SThM [Scanning Thermal Microscopy] or apparatus therefor

Industry

CPC
G01Q60/58

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/58SThM [Scanning Thermal Microscopy] or apparatus therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Measuring method for measuring heat distribution of specific space...
- Patent number 12,038,455
- Issue date Jul 16, 2024
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Quantum-dot-based measuring system and method
- Patent number 11,644,479
- Issue date May 9, 2023
- SHANGHAI UNIVERSITY
- Na Chen
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method for measuring heat distribution of specific space...
- Patent number 11,598,788
- Issue date Mar 7, 2023
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensitive atomic force microscope based infrared spectroscopy
- Patent number 11,226,285
- Issue date Jan 18, 2022
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling thermometer
- Patent number 11,215,636
- Issue date Jan 4, 2022
- Arizona Board of Regents on behalf of the University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Grant
Method of operating scanning thermal microscopy probe for quantitat...
- Patent number 11,162,978
- Issue date Nov 2, 2021
- The University of Akron
- Jiahua Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analysis for source rocks
- Patent number 11,150,206
- Issue date Oct 19, 2021
- Saudi Arabian Oil Company
- Shannon L. Eichmann
- G01 - MEASURING TESTING
Information Patent Grant
Probe and manufacturing method of probe for scanning probe microscope
- Patent number 11,125,775
- Issue date Sep 21, 2021
- Kioxia Corporation
- See Kei Lee
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling thermometer
- Patent number 10,830,792
- Issue date Nov 10, 2020
- Arizona Board of Regents on behalf of the University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Grant
Compact probe for atomic-force microscopy and atomic-force microsco...
- Patent number 10,527,645
- Issue date Jan 7, 2020
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting scanning sensor for nanometer scale temperature ima...
- Patent number 10,481,174
- Issue date Nov 19, 2019
- Yeda Research and Development Co. Ltd.
- Eli Zeldov
- G01 - MEASURING TESTING
Information Patent Grant
Thermal probe
- Patent number 10,466,272
- Issue date Nov 5, 2019
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal probe for a near-field thermal microscope and method for ge...
- Patent number 10,338,098
- Issue date Jul 2, 2019
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Computer-aided simulation method for atomic-resolution scanning see...
- Patent number 9,459,278
- Issue date Oct 4, 2016
- Korea Advanced Institute of Science and Technology
- Yong-Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Vertical embedded sensor and process of manufacturing thereof
- Patent number 9,389,244
- Issue date Jul 12, 2016
- Applied Nanostructures, Inc.
- Jeremy J. Goeckeritz
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic actuation and thermal cantilevers for temperature and freq...
- Patent number 8,914,911
- Issue date Dec 16, 2014
- The Board of Trustees of the University of Illinois
- William P. King
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Softening point measuring apparatus and thermal conductivity measur...
- Patent number 8,608,373
- Issue date Dec 17, 2013
- SII NanoTechnology Inc.
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Grant
Thermal probe
- Patent number 8,595,861
- Issue date Nov 26, 2013
- National Cheng Kung University
- Bernard HaoChih Liu
- G01 - MEASURING TESTING
Information Patent Grant
Thermal probe
- Patent number 8,578,511
- Issue date Nov 5, 2013
- National Cheng Kung University
- Bernard HaoChih Liu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic actuation and thermal cantilevers for temperature and freq...
- Patent number 8,533,861
- Issue date Sep 10, 2013
- The Board of Trustees of the University of Illinois
- William P. King
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 8,499,621
- Issue date Aug 6, 2013
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Spatially resolved quantitative mapping of thermomechanical propert...
- Patent number 8,484,759
- Issue date Jul 9, 2013
- UT-Battelle, LLC
- Stephen Jesse
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning thermal twisting atomic force microscopy
- Patent number 8,458,810
- Issue date Jun 4, 2013
- Michael E. McConney
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transition temperature microscopy
- Patent number 8,177,422
- Issue date May 15, 2012
- Anasys Instruments
- Kevin Kjoller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Infrared imaging using thermal radiation from a scanning probe tip
- Patent number 7,977,636
- Issue date Jul 12, 2011
- Anasys Instruments, Inc.
- Markus B. Raschke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindentation surface analysis method
- Patent number 7,849,731
- Issue date Dec 14, 2010
- International Business Machines Corporation
- Richard L. Bradshaw
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe and applications of the same
- Patent number 7,677,088
- Issue date Mar 16, 2010
- Intellectual Properties Partners LLC
- William P. King
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative calorimetry signal for sub-micron scale thermal analysis
- Patent number 7,665,889
- Issue date Feb 23, 2010
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning thermal microscope
- Patent number 7,514,678
- Issue date Apr 7, 2009
- Tsinghua University
- Yuan Yao
- G01 - MEASURING TESTING
Information Patent Grant
Probe with embedded heater for nanoscale analysis
- Patent number 7,497,613
- Issue date Mar 3, 2009
- Anasys Instruments
- William P. King
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING METHOD FOR MEASURING HEAT DISTRIBUTION OF SPECIFIC SPACE...
- Publication number 20230184808
- Publication date Jun 15, 2023
- Park Systems Corp.
- Sang-il PARK
- G01 - MEASURING TESTING
Information Patent Application
MEASURING METHOD FOR MEASURING HEAT DISTRIBUTION OF SPECIFIC SPACE...
- Publication number 20210373046
- Publication date Dec 2, 2021
- Park Systems Corp.
- Sang-il PARK
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND MANUFACTURING METHOD OF PROBE FOR SCANNING PROBE MICROSCOPE
- Publication number 20210278437
- Publication date Sep 9, 2021
- KIOXIA Corporation
- See Kei LEE
- G01 - MEASURING TESTING
Information Patent Application
Thermal Analysis for Source Rocks
- Publication number 20210080413
- Publication date Mar 18, 2021
- Saudi Arabian Oil Company
- Shannon L. Eichmann
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TUNNELING THERMOMETER
- Publication number 20210072282
- Publication date Mar 11, 2021
- Arizona Board of Regents on behalf of The University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF OPERATING SCANNING THERMAL MICROSCOPY PROBE FOR QUANTITAT...
- Publication number 20200300888
- Publication date Sep 24, 2020
- Jiahua Zhu
- G01 - MEASURING TESTING
Information Patent Application
THERMAL PROBE FOR A NEAR-FIELD THERMAL MICROSCOPE AND METHOD FOR GE...
- Publication number 20180203040
- Publication date Jul 19, 2018
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
THERMAL PROBE
- Publication number 20180180644
- Publication date Jun 28, 2018
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
SUPERCONDUCTING SCANNING SENSOR FOR NANOMETER SCALE TEMPERATURE IMA...
- Publication number 20180045754
- Publication date Feb 15, 2018
- Yeda Research and Development Co. Ltd.
- Eli ZELDOV
- G01 - MEASURING TESTING
Information Patent Application
SCANNING THERMO-IONIC MICROSCOPY
- Publication number 20170315148
- Publication date Nov 2, 2017
- University of Washington through its Center for Commercialization
- Jiangyu Li
- G01 - MEASURING TESTING
Information Patent Application
Computer-Aided Simulation Method For Atomic-Resolution Scanning See...
- Publication number 20150309072
- Publication date Oct 29, 2015
- Korea Advanced Institute of Science and Technology
- Yong-Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
Computer-Aided Simulation Method For Atomic-Resolution Scanning See...
- Publication number 20140366229
- Publication date Dec 11, 2014
- Yong-Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
Vertical Embedded Sensor and Process of Manufacturing Thereof
- Publication number 20140338075
- Publication date Nov 13, 2014
- APPLIED NANOSTRUCTURES, INC.
- Jeremy J. Goeckeritz
- B82 - NANO-TECHNOLOGY
Information Patent Application
SINGLE-CONTACT TUNNELING THERMOMETRY
- Publication number 20140003466
- Publication date Jan 2, 2014
- UT-Battelle, LLC
- Petro Maksymovych
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPATIAL RESOLUTION NON-CONTACT TEMPERATURE MEASUREMENT
- Publication number 20130340127
- Publication date Dec 19, 2013
- XIAOWEI WU
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Actuation and Thermal Cantilevers for Temperature and Freq...
- Publication number 20130276175
- Publication date Oct 17, 2013
- William P. King
- B82 - NANO-TECHNOLOGY
Information Patent Application
Magnetic Actuation and Thermal Cantilevers for Temperature and Freq...
- Publication number 20130047303
- Publication date Feb 21, 2013
- William P. King
- B82 - NANO-TECHNOLOGY
Information Patent Application
THERMAL PROBE
- Publication number 20130019352
- Publication date Jan 17, 2013
- Bernard HaoChih LIU
- B82 - NANO-TECHNOLOGY
Information Patent Application
THERMAL PROBE
- Publication number 20130019353
- Publication date Jan 17, 2013
- Bernard HaoChih LIU
- B82 - NANO-TECHNOLOGY
Information Patent Application
TEMPERATURE MEASURING PROBE, TEMPERATURE MEASURING APPARATUS, AND T...
- Publication number 20130010829
- Publication date Jan 10, 2013
- Canon Kabushiki Kaisha
- Kaoru Ojima
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING THERMAL TWISTING ATOMIC FORCE MICROSCOPY
- Publication number 20120260374
- Publication date Oct 11, 2012
- Michael E. MCCONNEY
- G01 - MEASURING TESTING
Information Patent Application
SPM Probe and Inspection Device for Light Emission Unit
- Publication number 20120054924
- Publication date Mar 1, 2012
- Hitachi High-Technologies Corporation
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DETECTION AND CHARACTERIZATION OF LASER-INDUCED HEAT AFFECTED ZONES...
- Publication number 20110302677
- Publication date Dec 8, 2011
- Amaranth Medical Pte.
- Kamal RAMZIPOOR
- G01 - MEASURING TESTING
Information Patent Application
Softening point measuring apparatus and thermal conductivity measur...
- Publication number 20110038392
- Publication date Feb 17, 2011
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Application
SPATIALLY RESOLVED QUANTITATIVE MAPPING OF THERMOMECHANICAL PROPERT...
- Publication number 20110041223
- Publication date Feb 17, 2011
- UT-Battelle, LLC
- Stephen Jesse
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE AND APPLICATIONS OF THE SAME
- Publication number 20100188113
- Publication date Jul 29, 2010
- INTELLECTUAL PROPERTY PARTNERS LLC
- William P. King
- G01 - MEASURING TESTING
Information Patent Application
Infrared imaging using thermal radiation from a scanning probe tip
- Publication number 20100045970
- Publication date Feb 25, 2010
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Application
Transition temperature microscopy
- Publication number 20100042356
- Publication date Feb 18, 2010
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Application
NANOINDENTATION SURFACE ANALYSIS METHOD
- Publication number 20090120172
- Publication date May 14, 2009
- IBM Corporation
- Richard L. Bradshaw
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE AND APPLICATIONS OF THE SAME
- Publication number 20090056428
- Publication date Mar 5, 2009
- William P. KING
- G01 - MEASURING TESTING

SThM [Scanning Thermal Microscopy] or apparatus therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measuring method for measuring heat distribution of specific space...

Quantum-dot-based measuring system and method

Measuring method for measuring heat distribution of specific space...

Surface sensitive atomic force microscope based infrared spectroscopy

Scanning tunneling thermometer

Method of operating scanning thermal microscopy probe for quantitat...

Thermal analysis for source rocks

Probe and manufacturing method of probe for scanning probe microscope

Scanning tunneling thermometer

Compact probe for atomic-force microscopy and atomic-force microsco...

Superconducting scanning sensor for nanometer scale temperature ima...

Thermal probe

Thermal probe for a near-field thermal microscope and method for ge...

Computer-aided simulation method for atomic-resolution scanning see...

Vertical embedded sensor and process of manufacturing thereof

Magnetic actuation and thermal cantilevers for temperature and freq...

Softening point measuring apparatus and thermal conductivity measur...

Thermal probe

Thermal probe

Magnetic actuation and thermal cantilevers for temperature and freq...

Scanning probe microscopy inspection and modification system

Spatially resolved quantitative mapping of thermomechanical propert...

Scanning thermal twisting atomic force microscopy

Transition temperature microscopy

Infrared imaging using thermal radiation from a scanning probe tip

Nanoindentation surface analysis method

Cantilever probe and applications of the same

Quantitative calorimetry signal for sub-micron scale thermal analysis

Probe for scanning thermal microscope

Probe with embedded heater for nanoscale analysis

Patents Applicationslast 30 patents

MEASURING METHOD FOR MEASURING HEAT DISTRIBUTION OF SPECIFIC SPACE...

MEASURING METHOD FOR MEASURING HEAT DISTRIBUTION OF SPECIFIC SPACE...

PROBE AND MANUFACTURING METHOD OF PROBE FOR SCANNING PROBE MICROSCOPE

Thermal Analysis for Source Rocks

SCANNING TUNNELING THERMOMETER

METHOD OF OPERATING SCANNING THERMAL MICROSCOPY PROBE FOR QUANTITAT...

THERMAL PROBE FOR A NEAR-FIELD THERMAL MICROSCOPE AND METHOD FOR GE...

THERMAL PROBE

SUPERCONDUCTING SCANNING SENSOR FOR NANOMETER SCALE TEMPERATURE IMA...

SCANNING THERMO-IONIC MICROSCOPY

Computer-Aided Simulation Method For Atomic-Resolution Scanning See...

Computer-Aided Simulation Method For Atomic-Resolution Scanning See...

Vertical Embedded Sensor and Process of Manufacturing Thereof

SINGLE-CONTACT TUNNELING THERMOMETRY

HIGH SPATIAL RESOLUTION NON-CONTACT TEMPERATURE MEASUREMENT

Magnetic Actuation and Thermal Cantilevers for Temperature and Freq...

Magnetic Actuation and Thermal Cantilevers for Temperature and Freq...

THERMAL PROBE

THERMAL PROBE

TEMPERATURE MEASURING PROBE, TEMPERATURE MEASURING APPARATUS, AND T...

SCANNING THERMAL TWISTING ATOMIC FORCE MICROSCOPY

SPM Probe and Inspection Device for Light Emission Unit

DETECTION AND CHARACTERIZATION OF LASER-INDUCED HEAT AFFECTED ZONES...

Softening point measuring apparatus and thermal conductivity measur...

SPATIALLY RESOLVED QUANTITATIVE MAPPING OF THERMOMECHANICAL PROPERT...

CANTILEVER PROBE AND APPLICATIONS OF THE SAME

Infrared imaging using thermal radiation from a scanning probe tip

Transition temperature microscopy

NANOINDENTATION SURFACE ANALYSIS METHOD

CANTILEVER PROBE AND APPLICATIONS OF THE SAME