SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor

Industry

CPC
G01Q60/18

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 12,000,861
- Issue date Jun 4, 2024
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Quantum-dot-based measuring system and method
- Patent number 11,644,479
- Issue date May 9, 2023
- SHANGHAI UNIVERSITY
- Na Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 11,415,597
- Issue date Aug 16, 2022
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Near field scanning probe microscope, probe for scanning probe micr...
- Patent number 10,877,065
- Issue date Dec 29, 2020
- Hitachi, Ltd.
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibrating tip-enhanced Raman microscopes
- Patent number 10,605,826
- Issue date Mar 31, 2020
- International Business Machines Corporation
- Michael Engel
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scanning near-field optical micro...
- Patent number 10,473,693
- Issue date Nov 12, 2019
- Bruker Nano, Inc.
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Near field scanning probe microscope, probe for scanning probe micr...
- Patent number 10,429,411
- Issue date Oct 1, 2019
- Hitachi, Ltd.
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 10,254,307
- Issue date Apr 9, 2019
- Shimadzu Corporation
- Kanji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for chemical and optical imaging with a broadb...
- Patent number 10,241,131
- Issue date Mar 26, 2019
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 10,082,523
- Issue date Sep 25, 2018
- Bruker Nano, Inc.
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and its sample holder
- Patent number 10,073,116
- Issue date Sep 11, 2018
- Hitachi, Ltd.
- Sanato Nagata
- G01 - MEASURING TESTING
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,933,453
- Issue date Apr 3, 2018
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for non-destructive surface chemical analysis o...
- Patent number 9,910,066
- Issue date Mar 6, 2018
- Horiba Instruments, Inc.
- Sergey A. Saunin
- G01 - MEASURING TESTING
Information Patent Grant
Probe-based data collection system with adaptive mode of probing co...
- Patent number 9,891,280
- Issue date Feb 13, 2018
- FEI EFA, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Structured illumination microscopy apparatus and method
- Patent number 9,885,859
- Issue date Feb 6, 2018
- Martin Russell Harris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for manipulating near field using light scatte...
- Patent number 9,857,302
- Issue date Jan 2, 2018
- Korea Advanced Institute of Science and Technology
- Yongkeun Park
- G01 - MEASURING TESTING
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,846,178
- Issue date Dec 19, 2017
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 9,778,282
- Issue date Oct 3, 2017
- Anasys Instruments
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 9,658,247
- Issue date May 23, 2017
- Anasys Instruments
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,448,252
- Issue date Sep 20, 2016
- BRUKER NANO, INCORPORATED
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measurement method using same
- Patent number 9,063,168
- Issue date Jun 23, 2015
- Hitachi, Ltd.
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for measuring the near-field signal
- Patent number 9,043,946
- Issue date May 26, 2015
- Neaspec GmbH
- Nenad Ocelic
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for near-field optical imaging
- Patent number 8,695,109
- Issue date Apr 8, 2014
- The Trustees of the University of Pennsylvania
- John C. Schotland
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and sample observing method using the same
- Patent number 8,695,110
- Issue date Apr 8, 2014
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and sample observing method using the same
- Patent number 8,272,068
- Issue date Sep 18, 2012
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Determination of field distribution
- Patent number 8,222,905
- Issue date Jul 17, 2012
- Agency for Science, Technology and Research
- Zengbo Weng
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Precision machining method using a near-field scanning optical micr...
- Patent number 7,323,657
- Issue date Jan 29, 2008
- Matsushita Electric Industrial Co., Ltd.
- Chen-Hsiung Cheng
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for determining the distance of a near-field probe from a sp...
- Patent number 6,703,614
- Issue date Mar 9, 2004
- Carl Zeiss Jena GmbH
- Thomas Stifter
- G01 - MEASURING TESTING
Information Patent Grant
Disentangling sample topography and physical properties in scanning...
- Patent number 6,376,836
- Issue date Apr 23, 2002
- University of Maryland
- Steven Mark Anlage
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device for optical scanning of objects on a scanning surface and pr...
- Patent number 5,841,129
- Issue date Nov 24, 1998
- Wolfgang Bacsa
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
System and Method for a Non-Tapping Mode Scattering-Type Scanning N...
- Publication number 20220390485
- Publication date Dec 8, 2022
- LEHIGH UNIVERSITY
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATING TIP-ENHANCED RAMAN MICROSCOPES
- Publication number 20190383854
- Publication date Dec 19, 2019
- International Business Machines Corporation
- Michael Engel
- G01 - MEASURING TESTING
Information Patent Application
Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...
- Publication number 20190346480
- Publication date Nov 14, 2019
- Hitachi, Ltd
- Kaifeng ZHANG
- C01 - INORGANIC CHEMISTRY
Information Patent Application
Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...
- Publication number 20180372776
- Publication date Dec 27, 2018
- Hitachi, Ltd
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APARATUS FOR INFRARED SCANNING NEAR-FIELD OPTICAL MICROS...
- Publication number 20180259553
- Publication date Sep 13, 2018
- Anasys Instruments Corp.
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20180259552
- Publication date Sep 13, 2018
- Shimadzu Corporation
- Kanji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20180203039
- Publication date Jul 19, 2018
- ANASYS INSTRUMENTS
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20180059136
- Publication date Mar 1, 2018
- BRUKER NANO, INC.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CHEMICAL AND OPTICAL IMAGING WITH A BROADB...
- Publication number 20180059137
- Publication date Mar 1, 2018
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20170219622
- Publication date Aug 3, 2017
- ANASYS INSTRUMENTS
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING METHOD OF TWO-PHOTON STRUCTURED ILLUMINATION POINT...
- Publication number 20170108532
- Publication date Apr 20, 2017
- National Central University
- Szu-Yu CHEN
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20170003316
- Publication date Jan 5, 2017
- ANASYS INSTRUMENTS
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Manipulating Near Field Using Light Scatte...
- Publication number 20160146731
- Publication date May 26, 2016
- Korea Advanced Institute of Science and Technology
- Yongkeun Park
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20160018437
- Publication date Jan 21, 2016
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20160003868
- Publication date Jan 7, 2016
- ANASYS INSTRUMENTS
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Non-Destructive Surface Chemical Analysis o...
- Publication number 20150338439
- Publication date Nov 26, 2015
- AIST-NT, Inc.
- Sergey A. Saunin
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Miscroscope
- Publication number 20150177276
- Publication date Jun 25, 2015
- Hitachi, Ltd
- Takehiro Tachizaki
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURED ILLUMINATION MICROSCOPY APPARATUS AND METHOD
- Publication number 20150168702
- Publication date Jun 18, 2015
- Martin Russell Harris
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR CORRELATING IMAGES OF A PHOTOLITHOGRAPHIC...
- Publication number 20150169997
- Publication date Jun 18, 2015
- CARL ZEISS SMS GMBH
- Dieter Weber
- G02 - OPTICS
Information Patent Application
METHOD FOR MEASURING THE NEAR-FIELD SIGNAL
- Publication number 20150089694
- Publication date Mar 26, 2015
- Neaspec GmbH
- Nenad Ocelic
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope and Measurement Method Using Same
- Publication number 20140165237
- Publication date Jun 12, 2014
- Hitachi, Ltd.
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME
- Publication number 20130145507
- Publication date Jun 6, 2013
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND SYSTEM FOR NEAR-FIELD OPTICAL IMAGING
- Publication number 20120096601
- Publication date Apr 19, 2012
- John C. Schotland
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME
- Publication number 20100064396
- Publication date Mar 11, 2010
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Determination of Field Distribution
- Publication number 20080284446
- Publication date Nov 20, 2008
- Zengbo Wang
- G01 - MEASURING TESTING
Information Patent Application
Precision machining method using a near-field scanning optical micr...
- Publication number 20060027543
- Publication date Feb 9, 2006
- Chen-Hsiung Cheng
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for a non-tapping mode scattering-type scanning n...

Quantum-dot-based measuring system and method

System and method for a non-tapping mode scattering-type scanning n...

Near field scanning probe microscope, probe for scanning probe micr...

Calibrating tip-enhanced Raman microscopes

Method and apparatus for infrared scanning near-field optical micro...

Near field scanning probe microscope, probe for scanning probe micr...

Scanning probe microscope

Method and apparatus for chemical and optical imaging with a broadb...

Method and apparatus for infrared scattering scanning near-field op...

Scanning probe microscope and its sample holder

Chemical nano-identification of a sample using normalized near-fiel...

Systems and methods for non-destructive surface chemical analysis o...

Probe-based data collection system with adaptive mode of probing co...

Structured illumination microscopy apparatus and method

Method and apparatus for manipulating near field using light scatte...

Chemical nano-identification of a sample using normalized near-fiel...

Method and apparatus for infrared scattering scanning near-field op...

Method and apparatus for infrared scattering scanning near-field op...

Chemical nano-identification of a sample using normalized near-fiel...

Scanning probe microscope and measurement method using same

Method for measuring the near-field signal

Method and system for near-field optical imaging

Scanning probe microscope and sample observing method using the same

Scanning probe microscope and sample observing method using the same

Determination of field distribution

Precision machining method using a near-field scanning optical micr...

Method for determining the distance of a near-field probe from a sp...

Disentangling sample topography and physical properties in scanning...

Device for optical scanning of objects on a scanning surface and pr...

Patents Applicationslast 30 patents

System and Method for a Non-Tapping Mode Scattering-Type Scanning N...

CALIBRATING TIP-ENHANCED RAMAN MICROSCOPES

Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...

Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...

METHOD AND APARATUS FOR INFRARED SCANNING NEAR-FIELD OPTICAL MICROS...

SCANNING PROBE MICROSCOPE

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

METHOD AND APPARATUS FOR CHEMICAL AND OPTICAL IMAGING WITH A BROADB...

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

IMAGE PROCESSING METHOD OF TWO-PHOTON STRUCTURED ILLUMINATION POINT...

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

Method and Apparatus for Manipulating Near Field Using Light Scatte...

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

Systems and Methods for Non-Destructive Surface Chemical Analysis o...

Scanning Probe Miscroscope

STRUCTURED ILLUMINATION MICROSCOPY APPARATUS AND METHOD

APPARATUS AND METHOD FOR CORRELATING IMAGES OF A PHOTOLITHOGRAPHIC...

METHOD FOR MEASURING THE NEAR-FIELD SIGNAL

Scanning Probe Microscope and Measurement Method Using Same

SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME

METHOD AND SYSTEM FOR NEAR-FIELD OPTICAL IMAGING

SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME

Determination of Field Distribution

Precision machining method using a near-field scanning optical micr...