Test of field programmable gate arrays [FPGA]

Industry

CPC
G01R31/318519

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/318519Test of field programmable gate arrays [FPGA]

Industries

Patents Grantslast 30 patents

Information Patent Grant
Calibration system and method
- Patent number 12,013,435
- Issue date Jun 18, 2024
- Westinghouse Electric Company LLC
- Timothy S. Meyers
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for providing wireless FPGA programming download...
- Patent number 11,923,847
- Issue date Mar 5, 2024
- Gowin Semiconductor Corporation
- Jinghui Zhu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Basic logic element, semiconductor device including the same, outpu...
- Patent number 11,899,062
- Issue date Feb 13, 2024
- NEC Space Technologies, Ltd.
- Hiroki Hihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system configuration adapter systems and methods
- Patent number 11,867,720
- Issue date Jan 9, 2024
- Advantest Corporation
- Eddy Wayne Chow
- G01 - MEASURING TESTING
Information Patent Grant
Method of converting a serial vector format (SVF) file to a vector...
- Patent number 11,747,400
- Issue date Sep 5, 2023
- The United States of America, as represented by the Secretary of the Navy
- Daniel M. Dosado
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing artificial intelligence chip, devi...
- Patent number 11,714,128
- Issue date Aug 1, 2023
- KUNLUNXIN TECHNOLOGY (BEIJING) COMPANY LIMITED
- Ziyu Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and/or methods for anomaly detection and characterization i...
- Patent number 11,686,770
- Issue date Jun 27, 2023
- GRAMMATECH INC.
- Jason Alvin Dickens
- G01 - MEASURING TESTING
Information Patent Grant
Field programmable gate array (FPGA) for improving reliability of k...
- Patent number 11,604,696
- Issue date Mar 14, 2023
- WUXI ESIONTECH CO., LTD.
- Yueer Shan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heterogeneous-computing based emulator
- Patent number 11,520,961
- Issue date Dec 6, 2022
- International Business Machines Corporation
- Yan Heng Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for adaptively utilizing programmable logic devices
- Patent number 11,385,287
- Issue date Jul 12, 2022
- Xilinx, Inc.
- Andreas L. Astuti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing a circuit which is optimized for protection ag...
- Patent number 11,378,616
- Issue date Jul 5, 2022
- Safran Electronics & Defense
- Cédric Autie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for single-event upset fault injection testing
- Patent number 11,378,622
- Issue date Jul 5, 2022
- Raytheon Company
- Patrick Fleming
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method and test system
- Patent number 11,293,982
- Issue date Apr 5, 2022
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G01 - MEASURING TESTING
Information Patent Grant
Highspeed data interface for distributed system motor controllers
- Patent number 11,199,585
- Issue date Dec 14, 2021
- Hamilton Sundstrand Corporation
- Robert P. Wichowski
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Compressed test patterns for a field programmable gate array
- Patent number 11,193,975
- Issue date Dec 7, 2021
- Intel Corportion
- Christopher J. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for reviewing an FPGA-program
- Patent number 11,187,748
- Issue date Nov 30, 2021
- dspace digital signal processing and control engineering GmbH
- Heiko Kalte
- G01 - MEASURING TESTING
Information Patent Grant
Systems and/or methods for anomaly detection and characterization i...
- Patent number 11,092,648
- Issue date Aug 17, 2021
- GrammaTech, Inc.
- Jason Alvin Dickens
- G01 - MEASURING TESTING
Information Patent Grant
Combinatorial serial and parallel test access port selection in a J...
- Patent number 11,041,905
- Issue date Jun 22, 2021
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In-system scan test of chips in an emulation system
- Patent number 10,997,343
- Issue date May 4, 2021
- Cadence Design Systems, Inc.
- Mitchell Poplack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for providing wireless FPGA programming download...
- Patent number 10,992,298
- Issue date Apr 27, 2021
- Gowin Semiconductor Corporation
- Jinghui Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for and method of receiving data in an integrated circuit
- Patent number 10,826,517
- Issue date Nov 3, 2020
- Xilinx, Inc.
- Bruno Miguel Vaz
- G01 - MEASURING TESTING
Information Patent Grant
Testing autonomous reconfiguration logic for an electromechanical a...
- Patent number 10,810,114
- Issue date Oct 20, 2020
- Hamilton Sundstrand Corporation
- David F. Dickie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for testing and configuration of an FPGA
- Patent number 10,746,796
- Issue date Aug 18, 2020
- MENTA
- Laurent Rouge
- G01 - MEASURING TESTING
Information Patent Grant
Configuration and testing method and system for FPGA chip using bum...
- Patent number 10,613,145
- Issue date Apr 7, 2020
- SINO IC TECHNOLOGY CO., LTD.
- Bin Luo
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor device and method of manufacturing...
- Patent number 10,591,543
- Issue date Mar 17, 2020
- Samsung Electronics Co., Ltd.
- Joo-sung Yun
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 10,571,520
- Issue date Feb 25, 2020
- Internatioanl Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
FPGA configured vector network analyzer for measuring the z paramet...
- Patent number 10,560,075
- Issue date Feb 11, 2020
- Cosmin Iorga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test network for a network on a chip and a configuration network
- Patent number 10,502,785
- Issue date Dec 10, 2019
- Xilinx, Inc.
- Rafael C. Camarota
- G01 - MEASURING TESTING
Information Patent Grant
Combinatorial serial and parallel test access port selection in a J...
- Patent number 10,495,690
- Issue date Dec 3, 2019
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital integrated circuit protected from transient errors
- Patent number 10,488,461
- Issue date Nov 26, 2019
- Thales
- Yann Nicolas Pierre Oster
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS
- Publication number 20240103037
- Publication date Mar 28, 2024
- Advantest Corporation
- Eddy Wayne CHOW
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONVERTING A SERIAL VECTOR FORMAT (SVF) FILE TO A VECTOR...
- Publication number 20230027456
- Publication date Jan 26, 2023
- The United States of America, as represented by the Secretary of the Navy
- Daniel M. Dosado
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION SYSTEM AND METHOD
- Publication number 20220229111
- Publication date Jul 21, 2022
- Westinghouse Electric Company LLC
- Timothy S. MEYERS
- G01 - MEASURING TESTING
Information Patent Application
BASIC LOGIC ELEMENT, SEMICONDUCTOR DEVICE INCLUDING THE SAME, OUTPU...
- Publication number 20220206066
- Publication date Jun 30, 2022
- NEC Space Technologies, Ltd.
- Hiroki HIHARA
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS
- Publication number 20220155342
- Publication date May 19, 2022
- Advantest Corporation
- Eddy Wayne CHOW
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND/OR METHODS FOR ANOMALY DETECTION AND CHARACTERIZATION I...
- Publication number 20220050140
- Publication date Feb 17, 2022
- GrammaTech, Inc.
- Jason Alvin DICKENS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING A CIRCUIT WHICH IS OPTIMIZED FOR PROTECTION AG...
- Publication number 20210247441
- Publication date Aug 12, 2021
- Safran Electronics & Defence
- Cédric AUTIE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PROVIDING WIRELESS FPGA PROGRAMMING DOWNLOAD...
- Publication number 20210226633
- Publication date Jul 22, 2021
- Gowin Semiconductor Corporation
- Jinghui Zhu
- G01 - MEASURING TESTING
Information Patent Application
HETEROGENEOUS-COMPUTING BASED EMULATOR
- Publication number 20210141868
- Publication date May 13, 2021
- International Business Machines Corporation
- Yan Heng Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PROVIDING WIRELESS FPGA PROGRAMMING DOWNLOAD...
- Publication number 20210119632
- Publication date Apr 22, 2021
- Gowin Semiconductor Corporation
- Jinghui Zhu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SERVER SWITCH SYSTEM INCLUDING FIELD-PROGRAMMABLE GATE ARRAY UNIT F...
- Publication number 20200386812
- Publication date Dec 10, 2020
- Inventec (Pudong) Technology Corp.
- Chih-Jen Chin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND/OR METHODS FOR ANOMALY DETECTION AND CHARACTERIZATION I...
- Publication number 20200326373
- Publication date Oct 15, 2020
- GrammaTech, Inc.
- Jason Alvin DICKENS
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD AND TEST SYSTEM
- Publication number 20200284839
- Publication date Sep 10, 2020
- Rohde& Schwarz GmbH & Co. KG
- Philip Diegmann
- G01 - MEASURING TESTING
Information Patent Application
PROCEDURE FOR REVIEWING AN FPGA-PROGRAM
- Publication number 20200132766
- Publication date Apr 30, 2020
- dSpace digital signal processing and control engineering GmbH
- Heiko KALTE
- G01 - MEASURING TESTING
Information Patent Application
COMBINATORIAL SERIAL AND PARALLEL TEST ACCESS PORT SELECTION IN A J...
- Publication number 20200064405
- Publication date Feb 27, 2020
- STMicroelectronics International N.V.
- Venkata Narayanan SRINIVASAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPRESSED TEST PATTERNS FOR A FIELD PROGRAMMABLE GATE ARRAY
- Publication number 20200003836
- Publication date Jan 2, 2020
- Intel Corporation
- Christopher J. NELSON
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...
- Publication number 20190377028
- Publication date Dec 12, 2019
- Samsung Electronics Co., Ltd.
- Joo-sung YUN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING AUTONOMOUS RECONFIGURATION LOGIC FOR AN ELECTROMECHANICAL A...
- Publication number 20190303278
- Publication date Oct 3, 2019
- HAMILTON SUNDSTRAND CORPORATION
- David F. Dickie
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING AND CONFIGURATION OF AN FPGA
- Publication number 20190227120
- Publication date Jul 25, 2019
- MENTA
- Laurent ROUGE
- G01 - MEASURING TESTING
Information Patent Application
COMBINATORIAL SERIAL AND PARALLEL TEST ACCESS PORT SELECTION IN A J...
- Publication number 20190064270
- Publication date Feb 28, 2019
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONVERGED TEST PLATFORMS AND PROCESSES FOR CLASS AND SYSTEM TESTING...
- Publication number 20180252772
- Publication date Sep 6, 2018
- Intel Corporation
- Abram M. Detofsky
- G01 - MEASURING TESTING
Information Patent Application
Field Programmable Gate Array
- Publication number 20180113757
- Publication date Apr 26, 2018
- Hitachi, Ltd
- Teruaki SAKATA
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURATION AND TESTING METHOD AND SYSTEM FOR FPGA CHIP USING BUM...
- Publication number 20180024194
- Publication date Jan 25, 2018
- SINO IC TECHNOLOGY CO., LTD.
- Bin LUO
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE LOGIC DEVICE AND VERIFICATION METHOD THEREFOR
- Publication number 20150204944
- Publication date Jul 23, 2015
- KABUSHIKI KAISHA TOSHIBA
- Shuji Hamada
- G01 - MEASURING TESTING
Information Patent Application
FILTERING EVENT LOG ENTRIES
- Publication number 20140372426
- Publication date Dec 18, 2014
- Enrique Q. Garcia
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20140298128
- Publication date Oct 2, 2014
- International Business Machines Corporation
- Dzmitry Maliuk
- G01 - MEASURING TESTING
Information Patent Application
System and method for optimized board test and configuration
- Publication number 20140298125
- Publication date Oct 2, 2014
- Testonica Lab OU
- Sergei DEVADZE
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE MEASUREMENT APPARATUS HAVING A SYSTEM-ON-A-CHIP DEVICE AND...
- Publication number 20140277827
- Publication date Sep 18, 2014
- Service Solutions U.S. LLC
- Manokar CHINNADURAI
- G01 - MEASURING TESTING
Information Patent Application
AT-SPEED SCAN TESTING OF CLOCK DIVIDER LOGIC IN A CLOCK MODULE OF A...
- Publication number 20140208175
- Publication date Jul 24, 2014
- LSI Corporation
- Priyesh Kumar
- G01 - MEASURING TESTING
Information Patent Application
pBIST READ ONLY MEMORY IMAGE COMPRESSION
- Publication number 20140164855
- Publication date Jun 12, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Raguram Damodaran
- G01 - MEASURING TESTING

Test of field programmable gate arrays [FPGA]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Calibration system and method

Method and system for providing wireless FPGA programming download...

Basic logic element, semiconductor device including the same, outpu...

Test system configuration adapter systems and methods

Method of converting a serial vector format (SVF) file to a vector...

Method and apparatus for testing artificial intelligence chip, devi...

Systems and/or methods for anomaly detection and characterization i...

Field programmable gate array (FPGA) for improving reliability of k...

Heterogeneous-computing based emulator

Method for adaptively utilizing programmable logic devices

Method for producing a circuit which is optimized for protection ag...

Methods and systems for single-event upset fault injection testing

Test method and test system

Highspeed data interface for distributed system motor controllers

Compressed test patterns for a field programmable gate array

Procedure for reviewing an FPGA-program

Systems and/or methods for anomaly detection and characterization i...

Combinatorial serial and parallel test access port selection in a J...

In-system scan test of chips in an emulation system

Method and system for providing wireless FPGA programming download...

Circuit for and method of receiving data in an integrated circuit

Testing autonomous reconfiguration logic for an electromechanical a...

System and method for testing and configuration of an FPGA

Configuration and testing method and system for FPGA chip using bum...

Test apparatus for semiconductor device and method of manufacturing...

Scan chain latch design that improves testability of integrated cir...

FPGA configured vector network analyzer for measuring the z paramet...

Test network for a network on a chip and a configuration network

Combinatorial serial and parallel test access port selection in a J...

Digital integrated circuit protected from transient errors

Patents Applicationslast 30 patents

TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS

METHOD OF CONVERTING A SERIAL VECTOR FORMAT (SVF) FILE TO A VECTOR...

CALIBRATION SYSTEM AND METHOD

BASIC LOGIC ELEMENT, SEMICONDUCTOR DEVICE INCLUDING THE SAME, OUTPU...

TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS

SYSTEMS AND/OR METHODS FOR ANOMALY DETECTION AND CHARACTERIZATION I...

METHOD FOR PRODUCING A CIRCUIT WHICH IS OPTIMIZED FOR PROTECTION AG...

METHOD AND SYSTEM FOR PROVIDING WIRELESS FPGA PROGRAMMING DOWNLOAD...

HETEROGENEOUS-COMPUTING BASED EMULATOR

METHOD AND SYSTEM FOR PROVIDING WIRELESS FPGA PROGRAMMING DOWNLOAD...

SERVER SWITCH SYSTEM INCLUDING FIELD-PROGRAMMABLE GATE ARRAY UNIT F...

SYSTEMS AND/OR METHODS FOR ANOMALY DETECTION AND CHARACTERIZATION I...

TEST METHOD AND TEST SYSTEM

PROCEDURE FOR REVIEWING AN FPGA-PROGRAM

COMBINATORIAL SERIAL AND PARALLEL TEST ACCESS PORT SELECTION IN A J...

COMPRESSED TEST PATTERNS FOR A FIELD PROGRAMMABLE GATE ARRAY

TEST APPARATUS FOR SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...

TESTING AUTONOMOUS RECONFIGURATION LOGIC FOR AN ELECTROMECHANICAL A...

SYSTEM AND METHOD FOR TESTING AND CONFIGURATION OF AN FPGA

COMBINATORIAL SERIAL AND PARALLEL TEST ACCESS PORT SELECTION IN A J...

CONVERGED TEST PLATFORMS AND PROCESSES FOR CLASS AND SYSTEM TESTING...

Field Programmable Gate Array

CONFIGURATION AND TESTING METHOD AND SYSTEM FOR FPGA CHIP USING BUM...

PROGRAMMABLE LOGIC DEVICE AND VERIFICATION METHOD THEREFOR

FILTERING EVENT LOG ENTRIES

SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...

System and method for optimized board test and configuration

VEHICLE MEASUREMENT APPARATUS HAVING A SYSTEM-ON-A-CHIP DEVICE AND...

AT-SPEED SCAN TESTING OF CLOCK DIVIDER LOGIC IN A CLOCK MODULE OF A...

pBIST READ ONLY MEMORY IMAGE COMPRESSION