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Specially adapted optical and illumination features
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G01N21/8806
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
Current Industry
G01N21/8806
Specially adapted optical and illumination features
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Inspection device and inspection method
Patent number
11,971,367
Issue date
Apr 30, 2024
JUKI CORPORATION
Yasuyuki Nuriya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical etendue matching methods for extreme ultraviolet metrology
Patent number
11,968,772
Issue date
Apr 23, 2024
KLA Corporation
Zefram Marks
G01 - MEASURING TESTING
Information
Patent Grant
Dark-field optical inspection device
Patent number
11,965,834
Issue date
Apr 23, 2024
UNITY SEMICONDUCTOR
Mayeul Durand De Gevigney
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for gray field imaging
Patent number
11,965,835
Issue date
Apr 23, 2024
KLA Corporation
Xiumei Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Assembly for detecting defects on a motor vehicle bodywork
Patent number
11,965,836
Issue date
Apr 23, 2024
PROOV STATION
Gabriel Tissandier
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor wafer evaluation method and semiconductor wafer manuf...
Patent number
11,955,390
Issue date
Apr 9, 2024
Sumco Corporation
Takahiro Nagasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Defective part recognition device and defective part recognition me...
Patent number
11,953,447
Issue date
Apr 9, 2024
V Technology Co., Ltd.
Michinobu Mizumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Visual inspection device
Patent number
11,953,449
Issue date
Apr 9, 2024
OPTO ENGINEERING S.P.A.
Claudio Sedazzari
G01 - MEASURING TESTING
Information
Patent Grant
Method and arrangement for determining a position of an object
Patent number
11,948,293
Issue date
Apr 2, 2024
Carl Zeiss Industrielle Messtechnik GmbH
Wolfgang Hoegele
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection apparatus, method for inspecting defect, and meth...
Patent number
11,940,391
Issue date
Mar 26, 2024
Shin-Etsu Chemical Co., Ltd.
Ryusei Terashima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical test platform
Patent number
11,938,483
Issue date
Mar 26, 2024
bioMerieux, Inc.
Jack R. Hoffmann
G01 - MEASURING TESTING
Information
Patent Grant
Device for recognizing defects in finished surface of product
Patent number
11,940,389
Issue date
Mar 26, 2024
Fu Tai Hua Industry (Shenzhen) Co., Ltd.
Liu-Bin Hu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detection device and method for detecting workpiece
Patent number
11,933,737
Issue date
Mar 19, 2024
Tyco Electronics AMP Guangdong Ltd.
Lei (Alex) Zhou
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Apparatus and methods of inspecting a wire segment
Patent number
11,933,736
Issue date
Mar 19, 2024
The Boeing Company
Brian J. Tillotson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus
Patent number
11,933,739
Issue date
Mar 19, 2024
NEC Corporation
Takashi Shibata
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optical detection device, optical detection method, method for desi...
Patent number
11,933,735
Issue date
Mar 19, 2024
Osaka University
Tsuyoshi Konishi
G01 - MEASURING TESTING
Information
Patent Grant
Vehicle detection system
Patent number
11,933,602
Issue date
Mar 19, 2024
Twinner GmbH
Jozsef Bugovics
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,927,539
Issue date
Mar 12, 2024
Tokyo Electron Limited
Naoki Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Evaluating surfaces
Patent number
11,926,160
Issue date
Mar 12, 2024
Hewlett-Packard Development Company, L.P.
Ana Cristina Garcia Alvarez
G01 - MEASURING TESTING
Information
Patent Grant
Solid immersion lens unit and semiconductor inspection device
Patent number
11,913,888
Issue date
Feb 27, 2024
Hamamatsu Photonics K.K.
Xiangguang Mao
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection method, non-transitory storage medium storing op...
Patent number
11,906,439
Issue date
Feb 20, 2024
Kaushiki Kaisha Toshiba
Hiroya Kano
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and inspection method
Patent number
11,906,440
Issue date
Feb 20, 2024
Kioxia Corporation
Ryoji Yoshikawa
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system
Patent number
11,897,001
Issue date
Feb 13, 2024
Ackley Machine Corporation
E. Michael Ackley
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Apparatus, method and computer program product for defect detection...
Patent number
11,892,493
Issue date
Feb 6, 2024
KLA Corporation
Tom Marivoet
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for checking for surface defect, using image sensor
Patent number
11,892,414
Issue date
Feb 6, 2024
VIEW-ON LTD.
Young Yeop Yoon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Composite structures with damage detection capability
Patent number
11,890,852
Issue date
Feb 6, 2024
Hamilton Sundstrand Corporation
Mark R. Gurvich
G01 - MEASURING TESTING
Information
Patent Grant
Component mounting machine
Patent number
11,871,521
Issue date
Jan 9, 2024
FUJI CORPORATION
Yusuke Yamakage
G01 - MEASURING TESTING
Information
Patent Grant
System and method for in situ inspection of defects in additively m...
Patent number
11,867,638
Issue date
Jan 9, 2024
Lawrence Livermore National Security, LLC
Jean-Baptiste Forien
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Portable lighting device for workbench
Patent number
11,859,798
Issue date
Jan 2, 2024
Dennis Rotim
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Article inspection apparatus using spectrum analyzer
Patent number
11,860,110
Issue date
Jan 2, 2024
Anritsu Corporation
Shigeo Arai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE TREATMENT SYSTEM INCLU...
Publication number
20240142389
Publication date
May 2, 2024
SEMES CO., LTD.
Jeong Hoon HAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods for Analyzing an Electrode Layer of a Battery Cell Using a...
Publication number
20240133819
Publication date
Apr 25, 2024
SIEMENS AKTIENGESELLSCHAFT
Sascha Schulte
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
Publication number
20240133824
Publication date
Apr 25, 2024
HITACHI HIGH-TECH CORPORATION
Yuta URANO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM
Publication number
20240131559
Publication date
Apr 25, 2024
Ackley Machine Corporation
E. Michael ACKLEY
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
Publication number
20240133772
Publication date
Apr 25, 2024
SPINFRAME TECHNOLOGIES LTD
Ori Yakov DANGUR
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR IDENTIFYING WAVEGUIDE DEFECTS
Publication number
20240125708
Publication date
Apr 18, 2024
ViaSat, Inc.
Matthew COVER
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
Publication number
20240125709
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Donggun Lee
G01 - MEASURING TESTING
Information
Patent Application
STROBOSCOPIC STEPPED ILLUMINATION DEFECT DETECTION SYSTEM
Publication number
20240118218
Publication date
Apr 11, 2024
Casi Vision Technology (Luoyang) Co., Ltd.
Xiaosong Hu
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
Publication number
20240118220
Publication date
Apr 11, 2024
Panasonic Intellectual Property Management Co., Ltd.
Shozo OSHIO
G01 - MEASURING TESTING
Information
Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
Publication number
20240102937
Publication date
Mar 28, 2024
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Tsung-Han TSAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR INSPECTING THE SURFACE OF A TRANSPARENT OBJECT, AND CORR...
Publication number
20240102940
Publication date
Mar 28, 2024
ISRA VISION AG
Josef DROSTE
G01 - MEASURING TESTING
Information
Patent Application
ARTIFACT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
Publication number
20240102938
Publication date
Mar 28, 2024
Apple Inc.
Mikael B. MANNBERG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
Publication number
20240102939
Publication date
Mar 28, 2024
Apple Inc.
Mikael B. MANNBERG
G01 - MEASURING TESTING
Information
Patent Application
DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME
Publication number
20240102942
Publication date
Mar 28, 2024
SAMSUNG DISPLAY CO., LTD.
YEON KEON MOON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LAMP FOR HYPERSPECTRAL IMAGING
Publication number
20240094136
Publication date
Mar 21, 2024
ZIUZ HOLDING B.V.
Dries Johannes Pruimboom
F21 - LIGHTING
Information
Patent Application
INSPECTION METHOD OF WORKPIECE AND INSPECTION APPARATUS
Publication number
20240094143
Publication date
Mar 21, 2024
Disco Corporation
Hayato IGA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
LIGHT IRRADIATION TYPE HEAT TREATMENT METHOD AND HEAT TREATMENT APP...
Publication number
20240084411
Publication date
Mar 14, 2024
SCREEN Holdings Co., Ltd.
Tomohiro UENO
C21 - METALLURGY OF IRON
Information
Patent Application
GLASS INSPECTION
Publication number
20240085342
Publication date
Mar 14, 2024
PILKINGTON GROUP LIMITED
Simon CHERRY
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETECTING A DEFECT ON A SEMI-REFLECTIVE FILM...
Publication number
20240077425
Publication date
Mar 7, 2024
HUA YANG Precision Machinery Co.,Ltd
Hsien-Te HSIAO
G01 - MEASURING TESTING
Information
Patent Application
Light-Based Inspection Tools For The Inspection Of The Internal Sur...
Publication number
20240077426
Publication date
Mar 7, 2024
Board of Trustees of Michigan State Unioversity
Yiming Deng
G01 - MEASURING TESTING
Information
Patent Application
WELDED PORTION INSPECTION DEVICE AND WELDED PORTION INSPECTION METHOD
Publication number
20240077427
Publication date
Mar 7, 2024
Honda Motor Co., Ltd.
Satoshi Fukui
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR OPTICAL INSPECTION OF A SUBSTRATE USING SAME OR DIFFEREN...
Publication number
20240068956
Publication date
Feb 29, 2024
Unity Semiconductor
Mayeul Durand de Gevigney
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT
Publication number
20240060904
Publication date
Feb 22, 2024
SAMSUNG DISPLAY CO., LTD.
Jeong Moon LEE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CHARACTERIZATION OF A MICROLITHOGRAPHY MASK
Publication number
20240061328
Publication date
Feb 22, 2024
Carl Zeiss SMT GMBH
Ulrich Matejka
G01 - MEASURING TESTING
Information
Patent Application
MARKING INSPECTION DEVICE AND MARKING DEVICE FOR TRANSPARENT EDIBLE...
Publication number
20240053277
Publication date
Feb 15, 2024
QUALICAPS CO., LTD.
Kousuke OOKITA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS
Publication number
20240035983
Publication date
Feb 1, 2024
WITRINS S.R.O.
Pavel Linhart
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION CONDITION PRESENTATION APPARATUS, SURFACE INSPECTION APP...
Publication number
20240027359
Publication date
Jan 25, 2024
Resonac Corporation
Katsuhisa YOSHIDA
G01 - MEASURING TESTING
Information
Patent Application
Defect Inspection Device
Publication number
20240027361
Publication date
Jan 25, 2024
Hitachi High-Tech Corporation
Kazuhide SATO
G01 - MEASURING TESTING
Information
Patent Application
GLASS INSPECTION EQUIPMENT AND METHOD OF GLASS INSPECTION
Publication number
20240027363
Publication date
Jan 25, 2024
SAMSUNG DISPLAY CO., LTD.
YUNKU KANG
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL LINE SENSOR
Publication number
20240027750
Publication date
Jan 25, 2024
VIENEX CORPORATION
Ryuta WATANABE
G01 - MEASURING TESTING