Specific tests of electronic circuits not provided for elsewhere

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G01R31/2832

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2832Specific tests of electronic circuits not provided for elsewhere

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and method for monitoring activity over time-domain of elect...
- Patent number 12,066,481
- Issue date Aug 20, 2024
- Isra-Juk Electronics Ltd.
- Isaac Sela
- G01 - MEASURING TESTING
Information Patent Grant
Spark gap structures for detection and protection against electrica...
- Patent number 12,055,569
- Issue date Aug 6, 2024
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for circuit testing using remote cooperative devices
- Patent number 12,025,641
- Issue date Jul 2, 2024
- Ford Global Technologies, LLC
- Rajarshi Roychowdhury
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Calibrating processor system power consumption
- Patent number 11,928,000
- Issue date Mar 12, 2024
- Dell Products L.P.
- Douglas E. Messick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of generating self-test signals, corresponding circuit and a...
- Patent number 11,860,223
- Issue date Jan 2, 2024
- STMicroelectronics S.r.l.
- Giorgio Maiellaro
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and apparatuses for intrusion detection and analy...
- Patent number 11,809,552
- Issue date Nov 7, 2023
- Power Fingerprinting Inc.
- Carlos R. Aguayo Gonzalez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of testing single DUT through multiple cores in p...
- Patent number 11,686,768
- Issue date Jun 27, 2023
- Test Research, Inc.
- Ching-Chih Lin
- G01 - MEASURING TESTING
Information Patent Grant
Spark gap structures for detection and protection against electrica...
- Patent number 11,668,734
- Issue date Jun 6, 2023
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for circuit testing using remote cooperative devices
- Patent number 11,592,468
- Issue date Feb 28, 2023
- Ford Global Technologies, LLC
- Rajarshi Roychowdhury
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Method and apparatus for delivering a thermal shock
- Patent number 11,543,327
- Issue date Jan 3, 2023
- GM CRUISE HOLDINGS LLC
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Configuring an analog gain for a load test
- Patent number 11,506,713
- Issue date Nov 22, 2022
- VIAVI Solutions Inc.
- Dejan Djonin
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for wireless power source identification by gen...
- Patent number 11,476,954
- Issue date Oct 18, 2022
- CIRCUITIQ INC.
- Luke Gordon Begley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerated measurements through adaptive test parameter selection
- Patent number 11,435,394
- Issue date Sep 6, 2022
- Anritsu Company
- Karam Noujeim
- G01 - MEASURING TESTING
Information Patent Grant
Electrical overstress detection device
- Patent number 11,372,030
- Issue date Jun 28, 2022
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for providing a supply voltage to a device und...
- Patent number 11,360,142
- Issue date Jun 14, 2022
- Advantest Corporation
- Martin Mücke
- G05 - CONTROLLING REGULATING
Information Patent Grant
Frequency detection circuit and method
- Patent number 11,327,098
- Issue date May 10, 2022
- GRACE CONNECTION MICROELECTRONICS LIMITED
- Pei Wei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating self-test signals, corresponding circuit and a...
- Patent number 11,150,294
- Issue date Oct 19, 2021
- STMicroelectronics S.r.l.
- Giorgio Maiellaro
- G01 - MEASURING TESTING
Information Patent Grant
Spark gap structures for detection and protection against electrica...
- Patent number 11,112,436
- Issue date Sep 7, 2021
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test system and method of operating the same
- Patent number 11,067,623
- Issue date Jul 20, 2021
- Test Research, Inc.
- Ming-Hsien Liu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for high precision cable length measurement in...
- Patent number 11,060,840
- Issue date Jul 13, 2021
- Marvell Asia Pte, Ltd.
- Shaoan Dai
- G01 - MEASURING TESTING
Information Patent Grant
Aging-sensitive recycling sensors for chip authentication
- Patent number 10,976,360
- Issue date Apr 13, 2021
- University of South Florida
- Swaroop Ghosh
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and apparatuses for intrusion detection and analy...
- Patent number 10,970,387
- Issue date Apr 6, 2021
- Power Fingerprinting Inc.
- Carlos R. Aguayo Gonzalez
- G01 - MEASURING TESTING
Information Patent Grant
Configuring an analog gain for a load test
- Patent number 10,859,629
- Issue date Dec 8, 2020
- VIAVI Solutions Inc.
- Dejan Djonin
- G01 - MEASURING TESTING
Information Patent Grant
Circuit comparing method and electronic device
- Patent number 10,755,008
- Issue date Aug 25, 2020
- Pegatron Corporation
- Yu-Jen Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Field adaptable in-system test mechanisms
- Patent number 10,746,798
- Issue date Aug 18, 2020
- NVIDIA Corp.
- Sailendra Chadalavada
- G01 - MEASURING TESTING
Information Patent Grant
Electrical overstress detection device
- Patent number 10,677,822
- Issue date Jun 9, 2020
- Analog Devices Global Unlimited Company
- David J. Clarke
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic discharge shielding semiconductor device and electros...
- Patent number 10,522,530
- Issue date Dec 31, 2019
- United Microelectronics Corp.
- Chun Chiang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for electric arc detection
- Patent number 10,502,778
- Issue date Dec 10, 2019
- SMA Solar Technology AG
- Martin Putz
- G01 - MEASURING TESTING
Information Patent Grant
Squib circuit for fire protection system
- Patent number 10,413,767
- Issue date Sep 17, 2019
- The Boeing Company
- Robert Steven Wright
- A62 - LIFE-SAVING FIRE-FIGHTING
Information Patent Grant
Autonomic supply voltage compensation for degradation of circuits o...
- Patent number 10,365,702
- Issue date Jul 30, 2019
- International Business Machines Corporation
- Chen-Yong Cher
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20240418768
- Publication date Dec 19, 2024
- Hioki E. E. Corporation
- Kazuaki HANEDA
- G01 - MEASURING TESTING
Information Patent Application
Adapter device and method for measuring the signal power in a coaxi...
- Publication number 20240258750
- Publication date Aug 1, 2024
- SICK AG
- Florian PUDENZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST ARRANGEMENT FOR EMULATING THE PHASE CURRENTS OF AN ELECTRIC MO...
- Publication number 20240201247
- Publication date Jun 20, 2024
- dSPACE GmbH
- Joerg BRACKER
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER
- Publication number 20240192265
- Publication date Jun 13, 2024
- dSPACE GmbH
- Daniel EPPING
- G01 - MEASURING TESTING
Information Patent Application
WEARABLE DEVICE WITH ENERGY HARVESTING
- Publication number 20240159804
- Publication date May 16, 2024
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF TESTING BONDED WIRES ON WIRE BONDING MACHINES
- Publication number 20240014169
- Publication date Jan 11, 2024
- KULICKE AND SOFFA INDUSTRIES, INC.
- ODAL KWON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...
- Publication number 20230375600
- Publication date Nov 23, 2023
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR CIRCUIT TESTING USING REMOTE COOPERATIVE DEVICES
- Publication number 20230194586
- Publication date Jun 22, 2023
- FORD GLOBAL TECHNOLOGIES, L.L.C.
- Rajarshi Roychowdhury
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
METHOD AND APPARATUS FOR DELIVERING A THERMAL SHOCK
- Publication number 20230084486
- Publication date Mar 16, 2023
- GM Cruise Holdings LLC
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR E...
- Publication number 20220252658
- Publication date Aug 11, 2022
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Seiko INOUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS, METHODS, AND APPARATUSES FOR INTRUSION DETECTION AND ANALY...
- Publication number 20220075869
- Publication date Mar 10, 2022
- Power Fingerprinting Inc.
- Carlos R. Aguayo Gonzalez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF GENERATING SELF-TEST SIGNALS, CORRESPONDING CIRCUIT AND A...
- Publication number 20220003814
- Publication date Jan 6, 2022
- STMicroelectronics S.r.l.
- Giorgio MAIELLARO
- G01 - MEASURING TESTING
Information Patent Application
SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...
- Publication number 20210396788
- Publication date Dec 23, 2021
- Analog Devices International Unlimited Company
- David J. Clarke
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED REQUIREMENTS DEVELOPMENT AND AUTOMATED GAP ANALYSIS FOR...
- Publication number 20210256218
- Publication date Aug 19, 2021
- Raytheon Company
- Nicholas W. Barrett
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DELIVERING A THERMAL SHOCK
- Publication number 20210239575
- Publication date Aug 5, 2021
- GM Cruise Holdings LLC
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY DETECTION CIRCUITAND METHOD
- Publication number 20210141008
- Publication date May 13, 2021
- Grace Connection Microelectronics Limited
- PEI WEI CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MONITORING ACTIVITY OVER TIME-DOMAIN OF ELECT...
- Publication number 20210102993
- Publication date Apr 8, 2021
- Isra-Juk Electronics Ltd.
- Isaac SELA
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURING AN ANALOG GAIN FOR A LOAD TEST
- Publication number 20210080502
- Publication date Mar 18, 2021
- VIAVI Solutions Inc.
- Dejan DJONIN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL OVERSTRESS DETECTION DEVICE
- Publication number 20200400725
- Publication date Dec 24, 2020
- Analog Devices Global Unlimited Company
- David J. Clarke
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD OF OPERATING THE SAME
- Publication number 20200363465
- Publication date Nov 19, 2020
- Test Research, Inc.
- Ming-Hsien LIU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CIRCUIT TESTING USING REMOTE COOPERATIVE DEVICES
- Publication number 20200249262
- Publication date Aug 6, 2020
- FORD GLOBAL TECHNOLOGIES, L.L.C.
- Rajarshi Roychowdhury
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
METHODS AND SYSTEMS FOR WIRELESS POWER SOURCE IDENTIFICATION BY GEN...
- Publication number 20200112380
- Publication date Apr 9, 2020
- 1985736 Ontario Inc.
- Luke Gordon Begley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURING AN ANALOG GAIN FOR A LOAD TEST
- Publication number 20200096563
- Publication date Mar 26, 2020
- VIAVI Solutions Inc.
- Dejan DJONIN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROVIDING A SUPPLY VOLTAGE TO A DEVICE UND...
- Publication number 20200011926
- Publication date Jan 9, 2020
- Advantest Corporation
- Martin MÜCKE
- G01 - MEASURING TESTING
Information Patent Application
SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...
- Publication number 20190293692
- Publication date Sep 26, 2019
- Analog Devices Global Unlimited Company
- David J. Clarke
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ELECTROSTATIC DISCHARGE SHIELDING SEMICONDUCTOR DEVICE AND ELECTROS...
- Publication number 20190273077
- Publication date Sep 5, 2019
- UNITED MICROELECTRONICS CORP.
- Chun Chiang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR HIGH PRECISION CABLE LENGTH MEASUREMENT IN...
- Publication number 20190257636
- Publication date Aug 22, 2019
- Marvell World Trade Ltd.
- Shaoan Dai
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND APPARATUSES FOR INTRUSION DETECTION AND ANALY...
- Publication number 20190197237
- Publication date Jun 27, 2019
- Power Fingerprinting Inc.
- Carlos R. Aguayo Gonzalez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Squib Circuit for Fire Protection System
- Publication number 20190083834
- Publication date Mar 21, 2019
- The Boeing Company
- Robert Steven Wright
- G01 - MEASURING TESTING
Information Patent Application
AGING-SENSITIVE RECYCLING SENSORS FOR CHIP AUTHENTICATION
- Publication number 20190018058
- Publication date Jan 17, 2019
- University of South Florida
- Swaroop Ghosh
- G01 - MEASURING TESTING

Specific tests of electronic circuits not provided for elsewhere

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for monitoring activity over time-domain of elect...

Spark gap structures for detection and protection against electrica...

System and method for circuit testing using remote cooperative devices

Calibrating processor system power consumption

Method of generating self-test signals, corresponding circuit and a...

Systems, methods, and apparatuses for intrusion detection and analy...

System and method of testing single DUT through multiple cores in p...

Spark gap structures for detection and protection against electrica...

System and method for circuit testing using remote cooperative devices

Method and apparatus for delivering a thermal shock

Configuring an analog gain for a load test

Methods and systems for wireless power source identification by gen...

Accelerated measurements through adaptive test parameter selection

Electrical overstress detection device

Apparatus and method for providing a supply voltage to a device und...

Frequency detection circuit and method

Method of generating self-test signals, corresponding circuit and a...

Spark gap structures for detection and protection against electrica...

Test system and method of operating the same

Systems and methods for high precision cable length measurement in...

Aging-sensitive recycling sensors for chip authentication

Systems, methods, and apparatuses for intrusion detection and analy...

Configuring an analog gain for a load test

Circuit comparing method and electronic device

Field adaptable in-system test mechanisms

Electrical overstress detection device

Electrostatic discharge shielding semiconductor device and electros...

Method and apparatus for electric arc detection

Squib circuit for fire protection system

Autonomic supply voltage compensation for degradation of circuits o...

Patents Applicationslast 30 patents

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

Adapter device and method for measuring the signal power in a coaxi...

TEST ARRANGEMENT FOR EMULATING THE PHASE CURRENTS OF AN ELECTRIC MO...

TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER

WEARABLE DEVICE WITH ENERGY HARVESTING

METHODS OF TESTING BONDED WIRES ON WIRE BONDING MACHINES

SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...

SYSTEM AND METHOD FOR CIRCUIT TESTING USING REMOTE COOPERATIVE DEVICES

METHOD AND APPARATUS FOR DELIVERING A THERMAL SHOCK

METHOD FOR PREDICTING ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR E...

SYSTEMS, METHODS, AND APPARATUSES FOR INTRUSION DETECTION AND ANALY...

METHOD OF GENERATING SELF-TEST SIGNALS, CORRESPONDING CIRCUIT AND A...

SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...

INTEGRATED REQUIREMENTS DEVELOPMENT AND AUTOMATED GAP ANALYSIS FOR...

METHOD AND APPARATUS FOR DELIVERING A THERMAL SHOCK

FREQUENCY DETECTION CIRCUITAND METHOD

SYSTEM AND METHOD FOR MONITORING ACTIVITY OVER TIME-DOMAIN OF ELECT...

CONFIGURING AN ANALOG GAIN FOR A LOAD TEST

ELECTRICAL OVERSTRESS DETECTION DEVICE

TEST SYSTEM AND METHOD OF OPERATING THE SAME

SYSTEM AND METHOD FOR CIRCUIT TESTING USING REMOTE COOPERATIVE DEVICES

METHODS AND SYSTEMS FOR WIRELESS POWER SOURCE IDENTIFICATION BY GEN...

CONFIGURING AN ANALOG GAIN FOR A LOAD TEST

APPARATUS AND METHOD FOR PROVIDING A SUPPLY VOLTAGE TO A DEVICE UND...

SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...

ELECTROSTATIC DISCHARGE SHIELDING SEMICONDUCTOR DEVICE AND ELECTROS...

SYSTEMS AND METHODS FOR HIGH PRECISION CABLE LENGTH MEASUREMENT IN...

SYSTEMS, METHODS, AND APPARATUSES FOR INTRUSION DETECTION AND ANALY...

Squib Circuit for Fire Protection System

AGING-SENSITIVE RECYCLING SENSORS FOR CHIP AUTHENTICATION