support of sample holder

Industry

CPC
G01N2223/309

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/309support of sample holder

Industries

Patents Grantslast 30 patents

Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 12,153,001
- Issue date Nov 26, 2024
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
Sample rotation system and method
- Patent number 12,085,522
- Issue date Sep 10, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kuojung Chiu
- G01 - MEASURING TESTING
Information Patent Grant
Battery holder device and battery test system including the same
- Patent number 12,061,157
- Issue date Aug 13, 2024
- SK ON CO., LTD.
- Hye Ju Jang
- G01 - MEASURING TESTING
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of testing formation samples using a rock hydro...
- Patent number 11,971,369
- Issue date Apr 30, 2024
- Halliburton Energy Services, Inc.
- Abraham S. Grader
- G01 - MEASURING TESTING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and non-transitory recording medium storing in...
- Patent number 11,933,745
- Issue date Mar 19, 2024
- Kabushiki Kaisha Toshiba
- Yuka Watanabe
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
Ball-mapping system comprising a sample stage and a sample holder f...
- Patent number 11,846,593
- Issue date Dec 19, 2023
- PROTO PATENTS LTD.
- James Pineault
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic support for skins and inspection method of skin
- Patent number 11,821,888
- Issue date Nov 21, 2023
- Epica International, Inc.
- Damiano Fortuna
- C14 - SKINS HIDES PELTS LEATHER
Information Patent Grant
Methods of inspecting samples with multiple beams of charged particles
- Patent number 11,815,473
- Issue date Nov 14, 2023
- ASML Netherlands B.V.
- Kuo-Feng Tseng
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer comprising a measurement device, sample...
- Patent number 11,788,977
- Issue date Oct 17, 2023
- S himadzu Corporation
- Yuji Morihisa
- G01 - MEASURING TESTING
Information Patent Grant
Specimen radiography system comprising cabinet and a specimen drawe...
- Patent number 11,730,434
- Issue date Aug 22, 2023
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 11,686,692
- Issue date Jun 27, 2023
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
CT scanner and method for performing a CT examination of an object
- Patent number 11,609,189
- Issue date Mar 21, 2023
- BIOMETIC S.R.L.
- Thomas Prenn
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Sample holding device for X-ray analysis
- Patent number 11,525,790
- Issue date Dec 13, 2022
- Rigaku Corporation
- Koichiro Ito
- G01 - MEASURING TESTING
Information Patent Grant
Shielded X-ray radiation apparatus
- Patent number 11,456,147
- Issue date Sep 27, 2022
- Chrysos Corporation Limited
- James Tickner
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer and X-ray fluorescence analysis method
- Patent number 11,391,680
- Issue date Jul 19, 2022
- Shimadzu Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Grant
Tomographic imaging system and connection assembly thereof
- Patent number 11,378,528
- Issue date Jul 5, 2022
- Delta Electronics, Inc.
- Fu-Xuan Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Tool for TEM grid applications
- Patent number 11,373,840
- Issue date Jun 28, 2022
- Norbert Kuhnmünch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material testing machine and radiation CT device
- Patent number 11,353,410
- Issue date Jun 7, 2022
- SHIMADZU TECHNO-RESEARCH, INC.
- Takashi Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic support for skins and inspection method of skin
- Patent number 11,199,531
- Issue date Dec 14, 2021
- Epica International, Inc.
- Damiano Fortuna
- C14 - SKINS HIDES PELTS LEATHER
Information Patent Grant
X-ray imaging system
- Patent number 11,150,202
- Issue date Oct 19, 2021
- Konica Minolta, Inc.
- Yasunori Tsuboi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Specimen radiography system comprising cabinet and a specimen drawe...
- Patent number 11,083,426
- Issue date Aug 10, 2021
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods and systems of testing formation samples using a rock hydro...
- Patent number 11,085,887
- Issue date Aug 10, 2021
- Halliburton Energy Services, Inc.
- Abraham S. Grader
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Vacuum chuck for clamping workpieces, measuring devices and method...
- Patent number 11,062,934
- Issue date Jul 13, 2021
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Werner Volz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME
- Publication number 20240345004
- Publication date Oct 17, 2024
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
Manipulating and Inspecting Large and Heavy Components
- Publication number 20240310303
- Publication date Sep 19, 2024
- Baker Hughes Holdings LLC
- Michael Wüstenbecker
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20240288391
- Publication date Aug 29, 2024
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Imaging Apparatus and Subject Holding Mechanism
- Publication number 20240230559
- Publication date Jul 11, 2024
- Shimadzu Corporation
- Masashi HAYAKAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF SCANNING A COMPONENT
- Publication number 20240201109
- Publication date Jun 20, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
Laue Measurement System With Turntable And Method Of Operating The...
- Publication number 20240151662
- Publication date May 9, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- G01 - MEASURING TESTING
Information Patent Application
SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
- Publication number 20240125718
- Publication date Apr 18, 2024
- Silanna UV Technologies Pte Ltd
- Petar Atanackovic
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...
- Publication number 20240102945
- Publication date Mar 28, 2024
- Shimadzu Corporation
- Kana KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR A SPECIMEN CONTAINER FOR USE IN CABINET X-RAY...
- Publication number 20240085284
- Publication date Mar 14, 2024
- KUB Technologies Inc.
- Vikram Butani
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...
- Publication number 20230404499
- Publication date Dec 21, 2023
- HOLOGIC, INC.
- Kenneth DEFREITAS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20230384245
- Publication date Nov 30, 2023
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY INSPECTION SYSTEM, AN X-RAY IMAGING ACCESSORY, A SAMPLE SU...
- Publication number 20230304946
- Publication date Sep 28, 2023
- Nordson Corporation
- Bill Walker
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS
- Publication number 20230258584
- Publication date Aug 17, 2023
- MALVERN PANALYTICAL B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Application
Multi-fraction sample holder for 3D particle analysis
- Publication number 20230146198
- Publication date May 11, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...
- Publication number 20230031147
- Publication date Feb 2, 2023
- Merck Patent GmbH
- Carolina VON ESSEN
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ROTATION SYSTEM AND METHOD
- Publication number 20230012319
- Publication date Jan 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- KUOJUNG CHIU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20220260508
- Publication date Aug 18, 2022
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20220178851
- Publication date Jun 9, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Device and Defect Inspection Method
- Publication number 20220107280
- Publication date Apr 7, 2022
- Hitachi High-Tech Corporation
- Kentaro OHIRA
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC SUPPORT FOR SKINS AND INSPECTION METHOD OF SKIN
- Publication number 20220099652
- Publication date Mar 31, 2022
- Epica International, Inc.
- Damiano Fortuna
- C14 - SKINS HIDES PELTS LEATHER
Information Patent Application
INDUSTRIAL X-RAY WORKPIECE MEASURING SYSTEM AND METHOD FOR OPERATIN...
- Publication number 20220050067
- Publication date Feb 17, 2022
- Intom GmbH
- Severin Ebner
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...
- Publication number 20220039766
- Publication date Feb 10, 2022
- HOLOGIC, INC.
- Kenneth DEFREITAS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SAMPLE HOLDER, SYSTEM AND METHOD
- Publication number 20210404977
- Publication date Dec 30, 2021
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Application
CHARGE-RESISTANT EPOXY RESINS FOR ELECTRON MICROSCOPY APPLICATIONS
- Publication number 20210333177
- Publication date Oct 28, 2021
- The Regents of the University of California
- Thomas Deerinck
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
METHODS AND SYSTEMS OF TESTING FORMATION SAMPLES USING A ROCK HYDRO...
- Publication number 20210325318
- Publication date Oct 21, 2021
- Halliburton Energy Services, Inc.
- Abraham S. Grader
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DUAL-ARM CLAMPING TYPE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPY...
- Publication number 20210208090
- Publication date Jul 8, 2021
- INSTITUTE OF MICROBIOLOGY, CHINESE ACADEMY OF SCIENCES
- Jingnan Liang
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC HOLDER FOR IMMUNOELECTRON MICROSCOPY GRIDS
- Publication number 20210208088
- Publication date Jul 8, 2021
- INSTITUTE OF MICROBIOLOGY, CHINESE ACADEMY OF SCIENCES
- Jingnan Liang
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND NON-TRANSITORY RECORDING MEDIUM STORING IN...
- Publication number 20210181124
- Publication date Jun 17, 2021
- Kabushiki Kaisha Toshiba
- Yuka WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDING DEVICE FOR X-RAY ANALYSIS
- Publication number 20210048398
- Publication date Feb 18, 2021
- Rigaku Corporation
- Koichiro Ito
- G01 - MEASURING TESTING

support of sample holder

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High throughput 3D x-ray imaging system using a transmission x-ray...

Sample rotation system and method

Battery holder device and battery test system including the same

System to inspect, modify or analyze a region of interest of a samp...

Sample holder, system and method

Methods and systems of testing formation samples using a rock hydro...

Ore component analysis device and method

Device for hosting a probe solution of molecules in a plurality of...

Inspection apparatus and non-transitory recording medium storing in...

Sample mounting system for an X-ray analysis apparatus

Ball-mapping system comprising a sample stage and a sample holder f...

Diagnostic support for skins and inspection method of skin

Methods of inspecting samples with multiple beams of charged particles

X-ray spectrometer and methods for use

Apparatuses and methods for combined simultaneous analyses of mater...

X-ray fluorescence analyzer comprising a measurement device, sample...

Specimen radiography system comprising cabinet and a specimen drawe...

High throughput 3D x-ray imaging system using a transmission x-ray...

CT scanner and method for performing a CT examination of an object

Sample holding device for X-ray analysis

Shielded X-ray radiation apparatus

X-ray fluorescence analyzer and X-ray fluorescence analysis method

Tomographic imaging system and connection assembly thereof

Tool for TEM grid applications

Material testing machine and radiation CT device

Diagnostic support for skins and inspection method of skin

X-ray imaging system

Specimen radiography system comprising cabinet and a specimen drawe...

Methods and systems of testing formation samples using a rock hydro...

Vacuum chuck for clamping workpieces, measuring devices and method...

Patents Applicationslast 30 patents

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME

Manipulating and Inspecting Large and Heavy Components

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

X-Ray Imaging Apparatus and Subject Holding Mechanism

METHOD OF SCANNING A COMPONENT

Laue Measurement System With Turntable And Method Of Operating The...

SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE

X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...

SYSTEM AND METHOD FOR A SPECIMEN CONTAINER FOR USE IN CABINET X-RAY...

SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

AN X-RAY INSPECTION SYSTEM, AN X-RAY IMAGING ACCESSORY, A SAMPLE SU...

SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS

Multi-fraction sample holder for 3D particle analysis

SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...

SAMPLE ROTATION SYSTEM AND METHOD

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

Defect Inspection Device and Defect Inspection Method

DIAGNOSTIC SUPPORT FOR SKINS AND INSPECTION METHOD OF SKIN

INDUSTRIAL X-RAY WORKPIECE MEASURING SYSTEM AND METHOD FOR OPERATIN...

SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...

SAMPLE HOLDER, SYSTEM AND METHOD

CHARGE-RESISTANT EPOXY RESINS FOR ELECTRON MICROSCOPY APPLICATIONS

METHODS AND SYSTEMS OF TESTING FORMATION SAMPLES USING A ROCK HYDRO...

DUAL-ARM CLAMPING TYPE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPY...

MAGNETIC HOLDER FOR IMMUNOELECTRON MICROSCOPY GRIDS

INSPECTION APPARATUS AND NON-TRANSITORY RECORDING MEDIUM STORING IN...

SAMPLE HOLDING DEVICE FOR X-RAY ANALYSIS