Static spectrometers

Industry

CPC
H01J49/46

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/46Static spectrometers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Energy spectrometer with dynamic focus
- Patent number 12,100,585
- Issue date Sep 24, 2024
- FEI Company
- Arthur Reinout Hartong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for electron transfer from a sample to an energy...
- Patent number 11,328,918
- Issue date May 10, 2022
- SPECS Surface Nano Analysis GmbH
- Gerd Schoenhense
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Momentum-resolving photoelectron spectrometer and method for moment...
- Patent number 11,133,166
- Issue date Sep 28, 2021
- Leibniz-Institut für Festkörper- und Werkstofffors
- Sergey Borisenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extraction system for charged secondary particles for use in a mass...
- Patent number 11,101,123
- Issue date Aug 24, 2021
- Luxembourg Institute of Science and Technology (LIST)
- David Dowsett
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Closed path ion mobility spectrometer having a common ion inlet and...
- Patent number 10,788,453
- Issue date Sep 29, 2020
- The Trustees of Indiana University
- David E. Clemmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Harmonic line noise correction for electron energy loss spectrometer
- Patent number 10,784,094
- Issue date Sep 22, 2020
- Gatan, Inc.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 10,629,425
- Issue date Apr 21, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for measuring energy of electrons
- Patent number 10,386,314
- Issue date Aug 20, 2019
- National University Corporation Nagoya University
- Toru Ujihara
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid ion mobility spectrometer
- Patent number 10,234,423
- Issue date Mar 19, 2019
- Indiana University Research and Technology Corporation
- David E. Clemmer
- G01 - MEASURING TESTING
Information Patent Grant
Ion trapping with integrated electromagnets
- Patent number 10,186,409
- Issue date Jan 22, 2019
- Honeywell International Inc.
- Daniel Youngner
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measuring the populations in each hyperfine ground state of alkali...
- Patent number 8,907,276
- Issue date Dec 9, 2014
- Honeywell International Inc.
- Karl D. Nelson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High-resolution auger electron spectrometer
- Patent number 7,560,691
- Issue date Jul 14, 2009
- KLA-Tencor Technologies Corporation
- Alexander J. Gubbens
- G01 - MEASURING TESTING
Information Patent Grant
Single stage charged particle beam energy width reduction system fo...
- Patent number 7,468,517
- Issue date Dec 23, 2008
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiternruftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron/ion gun for electron or ion beams with high monochromasy o...
- Patent number 6,770,878
- Issue date Aug 3, 2004
- CEOS Corrected Electron Optical Systems GmbH
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter for use in a scanning electron microscope or the like
- Patent number 6,593,578
- Issue date Jul 15, 2003
- Schlumberger Technologies, Inc.
- Paul J. Duval
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inverted orbit filter
- Patent number 6,521,888
- Issue date Feb 18, 2003
- Archimedes Technology Group, Inc.
- Arthur Carlson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam energy filter
- Patent number 6,483,110
- Issue date Nov 19, 2002
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter
- Patent number 6,452,169
- Issue date Sep 17, 2002
- Technische Universiteit Delft
- Hindrik Willem Mook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic energy filter
- Patent number 6,441,378
- Issue date Aug 27, 2002
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filtered focused ion beam column
- Patent number 6,410,924
- Issue date Jun 25, 2002
- Schlumberger Technologies, Inc.
- Li Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma filter with helical magnetic field
- Patent number 6,251,282
- Issue date Jun 26, 2001
- Archimedes Technology Group, Inc.
- Sergei Putvinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma mass filter
- Patent number 6,248,240
- Issue date Jun 19, 2001
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tandem plasma mass filter
- Patent number 6,235,202
- Issue date May 22, 2001
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging energy filter equipped with distortion corrector
- Patent number 6,140,642
- Issue date Oct 31, 2000
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer and method of spectroscopy
- Patent number 6,104,029
- Issue date Aug 15, 2000
- VG Systems Ltd.
- Peter Coxon
- G01 - MEASURING TESTING
Information Patent Grant
Electron energy filter
- Patent number 6,066,852
- Issue date May 23, 2000
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy Filter
- Patent number 6,015,973
- Issue date Jan 18, 2000
- Jeol Ltd.
- Hiromi Nunome
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detection of surface contaminations on silicon wafers
- Patent number 5,689,112
- Issue date Nov 18, 1997
- Harald A. Enge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy filter and transmission electron microscope provide...
- Patent number 5,585,630
- Issue date Dec 17, 1996
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput electron energy analyzer
- Patent number 5,583,336
- Issue date Dec 10, 1996
- Michael A. Kelly
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ENERGY SPECTROMETER WITH DYNAMIC FOCUS
- Publication number 20230005733
- Publication date Jan 5, 2023
- FEI Company
- Arthur Reinout HARTONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Momentum-Resolving Photoelectron Spectrometer and Method for Moment...
- Publication number 20210090868
- Publication date Mar 25, 2021
- Leibniz-lnstitut fur Festkörper- und Werkstoffforschung Dresden e.V.
- Sergey Borisenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR ELECTRON TRANSFER FROM A SAMPLE TO AN ENERGY...
- Publication number 20200303177
- Publication date Sep 24, 2020
- SPECS SURFACE NANO ANALYSIS GMBH
- Gerd SCHOENHENSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID ION MOBILITY SPECTROMETER
- Publication number 20190360964
- Publication date Nov 28, 2019
- Indiana University Research and Technology Corporation
- David E. Clemmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HARMONIC LINE NOISE CORRECTION FOR ELECTRON ENERGY LOSS SPECTROMETER
- Publication number 20190362953
- Publication date Nov 28, 2019
- GATAN, INC.
- Colin TREVOR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ENERGY OF ELECTRONS
- Publication number 20190079033
- Publication date Mar 14, 2019
- NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
- Toru UJIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAPPING WITH INTEGRATED ELECTROMAGNETS
- Publication number 20180114683
- Publication date Apr 26, 2018
- HONEYWELL INTERNATIONAL INC.
- Daniel Youngner
- B82 - NANO-TECHNOLOGY
Information Patent Application
HYBRID ION MOBILITY SPECTROMETER
- Publication number 20170307565
- Publication date Oct 26, 2017
- Indiana University Research and Technology Corporation
- David E. Clemmer
- G01 - MEASURING TESTING
Information Patent Application
MEASURING THE POPULATIONS IN EACH HYPERFINE GROUND STATE OF ALKALI...
- Publication number 20130270434
- Publication date Oct 17, 2013
- Honeywell International Inc.
- Karl D. Nelson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Single stage charged particle beam energy width reduction system fo...
- Publication number 20070158561
- Publication date Jul 12, 2007
- Jurgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron/ion gun for electron or ion beams with high monochromasy o...
- Publication number 20030098414
- Publication date May 29, 2003
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS

Static spectrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Energy spectrometer with dynamic focus

Device and method for electron transfer from a sample to an energy...

Momentum-resolving photoelectron spectrometer and method for moment...

Extraction system for charged secondary particles for use in a mass...

Closed path ion mobility spectrometer having a common ion inlet and...

Harmonic line noise correction for electron energy loss spectrometer

Imaging mass spectrometer

Apparatus and method for measuring energy of electrons

Hybrid ion mobility spectrometer

Ion trapping with integrated electromagnets

Measuring the populations in each hyperfine ground state of alkali...

High-resolution auger electron spectrometer

Single stage charged particle beam energy width reduction system fo...

Electron/ion gun for electron or ion beams with high monochromasy o...

Wien filter for use in a scanning electron microscope or the like

Inverted orbit filter

Electron beam energy filter

Wien filter

Magnetic energy filter

Energy filtered focused ion beam column

Plasma filter with helical magnetic field

Plasma mass filter

Tandem plasma mass filter

Imaging energy filter equipped with distortion corrector

Spectrometer and method of spectroscopy

Electron energy filter

Energy Filter

Apparatus for detection of surface contaminations on silicon wafers

Electron energy filter and transmission electron microscope provide...

High throughput electron energy analyzer

Patents Applicationslast 30 patents

ENERGY SPECTROMETER WITH DYNAMIC FOCUS

Momentum-Resolving Photoelectron Spectrometer and Method for Moment...

DEVICE AND METHOD FOR ELECTRON TRANSFER FROM A SAMPLE TO AN ENERGY...

HYBRID ION MOBILITY SPECTROMETER

HARMONIC LINE NOISE CORRECTION FOR ELECTRON ENERGY LOSS SPECTROMETER

APPARATUS AND METHOD FOR MEASURING ENERGY OF ELECTRONS

ION TRAPPING WITH INTEGRATED ELECTROMAGNETS

HYBRID ION MOBILITY SPECTROMETER

MEASURING THE POPULATIONS IN EACH HYPERFINE GROUND STATE OF ALKALI...

Single stage charged particle beam energy width reduction system fo...

Electron/ion gun for electron or ion beams with high monochromasy o...