Structural combination of electric measuring instruments with basic electronic circuits

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CPC
G01R1/30

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/30Structural combination of electric measuring instruments with basic electronic circuits

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Indicator light circuit configured for micro-current and micro-curr...
- Patent number 12,306,221
- Issue date May 20, 2025
- XIAMEN SOLEX HIGH-TECH INDUSTRIES CO., LTD.
- Boren Chen
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 12,181,495
- Issue date Dec 31, 2024
- Quanta Computer Inc.
- Wei-Chih Hung
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a pulse inverter, current measuring device for...
- Patent number 12,174,221
- Issue date Dec 24, 2024
- Audi AG
- Christoph Meier
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Current transducer
- Patent number 12,135,341
- Issue date Nov 5, 2024
- LEM International SA
- Fabien Millet
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit and apparatus based on equipotential shielding
- Patent number 12,105,127
- Issue date Oct 1, 2024
- KINGFAR INTERNATIONAL INC.
- Qichao Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Two-wire interface reference accelerometer with integrated mechanic...
- Patent number 12,025,633
- Issue date Jul 2, 2024
- Vibration Measurement Solutions, Inc.
- George V. Zusman
- G01 - MEASURING TESTING
Information Patent Grant
AFE circuit and related gain amplifier
- Patent number 11,953,523
- Issue date Apr 9, 2024
- NOVATEK Microelectronics Corp.
- Tzu-Wei Lin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Current detection system, current detection method, and detection a...
- Patent number 11,933,820
- Issue date Mar 19, 2024
- HUAWEI DIGITAL POWER TECHNOLOGIES CO., LTD.
- Yonghua Wu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measurement input circuit and measurement device
- Patent number 11,852,658
- Issue date Dec 26, 2023
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance monitoring circuit for power backup systems
- Patent number 11,828,780
- Issue date Nov 28, 2023
- ZT GROUP INT'L, INC.
- Yung-Tsung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Detection and protection circuit, power supply circuit, power suppl...
- Patent number 11,797,036
- Issue date Oct 24, 2023
- XI'AN ZHONGXING NEW SOFTWARE CO., LTD
- Qian Yang
- G01 - MEASURING TESTING
Information Patent Grant
Self-calibrated input voltage-agnostic replica-biased current sensi...
- Patent number 11,747,371
- Issue date Sep 5, 2023
- Intel Corporation
- Nachiket Desai
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic capacitance sensor
- Patent number 11,688,617
- Issue date Jun 27, 2023
- Rorze Corporation
- Yoshiki Fukuzaki
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit for a nerve stimulator
- Patent number 11,614,466
- Issue date Mar 28, 2023
- SCENERAY CO., LTD
- Weiran Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Control circuit for operating inductive load devices, a braking sys...
- Patent number 11,529,937
- Issue date Dec 20, 2022
- HALDEX BRAKE PRODUCTS AKTIEBOLAG
- Steven Horton
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Devices, systems and processes for capacitor testing
- Patent number 11,500,035
- Issue date Nov 15, 2022
- DISH Network L.L.C.
- Rodney Davis
- G01 - MEASURING TESTING
Information Patent Grant
Power supply for providing an electrical pulse to an electrical con...
- Patent number 11,469,662
- Issue date Oct 11, 2022
- Advantest Corporation
- Anton Thoma
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Current measurement device
- Patent number 11,428,715
- Issue date Aug 30, 2022
- Koa Corporation
- Tamotsu Endo
- G01 - MEASURING TESTING
Information Patent Grant
Monitor circuit for monitoring a lightning protection component
- Patent number 11,431,333
- Issue date Aug 30, 2022
- Safran Electronics & Defense
- Olivier Meline
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test and measurement instrument having overpulsed power supply and...
- Patent number 11,385,261
- Issue date Jul 12, 2022
- KEITHLEY INSTRUMENTS, LLC
- James A. Niemann
- G01 - MEASURING TESTING
Information Patent Grant
Measurement input circuit and measurement device
- Patent number 11,287,447
- Issue date Mar 29, 2022
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Shunt resistor averaging techniques
- Patent number 11,193,957
- Issue date Dec 7, 2021
- Analog Devices International Unlimited Company
- Hio Leong Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energization evaluation test equipment of a PWM converter input filter
- Patent number 11,163,012
- Issue date Nov 2, 2021
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Ryo Iida
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Readout circuit for resistive and capacitive sensors
- Patent number 11,099,213
- Issue date Aug 24, 2021
- Infineon Technologies AG
- Richard Gaggl
- G01 - MEASURING TESTING
Information Patent Grant
Active harmonic load pull impedance tuner
- Patent number 11,092,619
- Issue date Aug 17, 2021
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Switching circuit
- Patent number 11,063,584
- Issue date Jul 13, 2021
- Safran Electronics & Defense
- Olivier Meline
- G01 - MEASURING TESTING
Information Patent Grant
Active harmonic load pull impedance tuner
- Patent number 11,041,882
- Issue date Jun 22, 2021
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Low-glitch range change techniques
- Patent number 11,022,629
- Issue date Jun 1, 2021
- Analog Devices, Inc.
- Stefano I. D'Aquino
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Devices, systems and processes for capacitor testing
- Patent number 11,002,801
- Issue date May 11, 2021
- DISH Network L.L.C.
- Rodney Davis
- G01 - MEASURING TESTING
Information Patent Grant
Short detection device, a short detection circuit and a display dev...
- Patent number 10,997,882
- Issue date May 4, 2021
- Samsung Electronics Co., Ltd.
- Jin Oh Kim
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Patents Applicationslast 30 patents

Information Patent Application
PROBE HEAD FOR LED TEST SYSTEM
- Publication number 20250123319
- Publication date Apr 17, 2025
- Teradyne, Inc.
- Frank Brian Parrish
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICES AND PROBE CONTROL APPARATUS
- Publication number 20250067776
- Publication date Feb 27, 2025
- Parcan Nanotech Co., Ltd.
- Xiangqian ZHOU
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20250052847
- Publication date Feb 13, 2025
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Ryosuke MORI
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL TEST SYSTEM WITH GALVANIC COUPLING OF INTERMEDIATE CIR...
- Publication number 20250015594
- Publication date Jan 9, 2025
- AVL LIST GMBH
- Michael PUMBERGER
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CIRCUIT FOR IMPEDANCE MEASUREMENTS
- Publication number 20240418757
- Publication date Dec 19, 2024
- Mettler-Toledo GmbH
- Stefan Olejiniczak
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURATION METHOD OF CONFIGURING A MEASUREMENT INSTRUMENT
- Publication number 20240385213
- Publication date Nov 21, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Julius SEEGER
- G01 - MEASURING TESTING
Information Patent Application
Current Sensing Device
- Publication number 20240230726
- Publication date Jul 11, 2024
- SMART ELECTRONICS INC.
- Jeong Bok Lee
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE
- Publication number 20240159830
- Publication date May 16, 2024
- LS ELECTRIC CO., LTD.
- Kihyeon KIM
- G01 - MEASURING TESTING
Information Patent Application
Current Sensing Device
- Publication number 20240133926
- Publication date Apr 25, 2024
- SMART ELECTRONICS INC.
- Jeong Bok Lee
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE INCLUDING AN NTEGRATED SHUNT RESISTOR
- Publication number 20240125818
- Publication date Apr 18, 2024
- MICROCHIP TECHNOLOGY INCORPORATED
- Gerald Steele
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE
- Publication number 20240069067
- Publication date Feb 29, 2024
- QUANTA COMPUTER INC.
- Wei-Chih HUNG
- G01 - MEASURING TESTING
Information Patent Application
EEG IMPEDANCE TEST CIRCUIT, METHOD, AND DEVICE
- Publication number 20240053385
- Publication date Feb 15, 2024
- KINGFAR INTERNATIONAL INC.
- Qichao ZHAO
- G01 - MEASURING TESTING
Information Patent Application
DETECTION AND GATING MODULE, BATTERY MANAGEMENT SYSTEM AND BATTERY...
- Publication number 20240036120
- Publication date Feb 1, 2024
- ZHUHAI MAIJU MICROELECTRONICS CO., LTD.
- Hao ZHOU
- G01 - MEASURING TESTING
Information Patent Application
DETECTION CIRCUIT AND APPARATUS BASED ON EQUIPOTENTIAL SHIELDING
- Publication number 20240036091
- Publication date Feb 1, 2024
- KINGFAR INTERNATIONAL INC.
- Qichao ZHAO
- G01 - MEASURING TESTING
Information Patent Application
AMPLIFIER CIRCUIT AND MEASUREMENT APPARATUS
- Publication number 20240027496
- Publication date Jan 25, 2024
- HIOKI E.E. CORPORATION
- Kazuaki HANEDA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AMPLIFIER CIRCUIT AND SENSOR CIRCUIT
- Publication number 20230318550
- Publication date Oct 5, 2023
- Kabushiki Kaisha Toshiba
- Akira YAMAUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INDICATOR LIGHT CIRCUIT CONFIGURED FOR MICRO-CURRENT AND MICRO-CURR...
- Publication number 20230280380
- Publication date Sep 7, 2023
- XIAMEN SOLEX HIGH-TECH INDUSTRIES CO., LTD.
- Boren Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING A PULSE INVERTER, CURRENT MEASURING DEVICE FOR...
- Publication number 20230243873
- Publication date Aug 3, 2023
- Audi AG
- Christoph MEIER
- G01 - MEASURING TESTING
Information Patent Application
AFE circuit and related gain amplifier
- Publication number 20230168282
- Publication date Jun 1, 2023
- NOVATEK MICROELECTRONICS CORP.
- Tzu-Wei Lin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DETECTION CIRCUIT FOR A NERVE STIMULATOR
- Publication number 20220317204
- Publication date Oct 6, 2022
- SCENERAY CO., LTD.
- Weiran Zhu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MEASUREMENT INPUT CIRCUIT AND MEASUREMENT DEVICE
- Publication number 20220120786
- Publication date Apr 21, 2022
- Rohde& Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Application
SELF-CALIBRATED INPUT VOLTAGE-AGNOSTIC REPLICA-BIASED CURRENT SENSI...
- Publication number 20220065901
- Publication date Mar 3, 2022
- Intel Corporation
- Nachiket Desai
- G01 - MEASURING TESTING
Information Patent Application
DETECTION AND PROTECTION CIRCUIT, POWER SUPPLY CIRCUIT, POWER SUPPL...
- Publication number 20210373587
- Publication date Dec 2, 2021
- ZTE CORPORATION
- Qian Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CURRENT DETECTION SYSTEM, CURRENT DETECTION METHOD, AND DETECTION A...
- Publication number 20210325433
- Publication date Oct 21, 2021
- Huawei Technologies Co., Ltd
- Yonghua WU
- G01 - MEASURING TESTING
Information Patent Application
MONITOR CIRCUIT FOR MONITORING A LIGHTNING PROTECTION COMPONENT
- Publication number 20210328583
- Publication date Oct 21, 2021
- SAFRAN ELECTRONICS & DEFENSE
- Olivier MELINE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Readout Circuit for Resistive and Capacitive Sensors
- Publication number 20210270872
- Publication date Sep 2, 2021
- INFINEON TECHNOLOGIES AG
- Richard Gaggl
- G01 - MEASURING TESTING
Information Patent Application
Devices, Systems and Processes for Capacitor Testing
- Publication number 20210231749
- Publication date Jul 29, 2021
- Dish Network L.L.C.
- Rodney Davis
- G01 - MEASURING TESTING
Information Patent Application
CURRENT MEASUREMENT DEVICE
- Publication number 20210190834
- Publication date Jun 24, 2021
- KOA Corporation
- Tamotsu ENDO
- G01 - MEASURING TESTING
Information Patent Application
SHUNT RESISTOR AVERAGING TECHNIQUES
- Publication number 20210048453
- Publication date Feb 18, 2021
- Analog Devices International Unlimited Company
- Hio Leong Chao
- G01 - MEASURING TESTING
Information Patent Application
LOW-GLITCH RANGE CHANGE TECHNIQUES
- Publication number 20210033644
- Publication date Feb 4, 2021
- Analog Devices, Inc.
- Stefano I. D'Aquino
- G01 - MEASURING TESTING

Structural combination of electric measuring instruments with basic electronic circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Indicator light circuit configured for micro-current and micro-curr...

Test device

Method for producing a pulse inverter, current measuring device for...

Current transducer

Detection circuit and apparatus based on equipotential shielding

Two-wire interface reference accelerometer with integrated mechanic...

AFE circuit and related gain amplifier

Current detection system, current detection method, and detection a...

Measurement input circuit and measurement device

Capacitance monitoring circuit for power backup systems

Detection and protection circuit, power supply circuit, power suppl...

Self-calibrated input voltage-agnostic replica-biased current sensi...

Electrostatic capacitance sensor

Detection circuit for a nerve stimulator

Control circuit for operating inductive load devices, a braking sys...

Devices, systems and processes for capacitor testing

Power supply for providing an electrical pulse to an electrical con...

Current measurement device

Monitor circuit for monitoring a lightning protection component

Test and measurement instrument having overpulsed power supply and...

Measurement input circuit and measurement device

Shunt resistor averaging techniques

Energization evaluation test equipment of a PWM converter input filter

Readout circuit for resistive and capacitive sensors

Active harmonic load pull impedance tuner

Switching circuit

Active harmonic load pull impedance tuner

Low-glitch range change techniques

Devices, systems and processes for capacitor testing

Short detection device, a short detection circuit and a display dev...

Patents Applicationslast 30 patents

PROBE HEAD FOR LED TEST SYSTEM

PROBE DEVICES AND PROBE CONTROL APPARATUS

MEASUREMENT SYSTEM

MULTICHANNEL TEST SYSTEM WITH GALVANIC COUPLING OF INTERMEDIATE CIR...

CIRCUIT FOR IMPEDANCE MEASUREMENTS

CONFIGURATION METHOD OF CONFIGURING A MEASUREMENT INSTRUMENT

Current Sensing Device

TEST DEVICE

Current Sensing Device

INTEGRATED CIRCUIT PACKAGE INCLUDING AN NTEGRATED SHUNT RESISTOR

TEST DEVICE

EEG IMPEDANCE TEST CIRCUIT, METHOD, AND DEVICE

DETECTION AND GATING MODULE, BATTERY MANAGEMENT SYSTEM AND BATTERY...

DETECTION CIRCUIT AND APPARATUS BASED ON EQUIPOTENTIAL SHIELDING

AMPLIFIER CIRCUIT AND MEASUREMENT APPARATUS

AMPLIFIER CIRCUIT AND SENSOR CIRCUIT

INDICATOR LIGHT CIRCUIT CONFIGURED FOR MICRO-CURRENT AND MICRO-CURR...

METHOD FOR PRODUCING A PULSE INVERTER, CURRENT MEASURING DEVICE FOR...

AFE circuit and related gain amplifier

DETECTION CIRCUIT FOR A NERVE STIMULATOR

MEASUREMENT INPUT CIRCUIT AND MEASUREMENT DEVICE

SELF-CALIBRATED INPUT VOLTAGE-AGNOSTIC REPLICA-BIASED CURRENT SENSI...

DETECTION AND PROTECTION CIRCUIT, POWER SUPPLY CIRCUIT, POWER SUPPL...

CURRENT DETECTION SYSTEM, CURRENT DETECTION METHOD, AND DETECTION A...

MONITOR CIRCUIT FOR MONITORING A LIGHTNING PROTECTION COMPONENT

Readout Circuit for Resistive and Capacitive Sensors

Devices, Systems and Processes for Capacitor Testing

CURRENT MEASUREMENT DEVICE

SHUNT RESISTOR AVERAGING TECHNIQUES

LOW-GLITCH RANGE CHANGE TECHNIQUES