STM [Scanning Tunnelling Microscopy] or apparatus therefor

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

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G01Q60/10STM [Scanning Tunnelling Microscopy] or apparatus therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Science-driven automated experiments
- Patent number 11,982,684
- Issue date May 14, 2024
- UT-Battelle, LLC
- Maxim A. Ziatdinov
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices configured to operated scanning tunneling micro...
- Patent number 11,650,222
- Issue date May 16, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,635,450
- Issue date Apr 25, 2023
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope
- Patent number 11,320,456
- Issue date May 3, 2022
- GTHERANOSTICS CO., LTD.
- Hidemi Shigekawa
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling thermometer
- Patent number 11,215,636
- Issue date Jan 4, 2022
- Arizona Board of Regents on behalf of the University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices configured to operated scanning tunneling micro...
- Patent number 11,143,671
- Issue date Oct 12, 2021
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,047,877
- Issue date Jun 29, 2021
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Depassivation lithography by scanning tunneling microscopy
- Patent number 10,983,142
- Issue date Apr 20, 2021
- Zyvex Labs, LLC
- John Randall
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling thermometer
- Patent number 10,830,792
- Issue date Nov 10, 2020
- Arizona Board of Regents on behalf of the University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Grant
Method for moving and transferring nanowires using tapered hair of...
- Patent number 10,746,760
- Issue date Aug 18, 2020
- Dalian University of Technology
- Zhenyu Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods, devices and systems for scanning tunneling microscopy cont...
- Patent number 10,495,665
- Issue date Dec 3, 2019
- Zyvex Labs, LLC
- Seyed Omid Reza Moheimani
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and algorithm for carrier profiling in scanning frequency...
- Patent number 9,927,461
- Issue date Mar 27, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Probe-based data collection system with adaptive mode of probing co...
- Patent number 9,891,280
- Issue date Feb 13, 2018
- FEI EFA, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Electrode control methodology for a scanning tunneling microscope
- Patent number 9,885,736
- Issue date Feb 6, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Iridium tip, gas field ion source, focused ion beam apparatus, elec...
- Patent number 9,583,299
- Issue date Feb 28, 2017
- Hitachi High-Tech Science Corporation
- Tomokazu Kozakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computer-aided simulation method for atomic-resolution scanning see...
- Patent number 9,459,278
- Issue date Oct 4, 2016
- Korea Advanced Institute of Science and Technology
- Yong-Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods, devices, and systems for forming atomically precise struct...
- Patent number 9,329,201
- Issue date May 3, 2016
- Zyvex Labs LLC
- John Neal Randall
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Computer-aided simulation method for atomic-resolution scanning see...
- Patent number 9,081,030
- Issue date Jul 14, 2015
- Korea Advanced Institute of Science and Technology
- Yong-Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and means for coupling high-frequency energy to and/or from...
- Patent number 9,075,081
- Issue date Jul 7, 2015
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Generation of a frequency comb and applications thereof
- Patent number 8,601,607
- Issue date Dec 3, 2013
- LOS ALAMOS NATIONAL SECURITY, LLC
- Mark J. Hagmann
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for examining a sample
- Patent number 8,347,410
- Issue date Jan 1, 2013
- Forschungszentrum Juelich GmbH
- Ruslan Temirov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 6,710,339
- Issue date Mar 23, 2004
- Seiko Instruments Inc.
- Akira Egawa
- G01 - MEASURING TESTING
Information Patent Grant
Solid surface observation method and apparatus therefor, and electr...
- Patent number 5,510,614
- Issue date Apr 23, 1996
- Hitachi, Ltd.
- Munehisa Mitsuya
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of correcting error arising in current-imaging tunneling spe...
- Patent number 5,171,993
- Issue date Dec 15, 1992
- Jeol Ltd.
- Hiroshi Uchiumi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for visualizing the base sequence of nucleic acid polymers
- Patent number 5,106,729
- Issue date Apr 21, 1992
- Arizona Board of Regents acting on behalf of Arizona State University
- Stuart M. Lindsay
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Method of measurement by scanning tunneling microscope
- Patent number 4,902,892
- Issue date Feb 20, 1990
- Agency of Industrial Science and Technology, Kosaka Laboratory Ltd.
- Shigeo Okayama
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SINGLE SPIN NMR MEASUREMENT SYSTEMS AND METHODS
- Publication number 20240319304
- Publication date Sep 26, 2024
- B. G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD.
- Yishay MANASSEN
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING-DRIVEN OPERATION OF INSTRUMENTATION WITH HUMAN IN...
- Publication number 20240288467
- Publication date Aug 29, 2024
- UT-Battelle, LLC
- Maxim A. Ziatdinov
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...
- Publication number 20240264198
- Publication date Aug 8, 2024
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Bohuslav REZEK
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ATOMIC SCALE FABRICATION
- Publication number 20220130033
- Publication date Apr 28, 2022
- Quantum Silicon Inc.
- Mohammad Rashidi
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...
- Publication number 20220082582
- Publication date Mar 17, 2022
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL OUTPUT SYSTEM, MEASUREMENT SYSTEM, OPTICAL PUMP-PROBE SCANN...
- Publication number 20220026462
- Publication date Jan 27, 2022
- GTHERANOSTICS CO., LTD.
- Hidemi SHIGEKAWA
- G01 - MEASURING TESTING
Information Patent Application
INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...
- Publication number 20210325429
- Publication date Oct 21, 2021
- Quantum Silicon Inc.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...
- Publication number 20210132109
- Publication date May 6, 2021
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING TUNNELING THERMOMETER
- Publication number 20210072282
- Publication date Mar 11, 2021
- Arizona Board of Regents on behalf of The University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20210011052
- Publication date Jan 14, 2021
- GTHERANOSTICS CO., LTD.
- Hidemi SHIGEKAWA
- G01 - MEASURING TESTING
Information Patent Application
INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...
- Publication number 20200249256
- Publication date Aug 6, 2020
- Quantum Silicon Inc.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Depassivation Lithography by Scanning Tunneling Microscopy
- Publication number 20200132718
- Publication date Apr 30, 2020
- ZYVEX LABS, LLC
- John Randall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MOVING AND TRANSFERRING NANOWIRES USING TAPERED HAIR OF...
- Publication number 20200081033
- Publication date Mar 12, 2020
- DALIAN UNIVERSITY OF TECHNOLOGY
- Zhenyu ZHANG
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Tunneling Thermometer
- Publication number 20190285664
- Publication date Sep 19, 2019
- Vizona Board of Regents on Behalf of the University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Application
METHODS, DEVICES AND SYSTEMS FOR SCANNING TUNNELING MICROSCOPY CONT...
- Publication number 20180100875
- Publication date Apr 12, 2018
- ZYVEX LABS, LLC
- Seyed Omid Reza Moheimani
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Algorithm for Carrier Profiling In Scanning Frequency...
- Publication number 20170307654
- Publication date Oct 26, 2017
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Method of Carrier Profiling Utilizing Dielectric Relaxation
- Publication number 20170199221
- Publication date Jul 13, 2017
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Electrode Control Methodology for a Scanning Tunneling Microscope
- Publication number 20160356807
- Publication date Dec 8, 2016
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Methods, Devices, and Systems for Forming Atomically Precise Struct...
- Publication number 20150355226
- Publication date Dec 10, 2015
- ZYVEX LABS, LLC
- John Neal Randall
- G01 - MEASURING TESTING
Information Patent Application
Scanning Frequency Comb Microscopy (SFCM) For Carrier Profiling in...
- Publication number 20150247809
- Publication date Sep 3, 2015
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CORRELATING IMAGES OF A PHOTOLITHOGRAPHIC...
- Publication number 20150169997
- Publication date Jun 18, 2015
- CARL ZEISS SMS GMBH
- Dieter Weber
- G02 - OPTICS
Information Patent Application
COMPENSATION FOR CANONICAL SECOND ORDER SYSTEMS FOR ELIMINATING PEA...
- Publication number 20150101085
- Publication date Apr 9, 2015
- JONIX LLC
- Nicholas Paige
- G01 - MEASURING TESTING
Information Patent Application
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...
- Publication number 20150047079
- Publication date Feb 12, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tomokazu Kozakai
- G01 - MEASURING TESTING
Information Patent Application
Computer-Aided Simulation Method For Atomic-Resolution Scanning See...
- Publication number 20140366229
- Publication date Dec 11, 2014
- Yong-Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
GENERATION OF A FREQUENCY COMB AND APPLICATIONS THEREOF
- Publication number 20130212751
- Publication date Aug 15, 2013
- LOS ALAMOS NATIONAL SECURITY, LLC
- Mark J. Hagmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe microscopy-based metrology tool with a vacuum partition
- Publication number 20130097740
- Publication date Apr 18, 2013
- James F. Mack
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR EXAMINING A SAMPLE
- Publication number 20100263097
- Publication date Oct 14, 2010
- Ruslan Temirov
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20010030286
- Publication date Oct 18, 2001
- Akira Egawa
- B82 - NANO-TECHNOLOGY

STM [Scanning Tunnelling Microscopy] or apparatus therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Science-driven automated experiments

Methods and devices configured to operated scanning tunneling micro...

Initiating and monitoring the evolution of single electrons within...

Scanning probe microscope

Scanning tunneling thermometer

Methods and devices configured to operated scanning tunneling micro...

Initiating and monitoring the evolution of single electrons within...

Depassivation lithography by scanning tunneling microscopy

Scanning tunneling thermometer

Method for moving and transferring nanowires using tapered hair of...

Methods, devices and systems for scanning tunneling microscopy cont...

Apparatus and algorithm for carrier profiling in scanning frequency...

Probe-based data collection system with adaptive mode of probing co...

Electrode control methodology for a scanning tunneling microscope

Iridium tip, gas field ion source, focused ion beam apparatus, elec...

Computer-aided simulation method for atomic-resolution scanning see...

Methods, devices, and systems for forming atomically precise struct...

Computer-aided simulation method for atomic-resolution scanning see...

Method and means for coupling high-frequency energy to and/or from...

Generation of a frequency comb and applications thereof

Method for examining a sample

Scanning probe microscope

Solid surface observation method and apparatus therefor, and electr...

Method of correcting error arising in current-imaging tunneling spe...

Method for visualizing the base sequence of nucleic acid polymers

Method of measurement by scanning tunneling microscope

Patents Applicationslast 30 patents

SINGLE SPIN NMR MEASUREMENT SYSTEMS AND METHODS

MACHINE LEARNING-DRIVEN OPERATION OF INSTRUMENTATION WITH HUMAN IN...

A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...

AUTOMATED ATOMIC SCALE FABRICATION

METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...

OPTICAL OUTPUT SYSTEM, MEASUREMENT SYSTEM, OPTICAL PUMP-PROBE SCANN...

INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...

METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...

SCANNING TUNNELING THERMOMETER

SCANNING PROBE MICROSCOPE

INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...

Depassivation Lithography by Scanning Tunneling Microscopy

METHOD FOR MOVING AND TRANSFERRING NANOWIRES USING TAPERED HAIR OF...

Scanning Tunneling Thermometer

METHODS, DEVICES AND SYSTEMS FOR SCANNING TUNNELING MICROSCOPY CONT...

Apparatus and Algorithm for Carrier Profiling In Scanning Frequency...

Method of Carrier Profiling Utilizing Dielectric Relaxation

Electrode Control Methodology for a Scanning Tunneling Microscope

Methods, Devices, and Systems for Forming Atomically Precise Struct...

Scanning Frequency Comb Microscopy (SFCM) For Carrier Profiling in...

APPARATUS AND METHOD FOR CORRELATING IMAGES OF A PHOTOLITHOGRAPHIC...

COMPENSATION FOR CANONICAL SECOND ORDER SYSTEMS FOR ELIMINATING PEA...

Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...

Computer-Aided Simulation Method For Atomic-Resolution Scanning See...

GENERATION OF A FREQUENCY COMB AND APPLICATIONS THEREOF

Scanning probe microscopy-based metrology tool with a vacuum partition

METHOD FOR EXAMINING A SAMPLE

Scanning probe microscope