Spectrometers having multiple channels, parallel analysis

Industry

CPC
H01J49/009

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/009Spectrometers having multiple channels, parallel analysis

Industries

Patents Grantslast 30 patents

Information Patent Grant
Methods for sampling into an atmospheric pressure inlet mass spectr...
- Patent number 12,148,606
- Issue date Nov 19, 2024
- University of South Florida
- Theresa Evans-Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector
- Patent number 12,061,166
- Issue date Aug 13, 2024
- Micromass UK Limited
- David Gordon
- G01 - MEASURING TESTING
Information Patent Grant
Substantially simultaneous resonance-enhanced multiphoton and laser...
- Patent number 11,923,182
- Issue date Mar 5, 2024
- Helmholtz Zentrum Munchen Deutsches Forschungszentrum fur Gesundheit und Umwe...
- Ralf Zimmermann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Space-time buffer for ion processing pipelines
- Patent number 11,749,519
- Issue date Sep 5, 2023
- Thermo Finnigan LLC.
- Philip M. Remes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Daly detector operable in negative ion and positive ion detection m...
- Patent number 11,640,005
- Issue date May 2, 2023
- Thermo Finnigan LLC.
- Linfan Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry assay method for detection and quantitation of li...
- Patent number 11,536,726
- Issue date Dec 27, 2022
- Metabolon, Inc.
- Lisa Ford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry by detecting positively and negatively charged pa...
- Patent number 11,501,961
- Issue date Nov 15, 2022
- 908 Devices Inc.
- Christopher D. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic MS-N characterization of mass spectrometric “dark matter”
- Patent number 11,393,666
- Issue date Jul 19, 2022
- Thermo Finnigan LLC.
- Bennett S. Kalafut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and program for approximately identifying molecular structur...
- Patent number 11,275,053
- Issue date Mar 15, 2022
- JAPAN PETROLEUM ENERGY CENTER
- Teruo Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric method for determining the presence or absence o...
- Patent number 11,211,237
- Issue date Dec 28, 2021
- Wiebke Andrea Timm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Space-time buffer for ion processing pipelines
- Patent number 11,114,293
- Issue date Sep 7, 2021
- Thermo Finnigan LLC.
- Philip M. Remes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inorganic and organic mass spectrometry systems and methods of usin...
- Patent number 11,056,327
- Issue date Jul 6, 2021
- PerkinElmer Health Sciences Canada, Inc.
- Tak Shun Cheung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 10,984,998
- Issue date Apr 20, 2021
- Shimadzu Corporation
- Yusuke Midorikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for mass spectrometric examination of gas mixtures and mass...
- Patent number 10,903,060
- Issue date Jan 26, 2021
- LEYBOLD GMBH
- Hin Yiu Anthony Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Biomolecular processing platform and uses thereof
- Patent number 10,870,881
- Issue date Dec 22, 2020
- Cornell University
- Steven A. Soper
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Differential electrochemical mass spectrometry (DEMS) cell
- Patent number 10,777,396
- Issue date Sep 15, 2020
- The Regents of the University of California
- Ezra L. Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel mass analysis
- Patent number 10,755,908
- Issue date Aug 25, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for simultaneous multicomponent analysis using mass spectrom...
- Patent number 10,748,751
- Issue date Aug 18, 2020
- Shimadzu Corporation
- Riki Kitano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and operating methods therefor
- Patent number 10,734,210
- Issue date Aug 4, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for simultaneous multicomponent analysis using mass spectrom...
- Patent number 10,672,599
- Issue date Jun 2, 2020
- Shimadzu Corporation
- Riki Kitano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device to manipulate ions of same or different polarities
- Patent number 10,665,443
- Issue date May 26, 2020
- Battelle Memorial Institute
- Yehia M. Ibrahim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 10,629,425
- Issue date Apr 21, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for simultaneous multicomponent analysis using mass spectrom...
- Patent number 10,593,526
- Issue date Mar 17, 2020
- Shimadzu Corporation
- Riki Kitano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of multiplexing sample analysis by mass spectrometry
- Patent number 10,586,692
- Issue date Mar 10, 2020
- Florida State University Research Foundation, Inc.
- Michael G. Roper
- G01 - MEASURING TESTING
Information Patent Grant
Device for manipulating charged particles
- Patent number 10,559,454
- Issue date Feb 11, 2020
- Shimadzu Research Laboratory (Europe) Ltd.
- Alexander Berdnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of charge reduction of electron transfer dissociation produc...
- Patent number 10,490,394
- Issue date Nov 26, 2019
- Micromass UK Limited
- Weibin Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer having multi-dynode multiplier(s) of high dynamic...
- Patent number 10,468,239
- Issue date Nov 5, 2019
- Urs Steiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for manipulating charged particles
- Patent number 10,431,443
- Issue date Oct 1, 2019
- Shimadzu Research Laboratory (Europe) Ltd.
- Alexander Berdnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Targeted mass analysis
- Patent number 10,410,847
- Issue date Sep 10, 2019
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary ion mass spectrometer and secondary ion mass spectrometri...
- Patent number 10,354,851
- Issue date Jul 16, 2019
- IONTOF TECHNOLOGIES GmbH
- Rudolf Moellers
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARALLEL PROCESSING AND HORIZONTAL SCALING FOR PEAK DETECTION
- Publication number 20240371619
- Publication date Nov 7, 2024
- Thermo Finnigan LLC
- Sumanth Upadhya P
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND DATA ACQUISITION METHODS FOR IDENTIFICATION O...
- Publication number 20240274425
- Publication date Aug 15, 2024
- Thermo Finnigan LLC
- Rosa I. Viner
- G01 - MEASURING TESTING
Information Patent Application
MULTIMODE ION DETECTOR WITH WIDE DYNAMIC RANGE AND AUTOMATIC MODE S...
- Publication number 20240128070
- Publication date Apr 18, 2024
- Kimia Analytics Inc.
- Sina ALAVI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR SAMPLING INTO AN ATMOSPHERIC PRESSURE INLET MASS SPECTR...
- Publication number 20240096610
- Publication date Mar 21, 2024
- University of South Florida
- Theresa Evans-Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...
- Publication number 20230402272
- Publication date Dec 14, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPTIMIZING A PARAMETER SETTING OF AT LEAST ONE MASS SPEC...
- Publication number 20230326729
- Publication date Oct 12, 2023
- Roche Diagnostics Operations, Inc.
- Benjamin Tiemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Partial Structure Estimation Apparatus and Method of Generating Par...
- Publication number 20230274923
- Publication date Aug 31, 2023
- JEOL Ltd.
- Ayumi Kubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS OF MASS ANALYSING POSITIVELY CHARGED IONS AND...
- Publication number 20230274924
- Publication date Aug 31, 2023
- TOFWERK AG
- Urs ROHNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DALY DETECTOR OPERABLE IN NEGATIVE ION AND POSITIVE ION DETECTION M...
- Publication number 20230243986
- Publication date Aug 3, 2023
- Thermo Finnigan LLC
- Linfan LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL MULTI-BEAM TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20220367163
- Publication date Nov 17, 2022
- THE ROCKEFELLER UNIVERSITY
- Andrew Krutchinsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DALY DETECTOR OPERABLE IN NEGATIVE ION AND POSITIVE ION DETECTION M...
- Publication number 20220102125
- Publication date Mar 31, 2022
- Thermo Finnigan LLC
- Linfan LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTOR
- Publication number 20210382005
- Publication date Dec 9, 2021
- Micromass UK Limited
- David Gordon
- G01 - MEASURING TESTING
Information Patent Application
SPACE-TIME BUFFER FOR ION PROCESSING PIPELINES
- Publication number 20210384026
- Publication date Dec 9, 2021
- Thermo Finnigan LLC
- Philip M. REMES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL MULTI-BEAM TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210233753
- Publication date Jul 29, 2021
- THE ROCKEFELLER UNIVERSITY
- Andrew Krutchinsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPACE-TIME BUFFER FOR ION PROCESSING PIPELINES
- Publication number 20210183639
- Publication date Jun 17, 2021
- Thermo Finnigan LLC
- Philip M. REMES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY ASSAY METHOD FOR DETECTION AND QUANTITATION OF LI...
- Publication number 20210148924
- Publication date May 20, 2021
- Metabolon, Inc.
- Lisa FORD
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MASS SPECTROSCOPIC ANALYSIS OF PARTICLES
- Publication number 20210134574
- Publication date May 6, 2021
- HELMHOLTZ ZENTRUM MÜNCHEN DEUTSCHES FORSCHUNGSZENTRUM FÜR GESUNDHEIT UND UMWE...
- Ralf Zimmermann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR MASS ANALYSIS OF AEROSOL PARTICLES
- Publication number 20200393410
- Publication date Dec 17, 2020
- WATERS TECHNOLOGIES CORPORATION
- Joseph A. Jarrell
- G01 - MEASURING TESTING
Information Patent Application
SUBTERAHERTZ MICROFABRICATED SPECTROMETER
- Publication number 20200388475
- Publication date Dec 10, 2020
- Innovative Micro Technology
- Christopher S. GUDEMAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MASS SPECTROMETRIC METHOD FOR DETERMINING THE PRESENCE OR ABSENCE O...
- Publication number 20200243315
- Publication date Jul 30, 2020
- Bruker Daltonik GmbH
- Wiebke Andrea TIMM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SIMULTANEOUS MULTICOMPONENT ANALYSIS USING MASS SPECTROM...
- Publication number 20200211830
- Publication date Jul 2, 2020
- Shimadzu Corporation
- Riki KITANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SIMULTANEOUS MULTICOMPONENT ANALYSIS USING MASS SPECTROM...
- Publication number 20200083032
- Publication date Mar 12, 2020
- Shimadzu Corporation
- Riki KITANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Novel differential electrochemical mass spectrometry (DEMS) cell
- Publication number 20200013600
- Publication date Jan 9, 2020
- The Regents of the University of California
- Ezra L. Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR MANIPULATING CHARGED PARTICLES
- Publication number 20190371587
- Publication date Dec 5, 2019
- Shimadzu Research Laboratory (Europe) Ltd.
- Alexander Berdnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND PROGRAM FOR APPROXIMATELY IDENTIFYING MOLECULAR STRUCTUR...
- Publication number 20190353616
- Publication date Nov 21, 2019
- JAPAN PETROLEUM ENERGY CENTER
- Teruo SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INORGANIC AND ORGANIC MASS SPECTROMETRY SYSTEMS AND METHODS OF USIN...
- Publication number 20190355563
- Publication date Nov 21, 2019
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Tak Shun Cheung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER HAVING MULTI-DYNODE MULTIPLIER(S) OF HIGH DYNAMIC...
- Publication number 20190348265
- Publication date Nov 14, 2019
- Bruker Daltonics, Inc.
- Urs STEINER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Parallel Mass Analysis
- Publication number 20190221410
- Publication date Jul 18, 2019
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. MAKAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for simultaneous multicomponent analysis using mass spectrom...
- Publication number 20190221411
- Publication date Jul 18, 2019
- Shimadzu Corporation
- Riki KITANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE TO MANIPULATE IONS OF SAME OR DIFFERENT POLARITIES
- Publication number 20190198305
- Publication date Jun 27, 2019
- Battelle Memorial Institute
- Yehia M. Ibrahim
- H01 - BASIC ELECTRIC ELEMENTS

Spectrometers having multiple channels, parallel analysis

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods for sampling into an atmospheric pressure inlet mass spectr...

Ion detector

Substantially simultaneous resonance-enhanced multiphoton and laser...

Space-time buffer for ion processing pipelines

Daly detector operable in negative ion and positive ion detection m...

Mass spectrometry assay method for detection and quantitation of li...

Mass spectrometry by detecting positively and negatively charged pa...

Automatic MS-N characterization of mass spectrometric “dark matter”

Method and program for approximately identifying molecular structur...

Mass spectrometric method for determining the presence or absence o...

Space-time buffer for ion processing pipelines

Inorganic and organic mass spectrometry systems and methods of usin...

Mass spectrometer

Method for mass spectrometric examination of gas mixtures and mass...

Biomolecular processing platform and uses thereof

Differential electrochemical mass spectrometry (DEMS) cell

Parallel mass analysis

Method for simultaneous multicomponent analysis using mass spectrom...

Mass spectrometer and operating methods therefor

Method for simultaneous multicomponent analysis using mass spectrom...

Device to manipulate ions of same or different polarities

Imaging mass spectrometer

Method for simultaneous multicomponent analysis using mass spectrom...

Methods of multiplexing sample analysis by mass spectrometry

Device for manipulating charged particles

Method of charge reduction of electron transfer dissociation produc...

Mass spectrometer having multi-dynode multiplier(s) of high dynamic...

Device for manipulating charged particles

Targeted mass analysis

Secondary ion mass spectrometer and secondary ion mass spectrometri...

Patents Applicationslast 30 patents

PARALLEL PROCESSING AND HORIZONTAL SCALING FOR PEAK DETECTION

MASS SPECTROMETER AND DATA ACQUISITION METHODS FOR IDENTIFICATION O...

MULTIMODE ION DETECTOR WITH WIDE DYNAMIC RANGE AND AUTOMATIC MODE S...

METHODS FOR SAMPLING INTO AN ATMOSPHERIC PRESSURE INLET MASS SPECTR...

SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...

METHOD FOR OPTIMIZING A PARAMETER SETTING OF AT LEAST ONE MASS SPEC...

Partial Structure Estimation Apparatus and Method of Generating Par...

METHOD AND APPARATUS OF MASS ANALYSING POSITIVELY CHARGED IONS AND...

DALY DETECTOR OPERABLE IN NEGATIVE ION AND POSITIVE ION DETECTION M...

PARALLEL MULTI-BEAM TIME-OF-FLIGHT MASS SPECTROMETER

DALY DETECTOR OPERABLE IN NEGATIVE ION AND POSITIVE ION DETECTION M...

ION DETECTOR

SPACE-TIME BUFFER FOR ION PROCESSING PIPELINES

PARALLEL MULTI-BEAM TIME-OF-FLIGHT MASS SPECTROMETER

SPACE-TIME BUFFER FOR ION PROCESSING PIPELINES

MASS SPECTROMETRY ASSAY METHOD FOR DETECTION AND QUANTITATION OF LI...

DEVICE AND METHOD FOR MASS SPECTROSCOPIC ANALYSIS OF PARTICLES

TECHNIQUES FOR MASS ANALYSIS OF AEROSOL PARTICLES

SUBTERAHERTZ MICROFABRICATED SPECTROMETER

MASS SPECTROMETRIC METHOD FOR DETERMINING THE PRESENCE OR ABSENCE O...

METHOD FOR SIMULTANEOUS MULTICOMPONENT ANALYSIS USING MASS SPECTROM...

METHOD FOR SIMULTANEOUS MULTICOMPONENT ANALYSIS USING MASS SPECTROM...

Novel differential electrochemical mass spectrometry (DEMS) cell

DEVICE FOR MANIPULATING CHARGED PARTICLES

METHOD AND PROGRAM FOR APPROXIMATELY IDENTIFYING MOLECULAR STRUCTUR...

INORGANIC AND ORGANIC MASS SPECTROMETRY SYSTEMS AND METHODS OF USIN...

MASS SPECTROMETER HAVING MULTI-DYNODE MULTIPLIER(S) OF HIGH DYNAMIC...

Parallel Mass Analysis

Method for simultaneous multicomponent analysis using mass spectrom...

DEVICE TO MANIPULATE IONS OF SAME OR DIFFERENT POLARITIES