Testing light-emitting diodes, laser diodes or photodiodes

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G01R31/2635

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Intelligent wafer-level testing of photonic devices
- Patent number 12,174,238
- Issue date Dec 24, 2024
- Mellanox Technologies, Ltd.
- Amir Silber
- G01 - MEASURING TESTING
Information Patent Grant
Array substrate, display panel, and method of testing array substrate
- Patent number 12,175,898
- Issue date Dec 24, 2024
- BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.
- Hongting Lu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Probe module for inspecting display panel, panel inspection apparat...
- Patent number 12,175,942
- Issue date Dec 24, 2024
- LX Semicon Co., Ltd.
- Ho Min Lim
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Phase distortion measurement
- Patent number 12,158,491
- Issue date Dec 3, 2024
- Keysight Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Electronic detection interface and electronic detection module usin...
- Patent number 12,154,932
- Issue date Nov 26, 2024
- Ultra Display Technology Corp.
- Hsien-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic detection interface and electronic detection module usin...
- Patent number 12,148,786
- Issue date Nov 19, 2024
- Ultra Display Technology Corp.
- Hsien-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 12,130,324
- Issue date Oct 29, 2024
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device including base and base cap
- Patent number 12,126,144
- Issue date Oct 22, 2024
- Nichia Corporation
- Tomokazu Taji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lamp manufacturing process
- Patent number 12,111,366
- Issue date Oct 8, 2024
- LLINK TECHNOLOGIES, L.L.C.
- Jeff Goulet
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method of inspecting display device and method of manufacturing dis...
- Patent number 12,087,645
- Issue date Sep 10, 2024
- Samsung Display Co., Ltd.
- Seung Kyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Managing photonic integrated circuit optical coupling
- Patent number 12,078,674
- Issue date Sep 3, 2024
- Ciena Corporation
- Jérôme Leclerc-Perron
- G01 - MEASURING TESTING
Information Patent Grant
Selective transfer of micro devices
- Patent number 12,075,565
- Issue date Aug 27, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus for optical devices
- Patent number 12,025,650
- Issue date Jul 2, 2024
- Lumentum Operations LLC
- Albert Yuen
- G01 - MEASURING TESTING
Information Patent Grant
Laser diode testing system and laser diode testing method
- Patent number 12,015,239
- Issue date Jun 18, 2024
- CHROMA ATE INC.
- Sheng-Hung Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display device and method of driving display device
- Patent number 11,984,053
- Issue date May 14, 2024
- SHARP KABUSHIKI KAISHA
- Hirohisa Yamada
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Injection device and inspection and repairing method
- Patent number 11,971,444
- Issue date Apr 30, 2024
- PlayNitride Display Co., Ltd.
- Cheng-Cian Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus, image capturing apparatus, image capturing...
- Patent number 11,953,541
- Issue date Apr 9, 2024
- Canon Kabushiki Kaisha
- Kei Ochiai
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method for railroad smart flasher lamps
- Patent number 11,943,852
- Issue date Mar 26, 2024
- BNSF Railway Company
- Ross Martin Sterling
- B61 - RAILWAYS
Information Patent Grant
Circuit failure detection for diode arrays
- Patent number 11,927,644
- Issue date Mar 12, 2024
- ams AG
- Rahim Akbari-Dilmaghai
- G01 - MEASURING TESTING
Information Patent Grant
Electric circuit arrangement to determine a level of an excess bias...
- Patent number 11,921,150
- Issue date Mar 5, 2024
- ams International AG
- Nenad Lilic
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Optical detection system and laser light providing module without u...
- Patent number 11,906,571
- Issue date Feb 20, 2024
- MPI CORPORATION
- Chien-Yu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro device arrangement in donor substrate
- Patent number 11,892,497
- Issue date Feb 6, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wireless sensor device and system thereof for light bulb diagnostic...
- Patent number 11,879,624
- Issue date Jan 23, 2024
- Hendrik J Volkerink
- F21 - LIGHTING
Information Patent Grant
Enclosure detection for reliable optical failsafe
- Patent number 11,867,650
- Issue date Jan 9, 2024
- Apple Inc.
- Michael K. McCord
- G02 - OPTICS
Information Patent Grant
Optical inspection apparatus
- Patent number 11,867,612
- Issue date Jan 9, 2024
- Samsung Display Co., Ltd.
- Je Won Yoo
- G02 - OPTICS
Information Patent Grant
Method for testing light-emitting elements, testing device, and sub...
- Patent number 11,837,124
- Issue date Dec 5, 2023
- Interface Technology (ChengDu) Co., Ltd.
- Hung-Chih Wu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Lifetime estimating system and method for heating source, and inspe...
- Patent number 11,796,400
- Issue date Oct 24, 2023
- Tokyo Electron Limited
- Masahito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Chip chuck for supporting light emitting chip under optical inspect...
- Patent number 11,781,904
- Issue date Oct 10, 2023
- MPI Corporation
- Hung-I Lin
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting LED
- Patent number 11,739,890
- Issue date Aug 29, 2023
- CHONGQING KONKA PHOTOELECTRIC TECHNOLOGY RESEARCH INSTITUTE CO., LTD.
- Shiyuan Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for testing light-emitting unit
- Patent number 11,740,277
- Issue date Aug 29, 2023
- DynaScan Technology Corp.
- Tsun-I Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VIOS MODULATOR SENSITIVITY FOR MICRO LED BACKPLANE ARRAY ELECTRICAL...
- Publication number 20240429106
- Publication date Dec 26, 2024
- ORBOTECH LTD.
- Arie Glazer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrical Testing for Panel Characterization and Defect Screening
- Publication number 20240402237
- Publication date Dec 5, 2024
- Apple Inc.
- Xuebei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE TRANSFER OF MICRO DEVICES
- Publication number 20240381531
- Publication date Nov 14, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIXEL DETECTION DEVICE AND PIXEL DETECTION METHOD
- Publication number 20240377452
- Publication date Nov 14, 2024
- AUO Corporation
- Wen-Chiuan SU
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATION METHOD, ESTIMATION PROGRAM, AND ESTIMATION DEVICE
- Publication number 20240361375
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Katsuhiro NAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...
- Publication number 20240353485
- Publication date Oct 24, 2024
- ams-OSRAM International GmbH
- Stefan Kerscher
- G01 - MEASURING TESTING
Information Patent Application
ELECTROLUMINESCENCE INSPECTION APPARATUS
- Publication number 20240255563
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Sungyong MIN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE
- Publication number 20240230749
- Publication date Jul 11, 2024
- CARUX TECHNOLOGY PTE. LTD.
- Chao-Chin Sung
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR RAILROAD SMART FLASHER LAMPS
- Publication number 20240237172
- Publication date Jul 11, 2024
- BNSF Railway Company
- Ross Martin Sterling
- B61 - RAILWAYS
Information Patent Application
OPTOELECTRONIC MODULE
- Publication number 20240234659
- Publication date Jul 11, 2024
- ams-OSRAM Asia Pacific Pte. Ltd.
- Harald ETSCHMAIER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING...
- Publication number 20240210463
- Publication date Jun 27, 2024
- Canon Kabushiki Kaisha
- Kei Ochiai
- B60 - VEHICLES IN GENERAL
Information Patent Application
LIGHT OUTPUT ESTIMATION METHOD FOR LIGHT-EMITTING DEVICE
- Publication number 20240201244
- Publication date Jun 20, 2024
- Nikkiso Co., Ltd.
- Kenta URA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, CONDUCTIVE MEMBER, AND INSPECTION DEVICE
- Publication number 20240168080
- Publication date May 23, 2024
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Fault Diagnosis Apparatus and Method
- Publication number 20240163995
- Publication date May 16, 2024
- DIODES INCORPORATED
- Dongjie Cheng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ARRAY SUBSTRATE, DISPLAY PANEL, AND METHOD OF TESTING ARRAY SUBSTRATE
- Publication number 20240153417
- Publication date May 9, 2024
- CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Hongting Lu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE
- Publication number 20240133940
- Publication date Apr 25, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE
- Publication number 20240133941
- Publication date Apr 25, 2024
- CARUX TECHNOLOGY PTE. LTD.
- Chao-Chin Sung
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRONIC MODULE
- Publication number 20240136486
- Publication date Apr 25, 2024
- Harald ETSCHMAIER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST DEVICE CAPABLE OF TESTING MICRO LED AND MANUFACTURING METHOD T...
- Publication number 20240118335
- Publication date Apr 11, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...
- Publication number 20240110969
- Publication date Apr 4, 2024
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LIGHT-EMITTING DIODES
- Publication number 20240110968
- Publication date Apr 4, 2024
- Industrial Technology Research Institute
- Yan-Rung Lin
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20240102921
- Publication date Mar 28, 2024
- SAMSUNG DISPLAY CO., LTD.
- Je Won YOO
- G01 - MEASURING TESTING
Information Patent Application
Enclosure Detection for Reliable Optical Failsafe
- Publication number 20240094153
- Publication date Mar 21, 2024
- Apple Inc.
- Michael K. McCord
- G02 - OPTICS
Information Patent Application
MANAGING PHOTONIC INTEGRATED CIRCUIT OPTICAL COUPLING
- Publication number 20240077532
- Publication date Mar 7, 2024
- CIENA CORPORATION
- Jérôme Leclerc-Perron
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING, WAFER, AND TESTING STATION
- Publication number 20240012043
- Publication date Jan 11, 2024
- ROCKLEY PHOTONICS LIMITED
- Mohamad Dernaika
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE CONFIGURED TO DETECT ABNORMALITY OF LIGHT-EMITTING...
- Publication number 20230417817
- Publication date Dec 28, 2023
- TCL China Star Optoelectronics Technology Co., Ltd.
- Wuhui WANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING LIGHT-EMITTING DIODE
- Publication number 20230341455
- Publication date Oct 26, 2023
- Century Technology (Shenzhen) Corporation Limited
- KUANG-HUA LIU
- G01 - MEASURING TESTING
Information Patent Application
MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE
- Publication number 20230341456
- Publication date Oct 26, 2023
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP
- Publication number 20230291181
- Publication date Sep 14, 2023
- Nichia Corporation.
- Tomokazu TAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR RAILROAD SMART FLASHER LAMPS
- Publication number 20230269848
- Publication date Aug 24, 2023
- BNSF Railway Company
- Ross Martin Sterling
- B61 - RAILWAYS

Testing light-emitting diodes, laser diodes or photodiodes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Intelligent wafer-level testing of photonic devices

Array substrate, display panel, and method of testing array substrate

Probe module for inspecting display panel, panel inspection apparat...

Phase distortion measurement

Electronic detection interface and electronic detection module usin...

Electronic detection interface and electronic detection module usin...

Test apparatus, test method, and computer-readable storage medium

Light emitting device including base and base cap

Lamp manufacturing process

Method of inspecting display device and method of manufacturing dis...

Managing photonic integrated circuit optical coupling

Selective transfer of micro devices

Testing apparatus for optical devices

Laser diode testing system and laser diode testing method

Display device and method of driving display device

Injection device and inspection and repairing method

Semiconductor apparatus, image capturing apparatus, image capturing...

System and method for railroad smart flasher lamps

Circuit failure detection for diode arrays

Electric circuit arrangement to determine a level of an excess bias...

Optical detection system and laser light providing module without u...

Micro device arrangement in donor substrate

Wireless sensor device and system thereof for light bulb diagnostic...

Enclosure detection for reliable optical failsafe

Optical inspection apparatus

Method for testing light-emitting elements, testing device, and sub...

Lifetime estimating system and method for heating source, and inspe...

Chip chuck for supporting light emitting chip under optical inspect...

System for detecting LED

Method for testing light-emitting unit

Patents Applicationslast 30 patents

VIOS MODULATOR SENSITIVITY FOR MICRO LED BACKPLANE ARRAY ELECTRICAL...

Electrical Testing for Panel Characterization and Defect Screening

SELECTIVE TRANSFER OF MICRO DEVICES

PIXEL DETECTION DEVICE AND PIXEL DETECTION METHOD

ESTIMATION METHOD, ESTIMATION PROGRAM, AND ESTIMATION DEVICE

MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY...

ELECTROLUMINESCENCE INSPECTION APPARATUS

ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE

SYSTEM AND METHOD FOR RAILROAD SMART FLASHER LAMPS

OPTOELECTRONIC MODULE

SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING...

LIGHT OUTPUT ESTIMATION METHOD FOR LIGHT-EMITTING DEVICE

INSPECTION METHOD, CONDUCTIVE MEMBER, AND INSPECTION DEVICE

Fault Diagnosis Apparatus and Method

ARRAY SUBSTRATE, DISPLAY PANEL, AND METHOD OF TESTING ARRAY SUBSTRATE

MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE

ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE

OPTOELECTRONIC MODULE

TEST DEVICE CAPABLE OF TESTING MICRO LED AND MANUFACTURING METHOD T...

TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...

INSPECTION SYSTEM AND METHOD FOR INSPECTING LIGHT-EMITTING DIODES

OPTICAL INSPECTION APPARATUS

Enclosure Detection for Reliable Optical Failsafe

MANAGING PHOTONIC INTEGRATED CIRCUIT OPTICAL COUPLING

METHOD OF TESTING, WAFER, AND TESTING STATION

DETECTION DEVICE CONFIGURED TO DETECT ABNORMALITY OF LIGHT-EMITTING...

DEVICE AND METHOD FOR DETECTING LIGHT-EMITTING DIODE

MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE

LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP

SYSTEM AND METHOD FOR RAILROAD SMART FLASHER LAMPS