spectro-diffractometry

Industry

CPC
G01N2223/0568

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/0568spectro-diffractometry

Industries

Patents Grantslast 30 patents

Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Advanced X-ray emission spectrometers
- Patent number 11,874,239
- Issue date Jan 16, 2024
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING
Information Patent Grant
Energy-dispersive X-ray diffraction analyser comprising a substanti...
- Patent number 11,614,414
- Issue date Mar 28, 2023
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Richard Tickner
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer system
- Patent number 10,976,273
- Issue date Apr 13, 2021
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-cone x-ray imaging Bragg crystal spectrometer
- Patent number 10,677,744
- Issue date Jun 9, 2020
- U.S. Department of Energy
- Manfred Bitter
- G01 - MEASURING TESTING
Information Patent Grant
X-ray transmission spectrometer system
- Patent number 10,295,485
- Issue date May 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device and method for determining the energetic composition of elec...
- Patent number 9,417,341
- Issue date Aug 16, 2016
- IFG-Institute for Scientific Instruments GmbH
- Alexei Erko
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer
- Patent number 8,675,816
- Issue date Mar 18, 2014
- P. N. Lebedev Physical Institute of the Russian Academy of Sciences (LPI)
- Alexander Georgievich Turyansky
- G01 - MEASURING TESTING
Information Patent Grant
Ion scattering spectroscope
- Patent number 5,371,366
- Issue date Dec 6, 1994
- Shimadzu Corporation
- Takao Marui
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus with pulse amplitude shift correction and...
- Patent number 5,357,551
- Issue date Oct 18, 1994
- U.S. Philips Corporation
- Hendrik J. J. Bolk
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining the density of unoccupied electronic stat...
- Patent number 4,472,634
- Issue date Sep 18, 1984
- Commissariat a l'Energie Atomique
- Robert Baptist
- G01 - MEASURING TESTING
Information Patent Grant
3919549
- Patent number 3,919,549
- Issue date Nov 11, 1975
- G01 - MEASURING TESTING
Information Patent Grant
3914605
- Patent number 3,914,605
- Issue date Oct 21, 1975
- G01 - MEASURING TESTING
Information Patent Grant
3424428
- Patent number 3,424,428
- Issue date Jan 28, 1969
- G01 - MEASURING TESTING
Information Patent Grant
3291982
- Patent number 3,291,982
- Issue date Dec 13, 1966
- G01 - MEASURING TESTING
Information Patent Grant
3204097
- Patent number 3,204,097
- Issue date Aug 31, 1965
- G01 - MEASURING TESTING
Information Patent Grant
3163754
- Patent number 3,163,754
- Issue date Dec 29, 1964
- G01 - MEASURING TESTING
Information Patent Grant
3119013
- Patent number 3,119,013
- Issue date Jan 21, 1964
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...
- Publication number 20240345007
- Publication date Oct 17, 2024
- Zhejiang University
- Haikuo WANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Advanced X-Ray Emission Spectrometers
- Publication number 20230288352
- Publication date Sep 14, 2023
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION SPECTROMETER SYSTEM
- Publication number 20190145917
- Publication date May 16, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY TRANSMISSION SPECTROMETER SYSTEM
- Publication number 20170336334
- Publication date Nov 23, 2017
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Device and method for determining the energetic composition of elec...
- Publication number 20140314207
- Publication date Oct 23, 2014
- Alexei ERKO
- G01 - MEASURING TESTING
Information Patent Application
X-ray spectrometer
- Publication number 20110188631
- Publication date Aug 4, 2011
- P. N. Lebedev Physical Institute of the Russian Academy of Sciences (LPI)
- Alexander Georgievich Turyansky
- G01 - MEASURING TESTING

spectro-diffractometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray sequential array wavelength dispersive spectrometer

Advanced X-ray emission spectrometers

Energy-dispersive X-ray diffraction analyser comprising a substanti...

X-ray spectrometer system

Multi-cone x-ray imaging Bragg crystal spectrometer

X-ray transmission spectrometer system

Device and method for determining the energetic composition of elec...

X-ray spectrometer

Ion scattering spectroscope

X-ray analysis apparatus with pulse amplitude shift correction and...

Apparatus for determining the density of unoccupied electronic stat...

3919549

3914605

3424428

3291982

3204097

3163754

3119013

Patents Applicationslast 30 patents

METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

Advanced X-Ray Emission Spectrometers

X-RAY TRANSMISSION SPECTROMETER SYSTEM

X-RAY TRANSMISSION SPECTROMETER SYSTEM

Device and method for determining the energetic composition of elec...

X-ray spectrometer