stepped imaging (selected area of sample is changed)

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G01N2223/427

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/427stepped imaging (selected area of sample is changed)

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Patents Grantslast 30 patents

Information Patent Grant
X-ray phase imaging apparatus
- Patent number 11,311,260
- Issue date Apr 26, 2022
- Shimadzu Corporation
- Satoshi Sano
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...
- Patent number 11,152,130
- Issue date Oct 19, 2021
- Massachusetts Institute of Technology
- Akintunde I. Akinwande
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and system for combining microscopic imaging with X-Ray imaging
- Patent number 11,058,388
- Issue date Jul 13, 2021
- PERIMETER MEDICAL IMAGING, INC.
- David Rempel
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Super-resolution x-ray imaging method and apparatus
- Patent number 11,055,821
- Issue date Jul 6, 2021
- SVXR, Inc.
- Edward R. Ratner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for calculating a recording trajectory
- Patent number 11,016,041
- Issue date May 25, 2021
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Richard Schielein
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monochromatic x-ray gas excitation bond inspe...
- Patent number 10,989,675
- Issue date Apr 27, 2021
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for three-dimensional inspection of an object...
- Patent number 10,874,364
- Issue date Dec 29, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Philippe Pras
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sampling of scanning device
- Patent number 10,628,971
- Issue date Apr 21, 2020
- Beijing Neusoft Medical Equipment Co., Ltd.
- Shuangxue Li
- G01 - MEASURING TESTING
Information Patent Grant
Method of automatically modifying imaging range in biological sampl...
- Patent number 10,365,207
- Issue date Jul 30, 2019
- WUHAN OE-BIO CO., LTD.
- Hui Gong
- G02 - OPTICS
Information Patent Grant
X ray apparatus and method of operating the same
- Patent number 10,098,609
- Issue date Oct 16, 2018
- Samsung Electronics Co., Ltd.
- Tae-eui Kim
- G01 - MEASURING TESTING
Information Patent Grant
Large FOV phase contrast imaging based on detuned configuration inc...
- Patent number 10,058,300
- Issue date Aug 28, 2018
- Carestream Health, Inc.
- Pavlo Baturin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray analyzer
- Patent number 9,784,700
- Issue date Oct 10, 2017
- Hitachi High-Tech Science Corporation
- Masahiro Sakuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray imaging apparatus and method of controlling the same
- Patent number 9,743,901
- Issue date Aug 29, 2017
- Samsung Electronics Co., Ltd.
- Jae Mock Yi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
High-resolution computed tomography
- Patent number 9,459,217
- Issue date Oct 4, 2016
- Illinois Tool Works, Inc.
- Yuxin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Large FOV phase contrast imaging based on detuned configuration inc...
- Patent number 9,357,975
- Issue date Jun 7, 2016
- Carestream Health, Inc.
- Pavlo Baturin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for operating an x-ray diagnostics device
- Patent number 7,650,026
- Issue date Jan 19, 2010
- Siemens Aktiengesellschaft
- Frank Deinzer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and method
- Patent number 7,483,511
- Issue date Jan 27, 2009
- GE Homeland Protection, Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Thermal wave microscopy using areal infrared detection
- Patent number 4,578,584
- Issue date Mar 25, 1986
- International Business Machines Corporation
- Thomas Baumann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Procedure for generating fluoroscopic images for the reconstruction...
- Publication number 20240159691
- Publication date May 16, 2024
- Comet Yxlon GmbH
- Mareike Töpperwien
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...
- Publication number 20240151660
- Publication date May 9, 2024
- Diagnostic Instruments, Inc.
- Philip T. Merlo
- G01 - MEASURING TESTING
Information Patent Application
X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER
- Publication number 20240142392
- Publication date May 2, 2024
- MULTICT IMAGING LTD
- Nathan HERMONY
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...
- Publication number 20240102945
- Publication date Mar 28, 2024
- Shimadzu Corporation
- Kana KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR COMBINING MICROSCOPIC IMAGING WITH X-RAY
- Publication number 20190154595
- Publication date May 23, 2019
- PERIMETER MEDICAL IMAGING, INC.
- David Rempel
- G02 - OPTICS
Information Patent Application
METHOD OF AUTOMATICALLY MODIFYING IMAGING RANGE IN BIOLOGICAL SAMPL...
- Publication number 20190094129
- Publication date Mar 28, 2019
- WUHAN OE-BIO CO., LTD.
- Hui GONG
- G02 - OPTICS
Information Patent Application
LARGE FOV PHASE CONTRAST IMAGING BASED ON DETUNED CONFIGURATION INC...
- Publication number 20160242714
- Publication date Aug 25, 2016
- CARESTREAM HEALTH, INC.
- Pavlo Baturin
- G01 - MEASURING TESTING
Information Patent Application
Radiation image photographing method and apparatus
- Publication number 20100067655
- Publication date Mar 18, 2010
- FUJIFILM CORPORATION
- Yoshitaka Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20070280416
- Publication date Dec 6, 2007
- GENERAL ELECTRIC COMPANY
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Application
Method for operating an x-ray diagnostics device
- Publication number 20070053572
- Publication date Mar 8, 2007
- Frank Deinzer
- G06 - COMPUTING CALCULATING COUNTING

stepped imaging (selected area of sample is changed)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray phase imaging apparatus

Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...

Method and system for combining microscopic imaging with X-Ray imaging

Super-resolution x-ray imaging method and apparatus

Apparatus and method for calculating a recording trajectory

System and method for monochromatic x-ray gas excitation bond inspe...

Apparatus and method for three-dimensional inspection of an object...

Sampling of scanning device

Method of automatically modifying imaging range in biological sampl...

X ray apparatus and method of operating the same

Large FOV phase contrast imaging based on detuned configuration inc...

X-ray analyzer

X-ray imaging apparatus and method of controlling the same

High-resolution computed tomography

Large FOV phase contrast imaging based on detuned configuration inc...

Method for operating an x-ray diagnostics device

Inspection system and method

Thermal wave microscopy using areal infrared detection

Patents Applicationslast 30 patents

Procedure for generating fluoroscopic images for the reconstruction...

SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...

X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER

X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...

METHOD AND SYSTEM FOR COMBINING MICROSCOPIC IMAGING WITH X-RAY

METHOD OF AUTOMATICALLY MODIFYING IMAGING RANGE IN BIOLOGICAL SAMPL...

LARGE FOV PHASE CONTRAST IMAGING BASED ON DETUNED CONFIGURATION INC...

Radiation image photographing method and apparatus

INSPECTION SYSTEM AND METHOD

Method for operating an x-ray diagnostics device