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Spin resolved measurements; Influencing spins during measurements
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MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
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Arrangements or instruments for measuring magnetic variables
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G01R33/1284
Spin resolved measurements; Influencing spins during measurements
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Nanoscale scanning sensors
Patent number
12,169,209
Issue date
Dec 17, 2024
President and Fellows of Harvard College
Michael S. Grinolds
G01 - MEASURING TESTING
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Magnetic field sensor using acoustically driven ferromagnetic reson...
Patent number
11,837,211
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Dec 5, 2023
The Regents of the University of California
Sayeef Salahuddin
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
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Nanoscale scanning sensors
Patent number
11,815,528
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Nov 14, 2023
President and Fellows of Harvard College
Michael S. Grinolds
G01 - MEASURING TESTING
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Nanoscale strain engineering of graphene devices with tuneable elec...
Patent number
11,746,018
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Sep 5, 2023
California Institute of Technology
Nai-Chang Yeh
C01 - INORGANIC CHEMISTRY
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Spin torque oscillator (STO) sensors used in nucleic acid sequencin...
Patent number
11,738,336
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Aug 29, 2023
Western Digital Technologies, Inc.
Patrick Braganca
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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System and method for cryogenic hybrid technology computing and memory
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11,717,475
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Aug 8, 2023
SeeQC, Inc.
Oleg A. Mukhanov
G06 - COMPUTING CALCULATING COUNTING
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Chirality detection device, chirality detection method, separation...
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11,698,360
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Jul 11, 2023
University Public Corporation Osaka
Yoshihiko Togawa
G01 - MEASURING TESTING
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High-frequency magnetic field generating device
Patent number
11,668,778
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Jun 6, 2023
Sumida Corporation
Yoshiharu Yoshii
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Spin-based detection of terahertz and sub-terahertz electromagnetic...
Patent number
11,639,975
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May 2, 2023
The Regents of the University of California
Jing Shi
H01 - BASIC ELECTRIC ELEMENTS
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Techniques for control of quantum systems and related systems and m...
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11,635,456
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Apr 25, 2023
Yale University
Nissim Ofek
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Machine learning system utilizing magnetization susceptibility adju...
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11,593,636
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Feb 28, 2023
Seagate Technology LLC
Kirill A. Rivkin
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Devices and methods for frequency- and phase-based detection of mag...
Patent number
11,579,217
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Feb 14, 2023
Western Digital Technologies, Inc.
Patrick Braganca
G01 - MEASURING TESTING
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Optically pumped gradient magnetometer
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11,543,474
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Jan 3, 2023
National Technology & Engineering Solutions of Sandia, LLC
Peter Schwindt
G04 - HOROLOGY
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Apparatus and method for dynamically adjusting quantum computer clo...
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11,513,552
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Nov 29, 2022
Intel Corporation
Justin Hogaboam
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Stacked structure, magnetoresistive effect element, magnetic head,...
Patent number
11,422,211
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Aug 23, 2022
TDK Corporation
Kazuumi Inubushi
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System and method for cryogenic hybrid technology computing and memory
Patent number
11,406,583
Issue date
Aug 9, 2022
SeeQC, Inc.
Oleg A. Mukhanov
G06 - COMPUTING CALCULATING COUNTING
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Electron intrinsic spin analyzer
Patent number
11,402,445
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Aug 2, 2022
Hosein Majlesi
G01 - MEASURING TESTING
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Methods and systems using molecular glue for covalent bonding of so...
Patent number
11,370,941
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Jun 28, 2022
HI LLC
Sukanta Bhattacharyya
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
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Pulse sequence design protocol
Patent number
11,360,174
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Jun 14, 2022
President and Fellows of Harvard College
Mikhail D. Lukin
G01 - MEASURING TESTING
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Quantum sensor based on rare-earth-ion doped optical crystal and us...
Patent number
11,313,925
Issue date
Apr 26, 2022
University of Science and Technology of China
Zongquan Zhou
H01 - BASIC ELECTRIC ELEMENTS
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Quantum spin magnetometer
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11,269,026
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Mar 8, 2022
The University of Melbourne
Alexander Wood
G01 - MEASURING TESTING
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Acoustic excitation and detection of spin waves
Patent number
11,249,153
Issue date
Feb 15, 2022
Oxford University Innovation Limited
John Francis Gregg
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Magnetometer based on spin wave interferometer
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11,243,276
Issue date
Feb 8, 2022
The Regents of the University of California
Alexander Khitun
G01 - MEASURING TESTING
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Magnetoresistive sensor array for molecule detection and related de...
Patent number
11,112,468
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Sep 7, 2021
Western Digital Technologies, Inc.
Patrick Braganca
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Packages for coil actuated position sensors
Patent number
11,073,573
Issue date
Jul 27, 2021
ALLEGRO MICROSYSTEMS, LLC
Alexander Latham
H01 - BASIC ELECTRIC ELEMENTS
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Ultra high-sensitivity micro magnetic sensor
Patent number
10,989,768
Issue date
Apr 27, 2021
Asahi Intecc Co., Ltd.
Yoshinobu Honkura
G01 - MEASURING TESTING
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Microwave resonator readout of an ensemble solid state spin sensor
Patent number
10,962,611
Issue date
Mar 30, 2021
Massachusetts Institute of Technology
John F. Barry
G01 - MEASURING TESTING
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System and method for cryogenic hybrid technology computing and memory
Patent number
10,950,299
Issue date
Mar 16, 2021
SeeQC, Inc.
Oleg A. Mukhanov
G06 - COMPUTING CALCULATING COUNTING
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Integrated mounting solution for solid-state spin sensors used for...
Patent number
10,928,320
Issue date
Feb 23, 2021
President and Fellows of Harvard College
John Francis Barry
G01 - MEASURING TESTING
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Stacked structure, magnetoresistive effect element, magnetic head,...
Patent number
10,921,392
Issue date
Feb 16, 2021
TDK Corporation
Kazuumi Inubushi
B82 - NANO-TECHNOLOGY
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last 30 patents
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STABILIZATION OF LASER-BASED SENSORS
Publication number
20250012875
Publication date
Jan 9, 2025
DeUVe Photonics, Inc.
Chris Hessenius
G01 - MEASURING TESTING
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Patent Application
PHASE DIFFERENCE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND ELECTR...
Publication number
20240377485
Publication date
Nov 14, 2024
KYOTO UNIVERSITY
Norikazu MIZUOCHI
G01 - MEASURING TESTING
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SPIN WAVE EXCITATION/DETECTION STRUCTURE
Publication number
20240272250
Publication date
Aug 15, 2024
Shin-Etsu Chemical Co., Ltd.
Taichi GOTO
G01 - MEASURING TESTING
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METHOD TO CALCULATE PERFORMANCE OF A MAGNETIC ELEMENT COMPRISING A...
Publication number
20240210498
Publication date
Jun 27, 2024
ALLEGRO MICROSYSTEMS, LLC
Nikita Strelkov
G01 - MEASURING TESTING
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NANOSCALE SCANNING SENSORS
Publication number
20240044938
Publication date
Feb 8, 2024
President and Fellows of Harvard College
Michael S. GRINOLDS
G01 - MEASURING TESTING
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Patent Application
SPIN TORQUE OSCILLATOR (STO) SENSORS USED IN NUCLEIC ACID SEQUENCIN...
Publication number
20230294085
Publication date
Sep 21, 2023
Western Digital Technologies, Inc.
Patrick BRAGANCA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
SPIN-BASED DETECTION OF TERAHERTZ AND SUB-TERAHERTZ ELECTROMAGNETIC...
Publication number
20230266413
Publication date
Aug 24, 2023
The Regents of the University of California
Jing Shi
G01 - MEASURING TESTING
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Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
Publication number
20230258755
Publication date
Aug 17, 2023
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
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Patent Application
QUANTUM SPIN AMPLIFICATION
Publication number
20230194634
Publication date
Jun 22, 2023
The University of Chicago
Aashish Clerk
G01 - MEASURING TESTING
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Patent Application
SPIN DEFECT TRAFFIC SENSORS
Publication number
20230154318
Publication date
May 18, 2023
X Development LLC
Christian Thieu Nguyen
G08 - SIGNALLING
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Patent Application
NANOSCALE SCANNING SENSORS
Publication number
20220413007
Publication date
Dec 29, 2022
President and Fellows of Harvard College
Michael S. GRINOLDS
G01 - MEASURING TESTING
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Patent Application
ACOUSTIC EXCITATION AND DETECTION OF SPIN WAVES
Publication number
20220299583
Publication date
Sep 22, 2022
Oxford University Innovation Limited
John Francis GREGG
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
CHIRALITY DETECTION DEVICE, CHIRALITY DETECTION METHOD, SEPARATION...
Publication number
20220214308
Publication date
Jul 7, 2022
UNIVERSITY PUBLIC CORPORATION OSAKA
Yoshihiko TOGAWA
G01 - MEASURING TESTING
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Patent Application
MAGNETORESISTIVE SENSOR ARRAY FOR MOLECULE DETECTION AND RELATED DE...
Publication number
20210396820
Publication date
Dec 23, 2021
Western Digital Technologies, Inc.
Patrick BRAGANCA
G01 - MEASURING TESTING
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Patent Application
Microwave Resonator Readout of an Ensemble Solid State Spin Sensor
Publication number
20210255258
Publication date
Aug 19, 2021
Massachusetts Institute of Technology
John F. Barry
G01 - MEASURING TESTING
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Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
Publication number
20210199744
Publication date
Jul 1, 2021
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
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Patent Application
STACKED STRUCTURE, MAGNETORESISTIVE EFFECT ELEMENT, MAGNETIC HEAD,...
Publication number
20210165058
Publication date
Jun 3, 2021
TDK Corporation
Kazuumi INUBUSHI
B82 - NANO-TECHNOLOGY
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Patent Application
SPIN-BASED DETECTION OF TERAHERTZ AND SUB-TERAHERTZ ELECTROMAGNETIC...
Publication number
20210109172
Publication date
Apr 15, 2021
The Regents of the University of California
Jing Shi
G01 - MEASURING TESTING
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Patent Application
Memory Arrays
Publication number
20200341105
Publication date
Oct 29, 2020
Micron Technology, Inc.
Zengtao T. Liu
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Application
MAGNETORESISTIVE SENSOR ARRAY FOR MOLECULE DETECTION AND RELATED DE...
Publication number
20200326391
Publication date
Oct 15, 2020
Western Digital Technologies, Inc.
Patrick BRAGANCA
G11 - INFORMATION STORAGE
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Patent Application
DEVICES AND METHODS FOR FREQUENCY- AND PHASE-BASED DETECTION OF MAG...
Publication number
20200326392
Publication date
Oct 15, 2020
Western Digital Technologies, Inc.
Patrick BRAGANCA
G01 - MEASURING TESTING
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PULSE SEQUENCE DESIGN PROTOCOL
Publication number
20200284862
Publication date
Sep 10, 2020
President and Fellows of Harvard College
Mikhail D. LUKIN
G01 - MEASURING TESTING
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Patent Application
SYNCHRONIZED-READOUT FOR NARROWBAND DETECTION OF TIME-VARYING ELECT...
Publication number
20200278414
Publication date
Sep 3, 2020
President and Fellows of Harvard College
Ronald L. WALSWORTH
G01 - MEASURING TESTING
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Patent Application
Memory Arrays
Publication number
20200249307
Publication date
Aug 6, 2020
Micron Technology, Inc.
Zengtao T. Liu
G11 - INFORMATION STORAGE
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Patent Application
Packages For Coil Actuated Position Sensors
Publication number
20200241084
Publication date
Jul 30, 2020
ALLEGRO MICROSYSTEMS, LLC
Alexander Latham
G01 - MEASURING TESTING
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Patent Application
NANOSCALE NUCLEAR QUADRUPOLE RESONANCE SPECTROSCOPY
Publication number
20200225302
Publication date
Jul 16, 2020
President and Fellows of Harvard College
Igor X. LOVCHINSKY
G01 - MEASURING TESTING
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Patent Application
METHODS AND SYSTEMS USING MOLECULAR GLUE FOR COVALENT BONDING OF SO...
Publication number
20200123416
Publication date
Apr 23, 2020
HI LLC
Sukanta Bhattacharyya
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Application
ULTRA HIGH-SENSITIVITY MICRO MAGNETIC SENSOR
Publication number
20200116803
Publication date
Apr 16, 2020
ASAHI INTECC CO., LTD.
Yoshinobu HONKURA
G01 - MEASURING TESTING
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Patent Application
MAGNETOMETER BASED ON SPIN WAVE INTERFEROMETER
Publication number
20200081079
Publication date
Mar 12, 2020
The Regents of the University of California
Alexander Khitun
G01 - MEASURING TESTING
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Patent Application
QUANTUM SENSOR BASED ON RARE-EARTH-ION DOPED OPTICAL CRYSTAL AND US...
Publication number
20200072915
Publication date
Mar 5, 2020
UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
Zongquan Zhou
G01 - MEASURING TESTING