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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 11,043,434
- Issue date Jun 22, 2021
- ABLIC INC.
- Hitomi Sakurai
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods involving adjustable circuit-stress test co...
- Patent number 10,901,023
- Issue date Jan 26, 2021
- NXP B.V.
- Jan-Peter Schat
- G01 - MEASURING TESTING
Information Patent Grant
Testing solid state devices before completing manufacture
- Patent number 10,784,172
- Issue date Sep 22, 2020
- Texas Instruments Incorporated
- Cody Michael Berger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device and semiconductor de...
- Patent number 10,580,708
- Issue date Mar 3, 2020
- ABLIC Inc.
- Hitomi Sakurai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Triaxial DC-AC connection system
- Patent number 9,983,228
- Issue date May 29, 2018
- KEITHLEY INSTRUMENTS, LLC
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Grant
Kernel based cluster fault analysis
- Patent number 9,891,267
- Issue date Feb 13, 2018
- NXP USA, INC.
- Nikolas Bradley Sumikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for battery protection
- Patent number 9,660,301
- Issue date May 23, 2017
- Xiaomi Inc.
- Zhongxiang Zheng
- G05 - CONTROLLING REGULATING
Information Patent Grant
Scalable highly available modular battery system
- Patent number 9,583,794
- Issue date Feb 28, 2017
- Dell International L.L.C.
- Jason D. Adrian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dielectric strength voltage testing method for electronics device
- Patent number 9,404,958
- Issue date Aug 2, 2016
- Canon Kabushiki Kaisha
- Tetsuya Nozaki
- G01 - MEASURING TESTING
Information Patent Grant
System for testing semiconductor modules
- Patent number 9,134,365
- Issue date Sep 15, 2015
- Samsung Electronics Co., Ltd.
- Min-Woo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Process parameter event monitoring system and method for process
- Patent number 7,038,279
- Issue date May 2, 2006
- Credence Technologies, Inc.
- Vladimir Kraz
- G01 - MEASURING TESTING
Information Patent Grant
Withstand voltage testing apparatus and automatic testing method th...
- Patent number 6,300,774
- Issue date Oct 9, 2001
- Samsung Electronics Co., Ltd.
- Joung-Su Lim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for dielectric testing of gloves
- Patent number 4,810,971
- Issue date Mar 7, 1989
- Emmitte F. Marable
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing
- Patent number 4,583,038
- Issue date Apr 15, 1986
- Standard Telephones and Cables, Plc
- Robert C. Chittick
- G01 - MEASURING TESTING
Information Patent Grant
Test set for transient protection devices
- Patent number 4,484,136
- Issue date Nov 20, 1984
- The United States of America as represented by the Secretary of the Army
- John E. B. Tuttle
- G01 - MEASURING TESTING
Information Patent Grant
Method for destructive testing of dielectric ceramic capacitors
- Patent number 4,399,401
- Issue date Aug 16, 1983
- Centre Engineering, Inc.
- Solomon Levinson
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for dielectric breakdown caused by tracking pheno...
- Patent number 4,339,708
- Issue date Jul 13, 1982
- Matsushita Electric Industrial Co., Ltd.
- Mitsuru Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method and instrument for testing the operating characteristics of...
- Patent number 4,267,503
- Issue date May 12, 1981
- Marlin D. Westra
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for rapidly testing electrochemical cells
- Patent number 4,204,161
- Issue date May 20, 1980
- General Electric Company
- John J. Strickland
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Capacitor testing apparatus
- Patent number 4,184,112
- Issue date Jan 15, 1980
- Elbert W. Cox
- G01 - MEASURING TESTING
Information Patent Grant
Capacitor test apparatus and method
- Patent number 3,943,439
- Issue date Mar 9, 1976
- Zehntel, Inc.
- Douglas W. Raymond
- G01 - MEASURING TESTING
Information Patent Grant
3629702
- Patent number 3,629,702
- Issue date Dec 21, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3478876
- Patent number 3,478,876
- Issue date Nov 18, 1969
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
3364421
- Patent number 3,364,421
- Issue date Jan 16, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3165674
- Patent number 3,165,674
- Issue date Jan 12, 1965
- G01 - MEASURING TESTING
Information Patent Grant
3094212
- Patent number 3,094,212
- Issue date Jun 18, 1963
- G01 - MEASURING TESTING
Information Patent Grant
3024906
- Patent number 3,024,906
- Issue date Mar 13, 1962
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
3016142
- Patent number 3,016,142
- Issue date Jan 9, 1962
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
3010577
- Patent number 3,010,577
- Issue date Nov 28, 1961
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
2859871
- Patent number 2,859,871
- Issue date Nov 11, 1958
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
- Publication number 20200152529
- Publication date May 14, 2020
- ABLIC Inc.
- Hitomi SAKURAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES AND METHODS INVOLVING ADJUSTABLE CIRCUIT-STRESS TEST CO...
- Publication number 20200049756
- Publication date Feb 13, 2020
- NXP B.V.
- Jan-Peter SCHAT
- G01 - MEASURING TESTING
Information Patent Application
TESTING SOLID STATE DEVICES BEFORE COMPLETING MANUFACTURE
- Publication number 20190206746
- Publication date Jul 4, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Cody Michael BERGER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DE...
- Publication number 20180240721
- Publication date Aug 23, 2018
- ABLIC Inc.
- Hitomi SAKURAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR TESTING SEMICONDUCTOR MODULES
- Publication number 20140166544
- Publication date Jun 19, 2014
- Samsung Electronics Co., Ltd.
- Min-Woo Kim
- G01 - MEASURING TESTING
Information Patent Application
DIELECTRIC STRENGTH VOLTAGE TESTING METHOD FOR ELECTRONICS DEVICE
- Publication number 20130257451
- Publication date Oct 3, 2013
- Canon Kabushiki Kaisha
- Tetsuya Nozaki
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a reliability testing
- Publication number 20060208754
- Publication date Sep 21, 2006
- AGILENT TECHNOLOGIES, INC.
- Yasuhiro Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Process parameter event monitoring system and method for process
- Publication number 20040082083
- Publication date Apr 29, 2004
- Vladimir Kraz
- G01 - MEASURING TESTING

Subjecting similar articles in turn to test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of manufacturing a semiconductor device

Apparatuses and methods involving adjustable circuit-stress test co...

Testing solid state devices before completing manufacture

Method of manufacturing a semiconductor device and semiconductor de...

Triaxial DC-AC connection system

Kernel based cluster fault analysis

Methods and devices for battery protection

Scalable highly available modular battery system

Dielectric strength voltage testing method for electronics device

System for testing semiconductor modules

Process parameter event monitoring system and method for process

Withstand voltage testing apparatus and automatic testing method th...

Apparatus for dielectric testing of gloves

Electrical testing

Test set for transient protection devices

Method for destructive testing of dielectric ceramic capacitors

Testing apparatus for dielectric breakdown caused by tracking pheno...

Method and instrument for testing the operating characteristics of...

Apparatus for rapidly testing electrochemical cells

Capacitor testing apparatus

Capacitor test apparatus and method

3629702

3478876

3364421

3165674

3094212

3024906

3016142

3010577

2859871

Patents Applicationslast 30 patents

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE

APPARATUSES AND METHODS INVOLVING ADJUSTABLE CIRCUIT-STRESS TEST CO...

TESTING SOLID STATE DEVICES BEFORE COMPLETING MANUFACTURE

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DE...

SYSTEM FOR TESTING SEMICONDUCTOR MODULES

DIELECTRIC STRENGTH VOLTAGE TESTING METHOD FOR ELECTRONICS DEVICE

Method and apparatus for a reliability testing

Process parameter event monitoring system and method for process