Test strategies

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CPC
G01R31/31707

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31707Test strategies

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for controlling actions of testbench components w...
- Patent number 12,188,983
- Issue date Jan 7, 2025
- HCL America Inc.
- Manickam Muthiah
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit performing analog built-in self test and operati...
- Patent number 12,158,497
- Issue date Dec 3, 2024
- Samsung Electronics Co., Ltd.
- Hyunseok Nam
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Random number generation testing systems and methods
- Patent number 12,135,352
- Issue date Nov 5, 2024
- Advantest Corporation
- Marilyn Kushnick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Virtual quality control interpolation and process feedback in the p...
- Patent number 12,105,137
- Issue date Oct 1, 2024
- SanDisk Technologies LLC
- Yusuke Ikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus of testing circuit, and storage medium
- Patent number 12,078,671
- Issue date Sep 3, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng Gu
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
- Patent number 12,055,584
- Issue date Aug 6, 2024
- Tektronix, Inc.
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit, chip and semiconductor device
- Patent number 12,021,537
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chao Chieh Li
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for fault injection testing of an integrated ci...
- Patent number 12,019,119
- Issue date Jun 25, 2024
- Imagination Technologies Limited
- Reinald Cruz
- G01 - MEASURING TESTING
Information Patent Grant
Pattern generation system with pin function mapping
- Patent number 11,977,115
- Issue date May 7, 2024
- Yangtze Memory Technologies Co., Ltd.
- Feng Ru
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
- Patent number 11,927,627
- Issue date Mar 12, 2024
- Tektronix, Inc.
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 11,762,013
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic control unit testing optimization
- Patent number 11,756,349
- Issue date Sep 12, 2023
- NEC Corporation
- Jianwu Xu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 11,609,262
- Issue date Mar 21, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for fault injection testing of an integrated ci...
- Patent number 11,567,126
- Issue date Jan 31, 2023
- Imagination Technologies Limited
- Reinald Cruz
- G01 - MEASURING TESTING
Information Patent Grant
Mode controller and integrated circuit chip including the same
- Patent number 11,550,685
- Issue date Jan 10, 2023
- Samsung Electronics Co., Ltd.
- Jongseon Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit, chip and semiconductor device
- Patent number 11,533,056
- Issue date Dec 20, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chao Chieh Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Capability test method based on joint test support platform
- Patent number 11,481,309
- Issue date Oct 25, 2022
- Chao Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test and measurement system for parallel waveform analysis
- Patent number 11,442,102
- Issue date Sep 13, 2022
- Tektronix, Inc.
- Sriram Mandyam Krishnakumar
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for predicting the trajectory of an object with...
- Patent number 11,427,210
- Issue date Aug 30, 2022
- Toyota Research Institute, Inc.
- Guy Rosman
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Safety circuit and method for testing a safety circuit in an automa...
- Patent number 11,353,506
- Issue date Jun 7, 2022
- WAGO Verwaltungsgesellschaft mit beschraenkter Haftung
- Alexander Buelow
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing of integrated circuits during at-speed mode of operation
- Patent number 11,333,707
- Issue date May 17, 2022
- Texas Instruments Incorporated
- Khushboo Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Failure diagnostic apparatus and failure diagnostic method
- Patent number 11,193,974
- Issue date Dec 7, 2021
- Renesas Electronics Corporation
- Yukihisa Funatsu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit, test method for testing integrated circuit, and...
- Patent number 11,115,024
- Issue date Sep 7, 2021
- Kabushiki Kaisha Toshiba
- Masato Oda
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic weight selection process for logic built-in self test
- Patent number 11,112,457
- Issue date Sep 7, 2021
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Tester and method for testing a device under test and tester and me...
- Patent number 11,105,855
- Issue date Aug 31, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for detecting a malicious circuit on an integrate...
- Patent number 11,100,219
- Issue date Aug 24, 2021
- NXP B.V.
- Jan-Peter Schat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated laser voltage probe pad for measuring DC or low frequenc...
- Patent number 11,079,432
- Issue date Aug 3, 2021
- NXP B.V.
- Pieter Gustaaf Nierop
- G01 - MEASURING TESTING
Information Patent Grant
Segmented digital die ring
- Patent number 11,054,468
- Issue date Jul 6, 2021
- Micron Technology, Inc.
- Kevin G. Werhane
- G01 - MEASURING TESTING
Information Patent Grant
Testing integrated circuit designs containing multiple phase rotators
- Patent number 11,016,144
- Issue date May 25, 2021
- International Business Machines Corporation
- Robert G. Gerowitz
- G01 - MEASURING TESTING
Information Patent Grant
Method to improve testability using 2-dimensional exclusive or (XOR...
- Patent number 10,955,470
- Issue date Mar 23, 2021
- Cadence Design Systems, Inc.
- Brian Edward Foutz
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20240418774
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION APPARATUS, EVALUATION METHOD, AND NON-TRANSITORY COMPUTE...
- Publication number 20240385239
- Publication date Nov 21, 2024
- Advantest Corporation
- Yasunori MATSUZAKI
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE
- Publication number 20240305301
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO CHIEH LI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PATTERN GENERATION SYSTEM WITH PIN FUNCTION MAPPING
- Publication number 20240230756
- Publication date Jul 11, 2024
- Yangtze Memory Technologies Co., Ltd.
- Feng Ru
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20240003968
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS OF TESTING CIRCUIT, AND STORAGE MEDIUM
- Publication number 20230221365
- Publication date Jul 13, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Cheng GU
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR FAULT INJECTION TESTING OF AN INTEGRATED CI...
- Publication number 20230160957
- Publication date May 25, 2023
- Imagination Technologies Limited
- Reinald Cruz
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC CIRCUIT PERFORMING ANALOG BUILT-IN SELF TEST AND OPERATI...
- Publication number 20230137979
- Publication date May 4, 2023
- Samsung Electronics Co., Ltd.
- HYUNSEOK NAM
- G01 - MEASURING TESTING
Information Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
- Publication number 20230129176
- Publication date Apr 27, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE
- Publication number 20230118223
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO CHIEH LI
- G04 - HOROLOGY
Information Patent Application
VIRTUAL QUALITY CONTROL INTERPOLATION AND PROCESS FEEDBACK IN THE P...
- Publication number 20220413036
- Publication date Dec 29, 2022
- SANDISK TECHNOLOGIES LLC
- Yusuke Ikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN GENERATION SYSTEM WITH PIN FUNCTION MAPPING
- Publication number 20220317185
- Publication date Oct 6, 2022
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Feng Ru
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TE...
- Publication number 20220163587
- Publication date May 26, 2022
- Tektronix, Inc.
- Daniel S. Froelich
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR FAULT INJECTION TESTING OF AN INTEGRATED CI...
- Publication number 20220043059
- Publication date Feb 10, 2022
- Imagination Technologies Limited
- Reinald Cruz
- G01 - MEASURING TESTING
Information Patent Application
Random Number Generation Testing Systems and Methods
- Publication number 20210302496
- Publication date Sep 30, 2021
- Advantest Corporation
- Marilyn Kushnick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20210173007
- Publication date Jun 10, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD, SYSTEM, READABLE STORAGE MEDIUM AND ELECTRONIC DEVICE...
- Publication number 20210149782
- Publication date May 20, 2021
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Baodong SONG
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT, TEST METHOD FOR TESTING INTEGRATED CIRCUIT, AND...
- Publication number 20210083672
- Publication date Mar 18, 2021
- KABUSHIKI KAISHA TOSHIBA
- Masato ODA
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC CONTROL UNIT TESTING OPTIMIZATION
- Publication number 20210078589
- Publication date Mar 18, 2021
- NEC Laboratories America, Inc.
- Jianwu Xu
- B60 - VEHICLES IN GENERAL
Information Patent Application
CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE
- Publication number 20210080503
- Publication date Mar 18, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO CHIEH LI
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT SYSTEM FOR PARALLEL WAVEFORM ANALYSIS
- Publication number 20200363471
- Publication date Nov 19, 2020
- Tektronix, Inc.
- Sriram Mandyam Krishnakumar
- G01 - MEASURING TESTING
Information Patent Application
POWER DROOP MEASUREMENTS USING ANALOG-TO-DIGITAL CONVERTER DURING T...
- Publication number 20200319248
- Publication date Oct 8, 2020
- Apple Inc.
- Bibo Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED LASER VOLTAGE PROBE PAD FOR MEASURING DC OR LOW FREQUENC...
- Publication number 20200264232
- Publication date Aug 20, 2020
- NPX B.V.
- Pieter Gustaaf Nierop
- G01 - MEASURING TESTING
Information Patent Application
TESTING INTEGRATED CIRCUIT DESIGNS CONTAINING MULTIPLE PHASE ROTATORS
- Publication number 20200150175
- Publication date May 14, 2020
- International Business Machines Corporation
- Robert G. GEROWITZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING OF INTEGRATED CIRCUITS DURING AT-SPEED MODE OF OPERATION
- Publication number 20200132763
- Publication date Apr 30, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Khushboo Agarwal
- G01 - MEASURING TESTING
Information Patent Application
SAFETY CIRCUIT AND METHOD FOR TESTING A SAFETY CIRCUIT IN AN AUTOMA...
- Publication number 20200116785
- Publication date Apr 16, 2020
- WAGO VERWALTUNGSGESELLSCHAFT MBH
- Alexander BUELOW
- G01 - MEASURING TESTING
Information Patent Application
TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...
- Publication number 20190377027
- Publication date Dec 12, 2019
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
SEGMENTED DIGITAL DIE RING
- Publication number 20190369163
- Publication date Dec 5, 2019
- Micron Technology, Inc.
- Kevin G. Werhane
- G01 - MEASURING TESTING
Information Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
- Publication number 20190146028
- Publication date May 16, 2019
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ADAPTIVE TESTING OF SEMICONDUCTOR PRODUCT
- Publication number 20180364302
- Publication date Dec 20, 2018
- Nuvoton Technology Corporation
- Long Chieu
- G01 - MEASURING TESTING

Test strategies

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for controlling actions of testbench components w...

Electronic circuit performing analog built-in self test and operati...

Random number generation testing systems and methods

Virtual quality control interpolation and process feedback in the p...

Method and apparatus of testing circuit, and storage medium

Systems, methods, and devices for high-speed input/output margin te...

Circuit, chip and semiconductor device

Methods and systems for fault injection testing of an integrated ci...

Pattern generation system with pin function mapping

Systems, methods, and devices for high-speed input/output margin te...

Integrated circuit profiling and anomaly detection

Electronic control unit testing optimization

On-die aging measurements for dynamic timing modeling

Methods and systems for fault injection testing of an integrated ci...

Mode controller and integrated circuit chip including the same

Circuit, chip and semiconductor device

Capability test method based on joint test support platform

Test and measurement system for parallel waveform analysis

Systems and methods for predicting the trajectory of an object with...

Safety circuit and method for testing a safety circuit in an automa...

Testing of integrated circuits during at-speed mode of operation

Failure diagnostic apparatus and failure diagnostic method

Integrated circuit, test method for testing integrated circuit, and...

Dynamic weight selection process for logic built-in self test

Tester and method for testing a device under test and tester and me...

Method and device for detecting a malicious circuit on an integrate...

Integrated laser voltage probe pad for measuring DC or low frequenc...

Segmented digital die ring

Testing integrated circuit designs containing multiple phase rotators

Method to improve testability using 2-dimensional exclusive or (XOR...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

EVALUATION APPARATUS, EVALUATION METHOD, AND NON-TRANSITORY COMPUTE...

CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE

PATTERN GENERATION SYSTEM WITH PIN FUNCTION MAPPING

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

METHOD AND APPARATUS OF TESTING CIRCUIT, AND STORAGE MEDIUM

METHODS AND SYSTEMS FOR FAULT INJECTION TESTING OF AN INTEGRATED CI...

ELECTRONIC CIRCUIT PERFORMING ANALOG BUILT-IN SELF TEST AND OPERATI...

On-Die Aging Measurements for Dynamic Timing Modeling

CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE

VIRTUAL QUALITY CONTROL INTERPOLATION AND PROCESS FEEDBACK IN THE P...

PATTERN GENERATION SYSTEM WITH PIN FUNCTION MAPPING

SYSTEMS, METHODS, AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TE...

METHODS AND SYSTEMS FOR FAULT INJECTION TESTING OF AN INTEGRATED CI...

Random Number Generation Testing Systems and Methods

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

TEST METHOD, SYSTEM, READABLE STORAGE MEDIUM AND ELECTRONIC DEVICE...

INTEGRATED CIRCUIT, TEST METHOD FOR TESTING INTEGRATED CIRCUIT, AND...

ELECTRONIC CONTROL UNIT TESTING OPTIMIZATION

CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE

TEST AND MEASUREMENT SYSTEM FOR PARALLEL WAVEFORM ANALYSIS

POWER DROOP MEASUREMENTS USING ANALOG-TO-DIGITAL CONVERTER DURING T...

INTEGRATED LASER VOLTAGE PROBE PAD FOR MEASURING DC OR LOW FREQUENC...

TESTING INTEGRATED CIRCUIT DESIGNS CONTAINING MULTIPLE PHASE ROTATORS

TESTING OF INTEGRATED CIRCUITS DURING AT-SPEED MODE OF OPERATION

SAFETY CIRCUIT AND METHOD FOR TESTING A SAFETY CIRCUIT IN AN AUTOMA...

TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...

SEGMENTED DIGITAL DIE RING

On-Die Aging Measurements for Dynamic Timing Modeling

SYSTEM AND METHOD FOR ADAPTIVE TESTING OF SEMICONDUCTOR PRODUCT