Spin polarised electron sources

Industry

CPC
H01J2237/06383

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/06383Spin polarised electron sources

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Non-contact angle measuring apparatus
- Patent number 11,903,755
- Issue date Feb 20, 2024
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunable charged particle vortex beam generator and method
- Patent number 10,607,804
- Issue date Mar 31, 2020
- Forschungszentrum Julich GmbH
- Amir Tavabi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle vortex wave generation
- Patent number 9,018,596
- Issue date Apr 28, 2015
- Universiteit Antwerpen
- Johan Verbeeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 8,841,615
- Issue date Sep 23, 2014
- National University Corporation Nagoya University
- Nobuo Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for producing and using multiple electron beams w...
- Patent number 8,680,488
- Issue date Mar 25, 2014
- Benjamin McMorran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,536,773
- Issue date Sep 17, 2013
- Carl Zeiss Microscopy GmbH
- Wolfram Buehler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spin-polarized electron source
- Patent number 8,344,354
- Issue date Jan 1, 2013
- National University Corporation Nagoya University
- Toru Ujihara
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Magnetically modulated, spin vector correlated beam generator for p...
- Patent number 7,786,431
- Issue date Aug 31, 2010
- Raymond S. Donofrio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 7,755,046
- Issue date Jul 13, 2010
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for storing data using spin-polarized electrons
- Patent number 6,147,894
- Issue date Nov 14, 2000
- TeraStore, Inc.
- Thomas D. Hurt
- G11 - INFORMATION STORAGE
Information Patent Grant
Quantum magnetic memory
- Patent number 6,061,265
- Issue date May 9, 2000
- Intel Corporation
- Eric C. Hannah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spin-polarized electron emitter having semiconductor opto-electroni...
- Patent number 6,040,587
- Issue date Mar 21, 2000
- Katsumi Kishino
- Katsumi Kishino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for storing data using spin-polarized electrons
- Patent number 5,838,020
- Issue date Nov 17, 1998
- TeraStore, Inc.
- Thomas D. Hurt
- G11 - INFORMATION STORAGE
Information Patent Grant
Spin-polarized electron emitter having semiconductor opto-electroni...
- Patent number 5,747,862
- Issue date May 5, 1998
- Kishino; Katsumi
- Katsumi Kishino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data storage medium for storing data as a polarization of a data ma...
- Patent number 5,604,706
- Issue date Feb 18, 1997
- Terastore, Inc.
- Thomas D. Hurt
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for storing data using spin-polarized electrons
- Patent number 5,546,337
- Issue date Aug 13, 1996
- Terastore, Inc.
- Thomas D. Hurt
- G11 - INFORMATION STORAGE
Information Patent Grant
Data storage medium for storing data as a polarization of a data ma...
- Patent number 5,446,687
- Issue date Aug 29, 1995
- Terastore, Inc.
- Thomas D. Hurt
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE
- Publication number 20240249911
- Publication date Jul 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
- Publication number 20240115222
- Publication date Apr 11, 2024
- Weng-Dah Ken
- G04 - HOROLOGY
Information Patent Application
NON-CONTACT ANGLE MEASURING APPARATUS
- Publication number 20200397391
- Publication date Dec 24, 2020
- Weng-Dah Ken
- G01 - MEASURING TESTING
Information Patent Application
TUNABLE CHARGED PARTICLE VORTEX BEAM GENERATOR AND METHOD
- Publication number 20190259561
- Publication date Aug 22, 2019
- Amir Tavabi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE VORTEX WAVE GENERATION
- Publication number 20140346353
- Publication date Nov 27, 2014
- Johan Verbeeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONVERTER OF ORBITAL MOMENTUM INTO SPIN MOMENTUM FOR THE POLARIZATI...
- Publication number 20130168577
- Publication date Jul 4, 2013
- Consiglio Nazionale Delle Ricerche
- Vincenzo GRILLO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20130009058
- Publication date Jan 10, 2013
- NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
- Nobuo Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120248959
- Publication date Oct 4, 2012
- CARL ZEISS NTS GMBH
- Wolfram Buehler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PRODUCING AND USING MULTIPLE ELECTRON BEAMS W...
- Publication number 20120153144
- Publication date Jun 21, 2012
- Benjamin McMorran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPIN-POLARIZED ELECTRON SOURCE
- Publication number 20110089397
- Publication date Apr 21, 2011
- Toru Ujihara
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Transmission electron microscope
- Publication number 20080210868
- Publication date Sep 4, 2008
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS

Spin polarised electron sources

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Non-contact angle measuring apparatus

Tunable charged particle vortex beam generator and method

Charged particle vortex wave generation

Electron microscope

System and method for producing and using multiple electron beams w...

Electron beam source and method of manufacturing the same

Spin-polarized electron source

Magnetically modulated, spin vector correlated beam generator for p...

Transmission electron microscope

Method and apparatus for storing data using spin-polarized electrons

Quantum magnetic memory

Spin-polarized electron emitter having semiconductor opto-electroni...

Method and apparatus for storing data using spin-polarized electrons

Spin-polarized electron emitter having semiconductor opto-electroni...

Data storage medium for storing data as a polarization of a data ma...

Method and apparatus for storing data using spin-polarized electrons

Data storage medium for storing data as a polarization of a data ma...

Patents Applicationslast 30 patents

SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE

ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS

NON-CONTACT ANGLE MEASURING APPARATUS

TUNABLE CHARGED PARTICLE VORTEX BEAM GENERATOR AND METHOD

CHARGED PARTICLE VORTEX WAVE GENERATION

CONVERTER OF ORBITAL MOMENTUM INTO SPIN MOMENTUM FOR THE POLARIZATI...

ELECTRON MICROSCOPE

ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME

SYSTEM AND METHOD FOR PRODUCING AND USING MULTIPLE ELECTRON BEAMS W...

SPIN-POLARIZED ELECTRON SOURCE

Transmission electron microscope