Static spectrometers

Industry

CPC
H01J49/28

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/28Static spectrometers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Space weather forecasting
- Patent number 12,189,082
- Issue date Jan 7, 2025
- Universitetet I Oslo
- Anna Fæhn Follestad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring radical particle concentration using mass spectrometry
- Patent number 11,971,386
- Issue date Apr 30, 2024
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,887,832
- Issue date Jan 30, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Johannes Schwieters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detector having improved performance and service life
- Patent number 11,848,180
- Issue date Dec 19, 2023
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for crosstalk compensation
- Patent number 11,817,301
- Issue date Nov 14, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Kholomeev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tapered magnetic ion transport tunnel for particle collection
- Patent number 11,749,515
- Issue date Sep 5, 2023
- Northrop Grumman Systems Corporation
- Vivian W. Ryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis device
- Patent number 11,587,777
- Issue date Feb 21, 2023
- SHARP KABUSHIKI KAISHA
- Masamitsu Moritani
- G01 - MEASURING TESTING
Information Patent Grant
Mobility and mass measurement using time-varying electric fields
- Patent number 11,532,473
- Issue date Dec 20, 2022
- Micromass UK Limited
- Keith George Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging device with gated integrator
- Patent number 11,531,011
- Issue date Dec 20, 2022
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Daniel J. Gershman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for crosstalk compensation
- Patent number 11,361,952
- Issue date Jun 14, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Kholomeev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of atmospheric pressure megavolt electrostatic fi...
- Patent number 11,276,567
- Issue date Mar 15, 2022
- The University of Hong Kong
- Kwan Ming Ng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimised ion mobility separation timescales for targeted ions
- Patent number 11,255,817
- Issue date Feb 22, 2022
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter and electron-optics apparatus
- Patent number 11,131,826
- Issue date Sep 28, 2021
- Ebara Corporation
- Shinichi Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Zircon ID-TIMS Pb isotope determination method using multiple ion c...
- Patent number 11,127,579
- Issue date Sep 21, 2021
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Zhuyin Chu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring inert gas by ion probe
- Patent number 11,101,126
- Issue date Aug 24, 2021
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Yu Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide within pulsed converters
- Patent number 11,081,332
- Issue date Aug 3, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleanliness monitor and a method for monitoring a cleanliness of a...
- Patent number 11,049,704
- Issue date Jun 29, 2021
- Applied Materials Israel Ltd.
- Irit Ruach-Nir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and system for selective ionization and analyte detection an...
- Patent number 11,043,370
- Issue date Jun 22, 2021
- Battelle Memorial Institute
- Elizabeth Denis
- G01 - MEASURING TESTING
Information Patent Grant
Data directed DESI-MS imaging
- Patent number 11,031,230
- Issue date Jun 8, 2021
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Categorization data manipulation using a matrix-assisted laser deso...
- Patent number 10,910,205
- Issue date Feb 2, 2021
- Highland Innovations Inc.
- Eung Joon Jo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for crosstalk compensation
- Patent number 10,903,061
- Issue date Jan 26, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Kholomeev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi detector mass spectrometer and spectrometry method filter
- Patent number 10,867,780
- Issue date Dec 15, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Johannes Schwieters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap
- Patent number 10,748,755
- Issue date Aug 18, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
- Patent number 10,720,317
- Issue date Jul 21, 2020
- MERIDION, LLC
- Nicholas Wilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for isotope ratio mass spectrometry
- Patent number 10,607,822
- Issue date Mar 31, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Jens Griep-Raming
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Floating magnet for a mass spectrometer
- Patent number 10,580,635
- Issue date Mar 3, 2020
- Luxembourg Institute of Science and Technology (LIST)
- Roch Andrzejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 10,541,123
- Issue date Jan 21, 2020
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzer dynamic tuning for plural optimization criteria
- Patent number 10,529,547
- Issue date Jan 7, 2020
- Thermo Finnigan LLC.
- Jesse D. Canterbury
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical device
- Patent number 10,410,852
- Issue date Sep 10, 2019
- Shimadzu Corporation
- Kosuke Hosoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of atmospheric pressure megavolt electrostatic fi...
- Patent number 10,381,211
- Issue date Aug 13, 2019
- The University of Hong Kong
- Kwan Ming Ng
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Monitoring Radical Particle Concentration Using Mass Spectrometry
- Publication number 20240264116
- Publication date Aug 8, 2024
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND TECHNIQUES FOR IN-SOURCE ION SEPARATION
- Publication number 20240222105
- Publication date Jul 4, 2024
- Thermo Finnigan LLC
- Mikhail V. UGAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE
- Publication number 20240063004
- Publication date Feb 22, 2024
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD
- Publication number 20240014022
- Publication date Jan 11, 2024
- ISOTOPX LTD
- Damian Paul TOOTELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TAPERED MAGNETIC ION TRANSPORT TUNNEL FOR PARTICLE COLLECTION
- Publication number 20230411134
- Publication date Dec 21, 2023
- Northrop Grumman Systems Corporation
- Vivian W. Ryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPACE WEATHER FORECASTING
- Publication number 20220381949
- Publication date Dec 1, 2022
- UNIVERSITETET I OSLO
- Anna Fæhn FOLLESTAD
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CROSSTALK COMPENSATION
- Publication number 20220301841
- Publication date Sep 22, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander KHOLOMEEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20220223401
- Publication date Jul 14, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Johannes Schwieters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monitoring Radical Particle Concentration Using Mass Spectrometry
- Publication number 20220196597
- Publication date Jun 23, 2022
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMISED ION MOBILITY SEPARATION TIMESCALES FOR TARGETED IONS
- Publication number 20220128509
- Publication date Apr 28, 2022
- Micromass UK Limited
- Kevin Giles
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE
- Publication number 20210335590
- Publication date Oct 28, 2021
- Sharp Kabushiki Kaisha
- Masamitsu MORITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-GATE MULTI-FREQUENCY FILTER FOR ION MOBILITY ISOLATION
- Publication number 20210285913
- Publication date Sep 16, 2021
- Thermo Finnigan LLC
- Michael L. POLTASH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Device for Crosstalk Compensation
- Publication number 20210142994
- Publication date May 13, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander KHOLOMEEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE
- Publication number 20210074531
- Publication date Mar 11, 2021
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MEASURING INERT GAS BY ION PROBE
- Publication number 20210057204
- Publication date Feb 25, 2021
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Yu LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TAPERED MAGNETIC ION TRANSPORT TUNNEL FOR PARTICLE COLLECTION
- Publication number 20210050204
- Publication date Feb 18, 2021
- Northrop Grumman Systems Corporation
- Vivian W. Ryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20210013017
- Publication date Jan 14, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Johannes Schwieters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Zircon ID-TIMS Pb isotope determination method using multiple ion c...
- Publication number 20200335319
- Publication date Oct 22, 2020
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Zhuyin Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND SYSTEM FOR SELECTIVE IONIZATION AND ANALYTE DETECTION AN...
- Publication number 20200258734
- Publication date Aug 13, 2020
- Battelle Memorial Institute
- Elizabeth Denis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE WITHIN PULSED CONVERTERS
- Publication number 20200168447
- Publication date May 28, 2020
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOBILITY AND MASS MEASUREMENT USING TIME-VARYING ELECTRIC FIELDS
- Publication number 20200161119
- Publication date May 21, 2020
- Micromass UK Limited
- Keith George Richardson
- G01 - MEASURING TESTING
Information Patent Application
TAPERED MAGNETIC ION TRANSPORT TUNNEL FOR PARTICLE COLLECTION
- Publication number 20200152437
- Publication date May 14, 2020
- Northrop Grumman Systems Corporation
- Vivian W. Ryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY DEVICES AND METHODS
- Publication number 20200132627
- Publication date Apr 30, 2020
- ION DX, INC.
- W. Henry Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Analyzer Dynamic Tuning for Plural Optimization Criteria
- Publication number 20190371588
- Publication date Dec 5, 2019
- Thermo Finnigan LLC
- Jesse D. CANTERBURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF ATMOSPHERIC PRESSURE MEGAVOLT ELECTROSTATIC FI...
- Publication number 20190318921
- Publication date Oct 17, 2019
- The University of Hong Kong
- Kwan Ming Ng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA DIRECTED DESI-MS IMAGING
- Publication number 20190304768
- Publication date Oct 3, 2019
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20190295835
- Publication date Sep 26, 2019
- LECO CORPORATION
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Device for Crosstalk Compensation
- Publication number 20190198303
- Publication date Jun 27, 2019
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander KHOLOMEEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Trap
- Publication number 20190164740
- Publication date May 30, 2019
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. MAKAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20190157062
- Publication date May 23, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS

Static spectrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Space weather forecasting

Monitoring radical particle concentration using mass spectrometry

Mass spectrometer

Particle detector having improved performance and service life

Method and device for crosstalk compensation

Tapered magnetic ion transport tunnel for particle collection

Analysis device

Mobility and mass measurement using time-varying electric fields

Imaging device with gated integrator

Method and device for crosstalk compensation

Method and system of atmospheric pressure megavolt electrostatic fi...

Optimised ion mobility separation timescales for targeted ions

Wien filter and electron-optics apparatus

Zircon ID-TIMS Pb isotope determination method using multiple ion c...

Method and system for measuring inert gas by ion probe

Ion guide within pulsed converters

Cleanliness monitor and a method for monitoring a cleanliness of a...

Device and system for selective ionization and analyte detection an...

Data directed DESI-MS imaging

Categorization data manipulation using a matrix-assisted laser deso...

Methods for crosstalk compensation

Multi detector mass spectrometer and spectrometry method filter

Electrostatic trap

Apparatus for mass analysis of analytes by simultaneous positive an...

Method and apparatus for isotope ratio mass spectrometry

Floating magnet for a mass spectrometer

Ion trap mass spectrometer

Mass analyzer dynamic tuning for plural optimization criteria

Analytical device

Method and system of atmospheric pressure megavolt electrostatic fi...

Patents Applicationslast 30 patents

Monitoring Radical Particle Concentration Using Mass Spectrometry

SYSTEMS AND TECHNIQUES FOR IN-SOURCE ION SEPARATION

PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE

APPARATUS AND METHOD

TAPERED MAGNETIC ION TRANSPORT TUNNEL FOR PARTICLE COLLECTION

SPACE WEATHER FORECASTING

METHOD AND DEVICE FOR CROSSTALK COMPENSATION

Mass Spectrometer

Monitoring Radical Particle Concentration Using Mass Spectrometry

OPTIMISED ION MOBILITY SEPARATION TIMESCALES FOR TARGETED IONS

ANALYSIS DEVICE

MULTI-GATE MULTI-FREQUENCY FILTER FOR ION MOBILITY ISOLATION

Method and Device for Crosstalk Compensation

PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE

METHOD AND SYSTEM FOR MEASURING INERT GAS BY ION PROBE

TAPERED MAGNETIC ION TRANSPORT TUNNEL FOR PARTICLE COLLECTION

Mass Spectrometer

Zircon ID-TIMS Pb isotope determination method using multiple ion c...

DEVICE AND SYSTEM FOR SELECTIVE IONIZATION AND ANALYTE DETECTION AN...

ION GUIDE WITHIN PULSED CONVERTERS

MOBILITY AND MASS MEASUREMENT USING TIME-VARYING ELECTRIC FIELDS

TAPERED MAGNETIC ION TRANSPORT TUNNEL FOR PARTICLE COLLECTION

ION MOBILITY DEVICES AND METHODS

Mass Analyzer Dynamic Tuning for Plural Optimization Criteria

METHOD AND SYSTEM OF ATMOSPHERIC PRESSURE MEGAVOLT ELECTROSTATIC FI...

DATA DIRECTED DESI-MS IMAGING

Ion Trap Mass Spectrometer

Method and Device for Crosstalk Compensation

Electrostatic Trap

Ion Trap Mass Spectrometer