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G11C29/00
Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
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G11C29/46
Test trigger logic
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and devices for flexible RAM loading
Patent number
11,984,178
Issue date
May 14, 2024
STMicroelectronics S.r.l.
Gabriele Solcia
G11 - INFORMATION STORAGE
Information
Patent Grant
Systems and methods for fault-resilient system management random ac...
Patent number
11,984,183
Issue date
May 14, 2024
Dell Products L.P.
Balasingh P. Samuel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Enabling or disabling on-die error-correcting code for a memory bui...
Patent number
11,984,180
Issue date
May 14, 2024
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor apparatus related to a test function
Patent number
11,967,389
Issue date
Apr 23, 2024
SK hynix Inc.
Seon Woo Hwang
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for testing multicore SSD firmware based on preco...
Patent number
11,967,391
Issue date
Apr 23, 2024
SK Hynix Inc.
Yahor Zaitsau
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for testing failure of memory, storage medium,...
Patent number
11,967,392
Issue date
Apr 23, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Chenggong Zhou
G11 - INFORMATION STORAGE
Information
Patent Grant
Testing of on-chip analog-mixed signal circuits using on-chip memory
Patent number
11,961,577
Issue date
Apr 16, 2024
NXP USA, INC.
Kumar Abhishek
G11 - INFORMATION STORAGE
Information
Patent Grant
Testing circuit, testing device and testing method thereof
Patent number
11,948,650
Issue date
Apr 2, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Liang Zhang
G11 - INFORMATION STORAGE
Information
Patent Grant
Distributed phased SRAM repair for systems on a chip
Patent number
11,948,654
Issue date
Apr 2, 2024
Meta Platforms Technologies, LLC
Shrirang Madhav Yardi
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and device for processing data stored in a memory unit
Patent number
11,947,807
Issue date
Apr 2, 2024
Robert Bosch GmbH
Manuel Jauss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Indicating a status of a memory built-in self-test
Patent number
11,929,134
Issue date
Mar 12, 2024
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus, memory device, and method reducing clock training time
Patent number
11,923,042
Issue date
Mar 5, 2024
Samsung Electronics Co., Ltd.
Sangwoo Kim
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatuses and methods for bad row mode
Patent number
11,915,775
Issue date
Feb 27, 2024
Micron Technology, Inc.
Jack Riley
G11 - INFORMATION STORAGE
Information
Patent Grant
Selective margin testing to determine whether to signal train a mem...
Patent number
11,894,084
Issue date
Feb 6, 2024
Intel Corporation
Dujian Wu
G11 - INFORMATION STORAGE
Information
Patent Grant
Method, device, and circuit for high-speed memories
Patent number
11,894,086
Issue date
Feb 6, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Jaspal Singh Shah
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for verifying and analyzing memory for high perfo...
Patent number
11,862,275
Issue date
Jan 2, 2024
KingTiger Technology (Canada) Inc.
Bosco Chun Sang Lai
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory test method and memory test apparatus
Patent number
11,862,276
Issue date
Jan 2, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Wei Huang
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and device for determining repaired line and repairing line...
Patent number
11,862,279
Issue date
Jan 2, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Bo Yang
G11 - INFORMATION STORAGE
Information
Patent Grant
Test circuit in scribe region for memory failure analysis
Patent number
11,854,639
Issue date
Dec 26, 2023
Micron Technology, Inc.
Atsuko Otsuka
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory test methods and related devices
Patent number
11,854,642
Issue date
Dec 26, 2023
Changxin Memory Technologies, Inc.
Heng-Chia Chang
G11 - INFORMATION STORAGE
Information
Patent Grant
Counter-based sense amplifier method for memory cells
Patent number
11,842,783
Issue date
Dec 12, 2023
Micron Technology, Inc.
Riccardo Muzzetto
G11 - INFORMATION STORAGE
Information
Patent Grant
Storage subsystem read voltage determination system
Patent number
11,837,306
Issue date
Dec 5, 2023
Dell Products L.P.
Frederick K. H. Lee
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic memory device
Patent number
11,837,312
Issue date
Dec 5, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Chia-Hsiang Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Storage devices and methods of operating storage devices
Patent number
11,830,561
Issue date
Nov 28, 2023
Samsung Electronics Co., Ltd.
Youngmin Lee
G11 - INFORMATION STORAGE
Information
Patent Grant
Circuit for detecting anti-fuse memory cell state and memory
Patent number
11,817,159
Issue date
Nov 14, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Rumin Ji
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and method for checking an operation status of a memory d...
Patent number
11,815,985
Issue date
Nov 14, 2023
SK Hynix Inc.
Jong-Min Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Standby circuit dispatch method, apparatus, device and medium
Patent number
11,791,012
Issue date
Oct 17, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Yui-Lang Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for parallel memory test
Patent number
11,776,656
Issue date
Oct 3, 2023
Texas Instruments Incorporated
Nitesh Mishra
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for generating an memory built-in self-test algorithm circuit
Patent number
11,776,649
Issue date
Oct 3, 2023
ISTART-TEK INC.
Chia Wei Lee
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory device and operating method thereof
Patent number
11,769,565
Issue date
Sep 26, 2023
SK Hynix Inc.
Seung Hyun Chung
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
MEMORY BIST CIRCUIT AND METHOD
Publication number
20240170083
Publication date
May 23, 2024
TEXAS INSTRUMENTS INCORPORATED
Devanathan Varadarajan
G11 - INFORMATION STORAGE
Information
Patent Application
VERA DETECTION METHOD TO CATCH ERASE FAIL
Publication number
20240161858
Publication date
May 16, 2024
SANDISK TECHNOLOGIES LLC
Parth Amin
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM PERFORMING ERROR CORR...
Publication number
20240161853
Publication date
May 16, 2024
SK HYNIX INC.
Hong Ki MOON
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY TESTING SYSTEM AND MEMORY TESTING METHOD
Publication number
20240161857
Publication date
May 16, 2024
NANYA TECHNOLOGY CORPORATION
Chien Yu CHEN
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD, DEVICE, AND CIRCUIT FOR HIGH-SPEED MEMORIES
Publication number
20240153573
Publication date
May 9, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Jaspal Singh SHAH
G11 - INFORMATION STORAGE
Information
Patent Application
FLASH MEMORY FOR PERFORMING MARGIN READ TEST OPERATION AND MARGIN R...
Publication number
20240145021
Publication date
May 2, 2024
Samsung Electronics Co., Ltd.
Gyuseong KIM
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY DEVICE INCLUDING TEST PAD CONNECTION CIRCUIT
Publication number
20240145023
Publication date
May 2, 2024
Samsung Electronics Co., Ltd.
Chang-Wook SEO
G11 - INFORMATION STORAGE
Information
Patent Application
INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST
Publication number
20240127902
Publication date
Apr 18, 2024
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY DEVICE AND OPERATION METHOD THEREOF
Publication number
20240127879
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Kyo-Gil Lee
G11 - INFORMATION STORAGE
Information
Patent Application
TEMPERATURE-BASED ERROR MASKING DURING MBIST OPERATION
Publication number
20240127901
Publication date
Apr 18, 2024
Micron Technology, Inc.
Daniel S. Miller
G11 - INFORMATION STORAGE
Information
Patent Application
TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
Publication number
20240120014
Publication date
Apr 11, 2024
SK HYNIX INC.
Suk Hwan CHOI
G11 - INFORMATION STORAGE
Information
Patent Application
BUILT-IN SELF-TEST CIRCUIT FOR ROW HAMMERING IN MEMORY
Publication number
20240096435
Publication date
Mar 21, 2024
Synopsys, Inc.
Grigor TSHAGHARYAN
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAY
Publication number
20240079080
Publication date
Mar 7, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Jui-Jen Wu
G11 - INFORMATION STORAGE
Information
Patent Application
SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY...
Publication number
20240071560
Publication date
Feb 29, 2024
Micron Technology, Inc.
Yoshinori Fujiwara
G11 - INFORMATION STORAGE
Information
Patent Application
INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST FOR MULTIPLE MEM...
Publication number
20240047004
Publication date
Feb 8, 2024
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Application
READ-WRITE METHOD AND APPARATUS FOR LEPS SOFT DECODING ESTIMATION,...
Publication number
20240038318
Publication date
Feb 1, 2024
Institute of Microelectronics, Chinese Academy of Sciences
Qi Wang
G11 - INFORMATION STORAGE
Information
Patent Application
INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST USING A DATA MAS...
Publication number
20240038320
Publication date
Feb 1, 2024
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICES AND MEMORY SYSTEMS INCLUDING THE SAME
Publication number
20240029808
Publication date
Jan 25, 2024
Samsung Electronics Co., Ltd.
Yujung Song
G11 - INFORMATION STORAGE
Information
Patent Application
DYNAMIC RANDOM ACCESS MEMORY BUILT-IN SELF-TEST POWER FAIL MITIGATION
Publication number
20240021263
Publication date
Jan 18, 2024
Intel Corporation
Bill NALE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS WITH ADJUSTABLE DIAGNOSTIC MECHANISM AND METHODS FOR OPER...
Publication number
20240021262
Publication date
Jan 18, 2024
Micron Technology, Inc.
Takuya Tamano
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY BUILT-IN SELF-TEST WITH AUTOMATED REFERENCE TRIM FEEDBACK FO...
Publication number
20240013846
Publication date
Jan 11, 2024
Siemens Industry Software Inc.
Jongsin Yun
G11 - INFORMATION STORAGE
Information
Patent Application
TESTING OF ON-CHIP ANALOG-MIXED SIGNAL CIRCUITS USING ON-CHIP MEMORY
Publication number
20240013848
Publication date
Jan 11, 2024
NXP USA, Inc.
Kumar Abhishek
G11 - INFORMATION STORAGE
Information
Patent Application
MAGNETIC MEMORY DEVICE
Publication number
20230410932
Publication date
Dec 21, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Chia-Hsiang CHEN
G11 - INFORMATION STORAGE
Information
Patent Application
Magnetic Memory Device
Publication number
20230410931
Publication date
Dec 21, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Chia-Hsiang CHEN
G11 - INFORMATION STORAGE
Information
Patent Application
INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST
Publication number
20230410933
Publication date
Dec 21, 2023
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD FOR OPTIMIZING FLASH MEMORY CHIP AND RELATED APPARATUS
Publication number
20230402121
Publication date
Dec 14, 2023
Huawei Technologies Co., Ltd
Jun YU
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY DEVICE AND TEST METHOD OF MEMORY DEVICE
Publication number
20230402123
Publication date
Dec 14, 2023
Samsung Electronics Co., Ltd.
Jaewon Park
G11 - INFORMATION STORAGE
Information
Patent Application
SYSTEM AND METHOD FOR PARALLEL MEMORY TEST
Publication number
20230402124
Publication date
Dec 14, 2023
TEXAS INSTRUMENTS INCORPORATED
Nitesh MISHRA
G11 - INFORMATION STORAGE
Information
Patent Application
ENABLING OR DISABLING ON-DIE ERROR-CORRECTING CODE FOR A MEMORY BUI...
Publication number
20230395177
Publication date
Dec 7, 2023
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE
Information
Patent Application
INTERRUPTING A MEMORY BUILT-IN SELF-TEST
Publication number
20230395179
Publication date
Dec 7, 2023
Micron Technology, Inc.
Scott E. Schaefer
G11 - INFORMATION STORAGE