Synchronization

Industry

CPC
G01R31/31726

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31726Synchronization

Industries

Patents Grantslast 30 patents

Information Patent Grant
Time-to-digital converter circuit with self-testing function
- Patent number 12,164,002
- Issue date Dec 10, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- John Kevin Moore
- G04 - HOROLOGY
Information Patent Grant
Testing circuitry for testing multicycle path circuit
- Patent number 12,158,498
- Issue date Dec 3, 2024
- Realtek Semiconductor Corporation
- Chun-Yi Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Device under test synchronization with automated test equipment che...
- Patent number 12,140,632
- Issue date Nov 12, 2024
- Synopsys, Inc.
- Yongkang Hu
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing system and time certification method
- Patent number 12,135,350
- Issue date Nov 5, 2024
- CHROMA ATE INC.
- Tzu-Ching Yang
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and testing method
- Patent number 12,111,353
- Issue date Oct 8, 2024
- Realtek Semiconductor Corporation
- Shih-Hsuan Chiu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device and method for generating test pulse signals
- Patent number 12,105,144
- Issue date Oct 1, 2024
- Realtek Semiconductor Corp.
- Po-Lin Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit for transferring data from one clock domain to another
- Patent number 12,092,688
- Issue date Sep 17, 2024
- Advantest Corporation
- Andreas Beermann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Smart grid interface relay and breaker
- Patent number 12,088,087
- Issue date Sep 10, 2024
- Lunar Energy, Inc.
- Mark Holveck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Debug and trace circuit in lockstep architectures, associated metho...
- Patent number 11,892,505
- Issue date Feb 6, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Avneep Kumar Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Smart grid interface relay and breaker
- Patent number 11,862,962
- Issue date Jan 2, 2024
- Lunar Energy, Inc.
- Mark Holveck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Time offset method and device for test signal
- Patent number 11,860,226
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Liang Chen
- G01 - MEASURING TESTING
Information Patent Grant
On-chip oscilloscope
- Patent number 11,835,551
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Clock frequency monitoring device and clock frequency monitoring me...
- Patent number 11,815,552
- Issue date Nov 14, 2023
- Nippon Telegraph and Telephone Corporation
- Takaaki Hisashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault tolerant synchronizer
- Patent number 11,796,592
- Issue date Oct 24, 2023
- Texas Instruments Incorporated
- Denis Roland Beaudoin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining jitter, storage medium and ele...
- Patent number 11,733,293
- Issue date Aug 22, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Tianchen Lu
- G01 - MEASURING TESTING
Information Patent Grant
Transition fault testing of functionally asynchronous paths in an i...
- Patent number 11,709,203
- Issue date Jul 25, 2023
- Texas Instruments Incorporated
- Prakash Narayanan
- G01 - MEASURING TESTING
Information Patent Grant
On-chip oscilloscope
- Patent number 11,567,105
- Issue date Jan 31, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,567,120
- Issue date Jan 31, 2023
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Testing memory elements using an internal testing interface
- Patent number 11,500,017
- Issue date Nov 15, 2022
- Xilinx, Inc.
- Albert Shih-Huai Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated testing machine with data processing function and informa...
- Patent number 11,415,622
- Issue date Aug 16, 2022
- HEFEI SPIROX TECHNOLOGY CO., LTD.
- Hsing-Fu Lin
- G01 - MEASURING TESTING
Information Patent Grant
Digital circuit robustness verification method and system
- Patent number 11,353,509
- Issue date Jun 7, 2022
- Realtek Semiconductor Corporation
- Wen-Yi Mao
- G01 - MEASURING TESTING
Information Patent Grant
Memory loopback systems and methods
- Patent number 11,327,113
- Issue date May 10, 2022
- Micron Technology, Inc.
- David D. Wilmoth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for data preservation and power loss recovery in...
- Patent number 11,313,905
- Issue date Apr 26, 2022
- Landis+Gyr LLC
- David Schamber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auto-calibration circuit for pulse generating circuit used in reson...
- Patent number 11,313,906
- Issue date Apr 26, 2022
- Rezonent Microchips Pvt. Ltd.
- Ignatius Bezzam
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,307,243
- Issue date Apr 19, 2022
- RAMBUS INC.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Grant
Transistion fault testing of funtionally asynchronous paths in an i...
- Patent number 11,300,615
- Issue date Apr 12, 2022
- Texas Instruments Incorporated
- Prakash Narayanan
- G01 - MEASURING TESTING
Information Patent Grant
Data transmission apparatus and data transmission method
- Patent number 11,275,400
- Issue date Mar 15, 2022
- Kioxia Corporation
- Yoshiki Kashiwagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault tolerant synchronizer
- Patent number 11,255,905
- Issue date Feb 22, 2022
- Texas Instruments Incorporated
- Denis Roland Beaudoin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for reducing non-linear distortion
- Patent number 11,137,445
- Issue date Oct 5, 2021
- Keysight Technologies, Inc.
- Jan Verspecht
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test apparatus and test method
- Patent number 11,137,446
- Issue date Oct 5, 2021
- Advantest Corporation
- Shuichi Inage
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SIGNAL INTEGRITY MONITORING SYSTEM
- Publication number 20240410943
- Publication date Dec 12, 2024
- Synopsys, Inc.
- Firooz MASSOUDI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SCAN CLOCK GATING CONTROLLER AND METHOD FOR PERFORMING STUCK-AT FAU...
- Publication number 20240353489
- Publication date Oct 24, 2024
- Realtek Semiconductor Corp.
- Dong-Zhen Li
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20240329131
- Publication date Oct 3, 2024
- SINTOKOGIO, LTD.
- Nobuyuki TAKITA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD AND APPARATUS FOR LINK, ELECTRONIC DEVICE AND COMP...
- Publication number 20240219454
- Publication date Jul 4, 2024
- ZTE CORPORATION
- Ruina Xu
- G01 - MEASURING TESTING
Information Patent Application
TIME-TO-DIGTIAL CONVERTER CIRCUIT WITH SELF-TESTING FUNCTION
- Publication number 20240201255
- Publication date Jun 20, 2024
- STMicroelectronics International N.V.
- John Kevin Moore
- G04 - HOROLOGY
Information Patent Application
TRANSMITTER FOR ULTRA-HIGH SPEED AND STORAGE DEVICE INCLUDING THE SAME
- Publication number 20240168091
- Publication date May 23, 2024
- Samsung Electronics Co., Ltd.
- Ikjin JO
- G01 - MEASURING TESTING
Information Patent Application
SMART GRID INTERFACE RELAY AND BREAKER
- Publication number 20240154403
- Publication date May 9, 2024
- Lunar Energy, Inc.
- Mark Holveck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Selecting an Output as a System Output Responsive to an Indication...
- Publication number 20240142518
- Publication date May 2, 2024
- SiFive, Inc.
- Cameron Mcnairy
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM STORING TEST PATTERN GENERATION...
- Publication number 20240019492
- Publication date Jan 18, 2024
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Application
PROVIDING CONFIGURABLE SECURITY FOR INTELLECTUAL PROPERTY CIRCUITS...
- Publication number 20240003973
- Publication date Jan 4, 2024
- Intel Corporation
- Ratheesh Thekke Veetil
- G01 - MEASURING TESTING
Information Patent Application
TRAINING METHOD AND TEST APPARATUS USING THE SAME
- Publication number 20230417832
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Kwang Kyu KIM
- G01 - MEASURING TESTING
Information Patent Application
FAULT TOLERANT SYNCHRONIZER
- Publication number 20230400512
- Publication date Dec 14, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Denis Roland BEAUDOIN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING CIRCUITRY FOR TESTING MULTICYCLE PATH CIRCUIT
- Publication number 20230349971
- Publication date Nov 2, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- CHUN-YI KUO
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND TESTING METHOD
- Publication number 20230324459
- Publication date Oct 12, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- Shih-Hsuan CHIU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IN-CIRCUIT EMULATOR DEVICE
- Publication number 20230314513
- Publication date Oct 5, 2023
- LAPIS Technology Co., Ltd.
- Hiroshi YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...
- Publication number 20230266385
- Publication date Aug 24, 2023
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
SMART GRID INTERFACE RELAY AND BREAKER
- Publication number 20230198244
- Publication date Jun 22, 2023
- Lunar Energy, Inc.
- Mark Holveck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ON-CHIP OSCILLOSCOPE
- Publication number 20230122803
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Peng HSIEH
- G01 - MEASURING TESTING
Information Patent Application
TIME OFFSET METHOD AND DEVICE FOR TEST SIGNAL
- Publication number 20230003796
- Publication date Jan 5, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Liang CHEN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IMPLEMENTING A SCALABLE DIGITAL INFRASTRUC...
- Publication number 20220413045
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Richard WUNDERLICH
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method for generating test pulse signals
- Publication number 20220413044
- Publication date Dec 29, 2022
- Realtek Semiconductor Corp.
- Po-Lin Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20220283219
- Publication date Sep 8, 2022
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
Techniques For Reduction Of Degradation In Channels Caused By Bias...
- Publication number 20220268837
- Publication date Aug 25, 2022
- Intel Corporation
- Han Hua Leong
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT SYSTEM
- Publication number 20220268839
- Publication date Aug 25, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR TRANSFERRING DATA FROM ONE CLOCK DOMAIN TO ANOTHER
- Publication number 20220260635
- Publication date Aug 18, 2022
- Advantest Corporation
- Andreas BEERMANN
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTION FAULT TESTING OF FUNTIONALLY ASYNCHRONOUS PATHS IN AN I...
- Publication number 20220196738
- Publication date Jun 23, 2022
- TEXAS INSTRUMENTS INCORPORATED
- PRAKASH NARAYANAN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST SYNCHRONIZATION WITH AUTOMATED TEST EQUIPMENT CHE...
- Publication number 20220155370
- Publication date May 19, 2022
- Synopsys, Inc.
- Yongkang HU
- G01 - MEASURING TESTING
Information Patent Application
FAULT TOLERANT SYNCHRONIZER
- Publication number 20220137127
- Publication date May 5, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Denis Roland BEAUDOIN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AUTOMATED TESTING MACHINE WITH DATA PROCESSING FUNCTION AND INFORMA...
- Publication number 20220099729
- Publication date Mar 31, 2022
- SPIROX CORPORATION
- HSING-FU LIN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT TESTING SYSTEM AND TIME CERTIFICATION METHOD
- Publication number 20210349146
- Publication date Nov 11, 2021
- Tzu-Ching YANG
- G01 - MEASURING TESTING

Synchronization

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Time-to-digital converter circuit with self-testing function

Testing circuitry for testing multicycle path circuit

Device under test synchronization with automated test equipment che...

Electronic component testing system and time certification method

Testing system and testing method

Semiconductor device and method for generating test pulse signals

Circuit for transferring data from one clock domain to another

Smart grid interface relay and breaker

Debug and trace circuit in lockstep architectures, associated metho...

Smart grid interface relay and breaker

Time offset method and device for test signal

On-chip oscilloscope

Clock frequency monitoring device and clock frequency monitoring me...

Fault tolerant synchronizer

Method and apparatus for determining jitter, storage medium and ele...

Transition fault testing of functionally asynchronous paths in an i...

On-chip oscilloscope

Memory controller with integrated test circuitry

Testing memory elements using an internal testing interface

Automated testing machine with data processing function and informa...

Digital circuit robustness verification method and system

Memory loopback systems and methods

Device and method for data preservation and power loss recovery in...

Auto-calibration circuit for pulse generating circuit used in reson...

Memory controller with integrated test circuitry

Transistion fault testing of funtionally asynchronous paths in an i...

Data transmission apparatus and data transmission method

Fault tolerant synchronizer

Method and apparatus for reducing non-linear distortion

Test apparatus and test method

Patents Applicationslast 30 patents

SIGNAL INTEGRITY MONITORING SYSTEM

SCAN CLOCK GATING CONTROLLER AND METHOD FOR PERFORMING STUCK-AT FAU...

TEST SYSTEM

DETECTION METHOD AND APPARATUS FOR LINK, ELECTRONIC DEVICE AND COMP...

TIME-TO-DIGTIAL CONVERTER CIRCUIT WITH SELF-TESTING FUNCTION

TRANSMITTER FOR ULTRA-HIGH SPEED AND STORAGE DEVICE INCLUDING THE SAME

SMART GRID INTERFACE RELAY AND BREAKER

Selecting an Output as a System Output Responsive to an Indication...

COMPUTER-READABLE RECORDING MEDIUM STORING TEST PATTERN GENERATION...

PROVIDING CONFIGURABLE SECURITY FOR INTELLECTUAL PROPERTY CIRCUITS...

TRAINING METHOD AND TEST APPARATUS USING THE SAME

FAULT TOLERANT SYNCHRONIZER

TESTING CIRCUITRY FOR TESTING MULTICYCLE PATH CIRCUIT

TESTING SYSTEM AND TESTING METHOD

IN-CIRCUIT EMULATOR DEVICE

METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...

SMART GRID INTERFACE RELAY AND BREAKER

ON-CHIP OSCILLOSCOPE

TIME OFFSET METHOD AND DEVICE FOR TEST SIGNAL

APPARATUS AND METHOD FOR IMPLEMENTING A SCALABLE DIGITAL INFRASTRUC...

Semiconductor device and method for generating test pulse signals

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

Techniques For Reduction Of Degradation In Channels Caused By Bias...

TEST AND MEASUREMENT SYSTEM

CIRCUIT FOR TRANSFERRING DATA FROM ONE CLOCK DOMAIN TO ANOTHER

TRANSISTION FAULT TESTING OF FUNTIONALLY ASYNCHRONOUS PATHS IN AN I...

DEVICE UNDER TEST SYNCHRONIZATION WITH AUTOMATED TEST EQUIPMENT CHE...

FAULT TOLERANT SYNCHRONIZER

AUTOMATED TESTING MACHINE WITH DATA PROCESSING FUNCTION AND INFORMA...

ELECTRONIC COMPONENT TESTING SYSTEM AND TIME CERTIFICATION METHOD