Membership
Tour
Register
Log in
Slit arrangements
Follow
Industry
CPC
G01J5/0856
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J5/00
Radiation pyrometry
Current Industry
G01J5/0856
Slit arrangements
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Sensor unit and image processing device
Patent number
11,971,305
Issue date
Apr 30, 2024
Toshiba Tec Kabushiki Kaisha
Makoto Odani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sensor unit and image processing device
Patent number
11,709,100
Issue date
Jul 25, 2023
Toshiba Tec Kabushiki Kaisha
Makoto Odani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
MEMS infrared sensor including a plasmonic lens
Patent number
9,423,303
Issue date
Aug 23, 2016
Robert Bosch GmbH
Ashwin Samarao
G01 - MEASURING TESTING
Information
Patent Grant
MEMS infrared sensor including a plasmonic lens
Patent number
9,236,522
Issue date
Jan 12, 2016
Robert Bosch GmbH
Ashwin K. Samarao
G01 - MEASURING TESTING
Information
Patent Grant
Radiation thermometer
Patent number
8,042,997
Issue date
Oct 25, 2011
Land Instruments International Limited
Adrian John Masefield Lyndon
G01 - MEASURING TESTING
Information
Patent Grant
Fiber optic spectroscopic digital imaging sensor and method for fla...
Patent number
7,907,272
Issue date
Mar 15, 2011
Gas Technology Institute
Serguei A. Zelepouga
G01 - MEASURING TESTING
Information
Patent Grant
Sensor assembly with dual reflectors to offset sensor
Patent number
6,196,690
Issue date
Mar 6, 2001
McDonnell Douglas Corporation
James Bertram Blackmon
G02 - OPTICS
Information
Patent Grant
Temperature measuring method for semiconductor wafers and processin...
Patent number
6,142,663
Issue date
Nov 7, 2000
Sumitomo Metal Industries, Inc.
Eiryo Takasuka
G01 - MEASURING TESTING
Information
Patent Grant
Melt view camera
Patent number
6,091,444
Issue date
Jul 18, 2000
United States Enrichment Corporation
Thomas J. McCarville
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Sensor assembly with dual reflectors to offset sensor
Patent number
5,980,049
Issue date
Nov 9, 1999
McDonnell Douglas Corporation
James Bertram Blackmon
G02 - OPTICS
Information
Patent Grant
Temperature distribution measuring instrument
Patent number
5,964,529
Issue date
Oct 12, 1999
Zexel Corp.
Tatsuo Haraguchi
G01 - MEASURING TESTING
Information
Patent Grant
Sensor assembly with dual reflectors to offset sensor
Patent number
5,896,237
Issue date
Apr 20, 1999
McDonnell Douglas Corporation
James Bertram Blackmon
G02 - OPTICS
Information
Patent Grant
Optical warm stop with fresnel type reflective surface
Patent number
5,444,250
Issue date
Aug 22, 1995
Hughes Aircraft Company
Dietmar Hanke
G01 - MEASURING TESTING
Information
Patent Grant
Remote temperature and/or temperature difference measuring device
Patent number
5,352,039
Issue date
Oct 4, 1994
Ortomedic
Jean-Pierre Barral
G01 - MEASURING TESTING
Information
Patent Grant
Temperature monitoring unit
Patent number
5,242,224
Issue date
Sep 7, 1993
Mitsubishi Jukogyo Kabushiki Kaisha
Shunsuke Yoshioka
G01 - MEASURING TESTING
Information
Patent Grant
IR sensor for a scanned staggered element linear array having impro...
Patent number
5,075,553
Issue date
Dec 24, 1991
General Electric Company
Milton L. Noble
G01 - MEASURING TESTING
Information
Patent Grant
Agricultural infrared thermometer
Patent number
4,998,826
Issue date
Mar 12, 1991
Telatemp Corporation
Don E. Wood
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring and transmitting the combustion radiation in t...
Patent number
4,918,982
Issue date
Apr 24, 1990
FEV Motorentechnik GmbH & Co. KG
Franz Pischinger
G08 - SIGNALLING
Information
Patent Grant
3600581
Patent number
3,600,581
Issue date
Aug 17, 1971
G02 - OPTICS
Information
Patent Grant
2199082
Patent number
2,199,082
Issue date
Apr 30, 1940
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SENSOR UNIT AND IMAGE PROCESSING DEVICE
Publication number
20230314230
Publication date
Oct 5, 2023
Toshiba Tec Kabushiki Kaisha
Makoto ODANI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SENSOR UNIT AND IMAGE PROCESSING DEVICE
Publication number
20210389187
Publication date
Dec 16, 2021
Toshiba Tec Kabushiki Kaisha
Makoto ODANI
G01 - MEASURING TESTING
Information
Patent Application
MEMS INFRARED SENSOR INCLUDING A PLASMONIC LENS
Publication number
20140294043
Publication date
Oct 2, 2014
Ashwin Samarao
G01 - MEASURING TESTING
Information
Patent Application
MEMS Infrared Sensor Including a Plasmonic Lens
Publication number
20140151834
Publication date
Jun 5, 2014
ROBERT BOSCH GmbH
Ashwin K. Samarao
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE APERTURE MECHANISM FOR USE IN VACUUM AND CRYOGENICALLY-COO...
Publication number
20140061467
Publication date
Mar 6, 2014
Teledyne Scientific & Imaging, LLC
Robert Buzerak
G02 - OPTICS
Information
Patent Application
INFRARED TEMPERATURE MEASURING DEVICE
Publication number
20110243182
Publication date
Oct 6, 2011
Testo AG
Kerstin Tetzlaff
G02 - OPTICS
Information
Patent Application
Fiber optic spectroscopic digital imaging sensor and method for fla...
Publication number
20090153853
Publication date
Jun 18, 2009
Serguei A. Zelepouga
G01 - MEASURING TESTING
Information
Patent Application
Radiation Thermometer
Publication number
20090037135
Publication date
Feb 5, 2009
Land Instruments International Limited
Adrian John Masefield Lyndon
G01 - MEASURING TESTING
Information
Patent Application
Infrared Radiation Temperature Measuring System with Error Source R...
Publication number
20080259994
Publication date
Oct 23, 2008
Seong-Wan Kim
G01 - MEASURING TESTING