CPC
G01N21/55
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Patent Grant
Universite Laval
Maxime Joly
G01 - MEASURING TESTING
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Patent Grant
Specac Limited
Michael Ramsay
G01 - MEASURING TESTING
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Patent Grant
Qinetiq Limited
Christopher Robert Lawrence
G01 - MEASURING TESTING
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Patent Grant
LUMUS LTD.
Eitan Ronen
G01 - MEASURING TESTING
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Patent Grant
Carl Zeiss SMT GmbH
Tatjana Giessel
G01 - MEASURING TESTING
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Patent Grant
DrinkSavvy, Inc.
Min Hu
B82 - NANO-TECHNOLOGY
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Patent Grant
NanoMosaic Inc.
Qimin Quan
B82 - NANO-TECHNOLOGY
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Patent Grant
Canon Kabushiki Kaisha
Hironobu Koga
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Nicoya Lifesciences Inc.
Sanat Ganu
G01 - MEASURING TESTING
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Patent Grant
GIESECKE+DEVRIENT CURRENCY TECHNOLOGY GMBH
Klaus Thierauf
G07 - CHECKING-DEVICES
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Patent Grant
The Penn State Research Foundation
Brian M. Foley
G01 - MEASURING TESTING
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Patent Grant
Arcelormittal
Nathalie Labbe
G01 - MEASURING TESTING
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Patent Grant
Anton Paar GmbH
Josef Bloder
G01 - MEASURING TESTING
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Patent Grant
Ricoh Company, Ltd.
Shuhei Watanabe
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Consejo Superior de Investigaciones Cientificas
Francisco Javier Tamayo de Miguel
G01 - MEASURING TESTING
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Patent Grant
Waymo LLC
Hui Seong Son
G01 - MEASURING TESTING
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Patent Grant
Honeywell International Inc.
Ronald W. Myers
G01 - MEASURING TESTING
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Patent Grant
UNIVERSITY OF ESSEX ENTERPRISES LIMITED
Tracy Lawson
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
Samsung Electronics Co., Ltd.
Juntaek Oh
G01 - MEASURING TESTING
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Patent Grant
ASML Netherlands B.V.
Lorenzo Tripodi
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Hunter Associates Laboratory, Inc.
Michael T. Scardina
G01 - MEASURING TESTING
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Patent Grant
Laboratory Corporation of America Holdings
Mary Katherine Morr Kelemen
G01 - MEASURING TESTING
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Patent Grant
Yong Hak Choi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
SHENZHEN HYPERNANO OPTICS TECHNOLOGY CO., LTD.
Min Liu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Academia Sinica
Pei-Kuen Wei
G01 - MEASURING TESTING
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Patent Grant
Great Plains Manufacturing, Inc.
Brian Olander
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
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Patent Grant
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Cyrielle Monpeurt
G01 - MEASURING TESTING
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Patent Grant
ams Sensors Singapore Pte. Ltd.
Francesco Paolo D'Aleo
G01 - MEASURING TESTING
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Patent Grant
ASML Netherlands B.V.
Shakeeb Bin Hasan
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
University of Virginia Patent Foundation
Jeffrey L. Braun
G01 - MEASURING TESTING
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Patent Application
Apple Inc.
Chin San Han
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Application
University of Virginia Patent Foundation
Jeffrey L. BRAUN
G01 - MEASURING TESTING
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Patent Application
Applied Materials, Inc.
Zhepeng CONG
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Application
Laboratory Corporation of America Holdings
Mary Katherine Morr Kelemen
G01 - MEASURING TESTING
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Patent Application
ASML NETHERLANDS B.V.
Lorenzo Tripodi
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
HEMETRIX, INC.
Matthew BANET
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
DrinkSavvy, Inc.
Min Hu
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
RIBER
Youri ROUSSEAU
G01 - MEASURING TESTING
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Patent Application
THE TRUSTEES OF INDIANA UNIVERSITY
Rajesh SARDAR
B82 - NANO-TECHNOLOGY
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Patent Application
Industry-University Cooperation Foundation Hanyang University ERICA Campus
Jong-Ho KIM
B82 - NANO-TECHNOLOGY
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Patent Application
ASUSTek COMPUTER INC.
Jun-Shang Chung
G01 - MEASURING TESTING
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Patent Application
Plume Design, Inc.
Min-Feng HSIEH
G01 - MEASURING TESTING
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Patent Application
Alentic Microscience Inc.
Alan Marc Fine
G01 - MEASURING TESTING
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Patent Application
The Boeing Company
Daniel J. Sox
G01 - MEASURING TESTING
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Patent Application
WAVEFRONT TECHNOLOGY, INC.
Christopher Chapman Rich
G07 - CHECKING-DEVICES
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Patent Application
Applied Materials, Inc.
Patrick Tae
G01 - MEASURING TESTING
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Patent Application
The University of Melbourne
Christopher Graham Bolton
G01 - MEASURING TESTING
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Patent Application
Queen's University at Kingston
Cathleen M. Crudden
B32 - LAYERED PRODUCTS
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Patent Application
The Boeing Company
Brian Gunther
G02 - OPTICS
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Patent Application
National Research Council of Canada
Ryan Denomme
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
RETISPEC INC.
Eliav Shaked
G01 - MEASURING TESTING
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Patent Application
Korea Research Institute of Standards and Science
Dong Hyung KIM
G01 - MEASURING TESTING
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Patent Application
ONTO INNOVATION INC.
Manjusha MEHENDALE
G01 - MEASURING TESTING
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Patent Application
Kazuki NAGASAWA
G01 - MEASURING TESTING
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Patent Application
KWANSEI GAKUIN EDUCATIONAL FOUNDATION
Keiko TAWA
G01 - MEASURING TESTING
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Patent Application
M & G Jewelers, Inc.
Michael Insalago
G01 - MEASURING TESTING
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Patent Application
Rie Hirayama
G01 - MEASURING TESTING
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Patent Application
Samsung Electronics Co., Ltd.
Wontaek Kim
C01 - INORGANIC CHEMISTRY
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Patent Application
PROTEIN DYNAMIC SOLUTIONS, INC.
Belinda Pastrana-Rios
G01 - MEASURING TESTING
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Patent Application
Prime Planet Energy & Solutions, Inc.
Tomomichi YAMAZAKI
H01 - BASIC ELECTRIC ELEMENTS
