Storing and outputting test patterns

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CPC
G01R31/31919

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31919Storing and outputting test patterns

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Tester channel multiplexing in test equipment
- Patent number 12,136,958
- Issue date Nov 5, 2024
- Yangtze Memory Technologies Co., Ltd.
- Yangyang Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Memory device test method, apparatus, and system, medium, and elect...
- Patent number 11,867,755
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus and method for functional testing of one or more...
- Patent number 11,686,767
- Issue date Jun 27, 2023
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trajectory-optimized test pattern generation for built-in self-test
- Patent number 11,585,853
- Issue date Feb 21, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing circuit and testing method thereof
- Patent number 11,287,466
- Issue date Mar 29, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture with an FPGA based test board to simulate a DUT o...
- Patent number 11,009,550
- Issue date May 18, 2021
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, apparatus and method for in-field self testing in a diagnos...
- Patent number 10,962,596
- Issue date Mar 30, 2021
- Intel Corporation
- Vedvyas Shanbhogue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Receiving test input message packets and transmitting modulated ack...
- Patent number 10,928,444
- Issue date Feb 23, 2021
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus and method for probeless field scan of a processor
- Patent number 10,775,434
- Issue date Sep 15, 2020
- Intel Corporation
- Michael Mishaeli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Oscilloscope and method
- Patent number 10,775,417
- Issue date Sep 15, 2020
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
ATE compatible high-efficient functional test
- Patent number 10,768,232
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Thomas Gentner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Virtual probe sequencing
- Patent number 10,663,514
- Issue date May 26, 2020
- Artisan Electronics, Inc.
- Greg Gossett
- G01 - MEASURING TESTING
Information Patent Grant
Narrow-parallel scan-based device testing
- Patent number 10,656,205
- Issue date May 19, 2020
- Oracle International Corporation
- Mark Semmelmeyer
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus and method for in-field self testing in a diagnos...
- Patent number 10,620,266
- Issue date Apr 14, 2020
- Intel Corporation
- Vedvyas Shanbhogue
- G01 - MEASURING TESTING
Information Patent Grant
Configuration and testing method and system for FPGA chip using bum...
- Patent number 10,613,145
- Issue date Apr 7, 2020
- SINO IC TECHNOLOGY CO., LTD.
- Bin Luo
- G01 - MEASURING TESTING
Information Patent Grant
Multiple rate signature test to verify integrated circuit identity
- Patent number 10,564,216
- Issue date Feb 18, 2020
- Soh Ying Seah
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment (ATE) platform translation
- Patent number 10,481,206
- Issue date Nov 19, 2019
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Grant
Multi-bank digital stimulus response in a single field programmable...
- Patent number 10,288,685
- Issue date May 14, 2019
- Keysight Technologies, Inc.
- John H. Guilford
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture with a small form factor test board for rapid pro...
- Patent number 10,288,681
- Issue date May 14, 2019
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test architecture having multiple FPGA based hardware accelerator b...
- Patent number 10,162,007
- Issue date Dec 25, 2018
- Advantest Corporation
- Gerald Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tester with acceleration on memory and acceleration for automatic p...
- Patent number 10,161,993
- Issue date Dec 25, 2018
- Advantest Corporation
- John Frediani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Executing code on a test instrument in response to an event
- Patent number 10,156,611
- Issue date Dec 18, 2018
- Teradyne, Inc.
- Yonet A. Eracar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
De/mod, messaging circuitry coupling first/second function/test cir...
- Patent number 10,132,864
- Issue date Nov 20, 2018
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Device including programmable logic element and programmable switch
- Patent number 9,983,265
- Issue date May 29, 2018
- Semiconductor Energy Laboratory Co., Ltd.
- Yoshiyuki Kurokawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of generating test pattern, test system using...
- Patent number 9,933,486
- Issue date Apr 3, 2018
- SK hynix Inc.
- Jae Seok Kang
- G01 - MEASURING TESTING
Information Patent Grant
Test messaging demodulate and modulate on separate power pads
- Patent number 9,739,832
- Issue date Aug 22, 2017
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generation device, fault detection system, test patter...
- Patent number 9,702,927
- Issue date Jul 11, 2017
- Japan Science and Technology Agency
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Multiple rate signature test to verify integrated circuit identity
- Patent number 9,664,736
- Issue date May 30, 2017
- Texas Instruments Incorporated
- Soh Ying Seah
- G01 - MEASURING TESTING
Information Patent Grant
System on chip including built-in self test circuit and built-in se...
- Patent number 9,575,861
- Issue date Feb 21, 2017
- Samsung Electronics Co., Ltd.
- Yong-Jun Hong
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TESTER CHANNEL MULTIPLEXING IN TEST EQUIPMENT
- Publication number 20250023646
- Publication date Jan 16, 2025
- Yangtze Memory Technologies Co., Ltd.
- Yangyang Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CLOCK RECOVERY UNIT ADJUSTMENT
- Publication number 20240243896
- Publication date Jul 18, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Marlin E. Viss
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST SYSTEM THAT CONVERTS COMMAND SYNTAXES
- Publication number 20240241173
- Publication date Jul 18, 2024
- Teradyne, Inc.
- Richard W. FANNING
- G01 - MEASURING TESTING
Information Patent Application
APPRATUS FOR PERFORMING MULTIPLE TESTS ON A DEVICE UNDER TEST
- Publication number 20230184821
- Publication date Jun 15, 2023
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa SU
- G01 - MEASURING TESTING
Information Patent Application
SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
- Publication number 20220373598
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Kan TAN
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE TEST METHOD, APPARATUS, AND SYSTEM, MEDIUM, AND ELECT...
- Publication number 20220291284
- Publication date Sep 15, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT SYSTEM
- Publication number 20220268839
- Publication date Aug 25, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING CIRCUIT AND TESTING METHOD THEREOF
- Publication number 20210311109
- Publication date Oct 7, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
System, Apparatus And Method For In-Field Self Testing In A Diagnos...
- Publication number 20200300911
- Publication date Sep 24, 2020
- Intel Corporation
- Vedvyas Shanbhogue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE INSPECTION METHOD
- Publication number 20200174073
- Publication date Jun 4, 2020
- Tetsuya KAGAMI
- G01 - MEASURING TESTING
Information Patent Application
System, Apparatus And Method For Probeless Field Scan Of A Processor
- Publication number 20200096569
- Publication date Mar 26, 2020
- Intel Corporation
- Michael Mishaeli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NARROW-PARALLEL SCAN-BASED DEVICE TESTING
- Publication number 20190235023
- Publication date Aug 1, 2019
- Oracle International Corporation
- MARK SEMMELMEYER
- G01 - MEASURING TESTING
Information Patent Application
System, Apparatus And Method For In-Field Self Testing In A Diagnos...
- Publication number 20190162782
- Publication date May 30, 2019
- Intel Corporation
- Vedvyas Shanbhogue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System, Apparatus And Method For Functional Testing Of One Or More...
- Publication number 20190033367
- Publication date Jan 31, 2019
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULATED TEST MESSAGING FROM DEDICATED TEST CIRCUITRY TO POWER TER...
- Publication number 20190033370
- Publication date Jan 31, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
ATE COMPATIBLE HIGH-EFFICIENT FUNCTIONAL TEST
- Publication number 20190018061
- Publication date Jan 17, 2019
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL PROBE SEQUENCING
- Publication number 20180321316
- Publication date Nov 8, 2018
- Greg Gossett
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURATION AND TESTING METHOD AND SYSTEM FOR FPGA CHIP USING BUM...
- Publication number 20180024194
- Publication date Jan 25, 2018
- SINO IC TECHNOLOGY CO., LTD.
- Bin LUO
- G01 - MEASURING TESTING
Information Patent Application
MODULATED TEST MESSAGING FROM DEDICATED TEST CIRCUITRY TO POWER TER...
- Publication number 20170307686
- Publication date Oct 26, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
DEVICE
- Publication number 20150226802
- Publication date Aug 13, 2015
- Semiconductor Energy Laboratory Co., Ltd.
- Yoshiyuki Kurokawa
- G01 - MEASURING TESTING
Information Patent Application
DEVICE
- Publication number 20150192641
- Publication date Jul 9, 2015
- Semiconductor Energy Laboratory Co., Ltd.
- Yoshiyuki Kurokawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DEVICE TESTING USING MULTIPLE PROCESSING P...
- Publication number 20140281776
- Publication date Sep 18, 2014
- Teradyne, Inc.
- Corbin L. Champion
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING IN...
- Publication number 20140245090
- Publication date Aug 28, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SEMICONDUCTOR TEST METHOD
- Publication number 20140245088
- Publication date Aug 28, 2014
- Samsung Electro-Mechanics Co., Ltd.
- OSCAR PEDRO BANAAG TORRECAMPO
- G01 - MEASURING TESTING
Information Patent Application
TEST ARCHITECTURE HAVING MULTIPLE FPGA BASED HARDWARE ACCELERATOR B...
- Publication number 20140236525
- Publication date Aug 21, 2014
- Advantest Corporation
- Gerald CHAN
- G01 - MEASURING TESTING
Information Patent Application
Automatic Test Equipment
- Publication number 20140229782
- Publication date Aug 14, 2014
- Jochen Rueter
- G01 - MEASURING TESTING
Information Patent Application
EMBEDDED TESTER
- Publication number 20140207402
- Publication date Jul 24, 2014
- Teradyne, Inc.
- Joshua Mason Ferry
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20140043051
- Publication date Feb 13, 2014
- TOKYO ELECTRON LIMITED
- Haruo IWATSU
- G01 - MEASURING TESTING
Information Patent Application
TESTER HARDWARE
- Publication number 20130326299
- Publication date Dec 5, 2013
- Hiromi Oshima
- G01 - MEASURING TESTING
Information Patent Application
MODULATED TEST MESSAGING FROM DEDICATED TEST CIRCUITRY TO POWER TER...
- Publication number 20130300443
- Publication date Nov 14, 2013
- Lee D. Whetsel
- G01 - MEASURING TESTING

Storing and outputting test patterns

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus for performing multiple tests on a device under test

Tester channel multiplexing in test equipment

Memory device test method, apparatus, and system, medium, and elect...

System, apparatus and method for functional testing of one or more...

Trajectory-optimized test pattern generation for built-in self-test

Chip testing circuit and testing method thereof

Test architecture with an FPGA based test board to simulate a DUT o...

System, apparatus and method for in-field self testing in a diagnos...

Receiving test input message packets and transmitting modulated ack...

System, apparatus and method for probeless field scan of a processor

Oscilloscope and method

ATE compatible high-efficient functional test

Virtual probe sequencing

Narrow-parallel scan-based device testing

System, apparatus and method for in-field self testing in a diagnos...

Configuration and testing method and system for FPGA chip using bum...

Multiple rate signature test to verify integrated circuit identity

Automatic test equipment (ATE) platform translation

Multi-bank digital stimulus response in a single field programmable...

Test architecture with a small form factor test board for rapid pro...

Test architecture having multiple FPGA based hardware accelerator b...

Tester with acceleration on memory and acceleration for automatic p...

Executing code on a test instrument in response to an event

De/mod, messaging circuitry coupling first/second function/test cir...

Device including programmable logic element and programmable switch

Apparatus and method of generating test pattern, test system using...

Test messaging demodulate and modulate on separate power pads

Test pattern generation device, fault detection system, test patter...

Multiple rate signature test to verify integrated circuit identity

System on chip including built-in self test circuit and built-in se...

Patents Applicationslast 30 patents

TESTER CHANNEL MULTIPLEXING IN TEST EQUIPMENT

CLOCK RECOVERY UNIT ADJUSTMENT

TEST SYSTEM THAT CONVERTS COMMAND SYNTAXES

APPRATUS FOR PERFORMING MULTIPLE TESTS ON A DEVICE UNDER TEST

SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT

MEMORY DEVICE TEST METHOD, APPARATUS, AND SYSTEM, MEDIUM, AND ELECT...

TEST AND MEASUREMENT SYSTEM

CHIP TESTING CIRCUIT AND TESTING METHOD THEREOF

System, Apparatus And Method For In-Field Self Testing In A Diagnos...

DEVICE INSPECTION METHOD

System, Apparatus And Method For Probeless Field Scan Of A Processor

NARROW-PARALLEL SCAN-BASED DEVICE TESTING

System, Apparatus And Method For In-Field Self Testing In A Diagnos...

System, Apparatus And Method For Functional Testing Of One Or More...

MODULATED TEST MESSAGING FROM DEDICATED TEST CIRCUITRY TO POWER TER...

ATE COMPATIBLE HIGH-EFFICIENT FUNCTIONAL TEST

VIRTUAL PROBE SEQUENCING

CONFIGURATION AND TESTING METHOD AND SYSTEM FOR FPGA CHIP USING BUM...

MODULATED TEST MESSAGING FROM DEDICATED TEST CIRCUITRY TO POWER TER...

DEVICE

DEVICE

METHOD AND APPARATUS FOR DEVICE TESTING USING MULTIPLE PROCESSING P...

PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING IN...

SEMICONDUCTOR TEST DEVICE AND SEMICONDUCTOR TEST METHOD

TEST ARCHITECTURE HAVING MULTIPLE FPGA BASED HARDWARE ACCELERATOR B...

Automatic Test Equipment

EMBEDDED TESTER

INSPECTION APPARATUS, INSPECTION SYSTEM AND INSPECTION METHOD

TESTER HARDWARE

MODULATED TEST MESSAGING FROM DEDICATED TEST CIRCUITRY TO POWER TER...