Tandem in time

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H01J49/0081

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

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H01J49/0081Tandem in time

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Patents Grantslast 30 patents

Information Patent Grant
Two-dimensional mass spectrometry using ion micropacket detection
- Patent number 12,159,777
- Issue date Dec 3, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for performing multiple precurser, neutral loss...
- Patent number 12,027,355
- Issue date Jul 2, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-dimensional mass spectrometry using ion micropacket detection
- Patent number 11,804,370
- Issue date Oct 31, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Precursor and neutral loss scan in an ion trap
- Patent number 11,764,046
- Issue date Sep 19, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for performing multiple precursor, neutral loss...
- Patent number 11,676,805
- Issue date Jun 13, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for performing tandem mass spectrometry
- Patent number 11,670,494
- Issue date Jun 6, 2023
- Philip M. Remes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization for tandem ion mobility spectrometry
- Patent number 11,525,803
- Issue date Dec 13, 2022
- Hamilton Sundstrand Corporation
- Benjamin D. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Results dependent analysis—iterative analysis of SWATH data
- Patent number 11,373,735
- Issue date Jun 28, 2022
- DH Technologies Development Pte. Ltd.
- Stephen A. Tate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Precursor and neutral loss scan in an ion trap
- Patent number 11,348,778
- Issue date May 31, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for surgical monitoring using MALDI-TOF mass s...
- Patent number 11,232,940
- Issue date Jan 25, 2022
- Virgin Instruments Corporation
- Marvin L. Vestal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution MSI based quantification
- Patent number 10,989,698
- Issue date Apr 27, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Yue Xuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for performing multiple precursor, neutral loss...
- Patent number 10,937,638
- Issue date Mar 2, 2021
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for conducting neutral loss scans in a single i...
- Patent number 10,840,074
- Issue date Nov 17, 2020
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Library search tolerant to isotopes
- Patent number 10,825,668
- Issue date Nov 3, 2020
- DH Technologies Development Pte. Ltd.
- Lyle Lorrence Burton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of detecting reverse triiodothyronine by mass spectrometry
- Patent number 10,672,600
- Issue date Jun 2, 2020
- Quest Diagnostics Investments Incorporated
- J. Fred Banks
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for identifying precursor and product ion pairs...
- Patent number 10,651,019
- Issue date May 12, 2020
- DH Technologies Development Pte. Ltd.
- Gordana Ivosev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for conducting neutral loss scans in a single i...
- Patent number 10,580,633
- Issue date Mar 3, 2020
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for quantitative mass analysis
- Patent number 10,347,477
- Issue date Jul 9, 2019
- Thermo Finnigan LLC.
- Linfan Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of detecting reverse triiodothyronine by mass spectrometry
- Patent number 10,079,138
- Issue date Sep 18, 2018
- Quest Diagnostics Investments Incorporated
- J. Fred Banks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for using variable mass selection window widths...
- Patent number 10,074,527
- Issue date Sep 11, 2018
- DH Technologies Development Pte. Ltd.
- Ronald F. Bonner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with interleaved acquisition
- Patent number 10,062,557
- Issue date Aug 28, 2018
- Micromass UK Limited
- Daniel James Kenny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for using variable mass selection window widths...
- Patent number 9,842,731
- Issue date Dec 12, 2017
- DH Technologies Development Pte. Ltd.
- Ronald F. Bonner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tandem mass spectrometer and tandem mass spectrometry method
- Patent number 9,799,500
- Issue date Oct 24, 2017
- SYNCHROTRON SOLEIL
- Alexandre Giuliani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analysis of sample and apparatus therefor
- Patent number 9,691,594
- Issue date Jun 27, 2017
- Rigaku Corporation
- Tadashi Arii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modulation of instrument resolution dependant upon the complexity o...
- Patent number 9,691,595
- Issue date Jun 27, 2017
- DH Technologies Development Pte. Ltd.
- John Lawrence Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collision cell for tandem mass spectrometry
- Patent number 9,685,309
- Issue date Jun 20, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for detecting reverse triiodothyronine by mass spectrometry
- Patent number 9,685,311
- Issue date Jun 20, 2017
- Quest Diagnostics Investments Incorporated
- J. Fred Banks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for tandem mass spectrometry analysis in ion trap mass analyzer
- Patent number 9,640,377
- Issue date May 2, 2017
- FUDAN UNIVERSITY
- Fuxing Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with timing determination based on a signal inten...
- Patent number 9,576,780
- Issue date Feb 21, 2017
- Shimadzu Corporation
- Akihiko Niwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scheduled MS3 for quantitation
- Patent number 9,548,190
- Issue date Jan 17, 2017
- DH Technologies Development Pte. Ltd.
- John Lawrence Campbell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TANDEM MASS SPECTROMETER AND METHOD OF TANDEM MASS SPECTROMETRY
- Publication number 20240274424
- Publication date Aug 15, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO-DIMENSIONAL MASS SPECTROMETRY USING ION MICROPACKET DETECTION
- Publication number 20240063009
- Publication date Feb 22, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING MULTIPLE PRECURSER, NEUTRAL LOSS...
- Publication number 20230298874
- Publication date Sep 21, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simplification of Method or System Using Scout MRM
- Publication number 20230230825
- Publication date Jul 20, 2023
- DH Technologies Development Pte. Ltd.
- David M. Cox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20230207302
- Publication date Jun 29, 2023
- ASCEND DIAGNOSTICS LIMITED
- John ALLISON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Threshold-based IDA Exclusion List
- Publication number 20220392758
- Publication date Dec 8, 2022
- DH Technologies Development Pte. Ltd.
- Lyle Lorrence Burton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRECURSOR AND NEUTRAL LOSS SCAN IN AN ION TRAP
- Publication number 20220254620
- Publication date Aug 11, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING TANDEM MASS SPECTROMETRY
- Publication number 20220208535
- Publication date Jun 30, 2022
- Thermo Finnigan LLC
- Philip M. Remes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and methods for performing multiple precursor, neutral loss...
- Publication number 20210175057
- Publication date Jun 10, 2021
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION FOR TANDEM ION MOBILITY SPECTROMETRY
- Publication number 20210088474
- Publication date Mar 25, 2021
- HAMILTON SUNDSTRAND CORPORATION
- Benjamin D. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CONDUCTING NEUTRAL LOSS SCANS IN A SINGLE I...
- Publication number 20200161111
- Publication date May 21, 2020
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Library Search Tolerant to Isotopes
- Publication number 20200090918
- Publication date Mar 19, 2020
- DH Technologies Development Pte. Ltd.
- Lyle Lorrence Burton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Identifying Precursor and Product Ion Pairs...
- Publication number 20190228957
- Publication date Jul 25, 2019
- DH Technologies Development Pte. Ltd.
- Gordana Ivosev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Results Dependent Analysis - Iterative Analysis of SWATH Data
- Publication number 20190180848
- Publication date Jun 13, 2019
- DH Technologies Development Pte. Ltd.
- Stephen A. Tate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRECURSOR AND NEUTRAL LOSS SCAN IN AN ION TRAP
- Publication number 20190066989
- Publication date Feb 28, 2019
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF DETECTING REVERSE TRIIODOTHYRONINE BY MASS SPECTROMETRY
- Publication number 20190019660
- Publication date Jan 17, 2019
- Quest Diagnostics Investments Incorporated
- J. Fred BANKS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Using Variable Mass Selection Window Widths...
- Publication number 20180350579
- Publication date Dec 6, 2018
- DH Technologies Development Pte. Ltd.
- Ronald F. Bonner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Increasing Quality of Tandem Mass Spectra
- Publication number 20180108521
- Publication date Apr 19, 2018
- DH Technologies Development Pte. Ltd.
- John L. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Using Variable Mass Selection Window Widths...
- Publication number 20180096830
- Publication date Apr 5, 2018
- DH Technologies Development Pte. Ltd.
- Ronald F. Bonner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Surgical Monitoring Using MALDI-TOF Mass S...
- Publication number 20180040467
- Publication date Feb 8, 2018
- Virgin Instruments Corporation
- Marvin L. Vestal
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS OF DETECTING REVERSE TRIIODOTHYRONINE BY MASS SPECTROMETRY
- Publication number 20170287688
- Publication date Oct 5, 2017
- Quest Diagnostics Investments Incorporated
- J. Fred BANKS
- G01 - MEASURING TESTING
Information Patent Application
NOVEL METHODS AND KITS FOR DETECTING OF UREA CYCLE DISORDERS USING...
- Publication number 20170059535
- Publication date Mar 2, 2017
- Labsystems Diagnostics Oy
- Géraldine CARRARD
- G01 - MEASURING TESTING
Information Patent Application
QUANTIFICATION OF TRANSTHYRETIN AND ITS ISOFORMS
- Publication number 20170045536
- Publication date Feb 16, 2017
- Alnylam Pharmaceuticals, Inc.
- James Butler
- G01 - MEASURING TESTING
Information Patent Application
Mass Spectrometer With Interleaved Acquistion
- Publication number 20170047212
- Publication date Feb 16, 2017
- MICROMASS LIMITED UK
- Daniel James KENNY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Using Variable Mass Selection Window Widths...
- Publication number 20160372312
- Publication date Dec 22, 2016
- DH Technologies Development Pte. Ltd.
- Ronald F. Bonner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TANDEM MASS SPECTROMETRY ANALYSIS IN ION TRAP MASS ANALYZER
- Publication number 20160365231
- Publication date Dec 15, 2016
- Fudan University
- Fuxing XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tandem Mass Spectrometer and Tandem Mass Spectrometry Method
- Publication number 20160314952
- Publication date Oct 27, 2016
- Institut National de la Recherche Agronomique: INRA
- Alexandre GIULIANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY-CLEAVABLE CROSS-LINKING AGENTS TO FACILITATE STRU...
- Publication number 20160245822
- Publication date Aug 25, 2016
- The Regents of the University of California
- Scott D. Rychnovsky
- G01 - MEASURING TESTING
Information Patent Application
Modulation of Instrument Resolution Dependant upon the Complexity o...
- Publication number 20160093482
- Publication date Mar 31, 2016
- DH Technologies Development Pte. Ltd.
- John Lawrence Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Using Variable Mass Selection Window Widths...
- Publication number 20160079047
- Publication date Mar 17, 2016
- DH Technologies Development Pte. Ltd.
- Ronald F. Bonner
- H01 - BASIC ELECTRIC ELEMENTS

Tandem in time

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Two-dimensional mass spectrometry using ion micropacket detection

Systems and methods for performing multiple precurser, neutral loss...

Two-dimensional mass spectrometry using ion micropacket detection

Precursor and neutral loss scan in an ion trap

Systems and methods for performing multiple precursor, neutral loss...

Systems and methods for performing tandem mass spectrometry

Ionization for tandem ion mobility spectrometry

Results dependent analysis—iterative analysis of SWATH data

Precursor and neutral loss scan in an ion trap

Method and apparatus for surgical monitoring using MALDI-TOF mass s...

High resolution MSI based quantification

Systems and methods for performing multiple precursor, neutral loss...

Systems and methods for conducting neutral loss scans in a single i...

Library search tolerant to isotopes

Methods of detecting reverse triiodothyronine by mass spectrometry

Systems and methods for identifying precursor and product ion pairs...

Systems and methods for conducting neutral loss scans in a single i...

Methods and systems for quantitative mass analysis

Methods of detecting reverse triiodothyronine by mass spectrometry

Systems and methods for using variable mass selection window widths...

Mass spectrometer with interleaved acquisition

Systems and methods for using variable mass selection window widths...

Tandem mass spectrometer and tandem mass spectrometry method

Method for analysis of sample and apparatus therefor

Modulation of instrument resolution dependant upon the complexity o...

Collision cell for tandem mass spectrometry

Methods for detecting reverse triiodothyronine by mass spectrometry

Method for tandem mass spectrometry analysis in ion trap mass analyzer

Mass spectrometer with timing determination based on a signal inten...

Scheduled MS3 for quantitation

Patents Applicationslast 30 patents

TANDEM MASS SPECTROMETER AND METHOD OF TANDEM MASS SPECTROMETRY

TWO-DIMENSIONAL MASS SPECTROMETRY USING ION MICROPACKET DETECTION

SYSTEMS AND METHODS FOR PERFORMING MULTIPLE PRECURSER, NEUTRAL LOSS...

Simplification of Method or System Using Scout MRM

MASS SPECTROMETER

Threshold-based IDA Exclusion List

PRECURSOR AND NEUTRAL LOSS SCAN IN AN ION TRAP

SYSTEMS AND METHODS FOR PERFORMING TANDEM MASS SPECTROMETRY

Systems and methods for performing multiple precursor, neutral loss...

IONIZATION FOR TANDEM ION MOBILITY SPECTROMETRY

SYSTEMS AND METHODS FOR CONDUCTING NEUTRAL LOSS SCANS IN A SINGLE I...

Library Search Tolerant to Isotopes

Systems and Methods for Identifying Precursor and Product Ion Pairs...

Results Dependent Analysis - Iterative Analysis of SWATH Data

PRECURSOR AND NEUTRAL LOSS SCAN IN AN ION TRAP

METHODS OF DETECTING REVERSE TRIIODOTHYRONINE BY MASS SPECTROMETRY

Systems and Methods for Using Variable Mass Selection Window Widths...

Method of Increasing Quality of Tandem Mass Spectra

Systems and Methods for Using Variable Mass Selection Window Widths...

Method and Apparatus for Surgical Monitoring Using MALDI-TOF Mass S...

METHODS OF DETECTING REVERSE TRIIODOTHYRONINE BY MASS SPECTROMETRY

NOVEL METHODS AND KITS FOR DETECTING OF UREA CYCLE DISORDERS USING...

QUANTIFICATION OF TRANSTHYRETIN AND ITS ISOFORMS

Mass Spectrometer With Interleaved Acquistion

Systems and Methods for Using Variable Mass Selection Window Widths...

METHOD FOR TANDEM MASS SPECTROMETRY ANALYSIS IN ION TRAP MASS ANALYZER

Tandem Mass Spectrometer and Tandem Mass Spectrometry Method

MASS SPECTROMETRY-CLEAVABLE CROSS-LINKING AGENTS TO FACILITATE STRU...

Modulation of Instrument Resolution Dependant upon the Complexity o...

Systems and Methods for Using Variable Mass Selection Window Widths...