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G01N2223/3307
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating materials by wave or particle radiation
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G01N2223/3307
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Patents Grants
last 30 patents
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Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
Patent number
12,099,025
Issue date
Sep 24, 2024
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Rotational X-ray inspection system and method
Patent number
12,061,156
Issue date
Aug 13, 2024
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for generating three-dimensional images that en...
Patent number
12,056,840
Issue date
Aug 6, 2024
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray automated calibration and monitoring
Patent number
12,044,634
Issue date
Jul 23, 2024
John Bean Technologies Corporation
Jeffrey C. Gill
G01 - MEASURING TESTING
Information
Patent Grant
X-ray baggage and parcel inspection system with efficient third-par...
Patent number
12,007,341
Issue date
Jun 11, 2024
Battelle Memorial Institute
Rodney Arthur Hallgren
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray unit technology modules and automated application training
Patent number
11,988,617
Issue date
May 21, 2024
John Bean Technologies Corporation
Jeffrey C. Gill
G01 - MEASURING TESTING
Information
Patent Grant
Insert for screening tray
Patent number
11,977,037
Issue date
May 7, 2024
Rapiscan Holdings, Inc.
Philippe Desjeans-Gauthier
G01 - MEASURING TESTING
Information
Patent Grant
Static CT detection device
Patent number
11,925,183
Issue date
Mar 12, 2024
Tsinghua University
Zhiqiang Chen
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Grant
Multi-channel static CT device
Patent number
11,906,447
Issue date
Feb 20, 2024
Nuctech Company Limited
Zhiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Calibration method and device therefor
Patent number
11,885,752
Issue date
Jan 30, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Grant
X-ray collimator and related X-ray inspection apparatus
Patent number
11,854,712
Issue date
Dec 26, 2023
DUE2LAB S.R.L.
Nicola Zambelli
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Scanning systems and related methods
Patent number
11,807,466
Issue date
Nov 7, 2023
IDSS Holdings, Inc.
James Michael Connelly
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Real-time inline digital tomosynthesis system
Patent number
11,774,377
Issue date
Oct 3, 2023
JPI Healthcare CO., LTD.
Kyong-Woo Kim
G01 - MEASURING TESTING
Information
Patent Grant
X-ray security device
Patent number
11,761,912
Issue date
Sep 19, 2023
Delta Electronics, Inc.
Sih-Yu Chen
G01 - MEASURING TESTING
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Patent Grant
Method for imaging a sample
Patent number
11,742,171
Issue date
Aug 29, 2023
Excillum AB
Björn Hansson
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Specimen radiography system comprising cabinet and a specimen drawe...
Patent number
11,730,434
Issue date
Aug 22, 2023
Hologic, Inc.
Kenneth Defreitas
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray scanning system and method
Patent number
11,656,188
Issue date
May 23, 2023
United Parcel Service of America, Inc.
Wendie Patricia Hayler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Serial Moire scanning phase contrast x-ray imaging
Patent number
11,639,903
Issue date
May 2, 2023
Battelle Memorial Institute
Erin A. Miller
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Inspection device, inspection method, and method for producing obje...
Patent number
11,639,904
Issue date
May 2, 2023
Nikon Corporation
Takeshi Ohbayashi
G01 - MEASURING TESTING
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Patent Grant
CT scanner and method for performing a CT examination of an object
Patent number
11,609,189
Issue date
Mar 21, 2023
BIOMETIC S.R.L.
Thomas Prenn
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Methods and systems for generating three-dimensional images that en...
Patent number
11,594,001
Issue date
Feb 28, 2023
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for performing a tomographic examination of an...
Patent number
11,428,648
Issue date
Aug 30, 2022
Microtec S.R.L.
Enrico Ursella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detector, radiation inspecting device, and method for pro...
Patent number
11,402,517
Issue date
Aug 2, 2022
Nihon Kessho Kogaku Co., Ltd.
Makoto Otake
G01 - MEASURING TESTING
Information
Patent Grant
X-ray phase imaging apparatus
Patent number
11,311,260
Issue date
Apr 26, 2022
Shimadzu Corporation
Satoshi Sano
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray inspection apparatus
Patent number
11,268,917
Issue date
Mar 8, 2022
Shimadzu Corporation
Yoshihiko Iwao
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for determining the microstructure of a metal pro...
Patent number
11,249,037
Issue date
Feb 15, 2022
SMS group GMBH
Mostafa Biglari
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...
Patent number
11,152,130
Issue date
Oct 19, 2021
Massachusetts Institute of Technology
Akintunde I. Akinwande
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
System and method for nanoscale X-ray imaging of biological specimen
Patent number
11,145,431
Issue date
Oct 12, 2021
Massachusetts Institute of Technology
Richard C. Lanza
G01 - MEASURING TESTING
Information
Patent Grant
X-ray diffraction and X-ray spectroscopy method and related apparatus
Patent number
11,105,756
Issue date
Aug 31, 2021
NINGBO GALAXY MATERIALS TECHNOLOGY CO. LTD.
Xiao-dong Xiang
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting an anomaly in a single crystal structure
Patent number
11,099,143
Issue date
Aug 24, 2021
Rolls-Royce PLC
Jacqueline Griffiths
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...
Publication number
20240410837
Publication date
Dec 12, 2024
Nuctech Company Limited
Qingping HUANG
G01 - MEASURING TESTING
Information
Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
Publication number
20240412476
Publication date
Dec 12, 2024
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CT IMAGING SYSTEM
Publication number
20240410839
Publication date
Dec 12, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
RAY SCANNING APPARATUS
Publication number
20240369499
Publication date
Nov 7, 2024
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
Tray Insert for Screening Tray
Publication number
20240353354
Publication date
Oct 24, 2024
Rapiscan Holdings, Inc.
Philippe Desjeans-Gauthier
G01 - MEASURING TESTING
Information
Patent Application
3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE
Publication number
20240345003
Publication date
Oct 17, 2024
Faxitron Bioptics, LLC
Ciaran PURDY
G01 - MEASURING TESTING
Information
Patent Application
X-RAY IMAGE ACQUISITION DEVICE AND X-RAY IMAGE ACQUISITION SYSTEM
Publication number
20240319116
Publication date
Sep 26, 2024
Hamamatsu Photonics K.K.
Haruki SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
Publication number
20240280514
Publication date
Aug 22, 2024
Battelle Memorial Institute
Rodney Arthur Hallgren
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-Ray Imaging Apparatus and Subject Holding Mechanism
Publication number
20240230559
Publication date
Jul 11, 2024
Shimadzu Corporation
Masashi HAYAKAWA
G01 - MEASURING TESTING
Information
Patent Application
Calibration Method and Device Therefor
Publication number
20240134083
Publication date
Apr 25, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
Publication number
20240094147
Publication date
Mar 21, 2024
Rapiscan Holdings, Inc.
Mark Procter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
Publication number
20240044820
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Kuo-Feng TSENG
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD, APPARATUS AND SYSTEM
Publication number
20240027371
Publication date
Jan 25, 2024
Nuctech Company Limited
Zhi ZENG
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...
Publication number
20230404499
Publication date
Dec 21, 2023
HOLOGIC, INC.
Kenneth DEFREITAS
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
PROCEDURE FOR GENERATING THE DATA FOR THE RECONSTRUCTION OF A VOLUM...
Publication number
20230296534
Publication date
Sep 21, 2023
Comet Yxlon GmbH
Mareike TÖPPERWIEN
G01 - MEASURING TESTING
Information
Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
Publication number
20230298295
Publication date
Sep 21, 2023
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY SECURITY DEVICE
Publication number
20230258583
Publication date
Aug 17, 2023
Delta Electronics, Inc.
Sih-Yu CHEN
G01 - MEASURING TESTING
Information
Patent Application
LABORATORY-BASED 3D SCANNING X-RAY LAUE MICRO-DIFFRACTION SYSTEM AN...
Publication number
20230251213
Publication date
Aug 10, 2023
Danmarks Tekniske Universitet
Yubin Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATIC PARTICLE BEAM FOCUSING
Publication number
20230245291
Publication date
Aug 3, 2023
FEI Company
Yuchen Deng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems and Methods to Determine a Safe Time to Fire in a Vehicle I...
Publication number
20230036700
Publication date
Feb 2, 2023
Rapiscan Holdings, Inc.
Steven Thompson
G01 - MEASURING TESTING
Information
Patent Application
REAL-TIME INLINE DIGITAL TOMOSYNTHESIS SYSTEM
Publication number
20220365005
Publication date
Nov 17, 2022
JPI Healthcare CO., LTD.
Kyong-Woo KIM
G01 - MEASURING TESTING
Information
Patent Application
STATIC CT DETECTION DEVICE
Publication number
20220357288
Publication date
Nov 10, 2022
TSINGHUA UNIVERSITY
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
RAPID X-RAY RADIATION IMAGING SYSTEM AND MOBILE IMAGING SYSTEM
Publication number
20220326165
Publication date
Oct 13, 2022
JST POWER EQUIPMENT, INC.
Haoning Liang
G01 - MEASURING TESTING
Information
Patent Application
X-RAY AUTOMATED CALIBRATION AND MONITORING
Publication number
20220291148
Publication date
Sep 15, 2022
John Bean Technologies Corporation
Jeffrey C. Gill
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMAGING A SAMPLE
Publication number
20220262591
Publication date
Aug 18, 2022
Excillum AB
Björn HANSSON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH-ENERGY X-RAY IMAGING SYSTEM
Publication number
20220260745
Publication date
Aug 18, 2022
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
Publication number
20220230366
Publication date
Jul 21, 2022
Battelle Memorial Institute
Rodney Arthur Hallgren
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR X RAY IRRADIATION
Publication number
20220163464
Publication date
May 26, 2022
ION BEAM APPLICATIONS
Peter BAKER
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR, RADIATION INSPECTING DEVICE, AND METHOD FOR PRO...
Publication number
20220155469
Publication date
May 19, 2022
Nihon Kessho Kogaku Co.,Ltd.
Makoto OTAKE
G01 - MEASURING TESTING
Information
Patent Application
MULTI-CHANNEL STATIC CT DEVICE
Publication number
20220091051
Publication date
Mar 24, 2022
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING