Testing of combined analog and digital circuits

Industry

CPC
G01R31/3167

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3167Testing of combined analog and digital circuits

Industries

Patents Grantslast 30 patents

Information Patent Grant
On-chip checker for on-chip safety area
- Patent number 12,164,000
- Issue date Dec 10, 2024
- STMicroelectronics S.r.l.
- Alessandro Cannone
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus to implement a boundary scan for shared analo...
- Patent number 12,130,329
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Prasanth Viswanathan Pillai
- G01 - MEASURING TESTING
Information Patent Grant
Device under test (DUT) measurement circuit having harmonic minimiz...
- Patent number 12,000,892
- Issue date Jun 4, 2024
- Texas Instruments Incorporated
- Charles Kasimer Sestok
- G01 - MEASURING TESTING
Information Patent Grant
Integrity tests for mixed analog digital systems
- Patent number 11,959,963
- Issue date Apr 16, 2024
- Aptiv Technologies AG
- Olaf Donner
- G01 - MEASURING TESTING
Information Patent Grant
Interleaved testing of digital and analog subsystems with on-chip t...
- Patent number 11,940,490
- Issue date Mar 26, 2024
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Grant
Test method and apparatus of communication chip, device and medium
- Patent number 11,927,631
- Issue date Mar 12, 2024
- MORNINGCORE TECHNOLOGY CO., CHINA
- Shanzhi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery SOH determination circuit
- Patent number 11,835,584
- Issue date Dec 5, 2023
- Analog Devices International Unlimited Company
- Jeremy R. Gorbold
- G01 - MEASURING TESTING
Information Patent Grant
Electrical circuit for testing primary internal signals of an ASIC
- Patent number 11,808,809
- Issue date Nov 7, 2023
- Robert Bosch GmbH
- Carsten Hermann
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting circuit defects
- Patent number 11,709,196
- Issue date Jul 25, 2023
- Samsung Electronics Co., Ltd.
- Donggyu Minn
- G01 - MEASURING TESTING
Information Patent Grant
Root monitoring on an FPGA using satellite ADCs
- Patent number 11,709,275
- Issue date Jul 25, 2023
- Xilinx, Inc.
- Brendan Farley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit for testing monitoring circuit and operating method thereof
- Patent number 11,698,406
- Issue date Jul 11, 2023
- Samsung Electronics Co., Ltd.
- Hyunseok Nam
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 11,686,766
- Issue date Jun 27, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit test apparatus
- Patent number 11,587,634
- Issue date Feb 21, 2023
- Hyundai Mobis Co., Ltd.
- Yeon-Ho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses involving calibration of input offset voltage and signa...
- Patent number 11,585,849
- Issue date Feb 21, 2023
- NXP USA, INC.
- Tao Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electrical testing apparatus for spintronics devices
- Patent number 11,573,270
- Issue date Feb 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal path monitor
- Patent number 11,561,257
- Issue date Jan 24, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Ezequiel Rubinsztain
- G01 - MEASURING TESTING
Information Patent Grant
Interleaved testing of digital and analog subsystems with on-chip t...
- Patent number 11,531,061
- Issue date Dec 20, 2022
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device with integrated fault monitoring system
- Patent number 11,416,378
- Issue date Aug 16, 2022
- NXP B.V.
- Jan-Peter Schat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery service life management method and system
- Patent number 11,340,300
- Issue date May 24, 2022
- Samsung Electronics Co., Ltd.
- Mohan Kumar Singh Verma
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor device which detects occurrence of an abnormality dur...
- Patent number 11,327,829
- Issue date May 10, 2022
- Kabushiki Kaisha Toshiba
- Shigeru Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing device and testing method for testing a device under test
- Patent number 11,280,833
- Issue date Mar 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Stefan Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Real-time jitter impairment insertion for signal sources
- Patent number 11,237,204
- Issue date Feb 1, 2022
- Tektronix, Inc.
- Gregory A. Martin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for achieving functional coverage closure for ele...
- Patent number 11,227,090
- Issue date Jan 18, 2022
- Michael Alexander Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment for combined signals
- Patent number 11,187,743
- Issue date Nov 30, 2021
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Grant
Circuit arrangement comprising a microprocessor and a voltage gener...
- Patent number 11,067,626
- Issue date Jul 20, 2021
- Vitesco Technologies GmbH
- Andreas Wunderlich
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing high-power electronic components
- Patent number 11,067,629
- Issue date Jul 20, 2021
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing apparatus for spintronics devices
- Patent number 11,054,471
- Issue date Jul 6, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus
- Patent number 10,983,164
- Issue date Apr 20, 2021
- SK Hynix Inc.
- Chul Woo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system with embedded tester
- Patent number 10,866,283
- Issue date Dec 15, 2020
- NXP B.V.
- Jan-Peter Schat
- G01 - MEASURING TESTING
Information Patent Grant
Advanced discrete control device diagnostic on digital output modules
- Patent number 10,825,263
- Issue date Nov 3, 2020
- Honeywell International Inc.
- Nagaraja Sundaresh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SIGNAL PROCESSING METHOD AND MEASUREMENT SYSTEM
- Publication number 20240410941
- Publication date Dec 12, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Florian RAMIAN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20240310440
- Publication date Sep 19, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING
- Publication number 20240295601
- Publication date Sep 5, 2024
- QUALCOMM Incorporated
- Zdravko LUKIC
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND APPARATUS TO IMPLEMENT A BOUNDARY SCAN FOR SHARED ANALO...
- Publication number 20240288496
- Publication date Aug 29, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Prasanth Viswanathan Pillai
- G01 - MEASURING TESTING
Information Patent Application
Phase-Shifter Functional Safety Testing
- Publication number 20240175918
- Publication date May 30, 2024
- AyDeeKay LLC dba Indie Semiconductor
- Tom Heller
- G01 - MEASURING TESTING
Information Patent Application
SELF-TESTING CIRCUITS FOR DEVICES HAVING MULTIPLE INPUT CHANNELS WI...
- Publication number 20240159819
- Publication date May 16, 2024
- STMicroelectronics S.r.l.
- Nicola Errico
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20230280398
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING
Information Patent Application
Integrity Tests for Mixed Analog Digital Systems
- Publication number 20230258712
- Publication date Aug 17, 2023
- Aptiv Technologies Limited
- Olaf Donner
- G01 - MEASURING TESTING
Information Patent Application
INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...
- Publication number 20230078568
- Publication date Mar 16, 2023
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20220268838
- Publication date Aug 25, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BATTERY SOH DETERMINATION CIRCUIT
- Publication number 20220057452
- Publication date Feb 24, 2022
- Analog Devices International Unlimited Company
- Jeremy R. Gorbold
- G01 - MEASURING TESTING
Information Patent Application
INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...
- Publication number 20220034965
- Publication date Feb 3, 2022
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING CIRCUIT DEFECTS
- Publication number 20220018892
- Publication date Jan 20, 2022
- Samsung Electronics Co., Ltd.
- Donggyu MINN
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing Apparatus for Spintronics Devices
- Publication number 20210325460
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A NOVEL SYSTEM AND METHOD FOR ACHIEVING FUNCTIONAL COVERAGE CLOSURE...
- Publication number 20210264085
- Publication date Aug 26, 2021
- Michael Alexander Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20210199719
- Publication date Jul 1, 2021
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR TESTING MONITORING CIRCUIT AND OPERATING METHOD THEREOF
- Publication number 20210172999
- Publication date Jun 10, 2021
- Samsung Electronics Co., Ltd.
- Hyunseok Nam
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CIRCUIT FOR TESTING PRIMARY INTERNAL SIGNALS ON AN ASIC
- Publication number 20210063483
- Publication date Mar 4, 2021
- ROBERT BOSCH GmbH
- Carsten Hermann
- G01 - MEASURING TESTING
Information Patent Application
ROOT MONITORING ON AN FPGA USING SATELLITE ADCS
- Publication number 20210011172
- Publication date Jan 14, 2021
- Xilinx, Inc.
- Brendan Farley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT ARRANGEMENT COMPRISING A MICROPROCESSOR AND A VOLTAGE GENER...
- Publication number 20210011081
- Publication date Jan 14, 2021
- Vitesco Technologies GMBH
- Andreas Wunderlich
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AUTOMATED TEST EQUIPMENT FOR TESTING HIGH-POWER ELECTRONIC COMPONENTS
- Publication number 20200379043
- Publication date Dec 3, 2020
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Application
BATTERY SERVICE LIFE MANAGEMENT METHOD AND SYSTEM
- Publication number 20200319256
- Publication date Oct 8, 2020
- Samsung Electronics Co., Ltd.
- Mohan Kumar Singh VERMA
- B60 - VEHICLES IN GENERAL
Information Patent Application
REAL-TIME JITTER IMPAIRMENT INSERTION FOR SIGNAL SOURCES
- Publication number 20200209307
- Publication date Jul 2, 2020
- Tektronix, Inc.
- Gregory A. Martin
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20200132765
- Publication date Apr 30, 2020
- SK HYNIX INC.
- Chul Woo KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electrical Testing Apparatus for Spintronics Devices
- Publication number 20200116790
- Publication date Apr 16, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT DEVICE WITH INTEGRATED FAULT MONITORING SYSTEM
- Publication number 20200073786
- Publication date Mar 5, 2020
- NXP B.V.
- Jan-Peter Schat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFYING DEFECT SENSITIVE CODES FOR TESTING DEVICES WITH INPUT O...
- Publication number 20200057106
- Publication date Feb 20, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Lakshmanan Balasubramanian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electrical Testing Apparatus for Spintronics Devices
- Publication number 20190257881
- Publication date Aug 22, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OSCILLOSCOPE AND METHOD
- Publication number 20190094271
- Publication date Mar 28, 2019
- Rohde& Schwarz GmbH & Co. KG
- Markus Freidhof
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System and Method for Electric Current Leakage Detection in A Land...
- Publication number 20190072610
- Publication date Mar 7, 2019
- WesternGeco L.L.C.
- Kambiz Iranpour
- H01 - BASIC ELECTRIC ELEMENTS

Testing of combined analog and digital circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

On-chip checker for on-chip safety area

Methods and apparatus to implement a boundary scan for shared analo...

Device under test (DUT) measurement circuit having harmonic minimiz...

Integrity tests for mixed analog digital systems

Interleaved testing of digital and analog subsystems with on-chip t...

Test method and apparatus of communication chip, device and medium

Battery SOH determination circuit

Electrical circuit for testing primary internal signals of an ASIC

Method and apparatus for detecting circuit defects

Root monitoring on an FPGA using satellite ADCs

Circuit for testing monitoring circuit and operating method thereof

Built-in self-test circuit and temperature measurement circuit incl...

Integrated circuit test apparatus

Apparatuses involving calibration of input offset voltage and signa...

Electrical testing apparatus for spintronics devices

Signal path monitor

Interleaved testing of digital and analog subsystems with on-chip t...

Integrated circuit device with integrated fault monitoring system

Battery service life management method and system

Semiconductor device which detects occurrence of an abnormality dur...

Testing device and testing method for testing a device under test

Real-time jitter impairment insertion for signal sources

System and method for achieving functional coverage closure for ele...

Automated test equipment for combined signals

Circuit arrangement comprising a microprocessor and a voltage gener...

Automated test equipment for testing high-power electronic components

Electrical testing apparatus for spintronics devices

Test apparatus

Test system with embedded tester

Advanced discrete control device diagnostic on digital output modules

Patents Applicationslast 30 patents

SIGNAL PROCESSING METHOD AND MEASUREMENT SYSTEM

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING

METHODS AND APPARATUS TO IMPLEMENT A BOUNDARY SCAN FOR SHARED ANALO...

Phase-Shifter Functional Safety Testing

SELF-TESTING CIRCUITS FOR DEVICES HAVING MULTIPLE INPUT CHANNELS WI...

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

Integrity Tests for Mixed Analog Digital Systems

INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

BATTERY SOH DETERMINATION CIRCUIT

INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...

METHOD AND APPARATUS FOR DETECTING CIRCUIT DEFECTS

Electrical Testing Apparatus for Spintronics Devices

A NOVEL SYSTEM AND METHOD FOR ACHIEVING FUNCTIONAL COVERAGE CLOSURE...

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

CIRCUIT FOR TESTING MONITORING CIRCUIT AND OPERATING METHOD THEREOF

ELECTRICAL CIRCUIT FOR TESTING PRIMARY INTERNAL SIGNALS ON AN ASIC

ROOT MONITORING ON AN FPGA USING SATELLITE ADCS

CIRCUIT ARRANGEMENT COMPRISING A MICROPROCESSOR AND A VOLTAGE GENER...

AUTOMATED TEST EQUIPMENT FOR TESTING HIGH-POWER ELECTRONIC COMPONENTS

BATTERY SERVICE LIFE MANAGEMENT METHOD AND SYSTEM

REAL-TIME JITTER IMPAIRMENT INSERTION FOR SIGNAL SOURCES

TEST APPARATUS

Electrical Testing Apparatus for Spintronics Devices

INTEGRATED CIRCUIT DEVICE WITH INTEGRATED FAULT MONITORING SYSTEM

IDENTIFYING DEFECT SENSITIVE CODES FOR TESTING DEVICES WITH INPUT O...

Electrical Testing Apparatus for Spintronics Devices

OSCILLOSCOPE AND METHOD

System and Method for Electric Current Leakage Detection in A Land...