Testing of analog circuits

Industry

CPC
G01R31/316

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/316Testing of analog circuits

Industries

Patents Grantslast 30 patents

Information Patent Grant
On-chip checker for on-chip safety area
- Patent number 12,164,000
- Issue date Dec 10, 2024
- STMicroelectronics S.r.l.
- Alessandro Cannone
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit of electronic device, electronic device including test...
- Patent number 12,140,626
- Issue date Nov 12, 2024
- SK Hynix Inc.
- Ki Hyuk Sung
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
DFT architecture for analog circuits
- Patent number 12,135,351
- Issue date Nov 5, 2024
- STMicroelectronics S.r.l.
- Filippo Colombo
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus to implement a boundary scan for shared analo...
- Patent number 12,130,329
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Prasanth Viswanathan Pillai
- G01 - MEASURING TESTING
Information Patent Grant
Device under test (DUT) measurement circuit having harmonic minimiz...
- Patent number 12,000,892
- Issue date Jun 4, 2024
- Texas Instruments Incorporated
- Charles Kasimer Sestok
- G01 - MEASURING TESTING
Information Patent Grant
Integrity tests for mixed analog digital systems
- Patent number 11,959,963
- Issue date Apr 16, 2024
- Aptiv Technologies AG
- Olaf Donner
- G01 - MEASURING TESTING
Information Patent Grant
Interleaved testing of digital and analog subsystems with on-chip t...
- Patent number 11,940,490
- Issue date Mar 26, 2024
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Grant
Test method and apparatus of communication chip, device and medium
- Patent number 11,927,631
- Issue date Mar 12, 2024
- MORNINGCORE TECHNOLOGY CO., CHINA
- Shanzhi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery SOH determination circuit
- Patent number 11,835,584
- Issue date Dec 5, 2023
- Analog Devices International Unlimited Company
- Jeremy R. Gorbold
- G01 - MEASURING TESTING
Information Patent Grant
Electrical circuit for testing primary internal signals of an ASIC
- Patent number 11,808,809
- Issue date Nov 7, 2023
- Robert Bosch GmbH
- Carsten Hermann
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting circuit defects
- Patent number 11,709,196
- Issue date Jul 25, 2023
- Samsung Electronics Co., Ltd.
- Donggyu Minn
- G01 - MEASURING TESTING
Information Patent Grant
Root monitoring on an FPGA using satellite ADCs
- Patent number 11,709,275
- Issue date Jul 25, 2023
- Xilinx, Inc.
- Brendan Farley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit for testing monitoring circuit and operating method thereof
- Patent number 11,698,406
- Issue date Jul 11, 2023
- Samsung Electronics Co., Ltd.
- Hyunseok Nam
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 11,686,766
- Issue date Jun 27, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit test apparatus
- Patent number 11,587,634
- Issue date Feb 21, 2023
- Hyundai Mobis Co., Ltd.
- Yeon-Ho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses involving calibration of input offset voltage and signa...
- Patent number 11,585,849
- Issue date Feb 21, 2023
- NXP USA, INC.
- Tao Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electrical testing apparatus for spintronics devices
- Patent number 11,573,270
- Issue date Feb 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal path monitor
- Patent number 11,561,257
- Issue date Jan 24, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Ezequiel Rubinsztain
- G01 - MEASURING TESTING
Information Patent Grant
Predictive chip-maintenance
- Patent number 11,531,056
- Issue date Dec 20, 2022
- Infineon Technologies AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interleaved testing of digital and analog subsystems with on-chip t...
- Patent number 11,531,061
- Issue date Dec 20, 2022
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Grant
Method for diagnosing analog circuit fault based on vector-valued r...
- Patent number 11,486,925
- Issue date Nov 1, 2022
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Frequency-domain impedance sensing system and method for neural net...
- Patent number 11,461,660
- Issue date Oct 4, 2022
- Rockwell Collins, Inc.
- Orion Davies
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit device with integrated fault monitoring system
- Patent number 11,416,378
- Issue date Aug 16, 2022
- NXP B.V.
- Jan-Peter Schat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for diagnosing analog circuit fault based on cross wavelet f...
- Patent number 11,409,933
- Issue date Aug 9, 2022
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital output monitor circuit and high frequency front-end circuit
- Patent number 11,378,621
- Issue date Jul 5, 2022
- Murata Manufacturing Co., Ltd.
- Satoru Matsuyama
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Battery service life management method and system
- Patent number 11,340,300
- Issue date May 24, 2022
- Samsung Electronics Co., Ltd.
- Mohan Kumar Singh Verma
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor device which detects occurrence of an abnormality dur...
- Patent number 11,327,829
- Issue date May 10, 2022
- Kabushiki Kaisha Toshiba
- Shigeru Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High voltage interlock circuit and detection method
- Patent number 11,320,481
- Issue date May 3, 2022
- Contemporary Amperex Tectaology Co., Limited
- Jinglin Li
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Vector-valued regularized kernel function approximation based fault...
- Patent number 11,287,470
- Issue date Mar 29, 2022
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and testing method for testing a device under test
- Patent number 11,280,833
- Issue date Mar 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Stefan Schmidt
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SIGNAL PROCESSING METHOD AND MEASUREMENT SYSTEM
- Publication number 20240410941
- Publication date Dec 12, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Florian RAMIAN
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA
- Publication number 20240345159
- Publication date Oct 17, 2024
- TECHWIDU CO., LTD.
- Hyoung-Rae KIM
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20240310440
- Publication date Sep 19, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING
- Publication number 20240295601
- Publication date Sep 5, 2024
- QUALCOMM Incorporated
- Zdravko LUKIC
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND APPARATUS TO IMPLEMENT A BOUNDARY SCAN FOR SHARED ANALO...
- Publication number 20240288496
- Publication date Aug 29, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Prasanth Viswanathan Pillai
- G01 - MEASURING TESTING
Information Patent Application
SENSOR CIRCUITS, ELECTRONIC DEVICES, AND METHODS FOR PERFORMING INT...
- Publication number 20240210509
- Publication date Jun 27, 2024
- SK HYNIX INC.
- Dong Hyun HWANG
- G01 - MEASURING TESTING
Information Patent Application
Phase-Shifter Functional Safety Testing
- Publication number 20240175918
- Publication date May 30, 2024
- AyDeeKay LLC dba Indie Semiconductor
- Tom Heller
- G01 - MEASURING TESTING
Information Patent Application
SELF-TESTING CIRCUITS FOR DEVICES HAVING MULTIPLE INPUT CHANNELS WI...
- Publication number 20240159819
- Publication date May 16, 2024
- STMicroelectronics S.r.l.
- Nicola Errico
- G01 - MEASURING TESTING
Information Patent Application
RF TESTING METHOD AND TESTING SYSTEM
- Publication number 20240125849
- Publication date Apr 18, 2024
- MEDIATEK INC.
- Jung-Yin CHIEN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST CIRCUIT OF ELECTRONIC DEVICE, ELECTRONIC DEVICE INCLUDING TEST...
- Publication number 20230384369
- Publication date Nov 30, 2023
- SK HYNIX INC.
- Ki Hyuk SUNG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20230280398
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING
Information Patent Application
Integrity Tests for Mixed Analog Digital Systems
- Publication number 20230258712
- Publication date Aug 17, 2023
- Aptiv Technologies Limited
- Olaf Donner
- G01 - MEASURING TESTING
Information Patent Application
DFT ARCHITECTURE FOR ANALOG CIRCUITS
- Publication number 20230243886
- Publication date Aug 3, 2023
- STMicroelectronics S.r.l
- Filippo Colombo
- G01 - MEASURING TESTING
Information Patent Application
INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...
- Publication number 20230078568
- Publication date Mar 16, 2023
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20220268838
- Publication date Aug 25, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BATTERY SOH DETERMINATION CIRCUIT
- Publication number 20220057452
- Publication date Feb 24, 2022
- Analog Devices International Unlimited Company
- Jeremy R. Gorbold
- G01 - MEASURING TESTING
Information Patent Application
INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...
- Publication number 20220034965
- Publication date Feb 3, 2022
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING CIRCUIT DEFECTS
- Publication number 20220018892
- Publication date Jan 20, 2022
- Samsung Electronics Co., Ltd.
- Donggyu MINN
- G01 - MEASURING TESTING
Information Patent Application
PREDICTIVE CHIP-MAINTENANCE
- Publication number 20210325445
- Publication date Oct 21, 2021
- INFINEON TECHNOLOGIES AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrical Testing Apparatus for Spintronics Devices
- Publication number 20210325460
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VECTOR-VALUED REGULARIZED KERNEL FUNCTION APPROXIMATION BASED FAULT...
- Publication number 20210293881
- Publication date Sep 23, 2021
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EXTRACTING FAULT FEATURE OF ANALOG CIRCUIT BA...
- Publication number 20210270892
- Publication date Sep 2, 2021
- WUHAN UNIVERSITY
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
A NOVEL SYSTEM AND METHOD FOR ACHIEVING FUNCTIONAL COVERAGE CLOSURE...
- Publication number 20210264085
- Publication date Aug 26, 2021
- Michael Alexander Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING DEVICE AND TESTING METHOD
- Publication number 20210199716
- Publication date Jul 1, 2021
- KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO
- Sunao NAGAI
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20210199719
- Publication date Jul 1, 2021
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR TESTING MONITORING CIRCUIT AND OPERATING METHOD THEREOF
- Publication number 20210172999
- Publication date Jun 10, 2021
- Samsung Electronics Co., Ltd.
- Hyunseok Nam
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CIRCUIT FOR TESTING PRIMARY INTERNAL SIGNALS ON AN ASIC
- Publication number 20210063483
- Publication date Mar 4, 2021
- ROBERT BOSCH GmbH
- Carsten Hermann
- G01 - MEASURING TESTING
Information Patent Application
ROOT MONITORING ON AN FPGA USING SATELLITE ADCS
- Publication number 20210011172
- Publication date Jan 14, 2021
- Xilinx, Inc.
- Brendan Farley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT ARRANGEMENT COMPRISING A MICROPROCESSOR AND A VOLTAGE GENER...
- Publication number 20210011081
- Publication date Jan 14, 2021
- Vitesco Technologies GMBH
- Andreas Wunderlich
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method for diagnosing analog circuit fault based on cross wavelet f...
- Publication number 20200394354
- Publication date Dec 17, 2020
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING

Testing of analog circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

On-chip checker for on-chip safety area

Test circuit of electronic device, electronic device including test...

DFT architecture for analog circuits

Methods and apparatus to implement a boundary scan for shared analo...

Device under test (DUT) measurement circuit having harmonic minimiz...

Integrity tests for mixed analog digital systems

Interleaved testing of digital and analog subsystems with on-chip t...

Test method and apparatus of communication chip, device and medium

Battery SOH determination circuit

Electrical circuit for testing primary internal signals of an ASIC

Method and apparatus for detecting circuit defects

Root monitoring on an FPGA using satellite ADCs

Circuit for testing monitoring circuit and operating method thereof

Built-in self-test circuit and temperature measurement circuit incl...

Integrated circuit test apparatus

Apparatuses involving calibration of input offset voltage and signa...

Electrical testing apparatus for spintronics devices

Signal path monitor

Predictive chip-maintenance

Interleaved testing of digital and analog subsystems with on-chip t...

Method for diagnosing analog circuit fault based on vector-valued r...

Frequency-domain impedance sensing system and method for neural net...

Integrated circuit device with integrated fault monitoring system

Method for diagnosing analog circuit fault based on cross wavelet f...

Digital output monitor circuit and high frequency front-end circuit

Battery service life management method and system

Semiconductor device which detects occurrence of an abnormality dur...

High voltage interlock circuit and detection method

Vector-valued regularized kernel function approximation based fault...

Testing device and testing method for testing a device under test

Patents Applicationslast 30 patents

SIGNAL PROCESSING METHOD AND MEASUREMENT SYSTEM

TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING

METHODS AND APPARATUS TO IMPLEMENT A BOUNDARY SCAN FOR SHARED ANALO...

SENSOR CIRCUITS, ELECTRONIC DEVICES, AND METHODS FOR PERFORMING INT...

Phase-Shifter Functional Safety Testing

SELF-TESTING CIRCUITS FOR DEVICES HAVING MULTIPLE INPUT CHANNELS WI...

RF TESTING METHOD AND TESTING SYSTEM

TEST CIRCUIT OF ELECTRONIC DEVICE, ELECTRONIC DEVICE INCLUDING TEST...

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

Integrity Tests for Mixed Analog Digital Systems

DFT ARCHITECTURE FOR ANALOG CIRCUITS

INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

BATTERY SOH DETERMINATION CIRCUIT

INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...

METHOD AND APPARATUS FOR DETECTING CIRCUIT DEFECTS

PREDICTIVE CHIP-MAINTENANCE

Electrical Testing Apparatus for Spintronics Devices

VECTOR-VALUED REGULARIZED KERNEL FUNCTION APPROXIMATION BASED FAULT...

METHOD AND SYSTEM FOR EXTRACTING FAULT FEATURE OF ANALOG CIRCUIT BA...

A NOVEL SYSTEM AND METHOD FOR ACHIEVING FUNCTIONAL COVERAGE CLOSURE...

TESTING DEVICE AND TESTING METHOD

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

CIRCUIT FOR TESTING MONITORING CIRCUIT AND OPERATING METHOD THEREOF

ELECTRICAL CIRCUIT FOR TESTING PRIMARY INTERNAL SIGNALS ON AN ASIC

ROOT MONITORING ON AN FPGA USING SATELLITE ADCS

CIRCUIT ARRANGEMENT COMPRISING A MICROPROCESSOR AND A VOLTAGE GENER...

Method for diagnosing analog circuit fault based on cross wavelet f...