Software therefor

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CPC
G01R13/029

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

Current Industry

G01R13/029Software therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Swept parameter oscilloscope
- Patent number 12,085,590
- Issue date Sep 10, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, computer-readable medium, and inf...
- Patent number 12,066,463
- Issue date Aug 20, 2024
- Ricoh Company, Ltd.
- Miyako Asai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Oscilloscope and signal analysis method
- Patent number 12,055,564
- Issue date Aug 6, 2024
- Rohde & Schwarz GmbH & Co. KG
- Manuel Stein
- G01 - MEASURING TESTING
Information Patent Grant
Voltage monitoring circuit for interface
- Patent number 11,899,061
- Issue date Feb 13, 2024
- Apple Inc.
- Fabien S. Faure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal analyzer
- Patent number 11,885,832
- Issue date Jan 30, 2024
- Rohde & Schwarz GmbH & Co. KG
- Thomas Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement instrument
- Patent number 11,867,725
- Issue date Jan 9, 2024
- Rohde & Schwarz GmbH & Co. KG
- Bernhard Sterzbach
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing error in time domain waveform of a s...
- Patent number 11,821,920
- Issue date Nov 21, 2023
- Keysight Technologies, Inc.
- Marlin E. Viss
- G01 - MEASURING TESTING
Information Patent Grant
Signal post-processing method, signal post-processing circuit and o...
- Patent number 11,719,723
- Issue date Aug 8, 2023
- Rohde & Schwarz GmbH & Co. KG
- Thomas Günther
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device with local browser application
- Patent number 11,635,451
- Issue date Apr 25, 2023
- Rohde & Schwarz GmbH & Co. KG
- Joachim Eibl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High resolution spectrum monitoring
- Patent number 11,630,138
- Issue date Apr 18, 2023
- The Regents of the University of California
- Yeswanth Reddy Guddeti
- G01 - MEASURING TESTING
Information Patent Grant
Display device and inertial measurement system
- Patent number 11,624,649
- Issue date Apr 11, 2023
- Seiko Epson Corporation
- Kenta Sato
- G01 - MEASURING TESTING
Information Patent Grant
Frequency converter accessory for a test and measurement instrument
- Patent number 11,619,657
- Issue date Apr 4, 2023
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing error in time domain waveform of a s...
- Patent number 11,604,213
- Issue date Mar 14, 2023
- Keysight Technologies, Inc.
- Steven Draving
- G01 - MEASURING TESTING
Information Patent Grant
Method, a diagnosing system and a computer program product for diag...
- Patent number 11,544,163
- Issue date Jan 3, 2023
- Procentec B.V.
- Matthew Dulcey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for data mapping and storing in digital three-dimensional os...
- Patent number 11,486,901
- Issue date Nov 1, 2022
- University of Electronic Science and Technology of China
- Yuhua Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for displaying measurement results in tab windows
- Patent number 11,360,645
- Issue date Jun 14, 2022
- Rohde & Schwarz GmbH & Co. KG
- Thomas Koch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Categorization of acquired data based on explicit and implicit means
- Patent number 11,181,552
- Issue date Nov 23, 2021
- Tektronix, Inc.
- Joshua J. O'Brien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring device for measuring signals and data handling method
- Patent number 11,163,455
- Issue date Nov 2, 2021
- Rohde & Schwarz GmbH & Co. KG
- Mario Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating a representation of high-frequency electric power delive...
- Patent number 11,152,916
- Issue date Oct 19, 2021
- Schweitzer Engineering Laboratories, Inc.
- Matthew J. Halladay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring device and measuring method with multiple display
- Patent number 11,054,445
- Issue date Jul 6, 2021
- Rohde & Schwarz GmbH & Co. KG
- Matthias Keller
- G01 - MEASURING TESTING
Information Patent Grant
Method for performing a bus autoset function and measurement device
- Patent number 10,991,341
- Issue date Apr 27, 2021
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Soft front panel for concurrent radio frequency measurements
- Patent number 10,969,407
- Issue date Apr 6, 2021
- National Instruments Corporation
- Matthew D. Kisler
- G01 - MEASURING TESTING
Information Patent Grant
Changing the manner in which an electronic test instrument filters...
- Patent number 10,914,760
- Issue date Feb 9, 2021
- Teledyne LeCroy, Inc.
- Frederic Antonin
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and configuration method
- Patent number 10,908,197
- Issue date Feb 2, 2021
- Rohde & Schwarz GmbH & Co. KG
- Mario Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for 3D waveform mapping of full-parallel structure
- Patent number 10,885,604
- Issue date Jan 5, 2021
- University of Electronic Science and Technology of China
- Wuhuang Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Oscilloscope as well as method for analyzing a measured signal
- Patent number 10,837,983
- Issue date Nov 17, 2020
- Rohde & Schwarz GmbH & Co. KG
- Mario Guenther
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display device that allows cycle time comparison to be made
- Patent number 10,802,051
- Issue date Oct 13, 2020
- FANUC CORPORATION
- Kouta Tagami
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing a measured signal as well as measurement unit
- Patent number 10,802,050
- Issue date Oct 13, 2020
- Rohde & Schwarz GmbH & Co. KG
- Sven Barthel
- G01 - MEASURING TESTING
Information Patent Grant
Extracting real-time data from EtherCAT sensor bus in a substrate p...
- Patent number 10,761,517
- Issue date Sep 1, 2020
- Lam Research Corporation
- Behzad Lajevardi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variable resolution oscilloscope
- Patent number 10,725,070
- Issue date Jul 28, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE...
- Publication number 20240393369
- Publication date Nov 28, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
INTERLEAVED DIGITAL TRIGGER CORRECTION
- Publication number 20240353449
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT THAT USES MEASUREMENT PRECONDITIONS...
- Publication number 20240288474
- Publication date Aug 29, 2024
- Tektronix, Inc.
- David C. Vollum
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION DEVICE, MEASUREMENT APPLICATION SETUP AND M...
- Publication number 20240094272
- Publication date Mar 21, 2024
- Rohde& Schwarz GmbH & Co. KG
- Tobias FASTNER
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION SETUP AND METHOD
- Publication number 20240085461
- Publication date Mar 14, 2024
- Rohde& Schwarz GmbH & Co. KG
- Bendix KOOPMANN
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION DEVICE AND METHOD
- Publication number 20240036075
- Publication date Feb 1, 2024
- Rohde& Schwarz GmbH & Co. KG
- Christoph HOLZLEITNER
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED WAVEFORM ACQUISITIONS AND HISTOGRAMS USING GRAPHICS PROC...
- Publication number 20240027497
- Publication date Jan 25, 2024
- Tektronix, Inc.
- Andy K. Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATING NOISE TO INCREASE MACHINE LEARNING PREDICTION ACCURACY I...
- Publication number 20230408550
- Publication date Dec 21, 2023
- Tektronix, Inc.
- John J. PICKERD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OSCILLOSCOPE HAVING A PRINCIPAL COMPONENT ANALYZER
- Publication number 20230408551
- Publication date Dec 21, 2023
- Tektronix, Inc.
- Justin E. Patterson
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE POST PROCESSING SYSTEM, METHOD AND MEASUREMENT DEVICE
- Publication number 20230358788
- Publication date Nov 9, 2023
- Rohde& Schwarz GmbH & Co. KG
- Wolfgang Herbordt
- G01 - MEASURING TESTING
Information Patent Application
SEMI-AUTOMATED OSCILLOSCOPE NOISE COMPENSATION BASED ON POWER SPECT...
- Publication number 20230324439
- Publication date Oct 12, 2023
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
SEAMLESS SPECTROGRAMS IN A MULTI-CHANNEL TEST AND MEASUREMENT INSTR...
- Publication number 20230258692
- Publication date Aug 17, 2023
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC DETERMINATION OF SPECTRUM AND SPECTROGRAM ATTRIBUTES IN A...
- Publication number 20230221352
- Publication date Jul 13, 2023
- Tektronix, Inc.
- Gary J. Waldo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT HAVING SPECTROGRAM WITH CURSOR TIME...
- Publication number 20230221353
- Publication date Jul 13, 2023
- Tektronix, Inc.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME CLOCK RECOVERY FOR A NEARLY-REAL-TIME REAL-EQU...
- Publication number 20230070298
- Publication date Mar 9, 2023
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, COMPUTER-READABLE MEDIUM, AND INF...
- Publication number 20230034939
- Publication date Feb 2, 2023
- Miyako ASAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SWEPT PARAMETER OSCILLOSCOPE
- Publication number 20230019734
- Publication date Jan 19, 2023
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OSCILLOSCOPE AND SIGNAL ANALYSIS METHOD
- Publication number 20220397589
- Publication date Dec 15, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Manuel Stein
- G01 - MEASURING TESTING
Information Patent Application
Voltage Monitoring Circuit for Interface
- Publication number 20220397604
- Publication date Dec 15, 2022
- Apple Inc.
- Fabien S. Faure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PEAK SELECTION ASSISTANCE FOR RF SPECTRUM ANALYSIS
- Publication number 20220244293
- Publication date Aug 4, 2022
- EXFO INC.
- Dominic LAPIERRE
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INSTRUMENT
- Publication number 20220146554
- Publication date May 12, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Bernhard STERZBACH
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ANALYZER
- Publication number 20220113335
- Publication date Apr 14, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Thomas GUENTHER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Display Device and Inertial Measurement System
- Publication number 20210333147
- Publication date Oct 28, 2021
- SEIKO EPSON CORPORATION
- Kenta SATO
- G01 - MEASURING TESTING
Information Patent Application
HARDWARE TRIGGER GENERATION FROM A DECLARATIVE PROTOCOL DESCRIPTION
- Publication number 20210325432
- Publication date Oct 21, 2021
- Tektronix, Inc.
- Aidan A. D. Jensen
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM-BASED HEMODYNAMIC INSTABILITY WARNING
- Publication number 20210282724
- Publication date Sep 16, 2021
- Koninklijke Philips N.V.
- Annamalai NATARAJAN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IDENTIFYING ONE OR MORE ACQUISITIONS OF INTEREST USING VISUAL QUALI...
- Publication number 20210278441
- Publication date Sep 9, 2021
- Tektronix, Inc.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DATA MAPPING AND STORING IN DIGITAL THREE-DIMENSIONAL OS...
- Publication number 20210215744
- Publication date Jul 15, 2021
- University of Electronic Science and Technology of China
- Yuhua CHENG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DISPLAYING MEASUREMENT RESULTS IN TAB WINDOWS
- Publication number 20210165541
- Publication date Jun 3, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Thomas KOCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20210148951
- Publication date May 20, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DERIVING INFORMATION FROM SAMPLED DATA ON A...
- Publication number 20210148952
- Publication date May 20, 2021
- SCHNEIDER ELECTRIC USA, INC.
- Erin C. McPhalen
- G01 - MEASURING TESTING

Software therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Swept parameter oscilloscope

Information processing apparatus, computer-readable medium, and inf...

Oscilloscope and signal analysis method

Voltage monitoring circuit for interface

Signal analyzer

Measurement instrument

System and method for reducing error in time domain waveform of a s...

Signal post-processing method, signal post-processing circuit and o...

Measurement device with local browser application

High resolution spectrum monitoring

Display device and inertial measurement system

Frequency converter accessory for a test and measurement instrument

System and method for reducing error in time domain waveform of a s...

Method, a diagnosing system and a computer program product for diag...

System for data mapping and storing in digital three-dimensional os...

Method and device for displaying measurement results in tab windows

Categorization of acquired data based on explicit and implicit means

Measuring device for measuring signals and data handling method

Generating a representation of high-frequency electric power delive...

Measuring device and measuring method with multiple display

Method for performing a bus autoset function and measurement device

Soft front panel for concurrent radio frequency measurements

Changing the manner in which an electronic test instrument filters...

Measurement device and configuration method

Method for 3D waveform mapping of full-parallel structure

Oscilloscope as well as method for analyzing a measured signal

Waveform display device that allows cycle time comparison to be made

Method for analyzing a measured signal as well as measurement unit

Extracting real-time data from EtherCAT sensor bus in a substrate p...

Variable resolution oscilloscope

Patents Applicationslast 30 patents

REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE...

INTERLEAVED DIGITAL TRIGGER CORRECTION

TEST AND MEASUREMENT INSTRUMENT THAT USES MEASUREMENT PRECONDITIONS...

MEASUREMENT APPLICATION DEVICE, MEASUREMENT APPLICATION SETUP AND M...

MEASUREMENT APPLICATION SETUP AND METHOD

MEASUREMENT APPLICATION DEVICE AND METHOD

HIGH SPEED WAVEFORM ACQUISITIONS AND HISTOGRAMS USING GRAPHICS PROC...

SEPARATING NOISE TO INCREASE MACHINE LEARNING PREDICTION ACCURACY I...

OSCILLOSCOPE HAVING A PRINCIPAL COMPONENT ANALYZER

OSCILLOSCOPE POST PROCESSING SYSTEM, METHOD AND MEASUREMENT DEVICE

SEMI-AUTOMATED OSCILLOSCOPE NOISE COMPENSATION BASED ON POWER SPECT...

SEAMLESS SPECTROGRAMS IN A MULTI-CHANNEL TEST AND MEASUREMENT INSTR...

AUTOMATIC DETERMINATION OF SPECTRUM AND SPECTROGRAM ATTRIBUTES IN A...

TEST AND MEASUREMENT INSTRUMENT HAVING SPECTROGRAM WITH CURSOR TIME...

REAL-EQUIVALENT-TIME CLOCK RECOVERY FOR A NEARLY-REAL-TIME REAL-EQU...

INFORMATION PROCESSING APPARATUS, COMPUTER-READABLE MEDIUM, AND INF...

SWEPT PARAMETER OSCILLOSCOPE

OSCILLOSCOPE AND SIGNAL ANALYSIS METHOD

Voltage Monitoring Circuit for Interface

PEAK SELECTION ASSISTANCE FOR RF SPECTRUM ANALYSIS

MEASUREMENT INSTRUMENT

SIGNAL ANALYZER

Display Device and Inertial Measurement System

HARDWARE TRIGGER GENERATION FROM A DECLARATIVE PROTOCOL DESCRIPTION

WAVEFORM-BASED HEMODYNAMIC INSTABILITY WARNING

IDENTIFYING ONE OR MORE ACQUISITIONS OF INTEREST USING VISUAL QUALI...

SYSTEM FOR DATA MAPPING AND STORING IN DIGITAL THREE-DIMENSIONAL OS...

METHOD AND DEVICE FOR DISPLAYING MEASUREMENT RESULTS IN TAB WINDOWS

FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT

SYSTEMS AND METHODS FOR DERIVING INFORMATION FROM SAMPLED DATA ON A...