patent number 11,403,449
- Issue date Aug 2, 2022
- Cadence Design Systems, Inc.
- Samarth Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for automatic detection of a functional primitive in a model...
- Patent number 11,321,512
- Issue date May 3, 2022
- Technische Universitat Wien
- Christian Krieg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for non-invasive current estimation
- Patent number 11,300,616
- Issue date Apr 12, 2022
- Mayo Foundation for Medical Education and Research
- Jonathan L. Fasig
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for reviewing an FPGA-program
- Patent number 11,187,748
- Issue date Nov 30, 2021
- dspace digital signal processing and control engineering GmbH
- Heiko Kalte
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device test database generating method and electronic de...
- Patent number 11,163,003
- Issue date Nov 2, 2021
- Realtek Semiconductor Corp.
- Po-Lin Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Converting formal verification testbench drivers with nondeterminis...
- Patent number 11,150,298
- Issue date Oct 19, 2021
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Integrating Machine Learning Delay Estimation in FPGA-Based Emulati...
- Publication number 20240094290
- Publication date Mar 21, 2024
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACRO MODEL OF A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, A CIRCUIT...
- Publication number 20240012052
- Publication date Jan 11, 2024
- Rohm Co., Ltd.
- Kyoji MARUMOTO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND SYSTEM FOR INTERFACING A TESTBENCH TO CIRCUIT SIMULATION
- Publication number 20230169226
- Publication date Jun 1, 2023
- Xilinx, Inc.
- Saikat Bandyopadhyay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTS FOR INTEGRATED CIRCUIT (IC) CHIPS
- Publication number 20230143500
- Publication date May 11, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lakshmanan Balasubramanian
- G01 - MEASURING TESTING
Information Patent Application
SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTO...
- Publication number 20230097405
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Seaeun PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR AUTOMATIC WAVEFORM ANALYSIS
- Publication number 20230074806
- Publication date Mar 9, 2023
- Yangtze Memory Technologies Co., Ltd.
- Liqiang NI
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT SIMULATION TEST METHOD AND APPARATUS, DEVICE, AND MEDIUM
- Publication number 20230032066
- Publication date Feb 2, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Feng Lin
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS AND NON-TRANSITORY COMPUTER-READABLE STORAGE M...
- Publication number 20220413047
- Publication date Dec 29, 2022
- SILICON MOTION, INC.
- Yu-Lin JIANG
- G01 - MEASURING TESTING
Information Patent Application
MULTI-RATE SAMPLING FOR HIERARCHICAL SYSTEM ANALYSIS
- Publication number 20220390514
- Publication date Dec 8, 2022
- International Business Machines Corporation
- David Wells Winston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS
- Publication number 20220365136
- Publication date Nov 17, 2022
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE
- Publication number 20220357390
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Chien-Ming HUNG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CONVERTING FORMAL VERIFICATION TESTBENCH DRIVERS WITH NONDETERMINIS...
- Publication number 20220187368
- Publication date Jun 16, 2022
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING DELAY ESTIMATION FOR EMULATION SYSTEMS
- Publication number 20220187367
- Publication date Jun 16, 2022
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE-PASS DIAGNOSIS FOR MULTIPLE CHAIN DEFECTS
- Publication number 20220128628
- Publication date Apr 28, 2022
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
SUSPECT RESOLUTION FOR SCAN CHAIN DEFECT DIAGNOSIS
- Publication number 20220065932
- Publication date Mar 3, 2022
- Mentor Graphics Corporation
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC SIGNAL VERIFICATION USING A TRANSLATED SIMULATED WAVEFORM
- Publication number 20220012394
- Publication date Jan 13, 2022
- Tektronix, Inc.
- David Everett Burgess
- G01 - MEASURING TESTING
Information Patent Application
Verification of Hardware Design for Data Transformation Pipeline
- Publication number 20220004690
- Publication date Jan 6, 2022
- Imagination Technologies Limited
- Sam Elliott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...
- Publication number 20210270897
- Publication date Sep 2, 2021
- International Business Machines Corporation
- Pradip Bose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Physics-Based Artificial Intelligence Integrated Simulation and Mea...
- Publication number 20210173011
- Publication date Jun 10, 2021
- HAMED KAJBAF
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR NON-INVASIVE CURRENT ESTIMATION
- Publication number 20210132148
- Publication date May 6, 2021
- Mayo Foundation for Medical Education and Research
- Jonathan L. Fasig
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND...
- Publication number 20210132147
- Publication date May 6, 2021
- Realtek Semiconductor Corp.
- Ying-Yen Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF TESTING ADVERSE DEVICE CONDITIONS
- Publication number 20200379034
- Publication date Dec 3, 2020
- Apple Inc.
- Jay Mayur KHANDHAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...
- Publication number 20200300913
- Publication date Sep 24, 2020
- International Business Machines Corporation
- Pradip Bose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Verification of Hardware Design for Data Transformation Pipeline wi...
- Publication number 20200302104
- Publication date Sep 24, 2020
- Imagination Technologies Limited
- Sam Elliott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...
- Publication number 20200158782
- Publication date May 21, 2020
- International Business Machines Corporation
- Pradip Bose
- G01 - MEASURING TESTING
Information Patent Application
Method for a computer-aided automated verification of requirements
- Publication number 20200159980
- Publication date May 21, 2020
- Gerhard Schilling
- G01 - MEASURING TESTING
Information Patent Application
PROCEDURE FOR REVIEWING AN FPGA-PROGRAM
- Publication number 20200132766
- Publication date Apr 30, 2020
- dSpace digital signal processing and control engineering GmbH
- Heiko KALTE
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING DEFECT SENSITIVE CODES FOR TESTING DEVICES WITH INPUT O...
- Publication number 20200057106
- Publication date Feb 20, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Lakshmanan Balasubramanian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Automatic Detection of a Functional Primitive in a Model...
- Publication number 20200042662
- Publication date Feb 6, 2020
- Technische Universitat Wien
- Christian KRIEG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE TEST DATABASE GENERATING METHOD AND ELECTRONIC DE...
- Publication number 20190346508
- Publication date Nov 14, 2019
- Realtek Semiconductor Corp.
- Po-Lin Chen
- G06 - COMPUTING CALCULATING COUNTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for predicting compatibility of a new unit for an...

Integrating machine learning delay estimation in FPGA-based emulati...

System and method for device under test (DUT) validation reuse acro...

Tests for integrated circuit (IC) chips

Connecting random variables to coverage targets using an ensemble o...

Systems and methods of testing adverse device conditions

Simulation method and system of verifying operation of semiconducto...

Machine learning delay estimation for emulation systems

Circuit simulation test method and apparatus, device, and medium

Method and apparatus and non-transitory computer-readable storage m...

Single-pass diagnosis for multiple chain defects

Parameter space reduction for device testing

Multi-rate sampling for hierarchical system analysis

Converting formal verification testbench drivers with nondeterminis...

Verification of hardware design for data transformation pipeline

Determination and correction of physical circuit event related erro...

Trajectory-optimized test pattern generation for built-in self-test

Automated assisted circuit validation

Method and system for efficient testing of digital integrated circuits

Emulation system supporting computation of four-state combinational...

Activity coverage assessment of circuit designs under test stimuli

Timed transition cell-aware ATPG using fault rule files and SDF for...

Suspect resolution for scan chain defect diagnosis

Per-shift X-tolerant logic built-in self-test

Systems and methods for configurable switches for verification IP

Method for automatic detection of a functional primitive in a model...

Systems and methods for non-invasive current estimation

Procedure for reviewing an FPGA-program

Electronic device test database generating method and electronic de...

Converting formal verification testbench drivers with nondeterminis...

Patents Applicationslast 30 patents

Integrating Machine Learning Delay Estimation in FPGA-Based Emulati...

MACRO MODEL OF A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, A CIRCUIT...

METHOD AND SYSTEM FOR INTERFACING A TESTBENCH TO CIRCUIT SIMULATION

TESTS FOR INTEGRATED CIRCUIT (IC) CHIPS

SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTO...

METHODS AND SYSTEMS FOR AUTOMATIC WAVEFORM ANALYSIS

CIRCUIT SIMULATION TEST METHOD AND APPARATUS, DEVICE, AND MEDIUM

METHOD AND APPARATUS AND NON-TRANSITORY COMPUTER-READABLE STORAGE M...

MULTI-RATE SAMPLING FOR HIERARCHICAL SYSTEM ANALYSIS

METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS

ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE

CONVERTING FORMAL VERIFICATION TESTBENCH DRIVERS WITH NONDETERMINIS...

MACHINE LEARNING DELAY ESTIMATION FOR EMULATION SYSTEMS

SINGLE-PASS DIAGNOSIS FOR MULTIPLE CHAIN DEFECTS

SUSPECT RESOLUTION FOR SCAN CHAIN DEFECT DIAGNOSIS

ELECTRONIC SIGNAL VERIFICATION USING A TRANSLATED SIMULATED WAVEFORM

Verification of Hardware Design for Data Transformation Pipeline

DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...

Physics-Based Artificial Intelligence Integrated Simulation and Mea...

SYSTEMS AND METHODS FOR NON-INVASIVE CURRENT ESTIMATION

TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND...

SYSTEMS AND METHODS OF TESTING ADVERSE DEVICE CONDITIONS

DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...

Verification of Hardware Design for Data Transformation Pipeline wi...

DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...

Method for a computer-aided automated verification of requirements

PROCEDURE FOR REVIEWING AN FPGA-PROGRAM

IDENTIFYING DEFECT SENSITIVE CODES FOR TESTING DEVICES WITH INPUT O...

Method for Automatic Detection of a Functional Primitive in a Model...

ELECTRONIC DEVICE TEST DATABASE GENERATING METHOD AND ELECTRONIC DE...