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G01N2201/021
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
Current Industry
G01N2201/021
Special mounting in general
Industries
Overview
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Patents Grants
last 30 patents
Information
Patent Grant
Sample rotating rack and Raman spectrum detector
Patent number
11,971,358
Issue date
Apr 30, 2024
Shengqi Wang
G01 - MEASURING TESTING
Information
Patent Grant
Variable light diffuser for plant leaf gas exchange measurements
Patent number
11,965,828
Issue date
Apr 23, 2024
Chapman University
Z. Carter Berry
G01 - MEASURING TESTING
Information
Patent Grant
Assembly for detecting defects on a motor vehicle bodywork
Patent number
11,965,836
Issue date
Apr 23, 2024
PROOV STATION
Gabriel Tissandier
G01 - MEASURING TESTING
Information
Patent Grant
Deflection-type refractometer with extended measurement range
Patent number
11,953,476
Issue date
Apr 9, 2024
Polymer Characterization, S.A.
Alberto Ortin Sebastian
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for launching and recovering a remote inspecti...
Patent number
11,931,612
Issue date
Mar 19, 2024
Phillips 66 Company
Troy L. Staires
G01 - MEASURING TESTING
Information
Patent Grant
Multi-mode illumination system
Patent number
11,927,533
Issue date
Mar 12, 2024
ESSENLIX CORPORATION
Ji Qi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for launching and recovering a remote inspecti...
Patent number
11,925,824
Issue date
Mar 12, 2024
Phillips 66 Company
Troy L. Staires
G01 - MEASURING TESTING
Information
Patent Grant
Spinning apparatus for measurement of characteristics relating to m...
Patent number
11,913,872
Issue date
Feb 27, 2024
President and Fellows of Harvard College
Darren Yang
B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...
Information
Patent Grant
System of measuring image of pattern in scanning type EUV mask
Patent number
11,914,282
Issue date
Feb 27, 2024
Samsung Electronics Co., Ltd.
Donggun Lee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Portable lighting device for workbench
Patent number
11,859,798
Issue date
Jan 2, 2024
Dennis Rotim
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Method and apparatus for transmittance measurements of large articles
Patent number
11,828,707
Issue date
Nov 28, 2023
ASM IP Holding B.V.
Shiva K. T. Rajavelu Muralidhar
G01 - MEASURING TESTING
Information
Patent Grant
Fast and accurate Mueller matrix infrared ellipsometer
Patent number
11,821,833
Issue date
Nov 21, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Device for recognizing defects remaining in finished surface of pro...
Patent number
11,798,155
Issue date
Oct 24, 2023
Fu Tai Hua Industry (Shenzhen) Co., Ltd.
Liu-Bin Hu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for analyzing a rail
Patent number
11,787,452
Issue date
Oct 17, 2023
Ensco, Inc.
Anthony Kim
E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information
Patent Grant
Raman spectroscopy method and apparatus
Patent number
11,774,364
Issue date
Oct 3, 2023
The University of Nottingham
Ioan Notingher
G01 - MEASURING TESTING
Information
Patent Grant
Imaging and inspection of plugged honeycomb body
Patent number
11,761,908
Issue date
Sep 19, 2023
Corning Incorporated
Julie Marie Daugherty
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus, processing system, and method of manu...
Patent number
11,749,546
Issue date
Sep 5, 2023
Canon Kabushiki Kaisha
Kohei Suzuki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
Patent number
11,740,176
Issue date
Aug 29, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and method of measuring wavefront aberration
Patent number
11,733,176
Issue date
Aug 22, 2023
Samsung Electronics Co., Ltd.
Akihiro Komatsu
G01 - MEASURING TESTING
Information
Patent Grant
Structure of optical sensor having light-emitting element and light...
Patent number
11,674,893
Issue date
Jun 13, 2023
Canon Kabushiki Kaisha
Kazushi Ino
G01 - MEASURING TESTING
Information
Patent Grant
Information processing device, information processing method, and c...
Patent number
11,657,534
Issue date
May 23, 2023
Sony Group Corporation
Kayoko Tanaka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi parameter swimming pool fluid analysis and regulating method...
Patent number
11,619,059
Issue date
Apr 4, 2023
Maytronics Ltd.
Shay Witelson
E04 - BUILDING
Information
Patent Grant
Devices for instant detection and disinfection of aerosol droplet p...
Patent number
11,614,407
Issue date
Mar 28, 2023
DeNovo Lighting, LLC
John F Luk
G08 - SIGNALLING
Information
Patent Grant
Systems and methods for analyzing a rail
Patent number
11,590,992
Issue date
Feb 28, 2023
Ensco, Inc.
Anthony Kim
E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information
Patent Grant
Localization method and system for mobile remote inspection and/or...
Patent number
11,579,097
Issue date
Feb 14, 2023
Baker Hughes Holdings LLC
Moritz Oetiker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for monitoring soil composition at different dept...
Patent number
11,566,997
Issue date
Jan 31, 2023
CNH Industrial Canada, Ltd.
James W. Henry
G01 - MEASURING TESTING
Information
Patent Grant
Multi-mode illumination system
Patent number
11,543,353
Issue date
Jan 3, 2023
ESSENLIX CORPORATION
Ji Qi
G01 - MEASURING TESTING
Information
Patent Grant
Spectral camera control device, spectral camera control system, sto...
Patent number
11,542,035
Issue date
Jan 3, 2023
National University Corporation Hokkaido University
Yukihiro Takahashi
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Device and method for placing components
Patent number
11,530,978
Issue date
Dec 20, 2022
Totems Position SARL
Toni Orhanovic
G01 - MEASURING TESTING
Information
Patent Grant
Road management device
Patent number
11,467,097
Issue date
Oct 11, 2022
Honda Motor Co., Ltd.
Yasuo Oishi
B60 - VEHICLES IN GENERAL
Patents Applications
last 30 patents
Information
Patent Application
FOOD ANALYSIS APPARATUS
Publication number
20240102920
Publication date
Mar 28, 2024
BEYOND HONEYCOMB INC
Hyun Ki JUNG
F24 - HEATING RANGES VENTILATING
Information
Patent Application
AEROSOL SENSOR COMPONENT
Publication number
20240068954
Publication date
Feb 29, 2024
Honeywell International Inc.
Fan YANG
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR MANUFACTURING...
Publication number
20240071795
Publication date
Feb 29, 2024
Mitsubishi Electric Corporation
Motoki IINUMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR TRANSMITTANCE MEASUREMENTS OF LARGE ARTICLES
Publication number
20240044792
Publication date
Feb 8, 2024
ASM IP HOLDING B.V.
Shiva K.T. Rajavelu Muralidhar
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...
Publication number
20230341325
Publication date
Oct 26, 2023
ASML NETHERLANDS B.V.
Lars LOETGERING
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR PROVIDING TOTAL TRICHOME COUNT AND DENSITY OF CANNABIS...
Publication number
20230314333
Publication date
Oct 5, 2023
CHUBBY CAT, INC.
Robert Vincent O’Brien
G01 - MEASURING TESTING
Information
Patent Application
TOOL STABILIZATION MECHANISM AND RELATED METHODS
Publication number
20230305286
Publication date
Sep 28, 2023
GENERAL ELECTRIC COMPANY
Kirti Arvind Petkar
G01 - MEASURING TESTING
Information
Patent Application
ONLINE DETECTION DEVICE AND METHOD FOR UNDERWATER ELEMENTS BASED ON...
Publication number
20230304936
Publication date
Sep 28, 2023
Shenyang Institute of Automation, Chinese Academy of Sciences
Lanxiang SUN
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...
Publication number
20230298202
Publication date
Sep 21, 2023
SONY GROUP CORPORATION
Kayoko TANAKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Spectroscopy Combining Base Stations and Unmanned Aerial Vehicles
Publication number
20230280270
Publication date
Sep 7, 2023
University of South Carolina
Michael L. Myrick
G01 - MEASURING TESTING
Information
Patent Application
MULTI PARAMETER SWIMMING POOL FLUID ANALYSIS AND REGULATING METHOD...
Publication number
20230258013
Publication date
Aug 17, 2023
MAYTRONICS LTD.
Shay Witelson
E04 - BUILDING
Information
Patent Application
HOLDER FOR DRYING, METHOD OF MANUFACTURING MEASUREMENT SAMPLE, AND...
Publication number
20230258557
Publication date
Aug 17, 2023
Shimadzu Corporation
Kazumi KAWAHARA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETECTING ANOMALIES IN OBJECTS
Publication number
20230221263
Publication date
Jul 13, 2023
The Boeing Company
James J. Troy
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
SENSOR DEVICE TO MITIGATE THE EFFECTS OF UNWANTED SIGNALS MADE IN O...
Publication number
20230210390
Publication date
Jul 6, 2023
BIOBEAT TECHNOLOGIES LTD.
Arik BEN ISHAY
G01 - MEASURING TESTING
Information
Patent Application
Fast and accurated mueller matrix infrared ellipsometer
Publication number
20230194414
Publication date
Jun 22, 2023
J. A. WOOLLAM CO., INC.
STEFAN SCHOECHE
G01 - MEASURING TESTING
Information
Patent Application
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
Publication number
20230184671
Publication date
Jun 15, 2023
J. A. WOOLLAM CO., INC.
STEFAN SCHOECHE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR ANALYZING A RAIL
Publication number
20230174122
Publication date
Jun 8, 2023
ENSCO, Inc.
Anthony Kim
G02 - OPTICS
Information
Patent Application
SYSTEM OF MEASURING IMAGE OF PATTERN IN SCANNING TYPE EUV MASK
Publication number
20230131024
Publication date
Apr 27, 2023
Samsung Electronics Co., Ltd.
Donggun LEE
G01 - MEASURING TESTING
Information
Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
Publication number
20230109887
Publication date
Apr 13, 2023
ETAMAX CO., LTD
Huyndon JUNG
G01 - MEASURING TESTING
Information
Patent Application
MULTI-MODE ILLUMINATION SYSTEM
Publication number
20230078084
Publication date
Mar 16, 2023
ESSENLIX CORPORATION
Ji Qi
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20230033020
Publication date
Feb 2, 2023
Toyota Jidosha Kabushiki Kaisha
Yukinori II
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SYNCHRONIZED STAGE MOVEMENT
Publication number
20220390359
Publication date
Dec 8, 2022
Thermo Electron Scientific Instruments LLC
Peter Steinberg
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR RECOGNIZING DEFECTS REMAINING IN FINISHED SURFACE OF PRO...
Publication number
20220375061
Publication date
Nov 24, 2022
FU TAI HUA INDUSTRY (SHENZHEN) CO., LTD.
LIU-BIN HU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LEAK DETECTION SYSTEM
Publication number
20220364947
Publication date
Nov 17, 2022
Onesubsea IP UK Limited
Andrew J. Speck
E21 - EARTH DRILLING MINING
Information
Patent Application
ADJUSTABLE SLIDING PLATFORM FOR CELL CULTURE PLATE IMAGING
Publication number
20220357278
Publication date
Nov 10, 2022
The Regents of the University of California
Victoria Ly
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE AND METHOD OF MEASURING WAVEFRONT ABERRATION
Publication number
20220268709
Publication date
Aug 25, 2022
Samsung Electronics Co., Ltd.
AKIHIRO KOMATSU
G01 - MEASURING TESTING
Information
Patent Application
Device and Method for Determining a Surface State of a Roadway Trav...
Publication number
20220252394
Publication date
Aug 11, 2022
ROBERT BOSCH GmbH
Wolfgang Welsch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Publication number
20220244169
Publication date
Aug 4, 2022
J. A. WOOLLAM CO., INC.
Ping He
G02 - OPTICS
Information
Patent Application
SAMPLE ROTATING RACK AND RAMAN SPECTRUM DETECTOR
Publication number
20220221406
Publication date
Jul 14, 2022
ACADEMY OF MILITARY MEDICAL SCIENCES
Shengqi WANG
G01 - MEASURING TESTING
Information
Patent Application
IMAGING AND INSPECTION OF PLUGGED HONEYCOMB BODY
Publication number
20220214289
Publication date
Jul 7, 2022
Corning Incorporated
Julie Marie Daugherty
G01 - MEASURING TESTING