Slit arrangements

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G01J1/0462

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J1/00Photometry

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G01J1/0462Slit arrangements

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Patents Grantslast 30 patents

Information Patent Grant
Vision inspection and correction method, together with the system a...
- Patent number 11,789,259
- Issue date Oct 17, 2023
- PASSION LIGHT INC.
- Jih-Yi Liao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical sensing device
- Patent number 11,639,870
- Issue date May 2, 2023
- AUO Corporation
- Shih-Hua Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Indexed multiple slit slider
- Patent number 10,739,194
- Issue date Aug 11, 2020
- FIAT LUX PHOTONICS Inc.
- David Scott Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for increasing dynamic range of a particle sensor
- Patent number 10,591,422
- Issue date Mar 17, 2020
- Honeywell International Inc.
- Xiao Zhu Fan
- G01 - MEASURING TESTING
Information Patent Grant
Targeting system for color measurement device
- Patent number 10,190,911
- Issue date Jan 29, 2019
- X-Rite, Inc.
- Weston Harness
- G02 - OPTICS
Information Patent Grant
Tunable photo-detector device
- Patent number 9,989,410
- Issue date Jun 5, 2018
- HERAEUS NOBLELIGHT AMERICA LLC
- Keith Andrew Helms
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable aperture device with integral aperture holes
- Patent number 9,786,400
- Issue date Oct 10, 2017
- Agilent Technologies, Inc.
- Armin Steinke
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiometers for measuring circumsolar profiles
- Patent number 9,500,516
- Issue date Nov 22, 2016
- Masdar Institute of Science and Technology
- Peter Ross Armstrong
- G01 - MEASURING TESTING
Information Patent Grant
Irradiation field-limiting apparatus, X-ray-generating unit includi...
- Patent number 9,355,752
- Issue date May 31, 2016
- Canon Kabushiki Kaisha
- Yasuo Ohashi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Absolute measurement method and apparatus thereof for non-linear error
- Patent number 9,347,823
- Issue date May 24, 2016
- National Institute of Metrology
- Ruoduan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor
- Patent number 9,166,081
- Issue date Oct 20, 2015
- Denso Corporation
- Makiko Sugiura
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Optical sensor
- Patent number 9,029,746
- Issue date May 12, 2015
- Leonar3Do International Zrt.
- Dániel Rátai
- G01 - MEASURING TESTING
Information Patent Grant
Radiometers having an opaque, elongated member rotationally obstruc...
- Patent number 8,981,272
- Issue date Mar 17, 2015
- Masdar Institute of Science and Technology
- Peter Ross Armstrong
- G01 - MEASURING TESTING
Information Patent Grant
Control aperture for an IR sensor
- Patent number 8,766,186
- Issue date Jul 1, 2014
- Analog Devices, Inc.
- Oliver Kierse
- G01 - MEASURING TESTING
Information Patent Grant
Infrared light detecting apparatus and detecting method thereof
- Patent number 8,759,777
- Issue date Jun 24, 2014
- Capella Microsystems (Taiwan), Inc.
- Koon-Wing Tsang
- G01 - MEASURING TESTING
Information Patent Grant
Slit width adjusting device and microscope laser processing apparatus
- Patent number 8,680,428
- Issue date Mar 25, 2014
- Mitutoyo Corporation
- Hidemitsu Asano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Spatial filter in sample investigation system
- Patent number 8,013,996
- Issue date Sep 6, 2011
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Microscope
- Patent number 7,944,608
- Issue date May 17, 2011
- Olympus Corporation
- Kazuhiro Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus having photoelectric converting element, and device manuf...
- Patent number 7,433,020
- Issue date Oct 7, 2008
- Canon Kabushiki Kaisha
- Tadahiro Asaishi
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor with rotary shaft-driven light intercepting member
- Patent number 7,402,792
- Issue date Jul 22, 2008
- Denso Corporation
- Katsunori Michiyama
- G01 - MEASURING TESTING
Information Patent Grant
Motor control for flux-reduced braking
- Patent number 7,135,833
- Issue date Nov 14, 2006
- Rockwell Automation Technologies, Inc.
- Robert J. DeLange
- G01 - MEASURING TESTING
Information Patent Grant
LED measuring device
- Patent number 7,022,969
- Issue date Apr 4, 2006
- Photo Research, Inc.
- Thomas H. Bulpitt
- G01 - MEASURING TESTING
Information Patent Grant
Dose radiometer
- Patent number 6,952,264
- Issue date Oct 4, 2005
- 3M Innovative Properties Company
- David W. Kuhns
- G01 - MEASURING TESTING
Information Patent Grant
Optical radiation sensor device
- Patent number 6,512,234
- Issue date Jan 28, 2003
- Trojan Technologies, Inc.
- Michael Sasges
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Grant
Integrating cylindrical pixel density detector
- Patent number 6,078,041
- Issue date Jun 20, 2000
- Nishimoto Sangyo Co., Ltd.
- Haruo Kotani
- G01 - MEASURING TESTING
Information Patent Grant
Sun sensor
- Patent number 5,914,483
- Issue date Jun 22, 1999
- Ithaco Space Systems, Inc.
- James J. Fallon
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Sun sensor for orbiting spacecraft
- Patent number 5,698,842
- Issue date Dec 16, 1997
- Space Sciences Corporation
- James J. Fallon
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Radiometric calibration system
- Patent number 5,659,168
- Issue date Aug 19, 1997
- Eastman Kodak Company
- Thomas Willliam Dey
- G01 - MEASURING TESTING
Information Patent Grant
Photo detector adjustment device
- Patent number 4,859,847
- Issue date Aug 22, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Matsuno
- G11 - INFORMATION STORAGE
Information Patent Grant
High power laser beam intensity mapping apparatus
- Patent number 4,828,384
- Issue date May 9, 1989
- Westinghouse Electric Corp.
- Daniel J. Plankenhorn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR WITH AN OMNIDIRECTIONAL FIELD OF VIEW
- Publication number 20240201010
- Publication date Jun 20, 2024
- Life Safety Distribution GmbH
- Janmejaya Tripathy
- G08 - SIGNALLING
Information Patent Application
OPTICAL SENSING DEVICE
- Publication number 20230027911
- Publication date Jan 26, 2023
- AUO Corporation
- Shih-Hua Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Indexed Multiple Slit Slider
- Publication number 20190219442
- Publication date Jul 18, 2019
- FIAT LUX PHOTONICS Inc.
- David Scott Andrews
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INCREASING DYNAMIC RANGE OF A PARTICLE SENSOR
- Publication number 20190107496
- Publication date Apr 11, 2019
- HONEYWELL INTERNATIONAL INC.
- Xiao Zhu Fan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RADIOMETERS FOR MEASURING CIRCUMSOLAR PROFILES
- Publication number 20150355018
- Publication date Dec 10, 2015
- Masdar Institute of Science and Technology
- Peter Ross Armstrong
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS AND OPTICAL INSPECTION SYSTEM
- Publication number 20140250679
- Publication date Sep 11, 2014
- Canon Kabushiki Kaisha
- Masayuki Nishiwaki
- G01 - MEASURING TESTING
Information Patent Application
Infrared Light Detecting Apparatus and Detecting Method Thereof
- Publication number 20130168552
- Publication date Jul 4, 2013
- CAPELLA MICROSYSTEMS (TAIWAN), INC.
- Koon-Wing Tsang
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE APERTURE DEVICE WITH INTEGRAL APERTURE HOLES
- Publication number 20130161517
- Publication date Jun 27, 2013
- AGILENT TECHNOLOGIES, INC.
- Armin Steinke
- G01 - MEASURING TESTING
Information Patent Application
Optical Sensor
- Publication number 20130082168
- Publication date Apr 4, 2013
- Daniel Ratai
- G01 - MEASURING TESTING
Information Patent Application
RADIOMETERS FOR MEASURING CIRCUMSOLAR PROFILES
- Publication number 20130032705
- Publication date Feb 7, 2013
- Peter Ross Armstrong
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY MEASURING UNIT AND MICROSCOPE INCLUDING THE SAME
- Publication number 20120133925
- Publication date May 31, 2012
- OLYMPUS CORPORATION
- Eiji NAKASHO
- G02 - OPTICS
Information Patent Application
APPARATUS, METHOD, AND LITHOGRAPHY SYSTEM
- Publication number 20110222041
- Publication date Sep 15, 2011
- Canon Kabushiki Kaisha
- Yasuyuki Unno
- G01 - MEASURING TESTING
Information Patent Application
Slit width adjusting device and microscope laser processing apparatus
- Publication number 20090314749
- Publication date Dec 24, 2009
- Mitutoyo Corporation
- Hidemitsu Asano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MICROSCOPE
- Publication number 20090161209
- Publication date Jun 25, 2009
- OLYMPUS CORPORATION
- Kazuhiro HAYASHI
- G02 - OPTICS
Information Patent Application
Control aperture for an IR sensor
- Publication number 20080164415
- Publication date Jul 10, 2008
- Oliver Kierse
- G01 - MEASURING TESTING
Information Patent Application
Optical sensor
- Publication number 20060266939
- Publication date Nov 30, 2006
- DENSO CORPORATION
- Katsunori Michiyama
- G01 - MEASURING TESTING
Information Patent Application
Exposing head, luminous amount correction method for the same, and...
- Publication number 20060176361
- Publication date Aug 10, 2006
- Fuji Photo Film Co., Ltd.
- Yasuhiro Seto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Motor control for flux-reduced braking
- Publication number 20060113929
- Publication date Jun 1, 2006
- Rockwell Automation Technologies, Inc.
- Robert J. DeLange
- G02 - OPTICS
Information Patent Application
Apparatus having photoelectric converting element, and device manuf...
- Publication number 20060017051
- Publication date Jan 26, 2006
- Canon Kabushiki Kaisha
- Tadahiro Asaishi
- G01 - MEASURING TESTING
Information Patent Application
LED measuring device
- Publication number 20050253046
- Publication date Nov 17, 2005
- Photo Research, Inc.
- Thomas H. Bulpitt
- G01 - MEASURING TESTING
Information Patent Application
Dose radiometer
- Publication number 20030112438
- Publication date Jun 19, 2003
- 3M Innovative Properties Company
- David W. Kuhns
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS

Slit arrangements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vision inspection and correction method, together with the system a...

Optical sensing device

Indexed multiple slit slider

Apparatus and method for increasing dynamic range of a particle sensor

Targeting system for color measurement device

Tunable photo-detector device

Adjustable aperture device with integral aperture holes

Radiometers for measuring circumsolar profiles

Irradiation field-limiting apparatus, X-ray-generating unit includi...

Absolute measurement method and apparatus thereof for non-linear error

Optical sensor

Optical sensor

Radiometers having an opaque, elongated member rotationally obstruc...

Control aperture for an IR sensor

Infrared light detecting apparatus and detecting method thereof

Slit width adjusting device and microscope laser processing apparatus

Spatial filter in sample investigation system

Microscope

Apparatus having photoelectric converting element, and device manuf...

Optical sensor with rotary shaft-driven light intercepting member

Motor control for flux-reduced braking

LED measuring device

Dose radiometer

Optical radiation sensor device

Integrating cylindrical pixel density detector

Sun sensor

Sun sensor for orbiting spacecraft

Radiometric calibration system

Photo detector adjustment device

High power laser beam intensity mapping apparatus

Patents Applicationslast 30 patents

SENSOR WITH AN OMNIDIRECTIONAL FIELD OF VIEW

OPTICAL SENSING DEVICE

Indexed Multiple Slit Slider

APPARATUS AND METHOD FOR INCREASING DYNAMIC RANGE OF A PARTICLE SENSOR

RADIOMETERS FOR MEASURING CIRCUMSOLAR PROFILES

OPTICAL INSPECTION APPARATUS AND OPTICAL INSPECTION SYSTEM

Infrared Light Detecting Apparatus and Detecting Method Thereof

ADJUSTABLE APERTURE DEVICE WITH INTEGRAL APERTURE HOLES

Optical Sensor

RADIOMETERS FOR MEASURING CIRCUMSOLAR PROFILES

LIGHT INTENSITY MEASURING UNIT AND MICROSCOPE INCLUDING THE SAME

APPARATUS, METHOD, AND LITHOGRAPHY SYSTEM

Slit width adjusting device and microscope laser processing apparatus

MICROSCOPE

Control aperture for an IR sensor

Optical sensor

Exposing head, luminous amount correction method for the same, and...

Motor control for flux-reduced braking

Apparatus having photoelectric converting element, and device manuf...

LED measuring device

Dose radiometer