Test clips

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CPC
G01R1/0425

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/0425Test clips

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Assembly for carrying chip, and device and method for testing chip
- Patent number 12,092,654
- Issue date Sep 17, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinrong Huang
- G01 - MEASURING TESTING
Information Patent Grant
Contact socket module and method of testing electronic components u...
- Patent number 12,044,702
- Issue date Jul 23, 2024
- Cohu GmbH
- Karl Croce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antenna in package production test
- Patent number 11,592,479
- Issue date Feb 28, 2023
- Infineon Technologies AG
- Saverio Trotta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antenna-in-package production test
- Patent number 11,092,643
- Issue date Aug 17, 2021
- Infineon Technologies AG
- Saverio Trotta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
End effector attachment for testing electronic touchscreen device
- Patent number 11,003,560
- Issue date May 11, 2021
- Walmart Apollo, LLC
- Timothy M. Fenton
- G01 - MEASURING TESTING
Information Patent Grant
Modular pressing device capable of generating stage downward forces...
- Patent number 10,879,097
- Issue date Dec 29, 2020
- CHROMA ATE INC.
- Chi-Chen Wu
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Semiconductor device handler with chuck clamp interlock
- Patent number 10,871,507
- Issue date Dec 22, 2020
- Texas Instruments Incorporated
- Sonny Baskiñas Concepcion
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
End effector attachment for testing electronic touchscreen device
- Patent number 10,768,203
- Issue date Sep 8, 2020
- Walmart Apollo, LLC
- Timothy M. Fenton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses, systems and methods for testing electrical functions
- Patent number 10,324,111
- Issue date Jun 18, 2019
- BOE Technology Group Co., Ltd.
- Wenjin Fan
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for aligning and holding a plurality of singulate...
- Patent number 10,290,526
- Issue date May 14, 2019
- Multitest Elektronische Systeme GmbH
- Thomas Hofmann
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor package testing apparatus
- Patent number 9,846,193
- Issue date Dec 19, 2017
- ASM Technology Singapore Pte. Ltd.
- Chak Tong Sze
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable LED load board clamp
- Patent number 9,835,649
- Issue date Dec 5, 2017
- Vektrex Electronic Systems, Inc.
- Jeffery Neil Hulett
- G01 - MEASURING TESTING
Information Patent Grant
Test instrument probe with a pointed tip that is also capable of gr...
- Patent number 9,618,535
- Issue date Apr 11, 2017
- Paul Nicholas Chait
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Insulated test clip cover assembly
- Patent number 9,620,885
- Issue date Apr 11, 2017
- Westek Electronics, Inc.
- Kevin B. Larkin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe apparatus and wafer mounting table for probe apparatus
- Patent number 9,523,711
- Issue date Dec 20, 2016
- Tokyo Electron Limited
- Kazuya Yano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multichannel clip device and methods of use
- Patent number 9,517,338
- Issue date Dec 13, 2016
- AXONICS MODULATION TECHNOLOGIES, INC.
- Guanqiang Jiang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Clamp sensor and measurement apparatus
- Patent number 9,400,289
- Issue date Jul 26, 2016
- Hioki Denki Kabushiki Kaisha
- Tetsuya Komiyama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for burn-in test
- Patent number 9,366,721
- Issue date Jun 14, 2016
- Pentamaster Instrumentation SDN BHD
- Siow Khiang Teoh
- G01 - MEASURING TESTING
Information Patent Grant
System for post-processsing of electronic components
- Patent number 9,255,965
- Issue date Feb 9, 2016
- Multitest Elektronische Systeme GmbH
- Reinhart Richter
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of zeroing a test instrument
- Patent number 9,160,126
- Issue date Oct 13, 2015
- Fluke Corporation
- Brian Stanley Aikins
- G01 - MEASURING TESTING
Information Patent Grant
Elastic unit for clamping an electronic component and extending bel...
- Patent number 8,964,404
- Issue date Feb 24, 2015
- Multitest Elektronische Systeme GmbH
- Johann Poetzinger
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for aligning and holding a plurality of singulate...
- Patent number 8,794,613
- Issue date Aug 5, 2014
- Multitest Elektronishe Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
System for post-processing of electronic components
- Patent number 8,717,048
- Issue date May 6, 2014
- Multitest Elektronische Systems GmbH
- Reinhart Richter
- G01 - MEASURING TESTING
Information Patent Grant
Two abutting sections of an align fixture together floatingly engag...
- Patent number 8,689,436
- Issue date Apr 8, 2014
- Multitest Elektronische Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Align fixture for alignment of an electronic component
- Patent number 8,683,680
- Issue date Apr 1, 2014
- Multitest Elektronische Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for aligning and holding a plurality of singulate...
- Patent number 8,678,365
- Issue date Mar 25, 2014
- Multitest Elektronische Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a test instrument
- Patent number 8,336,190
- Issue date Dec 25, 2012
- Fluke Corporation
- Brian Stanley Aikins
- G01 - MEASURING TESTING
Information Patent Grant
Fixture for aligning an electronic component
- Patent number 8,281,483
- Issue date Oct 9, 2012
- Multitest Elektronische Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Use of magnets to provide resilience
- Patent number 8,262,069
- Issue date Sep 11, 2012
- Research In Motion Limited
- Simon Regis Louis Lancaster-Larocque
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Carrier for aligning electronic components with slidably arranged p...
- Patent number 8,230,587
- Issue date Jul 31, 2012
- Multitest Elektronische Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT SOCKET MODULE AND METHOD OF TESTING ELECTRONIC COMPONENTS U...
- Publication number 20230022960
- Publication date Jan 26, 2023
- Cohu GmbH
- Karl CROCE
- G01 - MEASURING TESTING
Information Patent Application
ASSEMBLY FOR CARRYING CHIP, ANDDEVICE AND METHOD FOR TESTING CHIP
- Publication number 20230003763
- Publication date Jan 5, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Jinrong Huang
- G01 - MEASURING TESTING
Information Patent Application
Antenna in Package Production Test
- Publication number 20210341536
- Publication date Nov 4, 2021
- INFINEON TECHNOLOGIES AG
- Saverio Trotta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTENNA-IN-PACKAGE PRODUCTION TEST
- Publication number 20210033668
- Publication date Feb 4, 2021
- INFINEON TECHNOLOGIES AG
- Saverio Trotta
- G01 - MEASURING TESTING
Information Patent Application
END EFFECTOR ATTACHMENT FOR TESTING ELECTRONIC TOUCHSCREEN DEVICE
- Publication number 20200363452
- Publication date Nov 19, 2020
- Walmart Apollo, LLC
- Timothy M. Fenton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE HANDLER WITH CHUCK CLAMP INTERLOCK
- Publication number 20200200796
- Publication date Jun 25, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Sonny Baskiñas Concepcion
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODULAR PRESSING DEVICE CAPABLE OF GENERATING STAGE DOWNWARD FORCES...
- Publication number 20190172740
- Publication date Jun 6, 2019
- CHROMA ATE INC.
- Chi-Chen WU
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
END EFFECTOR ATTACHMENT FOR TESTING ELECTRONIC TOUCHSCREEN DEVICE
- Publication number 20180180645
- Publication date Jun 28, 2018
- Wal-Mart Stores, Inc.
- Timothy M. Fenton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus for Burn-In Test
- Publication number 20160091559
- Publication date Mar 31, 2016
- Pentamaster Instrumentation SDN BHD
- Siow Khiang Teoh
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE TESTING APPARATUS
- Publication number 20150331012
- Publication date Nov 19, 2015
- ASM Technology Singapore Pte Ltd
- Chak Tong SZE
- G01 - MEASURING TESTING
Information Patent Application
CLAMP SENSOR AND MEASUREMENT APPARATUS
- Publication number 20150276802
- Publication date Oct 1, 2015
- Hioki Denki Kabushiki Kaisha
- Tetsuya KOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS AND WAFER MOUNTING TABLE FOR PROBE APPARATUS
- Publication number 20150145547
- Publication date May 28, 2015
- TOKYO ELECTRON LIMITED
- Kazuya Yano
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATE...
- Publication number 20140327202
- Publication date Nov 6, 2014
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR POST-PROCESSSING OF ELECTRONIC COMPONENTS
- Publication number 20140167798
- Publication date Jun 19, 2014
- Multitest elektronische Systeme GmbH
- Reinhart Richter
- G01 - MEASURING TESTING
Information Patent Application
INSULATED TEST CLIP COVER ASSEMBLY
- Publication number 20140117976
- Publication date May 1, 2014
- WESTEK ELECTRONICS, INC.
- Kevin B. Larkin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATE...
- Publication number 20130299386
- Publication date Nov 14, 2013
- Multitest elektronische Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method Of Zeroing A Test Instrument
- Publication number 20130244477
- Publication date Sep 19, 2013
- FLUKE CORPORATION
- Brian Stanley Aikins
- G01 - MEASURING TESTING
Information Patent Application
CAPACITOR TEST FIXTURE AND TEST SYSTEM EMPLOYING THE SAME
- Publication number 20120268150
- Publication date Oct 25, 2012
- HON HAI Precision Industry CO., LTD.
- QI-YAN LUO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF ZEROING A TEST INSTRUMENT
- Publication number 20110151710
- Publication date Jun 23, 2011
- FLUKE CORPORATION
- Brian Stanley AIKINS
- G01 - MEASURING TESTING
Information Patent Application
PIN CONNECTOR AND CHIP TEST FIXTURE HAVING THE SAME
- Publication number 20110128021
- Publication date Jun 2, 2011
- Shih-Yang CHOU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR POST-PROCESSING OF ELECTRONIC COMPONENTS
- Publication number 20110043231
- Publication date Feb 24, 2011
- Reinhart Richter
- G01 - MEASURING TESTING
Information Patent Application
TWO ABUTTING SECTIONS OF AN ALIGN FIXTURE TOGETHER FLOATINGLY ENGAG...
- Publication number 20110041311
- Publication date Feb 24, 2011
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC UNIT EXERTING TWO ANGLED FORCE COMPONENTS ON AN ABUTTING SE...
- Publication number 20110042264
- Publication date Feb 24, 2011
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC UNIT FOR CLAMPING AN ELECTRONIC COMPONENT AND EXTENDING BEL...
- Publication number 20110043982
- Publication date Feb 24, 2011
- Johann Poetzinger
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC UNIT AS A SEPARATE ELASTIC MEMBER TO BE MOUNTED AT AN ELAST...
- Publication number 20110041312
- Publication date Feb 24, 2011
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
CARRIER FOR ALIGNING ELECTRONIC COMPONENTS WITH SLIDABLY ARRANGED P...
- Publication number 20110042265
- Publication date Feb 24, 2011
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATE...
- Publication number 20110006183
- Publication date Jan 13, 2011
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATE...
- Publication number 20100206768
- Publication date Aug 19, 2010
- Multitest elektronische Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF ZEROING A TEST INSTRUMENT
- Publication number 20100176792
- Publication date Jul 15, 2010
- FLUKE CORPORATION
- Brian Stanley AIKINS
- G01 - MEASURING TESTING
Information Patent Application
USE OF MAGNETS TO PROVIDE RESILIENCE
- Publication number 20100078864
- Publication date Apr 1, 2010
- Research In Motion Limited
- Simon R. LANCASTER-LAROCQUE
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Assembly for carrying chip, and device and method for testing chip

Contact socket module and method of testing electronic components u...

Antenna in package production test

Antenna-in-package production test

End effector attachment for testing electronic touchscreen device

Modular pressing device capable of generating stage downward forces...

Semiconductor device handler with chuck clamp interlock

End effector attachment for testing electronic touchscreen device

Apparatuses, systems and methods for testing electrical functions

Device and method for aligning and holding a plurality of singulate...

Semiconductor package testing apparatus

Reconfigurable LED load board clamp

Test instrument probe with a pointed tip that is also capable of gr...

Insulated test clip cover assembly

Probe apparatus and wafer mounting table for probe apparatus

Multichannel clip device and methods of use

Clamp sensor and measurement apparatus

Apparatus for burn-in test

System for post-processsing of electronic components

Apparatus and method of zeroing a test instrument

Elastic unit for clamping an electronic component and extending bel...

Device and method for aligning and holding a plurality of singulate...

System for post-processing of electronic components

Two abutting sections of an align fixture together floatingly engag...

Align fixture for alignment of an electronic component

Device and method for aligning and holding a plurality of singulate...

Method of calibrating a test instrument

Fixture for aligning an electronic component

Use of magnets to provide resilience

Carrier for aligning electronic components with slidably arranged p...

Patents Applicationslast 30 patents

CONTACT SOCKET MODULE AND METHOD OF TESTING ELECTRONIC COMPONENTS U...

ASSEMBLY FOR CARRYING CHIP, ANDDEVICE AND METHOD FOR TESTING CHIP

Antenna in Package Production Test

ANTENNA-IN-PACKAGE PRODUCTION TEST

END EFFECTOR ATTACHMENT FOR TESTING ELECTRONIC TOUCHSCREEN DEVICE

SEMICONDUCTOR DEVICE HANDLER WITH CHUCK CLAMP INTERLOCK

MODULAR PRESSING DEVICE CAPABLE OF GENERATING STAGE DOWNWARD FORCES...

END EFFECTOR ATTACHMENT FOR TESTING ELECTRONIC TOUCHSCREEN DEVICE

Apparatus for Burn-In Test

SEMICONDUCTOR PACKAGE TESTING APPARATUS

CLAMP SENSOR AND MEASUREMENT APPARATUS

PROBE APPARATUS AND WAFER MOUNTING TABLE FOR PROBE APPARATUS

DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATE...

SYSTEM FOR POST-PROCESSSING OF ELECTRONIC COMPONENTS

INSULATED TEST CLIP COVER ASSEMBLY

DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATE...

Apparatus And Method Of Zeroing A Test Instrument

CAPACITOR TEST FIXTURE AND TEST SYSTEM EMPLOYING THE SAME

APPARATUS AND METHOD OF ZEROING A TEST INSTRUMENT

PIN CONNECTOR AND CHIP TEST FIXTURE HAVING THE SAME

SYSTEM FOR POST-PROCESSING OF ELECTRONIC COMPONENTS

TWO ABUTTING SECTIONS OF AN ALIGN FIXTURE TOGETHER FLOATINGLY ENGAG...

ELASTIC UNIT EXERTING TWO ANGLED FORCE COMPONENTS ON AN ABUTTING SE...

ELASTIC UNIT FOR CLAMPING AN ELECTRONIC COMPONENT AND EXTENDING BEL...

ELASTIC UNIT AS A SEPARATE ELASTIC MEMBER TO BE MOUNTED AT AN ELAST...

CARRIER FOR ALIGNING ELECTRONIC COMPONENTS WITH SLIDABLY ARRANGED P...

DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATE...

DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATE...

APPARATUS AND METHOD OF ZEROING A TEST INSTRUMENT

USE OF MAGNETS TO PROVIDE RESILIENCE