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G01R31/31935

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31935Storing data

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus
- Patent number 12,038,472
- Issue date Jul 16, 2024
- Advantest Corporation
- Naoya Toyota
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for integrated circuit testing
- Patent number 12,007,439
- Issue date Jun 11, 2024
- Winbond Electronics Corp.
- Kuo-Min Liao
- G01 - MEASURING TESTING
Information Patent Grant
System on chip for performing scan test and method of designing the...
- Patent number 11,940,494
- Issue date Mar 26, 2024
- Samsung Electronics Co., Ltd.
- Woohyun Son
- G01 - MEASURING TESTING
Information Patent Grant
Memory device test method, apparatus, and system, medium, and elect...
- Patent number 11,867,755
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and measurement method
- Patent number 11,789,079
- Issue date Oct 17, 2023
- Rohde & Schwarz GmbH & Co. KG
- Michael Feilen
- G01 - MEASURING TESTING
Information Patent Grant
Leakage screening based on use-case power prediction
- Patent number 11,768,237
- Issue date Sep 26, 2023
- Google LLC
- Emre Tuncer
- G01 - MEASURING TESTING
Information Patent Grant
End of life performance throttling to prevent data loss
- Patent number 11,756,638
- Issue date Sep 12, 2023
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device and operating method thereof
- Patent number 11,740,285
- Issue date Aug 29, 2023
- Kioxia Corporation
- Yuusuke Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, apparatus and method for functional testing of one or more...
- Patent number 11,686,767
- Issue date Jun 27, 2023
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, apparatus and storage medium for testing chip, and chip the...
- Patent number 11,639,964
- Issue date May 2, 2023
- Beijing Baidu Netcom Science and Technology Co., Ltd
- Ziyu Guo
- G01 - MEASURING TESTING
Information Patent Grant
Row redundancy techniques
- Patent number 11,521,703
- Issue date Dec 6, 2022
- ARM Limited
- Amandeep Kaur
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer test system and methods thereof
- Patent number 11,486,899
- Issue date Nov 1, 2022
- NANYA TECHNOLOGY CORPORATION
- Chia-Lin Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Secondary monitoring system for a machine under test
- Patent number 11,480,603
- Issue date Oct 25, 2022
- The Boeing Company
- Steven F Griffin
- G01 - MEASURING TESTING
Information Patent Grant
Automated testing machine with data processing function and informa...
- Patent number 11,415,622
- Issue date Aug 16, 2022
- HEFEI SPIROX TECHNOLOGY CO., LTD.
- Hsing-Fu Lin
- G01 - MEASURING TESTING
Information Patent Grant
Device, method and system of error detection and correction in mult...
- Patent number 11,385,288
- Issue date Jul 12, 2022
- STMicroelectronics S.A.
- Ricardo Gomez Gomez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Procedure for reviewing an FPGA-program
- Patent number 11,187,748
- Issue date Nov 30, 2021
- dspace digital signal processing and control engineering GmbH
- Heiko Kalte
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for measuring signals and data handling method
- Patent number 11,163,455
- Issue date Nov 2, 2021
- Rohde & Schwarz GmbH & Co. KG
- Mario Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
End of life performance throttling to prevent data loss
- Patent number 10,998,066
- Issue date May 4, 2021
- Micron Technology, Inc.
- Sebastien Andre Jean
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory apparatus relating to determination of a failed region and t...
- Patent number 10,976,368
- Issue date Apr 13, 2021
- SK hynix Inc.
- Ja Beom Koo
- G11 - INFORMATION STORAGE
Information Patent Grant
End of life performance throttling to prevent data loss
- Patent number 10,453,543
- Issue date Oct 22, 2019
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Grant
Memory apparatus relating to determination of a failed region and t...
- Patent number 10,302,701
- Issue date May 28, 2019
- SK hynix Inc.
- Ja Beom Koo
- G11 - INFORMATION STORAGE
Information Patent Grant
Controllably adjusting voltage for operating an integrated circuit...
- Patent number RE47250
- Issue date Feb 19, 2019
- Marvell Israel (M.I.S.L) Ltd.
- Eran Rotem
Information Patent Grant
Integrated circuit with self-verification function, verification me...
- Patent number 9,885,754
- Issue date Feb 6, 2018
- Realtek Semiconductor Corp.
- Chi-Shun Weng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for low latency communication in an automatic...
- Patent number 9,791,511
- Issue date Oct 17, 2017
- Teradyne, Inc.
- Thien D. Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Voltage-driven intelligent characterization bench for semiconductor
- Patent number 9,772,371
- Issue date Sep 26, 2017
- GLOBALFOUNDRIES Inc.
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Grant
Fast auto shift of failing memory diagnostics data using pattern de...
- Patent number 9,514,844
- Issue date Dec 6, 2016
- GLOBALFOUNDRIES Inc.
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit and method for testing semiconductor devices usi...
- Patent number 9,418,760
- Issue date Aug 16, 2016
- SK Hynix Inc.
- Woo-Sik Jung
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for scan-testing of idle functional units in oper...
- Patent number 9,310,436
- Issue date Apr 12, 2016
- OmniVision Technologies, Inc.
- Jenny Picalausa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatuses and methods for compressing data received over multiple...
- Patent number 9,183,952
- Issue date Nov 10, 2015
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage-driven intelligent characterization bench for semiconductor
- Patent number 9,043,179
- Issue date May 26, 2015
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE
- Publication number 20240230759
- Publication date Jul 11, 2024
- KIOXIA Corporation
- Mikio SHIRAISHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING
- Publication number 20240219465
- Publication date Jul 4, 2024
- WINBOND ELECTRONICS CORP.
- Kuo-Min Liao
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE
- Publication number 20240133953
- Publication date Apr 25, 2024
- KIOXIA Corporation
- Mikio SHIRAISHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS CAPABLE OF INDUCING REDUCTION OF POWER...
- Publication number 20230420068
- Publication date Dec 28, 2023
- YIK Corporation
- Hyo Sang JO
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM ON CHIP FOR PERFORMING SCAN TEST AND METHOD OF DESIGNING THE...
- Publication number 20230141786
- Publication date May 11, 2023
- Samsung Electronics Co., Ltd.
- WOOHYUN SON
- G01 - MEASURING TESTING
Information Patent Application
Row Redundancy Techniques
- Publication number 20220319632
- Publication date Oct 6, 2022
- ARM Limited
- Amandeep Kaur
- G11 - INFORMATION STORAGE
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20220308111
- Publication date Sep 29, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Michael Feilen
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE TEST METHOD, APPARATUS, AND SYSTEM, MEDIUM, AND ELECT...
- Publication number 20220291284
- Publication date Sep 15, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Application
Leakage Screening Based on Use-Case Power Prediction
- Publication number 20220268835
- Publication date Aug 25, 2022
- Google LLC
- Emre Tuncer
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TESTING MACHINE WITH DATA PROCESSING FUNCTION AND INFORMA...
- Publication number 20220099729
- Publication date Mar 31, 2022
- SPIROX CORPORATION
- HSING-FU LIN
- G01 - MEASURING TESTING
Information Patent Application
DEBUG DATA COMMUNICATION SYSTEM FOR MULTIPLE CHIPS
- Publication number 20210389371
- Publication date Dec 16, 2021
- Intel Corporation
- Vui Yong Liew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECONDARY MONITORING SYSTEM FOR A MACHINE UNDER TEST
- Publication number 20210293875
- Publication date Sep 23, 2021
- The Boeing Company
- Steven F. Griffin
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM AND METHODS THEREOF
- Publication number 20210239736
- Publication date Aug 5, 2021
- NANYA TECHNOLOGY CORPORATION
- CHIA-LIN TSAI
- G01 - MEASURING TESTING
Information Patent Application
END OF LIFE PERFORMANCE THROTTLING TO PREVENT DATA LOSS
- Publication number 20210233598
- Publication date Jul 29, 2021
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Application
Method, Apparatus and Storage Medium for Testing Chip, and Chip The...
- Publication number 20210215756
- Publication date Jul 15, 2021
- Beijing Baidu Netcom Science and Technology CO., Ltd.
- Ziyu Guo
- G01 - MEASURING TESTING
Information Patent Application
ERROR DETECTION AND CORRECTION
- Publication number 20210096183
- Publication date Apr 1, 2021
- STMicroelectronics S.A.
- Ricardo GOMEZ GOMEZ
- G01 - MEASURING TESTING
Information Patent Application
PROCEDURE FOR REVIEWING AN FPGA-PROGRAM
- Publication number 20200132766
- Publication date Apr 30, 2020
- dSpace digital signal processing and control engineering GmbH
- Heiko KALTE
- G01 - MEASURING TESTING
Information Patent Application
END OF LIFE PERFORMANCE THROTTLING TO PREVENT DATA LOSS
- Publication number 20200035314
- Publication date Jan 30, 2020
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Application
MEMORY APPARATUS RELATING TO DETERMINATION OF A FAILED REGION AND T...
- Publication number 20190242944
- Publication date Aug 8, 2019
- SK HYNIX INC.
- Ja Beom KOO
- G01 - MEASURING TESTING
Information Patent Application
EOL PERFORMANCE THROTTLING TO PREVENT DATA LOSS
- Publication number 20190130984
- Publication date May 2, 2019
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Application
System, Apparatus And Method For Functional Testing Of One Or More...
- Publication number 20190033367
- Publication date Jan 31, 2019
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY APPARATUS RELATING TO DETERMINATION OF A FAILED REGION AND T...
- Publication number 20180218777
- Publication date Aug 2, 2018
- SK HYNIX INC.
- Ja Beom KOO
- G11 - INFORMATION STORAGE
Information Patent Application
DE-SKEWING TRANSMITTED DATA
- Publication number 20150212157
- Publication date Jul 30, 2015
- International Business Machines Corporation
- Yiftach Benjamini
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR LOW LATENCY COMMUNICATION IN AN AUTOMATIC...
- Publication number 20140278177
- Publication date Sep 18, 2014
- Teradyne, Inc.
- Thien D. Nguyen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR COMPRESSING DATA RECEIVED OVER MULTIPLE...
- Publication number 20140237305
- Publication date Aug 21, 2014
- Micron Technology, Inc.
- James S. Rehmeyer
- G01 - MEASURING TESTING
Information Patent Application
Automatic Test Equipment
- Publication number 20140229782
- Publication date Aug 14, 2014
- Jochen Rueter
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INCREASING YIELD
- Publication number 20140204695
- Publication date Jul 24, 2014
- MARVELL ISRAEL (M.I.S.L) LTD.
- Eran ROTEM
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20140043051
- Publication date Feb 13, 2014
- TOKYO ELECTRON LIMITED
- Haruo IWATSU
- G01 - MEASURING TESTING
Information Patent Application
Measurement System Results Queue For Improved Performance
- Publication number 20140039826
- Publication date Feb 6, 2014
- Gerardo Orozco Valdes
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INCREASING YIELD
- Publication number 20140029368
- Publication date Jan 30, 2014
- MARVELL ISRAEL (M.I.S.L) LTD.
- Eran ROTEM
- G01 - MEASURING TESTING

Storing data

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test apparatus

Method and apparatus for integrated circuit testing

System on chip for performing scan test and method of designing the...

Memory device test method, apparatus, and system, medium, and elect...

Measurement system and measurement method

Leakage screening based on use-case power prediction

End of life performance throttling to prevent data loss

Semiconductor integrated circuit device and operating method thereof

System, apparatus and method for functional testing of one or more...

Method, apparatus and storage medium for testing chip, and chip the...

Row redundancy techniques

Wafer test system and methods thereof

Secondary monitoring system for a machine under test

Automated testing machine with data processing function and informa...

Device, method and system of error detection and correction in mult...

Procedure for reviewing an FPGA-program

Measuring device for measuring signals and data handling method

End of life performance throttling to prevent data loss

Memory apparatus relating to determination of a failed region and t...

End of life performance throttling to prevent data loss

Memory apparatus relating to determination of a failed region and t...

Controllably adjusting voltage for operating an integrated circuit...

Integrated circuit with self-verification function, verification me...

Method and apparatus for low latency communication in an automatic...

Voltage-driven intelligent characterization bench for semiconductor

Fast auto shift of failing memory diagnostics data using pattern de...

Integrated circuit and method for testing semiconductor devices usi...

System and method for scan-testing of idle functional units in oper...

Apparatuses and methods for compressing data received over multiple...

Voltage-driven intelligent characterization bench for semiconductor

Patents Applicationslast 30 patents

DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE

METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING

DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE

SEMICONDUCTOR TEST APPARATUS CAPABLE OF INDUCING REDUCTION OF POWER...

SYSTEM ON CHIP FOR PERFORMING SCAN TEST AND METHOD OF DESIGNING THE...

Row Redundancy Techniques

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

MEMORY DEVICE TEST METHOD, APPARATUS, AND SYSTEM, MEDIUM, AND ELECT...

Leakage Screening Based on Use-Case Power Prediction

AUTOMATED TESTING MACHINE WITH DATA PROCESSING FUNCTION AND INFORMA...

DEBUG DATA COMMUNICATION SYSTEM FOR MULTIPLE CHIPS

SECONDARY MONITORING SYSTEM FOR A MACHINE UNDER TEST

WAFER TEST SYSTEM AND METHODS THEREOF

END OF LIFE PERFORMANCE THROTTLING TO PREVENT DATA LOSS

Method, Apparatus and Storage Medium for Testing Chip, and Chip The...

ERROR DETECTION AND CORRECTION

PROCEDURE FOR REVIEWING AN FPGA-PROGRAM

END OF LIFE PERFORMANCE THROTTLING TO PREVENT DATA LOSS

MEMORY APPARATUS RELATING TO DETERMINATION OF A FAILED REGION AND T...

EOL PERFORMANCE THROTTLING TO PREVENT DATA LOSS

System, Apparatus And Method For Functional Testing Of One Or More...

MEMORY APPARATUS RELATING TO DETERMINATION OF A FAILED REGION AND T...

DE-SKEWING TRANSMITTED DATA

METHOD AND APPARATUS FOR LOW LATENCY COMMUNICATION IN AN AUTOMATIC...

APPARATUSES AND METHODS FOR COMPRESSING DATA RECEIVED OVER MULTIPLE...

Automatic Test Equipment

METHOD AND APPARATUS FOR INCREASING YIELD

INSPECTION APPARATUS, INSPECTION SYSTEM AND INSPECTION METHOD

Measurement System Results Queue For Improved Performance

METHOD AND APPARATUS FOR INCREASING YIELD