Surface alteration

Industry

CPC
H01J2237/2067

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2067Surface alteration

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Patents Grantslast 30 patents

Information Patent Grant
Device with at least one adjustable sample holder and method of cha...
- Patent number 11,476,080
- Issue date Oct 18, 2022
- TESCAN Brno, s.r.o.
- Pavel Dolezel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analyzing surface modification of a specimen in a charged...
- Patent number 10,811,223
- Issue date Oct 20, 2020
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for using multimodal imaging to determine struc...
- Patent number 10,707,052
- Issue date Jul 7, 2020
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced FIB-SEM systems for large-volume 3D imaging
- Patent number 10,600,615
- Issue date Mar 24, 2020
- Howard Hughes Medical Institute
- C. Shan Xu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and method for using multimodal imaging to determine struct...
- Patent number 10,446,368
- Issue date Oct 15, 2019
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for acquiring image and ion beam apparatus
- Patent number 10,276,343
- Issue date Apr 30, 2019
- Tomokazu Kozakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of modifying a sample surface layer from a microscopic sample
- Patent number 10,105,734
- Issue date Oct 23, 2018
- FEI Company
- Tomas Vystavel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,318,303
- Issue date Apr 19, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam microscope
- Patent number 9,261,360
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- G01 - MEASURING TESTING
Information Patent Grant
Producing images of a specimen
- Patent number 8,957,371
- Issue date Feb 17, 2015
- Carl Zeiss Microscopy GmbH
- Elke Haustein
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for ion beam processing of surfaces
- Patent number 8,790,498
- Issue date Jul 29, 2014
- Roth & Rau AG
- Joachim Mai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of preparing a transmission electron microscope sample and a...
- Patent number 8,191,168
- Issue date May 29, 2012
- SII NanoTechnology Inc.
- Xin Man
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample decontamination
- Patent number 8,013,300
- Issue date Sep 6, 2011
- Carl Zeiss NTS, LLC
- Lewis A. Stern
- G01 - MEASURING TESTING
Information Patent Grant
MEMS nanoindenter
- Patent number 7,654,159
- Issue date Feb 2, 2010
- Nanofactory Instruments AB
- Peter Enoksson
- G01 - MEASURING TESTING
Information Patent Grant
Systems configured to reduce distortion of a resist during a metrol...
- Patent number 7,304,302
- Issue date Dec 4, 2007
- KLA-Tencor Technologies Corp.
- Peter Nunan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of stabilizing measurement of ArF resist in CD-SEM
- Patent number 7,015,468
- Issue date Mar 21, 2006
- KLA-Tencor Technologies Corporation
- Amir Azordegan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device inspecting apparatus
- Patent number 6,714,289
- Issue date Mar 30, 2004
- Suruga Seiki Co., Ltd.
- Koshi Haraguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused particle beam systems and methods using a tilt column
- Patent number 6,497,194
- Issue date Dec 24, 2002
- FEI Company
- Charles J. Libby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process and device for ion thinning in a high resolution transmissi...
- Patent number 6,218,663
- Issue date Apr 17, 2001
- NMI Naturwissenschaftliches und Medizinisches
- Wilfried Nisch
- G01 - MEASURING TESTING
Information Patent Grant
Focused particle beam systems and methods using a tilt column
- Patent number 6,039,000
- Issue date Mar 21, 2000
- Micrion Corporation
- Charles J. Libby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam preparation device for electron microscopy
- Patent number 5,986,264
- Issue date Nov 16, 1999
- Bal-Tec A.G.
- Wolfgang Grunewald
- G01 - MEASURING TESTING
Information Patent Grant
Focused charged beam apparatus, and its processing and observation...
- Patent number 5,525,806
- Issue date Jun 11, 1996
- Seiko Instruments Inc.
- Koji Iwasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Sample Preparation
- Publication number 20240426717
- Publication date Dec 26, 2024
- FEI Company
- Jakub Kuba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PROCESSING ION BEAM BASED ON OPTICAL MICROSCOPY IMAGING
- Publication number 20240112880
- Publication date Apr 4, 2024
- Institute of Biophysics, Chinese Academy of Sciences
- Tao XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device with at Least One Adjustable Sample Holder and Method of Cha...
- Publication number 20210384005
- Publication date Dec 9, 2021
- TESCAN Brno, s.r.o.
- Pavel Dolezel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...
- Publication number 20200020507
- Publication date Jan 16, 2020
- Atomnaut Inc.
- Peter V. LIDDICOAT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...
- Publication number 20190074160
- Publication date Mar 7, 2019
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...
- Publication number 20190051492
- Publication date Feb 14, 2019
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING AND ANALYZING AN OBJECT AS WELL AS PARTICLE BE...
- Publication number 20150214004
- Publication date Jul 30, 2015
- CARL ZEISS MICROSCOPY GMBH
- Giuseppe Pavia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150060695
- Publication date Mar 5, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...
- Publication number 20140007307
- Publication date Jan 2, 2014
- Brian Roberts Routh
- B82 - NANO-TECHNOLOGY
Information Patent Application
SAMPLE OBSERVATION APPARATUS AND METHOD OF MARKING
- Publication number 20130134308
- Publication date May 30, 2013
- Hitachi High-Technologies Corporation
- Fumiaki ENDO
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Microscope
- Publication number 20120327213
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- G01 - MEASURING TESTING
Information Patent Application
Producing images of a specimen
- Publication number 20110292385
- Publication date Dec 1, 2011
- Elke Haustein
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DECONTAMINATION
- Publication number 20090314939
- Publication date Dec 24, 2009
- Carl Zeiss SMT Inc.
- Lewis A. Stern
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING A TRANSMISSION ELECTRON MICROSCOPE SAMPLE AND A...
- Publication number 20090119807
- Publication date May 7, 2009
- Xin Man
- G01 - MEASURING TESTING
Information Patent Application
Mems Nanoindenter
- Publication number 20080276727
- Publication date Nov 13, 2008
- NANOFACTORY INSTRUMENTS AB
- Peter Enoksson
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Ion Beam Processing of Surfaces
- Publication number 20080110745
- Publication date May 15, 2008
- ROTH & RAU AG
- Joachim Mai
- B82 - NANO-TECHNOLOGY
Information Patent Application
Charged particle beam system and its specimen holder
- Publication number 20080093565
- Publication date Apr 24, 2008
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN
- Publication number 20070194230
- Publication date Aug 23, 2007
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTING APPARATUS
- Publication number 20040016888
- Publication date Jan 29, 2004
- SURUGA SEIKI CO., LTD.
- Koshi Haraguchi
- H01 - BASIC ELECTRIC ELEMENTS

Surface alteration

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device with at least one adjustable sample holder and method of cha...

Method of analyzing surface modification of a specimen in a charged...

Systems and methods for using multimodal imaging to determine struc...

Enhanced FIB-SEM systems for large-volume 3D imaging

Systems and method for using multimodal imaging to determine struct...

Method for acquiring image and ion beam apparatus

Method of modifying a sample surface layer from a microscopic sample

Charged particle beam apparatus

Charged particle beam microscope

Producing images of a specimen

Method and device for ion beam processing of surfaces

Method of preparing a transmission electron microscope sample and a...

Sample decontamination

MEMS nanoindenter

Systems configured to reduce distortion of a resist during a metrol...

Methods of stabilizing measurement of ArF resist in CD-SEM

Semiconductor device inspecting apparatus

Focused particle beam systems and methods using a tilt column

Process and device for ion thinning in a high resolution transmissi...

Focused particle beam systems and methods using a tilt column

Ion beam preparation device for electron microscopy

Focused charged beam apparatus, and its processing and observation...

Patents Applicationslast 30 patents

Method and System for Sample Preparation

METHOD OF PROCESSING ION BEAM BASED ON OPTICAL MICROSCOPY IMAGING

Device with at Least One Adjustable Sample Holder and Method of Cha...

SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...

SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...

METHOD FOR PREPARING AND ANALYZING AN OBJECT AS WELL AS PARTICLE BE...

CHARGED PARTICLE BEAM APPARATUS

METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...

SAMPLE OBSERVATION APPARATUS AND METHOD OF MARKING

Charged Particle Beam Microscope

Producing images of a specimen

SAMPLE DECONTAMINATION

METHOD OF PREPARING A TRANSMISSION ELECTRON MICROSCOPE SAMPLE AND A...

Mems Nanoindenter

Method and Device for Ion Beam Processing of Surfaces

Charged particle beam system and its specimen holder

INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN

SEMICONDUCTOR DEVICE INSPECTING APPARATUS