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G01J2003/4538
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/4538
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method for diagnosing the compressibility at the centre...
Patent number
12,188,822
Issue date
Jan 7, 2025
Thomas Oksenhendler
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced full range optical coherence tomography
Patent number
12,146,792
Issue date
Nov 19, 2024
Topcon Corporation
Xiang Wei
G01 - MEASURING TESTING
Information
Patent Grant
Quadrilateral common-path time-modulated interferometric spectral i...
Patent number
11,971,303
Issue date
Apr 30, 2024
WUHAN UNIVERSITY
Ruyi Wei
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced full range optical coherence tomography
Patent number
11,846,546
Issue date
Dec 19, 2023
Topcon Corporation
Xiang Wei
G01 - MEASURING TESTING
Information
Patent Grant
Fourier spectroscopic analyzer
Patent number
11,774,285
Issue date
Oct 3, 2023
Yokogawa Electric Corporation
Yasuyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Compact computational spectrometer using solid wedged low finesse e...
Patent number
11,733,094
Issue date
Aug 22, 2023
Massachusetts Institute of Technology
Shawn Redmond
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for dual comb spectroscopy
Patent number
11,686,622
Issue date
Jun 27, 2023
The Regents of The University of Colorado, A Body Corporate
Gregory B. Rieker
G01 - MEASURING TESTING
Information
Patent Grant
Technologies for high resolution and wide swath spectrometer
Patent number
11,307,097
Issue date
Apr 19, 2022
ABB Schweiz AG
Florent M. Prel
G01 - MEASURING TESTING
Information
Patent Grant
Spectral measurement method, spectral measurement system, and broad...
Patent number
11,300,452
Issue date
Apr 12, 2022
Ushio Denki Kabushiki Kaisha
Aya Ota
G01 - MEASURING TESTING
Information
Patent Grant
High-throughput compact static-Fourier-transform spectrometer
Patent number
11,215,504
Issue date
Jan 4, 2022
Hong Kong Applied Science and Technology Research Institute Co., Ltd.
Jiangquan Mai
G01 - MEASURING TESTING
Information
Patent Grant
Fourier spectroscopic analyzer
Patent number
11,073,424
Issue date
Jul 27, 2021
Yokogawa Electric Corporation
Yasuyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Wavemeter using pairs of interferometric optical cavities
Patent number
10,845,251
Issue date
Nov 24, 2020
Zygo Corporation
Leslie L. Deck
G01 - MEASURING TESTING
Information
Patent Grant
System and method for an interferometer resistant to externally app...
Patent number
10,670,462
Issue date
Jun 2, 2020
Thermo Electron Scientific Instruments LLC
John Magie Coffin
G01 - MEASURING TESTING
Information
Patent Grant
Fourier transform infrared spectrophotometer
Patent number
10,670,518
Issue date
Jun 2, 2020
Shimadzu Corporation
Daijiro Kato
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for characterization of a light beam to determine...
Patent number
10,151,639
Issue date
Dec 11, 2018
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Fabien Quere
G01 - MEASURING TESTING
Information
Patent Grant
Method for snapshot interferometric spectrometry
Patent number
10,132,686
Issue date
Nov 20, 2018
Industrial Cooperation Foundation Chonbuk National University
Daesuk Kim
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for characterization of a light beam to determine...
Patent number
10,107,692
Issue date
Oct 23, 2018
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Fabien Quere
G01 - MEASURING TESTING
Information
Patent Grant
Noise reduction for pulsed lasers using clustering
Patent number
9,989,414
Issue date
Jun 5, 2018
Agilent Technologies, Inc.
Adam Kleczewski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photodetection apparatus including optical filter and optical detector
Patent number
9,976,904
Issue date
May 22, 2018
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Seiji Nishiwaki
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric device and corresponding spectrometer
Patent number
9,696,208
Issue date
Jul 4, 2017
Universite de Technologie de Troyes
Yassine Hadjar
G01 - MEASURING TESTING
Information
Patent Grant
Multiple window processing schemes for spectroscopic optical cohere...
Patent number
9,689,745
Issue date
Jun 27, 2017
Duke University
Adam Wax
G01 - MEASURING TESTING
Information
Patent Grant
Spectral characteristics measurement device and spectral characteri...
Patent number
9,474,476
Issue date
Oct 25, 2016
National University Corporation Kagawa University
Ichiro Ishimaru
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Fourier transform micro spectrometer based on spatially-shifted int...
Patent number
9,429,474
Issue date
Aug 30, 2016
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Imaging spectrometer with extended resolution
Patent number
9,279,724
Issue date
Mar 8, 2016
Raytheon Company
Ian S. Robinson
G01 - MEASURING TESTING
Information
Patent Grant
Dual window processing schemes for spectroscopic optical coherence...
Patent number
9,274,001
Issue date
Mar 1, 2016
Duke University
Adam Wax
G01 - MEASURING TESTING
Information
Patent Grant
Sampling spectrophotometer comprising an interferometer
Patent number
7,440,107
Issue date
Oct 21, 2008
Astrium SAS
Frédérick Pasternak
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus using optical interferometer
Patent number
6,381,015
Issue date
Apr 30, 2002
Hitachi, Ltd.
Tsuyoshi Sonehara
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
High temperature photodetector array
Patent number
5,436,442
Issue date
Jul 25, 1995
General Electric Company
Gerald J. Michon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High speed interferometer fourier transform spectrometer including...
Patent number
5,357,337
Issue date
Oct 18, 1994
General Electric Company
Gerald J. Michon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Deconvoluted band representation for infrared spectrum compression
Patent number
5,311,445
Issue date
May 10, 1994
Board of Regents of the University of Oklahoma
Robert L. White
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR CALIBRATING A SPECTROMETER DEVICE
Publication number
20240393178
Publication date
Nov 28, 2024
trinamiX GmbH
Robert LOVRINCIC
G01 - MEASURING TESTING
Information
Patent Application
ON-CHIP FOURIER TRANSFORM SPECTROMETER BASED ON DOUBLE-LAYER HELICA...
Publication number
20240337536
Publication date
Oct 10, 2024
SHANGHAI JIAO TONG UNIVERSITY
Liangjun LU
G01 - MEASURING TESTING
Information
Patent Application
REFERENCE METHOD FOR SPECTROMETER
Publication number
20240319010
Publication date
Sep 26, 2024
Thermo Electron Scientific Instruments LLC
John Iverson
G01 - MEASURING TESTING
Information
Patent Application
ENHANCED FULL RANGE OPTICAL COHERENCE TOMOGRAPHY
Publication number
20240142307
Publication date
May 2, 2024
TOPCON CORPORATION
Xiang WEI
G01 - MEASURING TESTING
Information
Patent Application
QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...
Publication number
20230408337
Publication date
Dec 21, 2023
WUHAN UNIVERSITY
Ruyi WEI
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR DIAGNOSING THE COMPRESSIBILITY AT THE CENTRE...
Publication number
20230056265
Publication date
Feb 23, 2023
Thomas Oksenhendler
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY DEVICE
Publication number
20220316945
Publication date
Oct 6, 2022
National University Corporation Kagawa University
Ichiro Ishimaru
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL MEASUREMENT METHOD, SPECTRAL MEASUREMENT SYSTEM, AND BROAD...
Publication number
20220268629
Publication date
Aug 25, 2022
Ushio Denki Kabushiki Kaisha
Aya OTA
G01 - MEASURING TESTING
Information
Patent Application
Compact Computational Spectrometer Using Solid Wedged Low Finesse E...
Publication number
20220252452
Publication date
Aug 11, 2022
Massachusetts Institute of Technology
Shawn REDMOND
G01 - MEASURING TESTING
Information
Patent Application
FOURIER SPECTROSCOPIC ANALYZER
Publication number
20220113187
Publication date
Apr 14, 2022
YOKOGAWA ELECTRIC CORPORATION
Yasuyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Application
HIGH-THROUGHPUT COMPACT STATIC-FOURIER-TRANSFORM SPECTROMETER
Publication number
20210310864
Publication date
Oct 7, 2021
Hong Kong Applied Science and Technology Research Institute Co., Ltd.
Jiangquan Mai
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DUAL COMB SPECTROSCOPY
Publication number
20210080324
Publication date
Mar 18, 2021
The Regents of the University of Colorado, a Body Corporate
Gregory B. Rieker
G01 - MEASURING TESTING
Information
Patent Application
FOURIER SPECTROSCOPIC ANALYZER
Publication number
20200278256
Publication date
Sep 3, 2020
YOKOGAWA ELECTRIC CORPORATION
Yasuyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Application
WAVEMETER
Publication number
20200003620
Publication date
Jan 2, 2020
Zygo Corporation
Leslie L. Deck
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR AN INTERFEROMETER RESISTANT TO EXTERNALLY APP...
Publication number
20180266882
Publication date
Sep 20, 2018
Thermo Electron Scientific Instruments LLC
John Magie COFFIN
G01 - MEASURING TESTING
Information
Patent Application
PHOTODETECTION APPARATUS INCLUDING OPTICAL FILTER AND OPTICAL DETECTOR
Publication number
20170023410
Publication date
Jan 26, 2017
Panasonic Intellectual Property Management Co., Ltd.
SEIJI NISHIWAKI
G01 - MEASURING TESTING
Information
Patent Application
Noise Reduction for Pulsed Lasers Using Clustering
Publication number
20160299007
Publication date
Oct 13, 2016
Adam Kleczewski
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE WINDOW PROCESSING SCHEMES FOR SPECTROSCOPIC OPTICAL COHERE...
Publication number
20160290867
Publication date
Oct 6, 2016
DUKE UNIVERSITY
Adam Wax
G01 - MEASURING TESTING
Information
Patent Application
Interferometric Device and Corresponding Spectrometer
Publication number
20160123814
Publication date
May 5, 2016
UNIVERSITE DE TECHNOLOGIE DE TROYES
Yassine Hadjar
G01 - MEASURING TESTING
Information
Patent Application
IMAGING SPECTROMETER WITH EXTENDED RESOLUTION
Publication number
20150369667
Publication date
Dec 24, 2015
Raytheon Company
Ian S. Robinson
G01 - MEASURING TESTING
Information
Patent Application
Fourier transform micro spectrometer based on spatially-shifted int...
Publication number
20140098371
Publication date
Apr 10, 2014
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
DUAL WINDOW PROCESSING SCHEMES FOR SPECTROSCOPIC OPTICAL COHERENCE...
Publication number
20130176560
Publication date
Jul 11, 2013
DUKE UNIVERSITY
Adam Wax
G01 - MEASURING TESTING
Information
Patent Application
DUAL WINDOW PROCESSING SCHEMES FOR SPECTROSCOPIC OPTICAL COHERENCE...
Publication number
20130135614
Publication date
May 30, 2013
Adam Wax
G01 - MEASURING TESTING
Information
Patent Application
Sampling Spectrophotometer Comprising an Interferometer
Publication number
20070127032
Publication date
Jun 7, 2007
ASTRIUM SAS
Frederick Pasternak
G01 - MEASURING TESTING