tester configuration

Industry

CPC
G01R31/31903

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31903tester configuration

Industries

Patents Grantslast 30 patents

Information Patent Grant
Stress-testing electrical components using telemetry modeling
- Patent number 12,038,479
- Issue date Jul 16, 2024
- Cisco Technology, Inc.
- James Edwin Turman
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for testing a device under test
- Patent number 11,762,018
- Issue date Sep 19, 2023
- Rohde & Schwarz GmbH & Co. KG
- Corbett Rowell
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and method for measuring a device under test
- Patent number 11,639,965
- Issue date May 2, 2023
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Debug system providing debug protection
- Patent number 11,609,268
- Issue date Mar 21, 2023
- Realtek Semiconductor Corp.
- Jieyu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Configurable integrated logic analyzer
- Patent number 11,442,104
- Issue date Sep 13, 2022
- Marvell Asia Pte, Ltd.
- Avi Haimzon
- G01 - MEASURING TESTING
Information Patent Grant
Calibration standard for partial discharge measurement
- Patent number 11,131,739
- Issue date Sep 28, 2021
- GM Global Technology Operations LLC
- Ronald M. Lesperance
- G01 - MEASURING TESTING
Information Patent Grant
Chip health monitor
- Patent number 11,074,150
- Issue date Jul 27, 2021
- NXP B.V.
- Jurgen Geerlings
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test architecture with an FPGA based test board to simulate a DUT o...
- Patent number 11,009,550
- Issue date May 18, 2021
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deterministic concurrent test program executor for an automated tes...
- Patent number 10,990,513
- Issue date Apr 27, 2021
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply device, a test equipment comprising a power supply dev...
- Patent number 10,794,949
- Issue date Oct 6, 2020
- Advantest Corporation
- Heinz Nuessle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for dynamic signal generation and analysis
- Patent number 10,788,534
- Issue date Sep 29, 2020
- Zurich Instruments AG
- Niels Haandbaek
- G01 - MEASURING TESTING
Information Patent Grant
Testing monolithic three dimensional integrated circuits
- Patent number 10,775,429
- Issue date Sep 15, 2020
- Marvell Asia Pte., Ltd.
- Sukeshwar Kannan
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and method for operating the same
- Patent number 10,753,973
- Issue date Aug 25, 2020
- ASE TEST, INC.
- Zi-Ning Mao
- G01 - MEASURING TESTING
Information Patent Grant
Electronic test apparatus
- Patent number 10,466,299
- Issue date Nov 5, 2019
- Winway Technology Co., Ltd.
- Kuan-Chung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Terminal apparatus, base station apparatus, communication method, a...
- Patent number 10,436,842
- Issue date Oct 8, 2019
- SHARP KABUSHIKI KAISHA
- Katsunari Uemura
- G01 - MEASURING TESTING
Information Patent Grant
System for performing modulation analysis without using a modulated...
- Patent number 10,379,162
- Issue date Aug 13, 2019
- Keysight Technologies, Inc.
- Sho Okuyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test architecture with a small form factor test board for rapid pro...
- Patent number 10,288,681
- Issue date May 14, 2019
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scheduler
- Patent number 10,255,155
- Issue date Apr 9, 2019
- Advantest Corporation
- Peter Schinzel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Independently driving built-in self test circuitry over a range of...
- Patent number 10,254,340
- Issue date Apr 9, 2019
- International Business Machines Corporation
- John B. DeForge
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing a device under test and method...
- Patent number 10,234,498
- Issue date Mar 19, 2019
- Advantest Corporation
- Jonas Horst
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated defect detection and location systems and methods in sem...
- Patent number 10,168,387
- Issue date Jan 1, 2019
- Infineon Technologies Austria AG
- Cheow Guan Lim
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture having multiple FPGA based hardware accelerator b...
- Patent number 10,162,007
- Issue date Dec 25, 2018
- Advantest Corporation
- Gerald Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tester with acceleration on memory and acceleration for automatic p...
- Patent number 10,161,993
- Issue date Dec 25, 2018
- Advantest Corporation
- John Frediani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hardware trigger generation from a declarative protocol description
- Patent number 10,148,547
- Issue date Dec 4, 2018
- Tektronix, Inc.
- Edward F. Tanous
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiuse-capable test environment for a plurality of test objects
- Patent number 10,120,771
- Issue date Nov 6, 2018
- Airbus Defence and Space GmbH
- Philipp Wager
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing system using different operating systems to test electronic...
- Patent number 10,061,673
- Issue date Aug 28, 2018
- Primax Electronics Ltd.
- Pei-Ming Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ATE digital channel for RF frequency/power measurement
- Patent number 9,983,258
- Issue date May 29, 2018
- ADVANTEST
- Wei Min Zhang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for hybrid board-level diagnostics
- Patent number 9,612,284
- Issue date Apr 4, 2017
- FutureWei Technologies, Inc.
- Xinli Gu
- G01 - MEASURING TESTING
Information Patent Grant
Test system
- Patent number 9,484,116
- Issue date Nov 1, 2016
- Advantest Corporation
- Masaaki Kosugi
- G11 - INFORMATION STORAGE
Information Patent Grant
Real-time rule engine for adaptive testing of integrated circuits
- Patent number 9,336,109
- Issue date May 10, 2016
- International Business Machines Corporation
- David E. Atkinson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Segmented Boundary Scan Chain Testing
- Publication number 20240353490
- Publication date Oct 24, 2024
- Ee Mei Ooi
- G01 - MEASURING TESTING
Information Patent Application
DEBUG SYSTEM PROVIDING DEBUG PROTECTION
- Publication number 20220170985
- Publication date Jun 2, 2022
- Realtek Semiconductor Corp.
- JIEYU WANG
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION STANDARD FOR PARTIAL DISCHARGE MEASUREMENT
- Publication number 20200355776
- Publication date Nov 12, 2020
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Ronald M. Lesperance
- G01 - MEASURING TESTING
Information Patent Application
CHIP HEALTH MONITOR
- Publication number 20200334118
- Publication date Oct 22, 2020
- NXP. B.V.
- Jurgen Geerlings
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND METHOD FOR OPERATING THE SAME
- Publication number 20190324082
- Publication date Oct 24, 2019
- Advanced Semiconductor Engineering, Inc.
- Zi-Ning MAO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20190302184
- Publication date Oct 3, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Corbett Rowell
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC TEST APPARATUS
- Publication number 20190204379
- Publication date Jul 4, 2019
- WINWAY TECHNOLOGY CO., LTD.
- Kuan-Chung CHEN
- G01 - MEASURING TESTING
Information Patent Application
TESTING MONOLITHIC THREE DIMENSIONAL INTEGRATED CIRCUITS
- Publication number 20190094294
- Publication date Mar 28, 2019
- DUKE UNIVERSITY
- Sukeshwar Kannan
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DYNAMIC SIGNAL GENERATION AND ANALYSIS
- Publication number 20180356465
- Publication date Dec 13, 2018
- ZURICH INSTRUMENTS AG
- Niels HAANDBAEK
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND METHOD FOR MEASURING A DEVICE UNDER TEST
- Publication number 20180284189
- Publication date Oct 4, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Application
TERMINAL APPARATUS, BASE STATION APPARATUS, COMMUNICATION METHOD, A...
- Publication number 20170285105
- Publication date Oct 5, 2017
- SHARP KABUSHIKI KAISHA
- Katsunari UEMURA
- G01 - MEASURING TESTING
Information Patent Application
SCHEDULER
- Publication number 20170228301
- Publication date Aug 10, 2017
- Advantest Corporation
- Peter Schinzel
- G01 - MEASURING TESTING
Information Patent Application
Multiuser-Capable Test Environment for a Plurality of Test Objects
- Publication number 20160070631
- Publication date Mar 10, 2016
- EADS Deutschland GmbH
- Philipp WAGER
- G01 - MEASURING TESTING
Information Patent Application
Reconfigurable Automatic Test Circuit Techniques
- Publication number 20140336974
- Publication date Nov 13, 2014
- ADVANTEST (SINGAPORE) PTE LTD
- Rivoir Jochen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DEVICE TESTING USING MULTIPLE PROCESSING P...
- Publication number 20140281776
- Publication date Sep 18, 2014
- Teradyne, Inc.
- Corbin L. Champion
- G01 - MEASURING TESTING
Information Patent Application
USING SHARED PINS IN A CONCURRENT TEST EXECUTION ENVIRONMENT
- Publication number 20140237291
- Publication date Aug 21, 2014
- Advantest Corporation
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS
- Publication number 20140059382
- Publication date Feb 27, 2014
- International Business Machines Corporation
- David E. Atkinson
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS
- Publication number 20140059386
- Publication date Feb 27, 2014
- International Business Machines Corporation
- David E. Atkinson
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Hybrid Board-Level Diagnostics
- Publication number 20140058698
- Publication date Feb 27, 2014
- FutureWei Technologies, Inc.
- Xinli Gu
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD AND SYSTEM
- Publication number 20110282617
- Publication date Nov 17, 2011
- Advantest Corporation
- Hironaga YAMASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RE-CONFIGURABLE TEST CIRCUIT, METHOD FOR OPERATING AN AUTOMATED TES...
- Publication number 20110276302
- Publication date Nov 10, 2011
- Verigy (Singapore) Pte. Ltd.
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Wirelessly Testing Integrated Circuits
- Publication number 20110244814
- Publication date Oct 6, 2011
- Centre National De La Recherche Scientifique-cnrs
- David Andreu
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD FOR TESTING ELECTRONIC DEVICES USING A PIPEL...
- Publication number 20110145645
- Publication date Jun 16, 2011
- Verigy (Singapore) Pte. Ltd.
- Erik H. Volkerink
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TRANSMISSION DEVICE
- Publication number 20110087931
- Publication date Apr 14, 2011
- Advantest Corporation
- Hironaga YAMASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMMUNICATION SYSTEM, TEST APPARATUS, COMMUNICATION APPARATUS, COMM...
- Publication number 20110085608
- Publication date Apr 14, 2011
- Advantest Corporation
- Masaaki KOSUGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Self-trim and self-test of on-chip values
- Publication number 20100289590
- Publication date Nov 18, 2010
- Dialog Semiconductor GmbH
- Hans Martin von Staudt
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCED PROBE CARD ARCHITECTURE
- Publication number 20090273358
- Publication date Nov 5, 2009
- FormFactor, Inc.
- Brian Arkin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY ADJUSTING LENGTH OF TEST LINE,...
- Publication number 20080126002
- Publication date May 29, 2008
- HON HAI Precision Industry CO., LTD.
- KUNG-TAI CHANG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Test signal generating apparatus semiconductor integrated circuit a...
- Publication number 20080048671
- Publication date Feb 28, 2008
- Hynix Semiconductor Inc.
- Sung-Joo Ha
- G01 - MEASURING TESTING
Information Patent Application
Test system and method for testing electronic devices using a pipel...
- Publication number 20070198881
- Publication date Aug 23, 2007
- Erik H. Volkerink
- G01 - MEASURING TESTING

tester configuration

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Stress-testing electrical components using telemetry modeling

Measurement system and method for testing a device under test

Measurement device and method for measuring a device under test

Debug system providing debug protection

Configurable integrated logic analyzer

Calibration standard for partial discharge measurement

Chip health monitor

Test architecture with an FPGA based test board to simulate a DUT o...

Deterministic concurrent test program executor for an automated tes...

Power supply device, a test equipment comprising a power supply dev...

Device for dynamic signal generation and analysis

Testing monolithic three dimensional integrated circuits

Test apparatus and method for operating the same

Electronic test apparatus

Terminal apparatus, base station apparatus, communication method, a...

System for performing modulation analysis without using a modulated...

Test architecture with a small form factor test board for rapid pro...

Scheduler

Independently driving built-in self test circuitry over a range of...

Automated test equipment for testing a device under test and method...

Integrated defect detection and location systems and methods in sem...

Test architecture having multiple FPGA based hardware accelerator b...

Tester with acceleration on memory and acceleration for automatic p...

Hardware trigger generation from a declarative protocol description

Multiuse-capable test environment for a plurality of test objects

Testing system using different operating systems to test electronic...

ATE digital channel for RF frequency/power measurement

System and method for hybrid board-level diagnostics

Test system

Real-time rule engine for adaptive testing of integrated circuits

Patents Applicationslast 30 patents

Segmented Boundary Scan Chain Testing

DEBUG SYSTEM PROVIDING DEBUG PROTECTION

CALIBRATION STANDARD FOR PARTIAL DISCHARGE MEASUREMENT

CHIP HEALTH MONITOR

TEST APPARATUS AND METHOD FOR OPERATING THE SAME

MEASUREMENT SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST

ELECTRONIC TEST APPARATUS

TESTING MONOLITHIC THREE DIMENSIONAL INTEGRATED CIRCUITS

DEVICE FOR DYNAMIC SIGNAL GENERATION AND ANALYSIS

MEASUREMENT DEVICE AND METHOD FOR MEASURING A DEVICE UNDER TEST

TERMINAL APPARATUS, BASE STATION APPARATUS, COMMUNICATION METHOD, A...

SCHEDULER

Multiuser-Capable Test Environment for a Plurality of Test Objects

Reconfigurable Automatic Test Circuit Techniques

METHOD AND APPARATUS FOR DEVICE TESTING USING MULTIPLE PROCESSING P...

USING SHARED PINS IN A CONCURRENT TEST EXECUTION ENVIRONMENT

REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS

REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS

System and Method for Hybrid Board-Level Diagnostics

TEST APPARATUS, TEST METHOD AND SYSTEM

RE-CONFIGURABLE TEST CIRCUIT, METHOD FOR OPERATING AN AUTOMATED TES...

System and Method for Wirelessly Testing Integrated Circuits

TEST SYSTEM AND METHOD FOR TESTING ELECTRONIC DEVICES USING A PIPEL...

TEST APPARATUS AND TRANSMISSION DEVICE

COMMUNICATION SYSTEM, TEST APPARATUS, COMMUNICATION APPARATUS, COMM...

Self-trim and self-test of on-chip values

METHOD AND APPARATUS FOR ENHANCED PROBE CARD ARCHITECTURE

SYSTEM AND METHOD FOR AUTOMATICALLY ADJUSTING LENGTH OF TEST LINE,...

Test signal generating apparatus semiconductor integrated circuit a...

Test system and method for testing electronic devices using a pipel...