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G01R31/01

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/01Subjecting similar articles in turn to test

Industries

Patents Grantslast 30 patents

Information Patent Grant
Capacitor inspection method and inspection apparatus used for same
- Patent number 12,117,478
- Issue date Oct 15, 2024
- YURI HOLDINGS CO., LTD.
- Reijiro Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Margin test data tagging and predictive expected margins
- Patent number 12,061,232
- Issue date Aug 13, 2024
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer ceramic capacitor having ultra-broadband performance
- Patent number 11,984,268
- Issue date May 14, 2024
- KYOCERA AVX Components Corporation
- Marianne Berolini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-flip semiconductor die sorter tool
- Patent number 11,915,954
- Issue date Feb 27, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chih-Hung Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,892,493
- Issue date Feb 6, 2024
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for real time outlier detection and product re-bi...
- Patent number 11,852,668
- Issue date Dec 26, 2023
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,726,126
- Issue date Aug 15, 2023
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus to improve detection of capacitors implemente...
- Patent number 11,614,499
- Issue date Mar 28, 2023
- Texas Instruments Incorporated
- Siang Tong Tan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Multi-flip semiconductor die sorter tool
- Patent number 11,569,105
- Issue date Jan 31, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chih-Hung Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring capacitor faults in a capacitor...
- Patent number 11,525,850
- Issue date Dec 13, 2022
- GENTEC INC.
- Benjamin Couillard
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Multilayer ceramic capacitor having ultra-broadband performance
- Patent number 11,495,406
- Issue date Nov 8, 2022
- KYOCERA AVX Components Corporation
- Marianne Berolini
- G01 - MEASURING TESTING
Information Patent Grant
Screening method for electrolytic capacitors that maintains individ...
- Patent number 11,448,680
- Issue date Sep 20, 2022
- KYOCERA AVX Components Corporation
- Howard Bernier
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle electricity storage device
- Patent number 11,420,608
- Issue date Aug 23, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Takeshi Umeda
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Capacitor testing device and testing method thereof
- Patent number 11,402,420
- Issue date Aug 2, 2022
- SUZHOU APPARATUS SCIENCE ACADEMY CO., LTD.
- Delin Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for real time outlier detection and product re-bi...
- Patent number 11,402,419
- Issue date Aug 2, 2022
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and assessment unit for determining the remaining service li...
- Patent number 11,346,893
- Issue date May 31, 2022
- ZIEHL-ABEGG SE
- Marco Schnell
- G01 - MEASURING TESTING
Information Patent Grant
Indicator for failed capacitor unit
- Patent number 11,333,715
- Issue date May 17, 2022
- General Electric Technology GmbH
- Tuomo Rinne
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for verifying electronic circuits
- Patent number 11,270,056
- Issue date Mar 8, 2022
- BQR RELIABILITY ENGINEERING LTD.
- Yizhak Bot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Current measurement apparatus including charge/discharge means and...
- Patent number 11,255,886
- Issue date Feb 22, 2022
- PHOSPHIL INC.
- Byung Kyu Kim
- G01 - MEASURING TESTING
Information Patent Grant
State detecting system and state detecting method
- Patent number 11,156,650
- Issue date Oct 26, 2021
- Hitachi, Ltd.
- Ryohei Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and computer program product for defect detection...
- Patent number 11,105,839
- Issue date Aug 31, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining an electrical capacitance in an intermediate...
- Patent number 11,072,299
- Issue date Jul 27, 2021
- Robert Bosch GmbH
- Jochen Fassnacht
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Driver circuit capable of detecting abnormality of capacitive load
- Patent number 11,070,204
- Issue date Jul 20, 2021
- Rohm Co., Ltd.
- Hiroyuki Inokuchi
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive protection method for impedance of parallel capacitors
- Patent number 11,063,424
- Issue date Jul 13, 2021
- NR ELECTRIC CO., LTD
- Zhongpeng Song
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting light-emitting diodes and inspection apparatus
- Patent number 11,002,783
- Issue date May 11, 2021
- Industrial Technology Research Institute
- Yan-Rung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Fully differential current sensing
- Patent number 10,996,256
- Issue date May 4, 2021
- Texas Instruments Incorporated
- Sudeep Banerji
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Self-test for a piezoelectric device
- Patent number 10,996,254
- Issue date May 4, 2021
- Honeywell International Inc.
- David Cada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing semiconductor packages
- Patent number 10,962,581
- Issue date Mar 30, 2021
- Samsung Electronics Co., Ltd.
- Ji Nyeong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Calibration system and calibrating method
- Patent number 10,957,471
- Issue date Mar 23, 2021
- Tyco Electronics (Shanghai) Co. Ltd.
- Fengchun Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus and testing method of vaporizers of electronic ci...
- Patent number 10,955,454
- Issue date Mar 23, 2021
- Sluis Cigar Machinery B.V.
- Oscar Slurink
- A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES

Patents Applicationslast 30 patents

Information Patent Application
HEALTH MONITORING OF INPUT FILTER FOR DEGRADATION DETECTION
- Publication number 20240353826
- Publication date Oct 24, 2024
- HAMILTON SUNDSTRAND CORPORATION
- Ali Khalid AL-KARAGHOULI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TUNING AN ELECTROCHEMICAL DOUBLE LAYER TO GENERATE SOUND...
- Publication number 20240319249
- Publication date Sep 26, 2024
- Wisconsin Alumni Research Foundation
- Marcel Schreier
- G01 - MEASURING TESTING
Information Patent Application
CAPACITOR TEST
- Publication number 20240288480
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Marco REDAELLI
- G01 - MEASURING TESTING
Information Patent Application
Power Conversion Apparatus, Deterioration Determination Method for...
- Publication number 20240264213
- Publication date Aug 8, 2024
- HITACHI INDUSTRIAL EQUIPMENT SYSTEMS CO., LTD.
- Mendez Mauricio TOBON
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD AND CONTROL ARRANGEMENT FOR MASS SCALE PRODUCTION TESTING OF...
- Publication number 20240255580
- Publication date Aug 1, 2024
- NORTHVOLT AB
- Sean Stephenson
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...
- Publication number 20240159813
- Publication date May 16, 2024
- Optimal Plus
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
MULTI-FLIP SEMICONDUCTOR DIE SORTER TOOL
- Publication number 20240162064
- Publication date May 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Hung HUANG
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
System for Testing Electrical Products in a Closed Circuit
- Publication number 20240125839
- Publication date Apr 18, 2024
- CINERGIA POWER SOLUTIONS, S.L.
- Joaquim Lopez Mestre
- G01 - MEASURING TESTING
Information Patent Application
CAPACITOR INSPECTION METHOD AND INSPECTION APPARATUS USED FOR SAME
- Publication number 20240103062
- Publication date Mar 28, 2024
- YURI HOLDINGS CO., LTD.
- Reijiro MATSUO
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING PARAMETERS OF A FILTER CIRCUIT
- Publication number 20240069085
- Publication date Feb 29, 2024
- ABB Schweiz AG
- Eduardo Rohr
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20230393185
- Publication date Dec 7, 2023
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR USE IN HANDLING COMPONENTS
- Publication number 20230393220
- Publication date Dec 7, 2023
- ELECTRO SCIENTIFIC INDUSTRIES, INC.
- Yonghang FU
- G01 - MEASURING TESTING
Information Patent Application
EXAMINATION METHOD AND MANUFACTURING METHOD FOR ASSEMBLED BATTERY
- Publication number 20230358813
- Publication date Nov 9, 2023
- APB CORPORATION
- Yusuke NAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-FLIP SEMICONDUCTOR DIE SORTER TOOL
- Publication number 20230170234
- Publication date Jun 1, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Hung HUANG
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD FOR CONFECTIONING RESISTORS, RESISTOR, AND HEATING DEVICE
- Publication number 20230162895
- Publication date May 25, 2023
- BorgWarner Inc.
- Julio Abraham Carrera Garcia
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Multilayer Ceramic Capacitor Having Ultra-Broadband Performance
- Publication number 20230068137
- Publication date Mar 2, 2023
- KYOCERA AVX Components Corporation
- Marianne Berolini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...
- Publication number 20220349930
- Publication date Nov 3, 2022
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
REDUCED IMPEDANCE VARIATION IN A MODULAR 2-TERMINAL TERMINAL CONTAC...
- Publication number 20220299555
- Publication date Sep 22, 2022
- ELECTRO SCIENTIFIC INDUSTRIES, INC.
- Doug GARCIA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20220099725
- Publication date Mar 31, 2022
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
MARGIN TEST DATA TAGGING AND PREDICTIVE EXPECTED MARGINS
- Publication number 20220091185
- Publication date Mar 24, 2022
- Tektronix, Inc.
- Sam J. Strickling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR VERIFYING ELECTRONIC CIRCUITS
- Publication number 20220043958
- Publication date Feb 10, 2022
- BQR RELIABILITY ENGINEERING LTD.
- Yizhak BOT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-FLIP SEMICONDUCTOR DIE SORTER TOOL
- Publication number 20210391197
- Publication date Dec 16, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Chih-Hung HUANG
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
CAPACITOR TESTING DEVICE AND TESTING METHOD THEREOF
- Publication number 20210373062
- Publication date Dec 2, 2021
- SUZHOU APPARATUS SCIENCE ACADEMY CO., LTD.
- Delin HU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR USE IN HANDLING COMPONENTS
- Publication number 20210333313
- Publication date Oct 28, 2021
- Electro Scientific Industries, Inc.
- Douglas Garcia
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
Screening Method for Electrolytic Capacitors that Maintains Individ...
- Publication number 20210302486
- Publication date Sep 30, 2021
- AVX CORPORATION
- Howard Bernier
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING A MALFUNCTION OF A VOLTAGE-LIMITING CIRCUIT AN...
- Publication number 20210247434
- Publication date Aug 12, 2021
- Sébastien CHIABO
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20210048396
- Publication date Feb 18, 2021
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...
- Publication number 20210018450
- Publication date Jan 21, 2021
- KLA Corporation
- Tom Marivoet
- G01 - MEASURING TESTING
Information Patent Application
REUSABLE PROBE CARD WITH REMOVABLE PROBE INSERT
- Publication number 20200386787
- Publication date Dec 10, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Yazdi Dinshaw Contractor
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ASSESSMENT UNIT FOR DETERMINING THE REMAINING SERVICE LI...
- Publication number 20200363480
- Publication date Nov 19, 2020
- Ziehl-Abegg SE
- Marco SCHNELL
- G01 - MEASURING TESTING

Subjecting similar articles in turn to test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Capacitor inspection method and inspection apparatus used for same

Margin test data tagging and predictive expected margins

Multilayer ceramic capacitor having ultra-broadband performance

Multi-flip semiconductor die sorter tool

Apparatus, method and computer program product for defect detection...

Method and system for real time outlier detection and product re-bi...

Apparatus, method and computer program product for defect detection...

Methods and apparatus to improve detection of capacitors implemente...

Multi-flip semiconductor die sorter tool

Method and apparatus for monitoring capacitor faults in a capacitor...

Multilayer ceramic capacitor having ultra-broadband performance

Screening method for electrolytic capacitors that maintains individ...

Vehicle electricity storage device

Capacitor testing device and testing method thereof

Method and system for real time outlier detection and product re-bi...

Method and assessment unit for determining the remaining service li...

Indicator for failed capacitor unit

Method and apparatus for verifying electronic circuits

Current measurement apparatus including charge/discharge means and...

State detecting system and state detecting method

Apparatus, method and computer program product for defect detection...

Method for determining an electrical capacitance in an intermediate...

Driver circuit capable of detecting abnormality of capacitive load

Adaptive protection method for impedance of parallel capacitors

Method for inspecting light-emitting diodes and inspection apparatus

Fully differential current sensing

Self-test for a piezoelectric device

Apparatus for testing semiconductor packages

Calibration system and calibrating method

Testing apparatus and testing method of vaporizers of electronic ci...

Patents Applicationslast 30 patents

HEALTH MONITORING OF INPUT FILTER FOR DEGRADATION DETECTION

METHOD FOR TUNING AN ELECTROCHEMICAL DOUBLE LAYER TO GENERATE SOUND...

CAPACITOR TEST

Power Conversion Apparatus, Deterioration Determination Method for...

METHOD AND CONTROL ARRANGEMENT FOR MASS SCALE PRODUCTION TESTING OF...

METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...

MULTI-FLIP SEMICONDUCTOR DIE SORTER TOOL

System for Testing Electrical Products in a Closed Circuit

CAPACITOR INSPECTION METHOD AND INSPECTION APPARATUS USED FOR SAME

DETERMINING PARAMETERS OF A FILTER CIRCUIT

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

SYSTEMS AND METHODS FOR USE IN HANDLING COMPONENTS

EXAMINATION METHOD AND MANUFACTURING METHOD FOR ASSEMBLED BATTERY

MULTI-FLIP SEMICONDUCTOR DIE SORTER TOOL

METHOD FOR CONFECTIONING RESISTORS, RESISTOR, AND HEATING DEVICE

Multilayer Ceramic Capacitor Having Ultra-Broadband Performance

METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...

REDUCED IMPEDANCE VARIATION IN A MODULAR 2-TERMINAL TERMINAL CONTAC...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

MARGIN TEST DATA TAGGING AND PREDICTIVE EXPECTED MARGINS

METHOD AND APPARATUS FOR VERIFYING ELECTRONIC CIRCUITS

MULTI-FLIP SEMICONDUCTOR DIE SORTER TOOL

CAPACITOR TESTING DEVICE AND TESTING METHOD THEREOF

SYSTEMS AND METHODS FOR USE IN HANDLING COMPONENTS

Screening Method for Electrolytic Capacitors that Maintains Individ...

METHOD FOR DETECTING A MALFUNCTION OF A VOLTAGE-LIMITING CIRCUIT AN...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION...

REUSABLE PROBE CARD WITH REMOVABLE PROBE INSERT

METHOD AND ASSESSMENT UNIT FOR DETERMINING THE REMAINING SERVICE LI...