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G01N2201/021
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
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G01N2201/021
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Patents Grants
last 30 patents
Information
Patent Grant
Food analysis apparatus
Patent number
12,158,413
Issue date
Dec 3, 2024
BEYOND HONEYCOMB INC
Hyun Ki Jung
F24 - HEATING RANGES VENTILATING
Information
Patent Grant
Slope, p-component and s-component measurement
Patent number
12,146,830
Issue date
Nov 19, 2024
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Remote microscopy for biological sciences
Patent number
12,099,012
Issue date
Sep 24, 2024
The Regents of the University of California
Victoria Ly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Leak detection system for subsea equipment
Patent number
12,072,264
Issue date
Aug 27, 2024
OneSubsea IP UK Limited
Andrew J. Speck
E21 - EARTH DRILLING MINING
Information
Patent Grant
System and device for substance detection
Patent number
12,050,173
Issue date
Jul 30, 2024
Urugus S.A.
David Vilaseca
G01 - MEASURING TESTING
Information
Patent Grant
Automatic system for blade inspection
Patent number
12,044,630
Issue date
Jul 23, 2024
Faspar S.P.A.
Paolo Ottavio Aime
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
System and method for synchronized stage movement
Patent number
12,038,375
Issue date
Jul 16, 2024
Thermo Electron Scientific Instruments LLC
Peter Steinberg
G02 - OPTICS
Information
Patent Grant
Method and apparatus for launching and recovering a remote inspecti...
Patent number
12,011,626
Issue date
Jun 18, 2024
Phillips 66 Company
Troy L. Staires
G01 - MEASURING TESTING
Information
Patent Grant
Metrology apparatus and method based on diffraction using oblique i...
Patent number
12,002,698
Issue date
Jun 4, 2024
Samsung Electronics Co., Ltd.
Myungjun Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sample rotating rack and Raman spectrum detector
Patent number
11,971,358
Issue date
Apr 30, 2024
Shengqi Wang
G01 - MEASURING TESTING
Information
Patent Grant
Variable light diffuser for plant leaf gas exchange measurements
Patent number
11,965,828
Issue date
Apr 23, 2024
Chapman University
Z. Carter Berry
G01 - MEASURING TESTING
Information
Patent Grant
Assembly for detecting defects on a motor vehicle bodywork
Patent number
11,965,836
Issue date
Apr 23, 2024
PROOV STATION
Gabriel Tissandier
G01 - MEASURING TESTING
Information
Patent Grant
Deflection-type refractometer with extended measurement range
Patent number
11,953,476
Issue date
Apr 9, 2024
Polymer Characterization, S.A.
Alberto Ortin Sebastian
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for launching and recovering a remote inspecti...
Patent number
11,931,612
Issue date
Mar 19, 2024
Phillips 66 Company
Troy L. Staires
G01 - MEASURING TESTING
Information
Patent Grant
Multi-mode illumination system
Patent number
11,927,533
Issue date
Mar 12, 2024
ESSENLIX CORPORATION
Ji Qi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for launching and recovering a remote inspecti...
Patent number
11,925,824
Issue date
Mar 12, 2024
Phillips 66 Company
Troy L. Staires
G01 - MEASURING TESTING
Information
Patent Grant
Spinning apparatus for measurement of characteristics relating to m...
Patent number
11,913,872
Issue date
Feb 27, 2024
President and Fellows of Harvard College
Darren Yang
B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...
Information
Patent Grant
System of measuring image of pattern in scanning type EUV mask
Patent number
11,914,282
Issue date
Feb 27, 2024
Samsung Electronics Co., Ltd.
Donggun Lee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Portable lighting device for workbench
Patent number
11,859,798
Issue date
Jan 2, 2024
Dennis Rotim
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Method and apparatus for transmittance measurements of large articles
Patent number
11,828,707
Issue date
Nov 28, 2023
ASM IP Holding B.V.
Shiva K. T. Rajavelu Muralidhar
G01 - MEASURING TESTING
Information
Patent Grant
Fast and accurate Mueller matrix infrared ellipsometer
Patent number
11,821,833
Issue date
Nov 21, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Device for recognizing defects remaining in finished surface of pro...
Patent number
11,798,155
Issue date
Oct 24, 2023
Fu Tai Hua Industry (Shenzhen) Co., Ltd.
Liu-Bin Hu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for analyzing a rail
Patent number
11,787,452
Issue date
Oct 17, 2023
Ensco, Inc.
Anthony Kim
E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information
Patent Grant
Raman spectroscopy method and apparatus
Patent number
11,774,364
Issue date
Oct 3, 2023
The University of Nottingham
Ioan Notingher
G01 - MEASURING TESTING
Information
Patent Grant
Imaging and inspection of plugged honeycomb body
Patent number
11,761,908
Issue date
Sep 19, 2023
Corning Incorporated
Julie Marie Daugherty
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus, processing system, and method of manu...
Patent number
11,749,546
Issue date
Sep 5, 2023
Canon Kabushiki Kaisha
Kohei Suzuki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
Patent number
11,740,176
Issue date
Aug 29, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and method of measuring wavefront aberration
Patent number
11,733,176
Issue date
Aug 22, 2023
Samsung Electronics Co., Ltd.
Akihiro Komatsu
G01 - MEASURING TESTING
Information
Patent Grant
Structure of optical sensor having light-emitting element and light...
Patent number
11,674,893
Issue date
Jun 13, 2023
Canon Kabushiki Kaisha
Kazushi Ino
G01 - MEASURING TESTING
Information
Patent Grant
Information processing device, information processing method, and c...
Patent number
11,657,534
Issue date
May 23, 2023
Sony Group Corporation
Kayoko Tanaka
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
MACHINE LEARNING DEVICE, EXHAUST GAS ANALYSIS DEVICE, MACHINE LEARN...
Publication number
20240418638
Publication date
Dec 19, 2024
HORIBA, LTD.
Makoto NAGAOKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COLORIMETRIC APPARATUS AND COLORIMETRIC METHOD
Publication number
20240377313
Publication date
Nov 14, 2024
SEIKO EPSON CORPORATION
Masayoshi MIYAKAWA
G01 - MEASURING TESTING
Information
Patent Application
Microspot Reflectometer
Publication number
20240344980
Publication date
Oct 17, 2024
The Boeing Company
Brian Gunther
G02 - OPTICS
Information
Patent Application
PHOTOACOUSTIC CUVETTE PLATFORM
Publication number
20240337585
Publication date
Oct 10, 2024
Arizona Board of Regents on behalf of Arizona State University
Barbara Smith
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL IMAGING SYSTEM AND METHOD
Publication number
20240328931
Publication date
Oct 3, 2024
MOTION METRICS INTERNATIONAL CORP.
Obada Alhumsi
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR DETECTING OPTICAL SIGNALS
Publication number
20240310282
Publication date
Sep 19, 2024
SEEGENE, Inc
Simon Philip Adam HIGGINS
G01 - MEASURING TESTING
Information
Patent Application
UV SPECTROPHOTOMETRIC DETECTION MODULE OF POLYMER PARTICLES AND PHY...
Publication number
20240295485
Publication date
Sep 5, 2024
LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
Jérôme POLESEL
G01 - MEASURING TESTING
Information
Patent Application
HIGH-SPEED SURFACE INSPECTION SYSTEM FOR RETICLE POD AND HIGH-SPEED...
Publication number
20240295504
Publication date
Sep 5, 2024
GUDENG EQUIPMENT CO., LTD.
YIN-FENG CHAN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR DETECTION OF ANALYTES
Publication number
20240288360
Publication date
Aug 29, 2024
Nanopath Inc.
Alison Burklund
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD
Publication number
20240284050
Publication date
Aug 22, 2024
TE Connectivity Solutions GMBH
Edward T. Price
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SENSING DEVICE AND RELATED METHODS
Publication number
20240241043
Publication date
Jul 18, 2024
GeoPulse Solutions
Ryan Barlow
G01 - MEASURING TESTING
Information
Patent Application
MULTI-MODE ILLUMINATION SYSTEM
Publication number
20240192137
Publication date
Jun 13, 2024
ESSENLIX CORPORATION
Ji Qi
G01 - MEASURING TESTING
Information
Patent Application
Method for Inspecting Surface Deformation of Structure, System for...
Publication number
20240175823
Publication date
May 30, 2024
Keiwa Incorporated
Satoru Tani
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information
Patent Application
MEASURING CELL, MEASURING CELL RECEPTACLE AND MEASURING DEVICE WITH...
Publication number
20240167937
Publication date
May 23, 2024
Andreas Müller
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR AUTOMATIC MONITORING OF PAVEMENT CONDITION
Publication number
20240167962
Publication date
May 23, 2024
IRIS R&D Group Inc.
Emil Sylvester Ramos
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FOOD ANALYSIS APPARATUS
Publication number
20240102920
Publication date
Mar 28, 2024
BEYOND HONEYCOMB INC
Hyun Ki JUNG
F24 - HEATING RANGES VENTILATING
Information
Patent Application
AEROSOL SENSOR COMPONENT
Publication number
20240068954
Publication date
Feb 29, 2024
Honeywell International Inc.
Fan YANG
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR MANUFACTURING...
Publication number
20240071795
Publication date
Feb 29, 2024
Mitsubishi Electric Corporation
Motoki IINUMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR TRANSMITTANCE MEASUREMENTS OF LARGE ARTICLES
Publication number
20240044792
Publication date
Feb 8, 2024
ASM IP HOLDING B.V.
Shiva K.T. Rajavelu Muralidhar
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...
Publication number
20230341325
Publication date
Oct 26, 2023
ASML NETHERLANDS B.V.
Lars LOETGERING
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR PROVIDING TOTAL TRICHOME COUNT AND DENSITY OF CANNABIS...
Publication number
20230314333
Publication date
Oct 5, 2023
CHUBBY CAT, INC.
Robert Vincent O’Brien
G01 - MEASURING TESTING
Information
Patent Application
TOOL STABILIZATION MECHANISM AND RELATED METHODS
Publication number
20230305286
Publication date
Sep 28, 2023
GENERAL ELECTRIC COMPANY
Kirti Arvind Petkar
G01 - MEASURING TESTING
Information
Patent Application
ONLINE DETECTION DEVICE AND METHOD FOR UNDERWATER ELEMENTS BASED ON...
Publication number
20230304936
Publication date
Sep 28, 2023
Shenyang Institute of Automation, Chinese Academy of Sciences
Lanxiang SUN
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...
Publication number
20230298202
Publication date
Sep 21, 2023
SONY GROUP CORPORATION
Kayoko TANAKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Spectroscopy Combining Base Stations and Unmanned Aerial Vehicles
Publication number
20230280270
Publication date
Sep 7, 2023
University of South Carolina
Michael L. Myrick
G01 - MEASURING TESTING
Information
Patent Application
MULTI PARAMETER SWIMMING POOL FLUID ANALYSIS AND REGULATING METHOD...
Publication number
20230258013
Publication date
Aug 17, 2023
MAYTRONICS LTD.
Shay Witelson
E04 - BUILDING
Information
Patent Application
HOLDER FOR DRYING, METHOD OF MANUFACTURING MEASUREMENT SAMPLE, AND...
Publication number
20230258557
Publication date
Aug 17, 2023
Shimadzu Corporation
Kazumi KAWAHARA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETECTING ANOMALIES IN OBJECTS
Publication number
20230221263
Publication date
Jul 13, 2023
The Boeing Company
James J. Troy
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
SENSOR DEVICE TO MITIGATE THE EFFECTS OF UNWANTED SIGNALS MADE IN O...
Publication number
20230210390
Publication date
Jul 6, 2023
BIOBEAT TECHNOLOGIES LTD.
Arik BEN ISHAY
G01 - MEASURING TESTING
Information
Patent Application
Fast and accurated mueller matrix infrared ellipsometer
Publication number
20230194414
Publication date
Jun 22, 2023
J. A. WOOLLAM CO., INC.
STEFAN SCHOECHE
G01 - MEASURING TESTING