specially adapted for studying electrical or magnetical properties of objects

Industry

CPC
H01J2237/2008

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2008specially adapted for studying electrical or magnetical properties of objects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Sample fixation mechanism for test with nano-probe, apparatus for t...
- Patent number 12,099,076
- Issue date Sep 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jiabao Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting an EUV mask
- Patent number 11,662,323
- Issue date May 30, 2023
- ASML Netherlands B.V.
- Guochong Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical devices with edge slits for mounting sample
- Patent number 11,476,083
- Issue date Oct 18, 2022
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radio-frequency (RF) transmission systems, devices, and methods for...
- Patent number 11,069,507
- Issue date Jul 20, 2021
- University of Maryland, College Park
- Michael Katz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic response analysis prober device
- Patent number 10,782,340
- Issue date Sep 22, 2020
- HITACHI HIGH-TECH CORPORATION
- Masaaki Komori
- G02 - OPTICS
Information Patent Grant
Method and system for inspecting an EUV mask
- Patent number 10,775,325
- Issue date Sep 15, 2020
- ASML Netherlands B.V.
- Guochong Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen holder used for mounting samples in electron microscopes
- Patent number RE48201
- Issue date Sep 8, 2020
- PROTOCHIPS, INC.
- David P. Nackashi
Information Patent Grant
Cell for electrochemical measurement
- Patent number 10,718,731
- Issue date Jul 21, 2020
- Toyota Jidosha Kabushiki Kaisha
- Shinya Nagashima
- G01 - MEASURING TESTING
Information Patent Grant
Through process flow intra-chip and inter-chip electrical analysis...
- Patent number 10,539,589
- Issue date Jan 21, 2020
- FEI EFA, Inc.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming an electrical connection to a sample support in...
- Patent number 10,256,563
- Issue date Apr 9, 2019
- Protochips, Inc.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device
- Patent number 10,157,722
- Issue date Dec 18, 2018
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting an EUV mask
- Patent number 10,088,438
- Issue date Oct 2, 2018
- Hermes-Microvision, Inc.
- Guochong Weng
- G01 - MEASURING TESTING
Information Patent Grant
Structure electron beam inspection system for inspecting extreme ul...
- Patent number 10,054,556
- Issue date Aug 21, 2018
- Hermes Microvision Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer grounding and biasing method, apparatus, and application
- Patent number 9,991,147
- Issue date Jun 5, 2018
- Hermes Microvision, Inc.
- Yi-Xiang Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microscopy support structures
- Patent number 9,984,850
- Issue date May 29, 2018
- Protochips, Inc.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fixture for in situ electromigration testing during X-ray microtomo...
- Patent number 9,952,272
- Issue date Apr 24, 2018
- Arizona Board of Regents on behalf of Arizona State University
- Nikhilesh Chawla
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting and grounding an EUV mask
- Patent number 9,859,089
- Issue date Jan 2, 2018
- Hermes Microvision Inc.
- Guochong Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an electrical connection to a sample support in...
- Patent number 9,837,746
- Issue date Dec 5, 2017
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit probe for charged particle beam system
- Patent number 9,709,600
- Issue date Jul 18, 2017
- FEI Company
- Paul Johannes L. Barends
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure electron beam inspection system for inspecting extreme ul...
- Patent number 9,572,237
- Issue date Feb 14, 2017
- Hermes Microvision Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting an EUV mask
- Patent number 9,485,846
- Issue date Nov 1, 2016
- Hermes Microvision Inc.
- Guochong Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an electrical connection to an sample support in...
- Patent number 9,437,393
- Issue date Sep 6, 2016
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen holder used for mounting samples in electron microscopes
- Patent number 9,312,097
- Issue date Apr 12, 2016
- PROTOCHIPS, INC.
- David P. Nackashi
- G01 - MEASURING TESTING
Information Patent Grant
Microscopy support structures
- Patent number 9,275,826
- Issue date Mar 1, 2016
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure electron beam inspection system for inspecting extreme ul...
- Patent number 9,113,538
- Issue date Aug 18, 2015
- Hermes-Microvision, Inc.
- You-Jin Wang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Charged particle beam apparatus sample holder with magnetic field g...
- Patent number 9,070,532
- Issue date Jun 30, 2015
- Hitachi, Ltd.
- Akira Sugawara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen mount for microscopy
- Patent number 9,064,672
- Issue date Jun 23, 2015
- Protochips, Inc.
- Stephen E. Mick
- G02 - OPTICS
Information Patent Grant
Charged particle beam microscope, sample holder for charged particl...
- Patent number 8,963,102
- Issue date Feb 24, 2015
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer grounding and biasing method, apparatus, and application
- Patent number 8,908,348
- Issue date Dec 9, 2014
- Hermes Microvision, Inc.
- Yi-Xiang Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample holder providing interface to semiconductor device with high...
- Patent number 8,872,128
- Issue date Oct 28, 2014
- Protochips, Inc.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN HOLDER
- Publication number 20230268157
- Publication date Aug 24, 2023
- Mel-Build Corporation
- Hiroya Miyazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AN EUV MASK
- Publication number 20210172891
- Publication date Jun 10, 2021
- ASML NETHERLANDS B.V.
- Guochong Weng
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AN EUV MASK
- Publication number 20190170671
- Publication date Jun 6, 2019
- HERMES MICROVISION, INC.
- Guochong Weng
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Response Analysis Prober Device
- Publication number 20180299504
- Publication date Oct 18, 2018
- Hitachi High-Technologies Corporation
- Masaaki KOMORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN...
- Publication number 20180097307
- Publication date Apr 5, 2018
- PROTOCHIPS, INC.
- John DAMIANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...
- Publication number 20170053774
- Publication date Feb 23, 2017
- HERMES MICROVISION INC.
- You-Jin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIXTURE FOR IN SITU ELECTROMIGRATION TESTING DURING X-RAY MICROTOMO...
- Publication number 20160169782
- Publication date Jun 16, 2016
- Nikhilesh Chawla
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...
- Publication number 20140353500
- Publication date Dec 4, 2014
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER AND CHARGED PARTICLE BEAM APPARATUS USING SAME
- Publication number 20140319371
- Publication date Oct 30, 2014
- Akira Sugawara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR IMAGING ELECTRON MICROSCOPE ENVIRONMENTAL SAMPLE SUPPORT...
- Publication number 20140268321
- Publication date Sep 18, 2014
- PROTOCHIPS, INC.
- John DAMIANO
- G02 - OPTICS
Information Patent Application
METHOD FOR FORMING AN ELECTRICAL CONNECTION TO AN SAMPLE SUPPORT IN...
- Publication number 20140138558
- Publication date May 22, 2014
- PROTOCHIPS, INC.
- John DAMIANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE FOR DISCHARGING EXTREME ULTRAVIOLET MASK
- Publication number 20140027634
- Publication date Jan 30, 2014
- HERMES MICROVISION, INC.
- You-Jin WANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20140014848
- Publication date Jan 16, 2014
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER PROVIDING INTERFACE TO SEMICONDUCTOR DEVICE WITH HIGH...
- Publication number 20130277572
- Publication date Oct 24, 2013
- JOHN DAMIANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES
- Publication number 20130206984
- Publication date Aug 15, 2013
- PROTOCHIPS, INC.
- David P. Nackashi
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES
- Publication number 20130146784
- Publication date Jun 13, 2013
- PROTOCHIPS, INC.
- David P. Nackashi
- G01 - MEASURING TESTING
Information Patent Application
MANIPULATOR CARRIER FOR ELECTRON MICROSCOPES
- Publication number 20130099134
- Publication date Apr 25, 2013
- Yu Sun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE ELEMENT FOR ELECTRICALLY COUPLING AN EUVL MASK TO A SUPP...
- Publication number 20130075605
- Publication date Mar 28, 2013
- APPLIED MATERIALS ISRAEL, LTD.
- Igor Krivts (Krayvitz)
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE FOR DISCHARGING EXTREME ULTRAVIOLET MASK
- Publication number 20120292509
- Publication date Nov 22, 2012
- You-Jin WANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20120235036
- Publication date Sep 20, 2012
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
PATTERN CHECK DEVICE AND PATTERN CHECK METHOD
- Publication number 20110278452
- Publication date Nov 17, 2011
- Mari Nozoe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER PROVIDING INTERFACE TO SEMICONDUCTOR DEVICE WITH HIGH...
- Publication number 20110248165
- Publication date Oct 13, 2011
- PROTOCHIPS, INC.
- John Damiano, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20110140729
- Publication date Jun 16, 2011
- Hitachi High-Technologies Corporation
- Mitsuhiro Nakamura
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN HOLDER USED FOR MOUNTING
- Publication number 20110127427
- Publication date Jun 2, 2011
- PROTOCHIPS, INC.
- David P. Nackashi
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPY SUPPORT STRUCTURES
- Publication number 20110079710
- Publication date Apr 7, 2011
- PROTOCHIPS, INC.
- John Damiano, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20110057101
- Publication date Mar 10, 2011
- Hitachi High-Technologies Corporation
- Osamu Komuro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER GROUNDING AND BIASING METHOD, APPARATUS, AND APPLICATION
- Publication number 20110051306
- Publication date Mar 3, 2011
- Hermes Microvision, Inc.
- YI-XIANG WANG
- B82 - NANO-TECHNOLOGY
Information Patent Application
SPECIMEN MOUNT FOR MICROSCOPY
- Publication number 20110032611
- Publication date Feb 10, 2011
- PROTOCHIPS, INC.
- Stephen E. Mick
- G02 - OPTICS
Information Patent Application
Method for Inspecting a Sample
- Publication number 20110006208
- Publication date Jan 13, 2011
- FEI Company
- Bert Henning Freitag
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR ELECTRON MICROSCOPE
- Publication number 20100320396
- Publication date Dec 23, 2010
- Hitachi, Ltd.
- Shohei TERADA
- H01 - BASIC ELECTRIC ELEMENTS

specially adapted for studying electrical or magnetical properties of objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sample fixation mechanism for test with nano-probe, apparatus for t...

Method and system for inspecting an EUV mask

Electrical devices with edge slits for mounting sample

Radio-frequency (RF) transmission systems, devices, and methods for...

Dynamic response analysis prober device

Method and system for inspecting an EUV mask

Specimen holder used for mounting samples in electron microscopes

Cell for electrochemical measurement

Through process flow intra-chip and inter-chip electrical analysis...

Method for forming an electrical connection to a sample support in...

Inspection device

Method and system for inspecting an EUV mask

Structure electron beam inspection system for inspecting extreme ul...

Wafer grounding and biasing method, apparatus, and application

Microscopy support structures

Fixture for in situ electromigration testing during X-ray microtomo...

Method and system for inspecting and grounding an EUV mask

Method for forming an electrical connection to a sample support in...

Circuit probe for charged particle beam system

Structure electron beam inspection system for inspecting extreme ul...

Method and system for inspecting an EUV mask

Method for forming an electrical connection to an sample support in...

Specimen holder used for mounting samples in electron microscopes

Microscopy support structures

Structure electron beam inspection system for inspecting extreme ul...

Charged particle beam apparatus sample holder with magnetic field g...

Specimen mount for microscopy

Charged particle beam microscope, sample holder for charged particl...

Wafer grounding and biasing method, apparatus, and application

Sample holder providing interface to semiconductor device with high...

Patents Applicationslast 30 patents

SPECIMEN HOLDER

METHOD AND SYSTEM FOR INSPECTING AN EUV MASK

METHOD AND SYSTEM FOR INSPECTING AN EUV MASK

Dynamic Response Analysis Prober Device

METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN...

STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...

FIXTURE FOR IN SITU ELECTROMIGRATION TESTING DURING X-RAY MICROTOMO...

CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...

SAMPLE HOLDER AND CHARGED PARTICLE BEAM APPARATUS USING SAME

DEVICE FOR IMAGING ELECTRON MICROSCOPE ENVIRONMENTAL SAMPLE SUPPORT...

METHOD FOR FORMING AN ELECTRICAL CONNECTION TO AN SAMPLE SUPPORT IN...

STRUCTURE FOR DISCHARGING EXTREME ULTRAVIOLET MASK

INSPECTION DEVICE

SAMPLE HOLDER PROVIDING INTERFACE TO SEMICONDUCTOR DEVICE WITH HIGH...

SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES

SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES

MANIPULATOR CARRIER FOR ELECTRON MICROSCOPES

CONDUCTIVE ELEMENT FOR ELECTRICALLY COUPLING AN EUVL MASK TO A SUPP...

STRUCTURE FOR DISCHARGING EXTREME ULTRAVIOLET MASK

INSPECTION DEVICE

PATTERN CHECK DEVICE AND PATTERN CHECK METHOD

SAMPLE HOLDER PROVIDING INTERFACE TO SEMICONDUCTOR DEVICE WITH HIGH...

INSPECTION DEVICE

SPECIMEN HOLDER USED FOR MOUNTING

MICROSCOPY SUPPORT STRUCTURES

CHARGED PARTICLE BEAM SYSTEM

WAFER GROUNDING AND BIASING METHOD, APPARATUS, AND APPLICATION

SPECIMEN MOUNT FOR MICROSCOPY

Method for Inspecting a Sample

SAMPLE HOLDER FOR ELECTRON MICROSCOPE