Testing of optical properties of lenses

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GPHYSICS G01Measuring instruments G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR G01M11/00Testing of optical apparatus Testing structures by optical methods not otherwise provided for

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G01M11/02Testing of optical properties of lenses

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Refractive periscope for extended-pupil parallelism and virtual ima...
- Patent number 12,188,840
- Issue date Jan 7, 2025
- MLOptic Corp.
- Pengfei Wu
- G01 - MEASURING TESTING
Information Patent Grant
Processing device, measurement device, and measurement method
- Patent number 12,183,027
- Issue date Dec 31, 2024
- Kabushiki Kaisha Toshiba
- Kiminori Toya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Loopback waveguide
- Patent number 12,174,421
- Issue date Dec 24, 2024
- POET Technologies, Inc.
- Suresh Venkatesan
- G01 - MEASURING TESTING
Information Patent Grant
Camera module manufacturing device
- Patent number 12,174,445
- Issue date Dec 24, 2024
- PFA Corporation
- Tsukasa Yamamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical apparatus evaluating method
- Patent number 12,169,154
- Issue date Dec 17, 2024
- Canon Kabushiki Kaisha
- Kunihiko Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system and method of determining one or more optical par...
- Patent number 12,169,153
- Issue date Dec 17, 2024
- 6 OVER 6 VISION LTD.
- Ofer Limon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber laser with optical feedback for contaminant detection and oth...
- Patent number 12,166,326
- Issue date Dec 10, 2024
- InnoVoyce LLC
- Richard Shaun Welches
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Loopback waveguide
- Patent number 12,164,148
- Issue date Dec 10, 2024
- POET Technologies, Inc.
- Suresh Venkatesan
- G02 - OPTICS
Information Patent Grant
Inundation detection system and inundation detection method
- Patent number 12,152,957
- Issue date Nov 26, 2024
- Nippon Telegraph and Telephone Corporation
- Atsushi Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Ocular aberrometry recovery systems and methods
- Patent number 12,150,707
- Issue date Nov 26, 2024
- Alcon Inc.
- Max Hall
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to measure light loss of optical films and optical substrates
- Patent number 12,140,494
- Issue date Nov 12, 2024
- Applied Materials, Inc.
- Jinxin Fu
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation system for an optical device
- Patent number 12,140,492
- Issue date Nov 12, 2024
- ZF ACTIVE SAFETY AND ELECTRONICS US LLC
- Matthew W. Warmuth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing non-normal incidence distortion i...
- Patent number 12,138,846
- Issue date Nov 12, 2024
- RO Technologies, LLC
- Bart E. Wilson
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Wave front sensor for wave aberration compensation in an optical sy...
- Patent number 12,140,493
- Issue date Nov 12, 2024
- University of Notre Dame Du Lac
- Justin Crepp
- G02 - OPTICS
Information Patent Grant
Method for centering an optical element in an optical system for an...
- Patent number 12,135,436
- Issue date Nov 5, 2024
- Olympus Winter & IBE GmbH
- Uwe Schoeler
- G02 - OPTICS
Information Patent Grant
Laser apparatus
- Patent number 12,130,422
- Issue date Oct 29, 2024
- NPS CO., LTD.
- Seong Ho Bae
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Active alignment of optical die to optical substrates
- Patent number 12,130,195
- Issue date Oct 29, 2024
- PSIQUANTUM, CORP.
- Bradley Snyder
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting absolute or relative temperature an...
- Patent number 12,123,800
- Issue date Oct 22, 2024
- Adtran Networks SE
- Benjamin Wohlfeil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface metrology systems and methods thereof
- Patent number 12,123,701
- Issue date Oct 22, 2024
- Optipro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Grant
Lens ordering system, lens ordering method, program, and data struc...
- Patent number 12,124,111
- Issue date Oct 22, 2024
- Mitsui Chemicals, Inc.
- Shinsuke Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for evaluating a performance of a visual equipmen...
- Patent number 12,111,223
- Issue date Oct 8, 2024
- Essilor International
- Sébastien Fricker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Portable optic metrology thermal chamber module and method therefor
- Patent number 12,104,975
- Issue date Oct 1, 2024
- Optikos Corporation
- David Imrie
- G01 - MEASURING TESTING
Information Patent Grant
Device for pulling out optical fiber, method for pulling out optica...
- Patent number 12,098,968
- Issue date Sep 24, 2024
- Fujikura Ltd.
- Shengyang Luo
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Pre-conditioning interferometer
- Patent number 12,092,456
- Issue date Sep 17, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Dae Wook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating spectacle lens, and spectacle lens
- Patent number 12,092,547
- Issue date Sep 17, 2024
- HOYA LENS THAILAND LTD.
- Hua Qi
- G01 - MEASURING TESTING
Information Patent Grant
Combination detector for detecting visual and optical properties of...
- Patent number 12,085,472
- Issue date Sep 10, 2024
- Optocraft GmbH
- Juergen Lamprecht
- G01 - MEASURING TESTING
Information Patent Grant
Deflectometry devices, systems and methods
- Patent number 12,085,473
- Issue date Sep 10, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Dae Wook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Optical-based validation of orientations of internal facets
- Patent number 12,078,476
- Issue date Sep 3, 2024
- LUMUS LTD.
- Ido Eisenberg
- G01 - MEASURING TESTING
Information Patent Grant
Resolution measurement apparatus and resolution measurement method...
- Patent number 12,072,259
- Issue date Aug 27, 2024
- Samsung Display Co., Ltd.
- Sanghui Park
- G01 - MEASURING TESTING
Information Patent Grant
Collimator
- Patent number 12,066,638
- Issue date Aug 20, 2024
- Konrad GmbH
- Michael Konrad
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR PERFORMING CLEAVE ANGLE METROLOGY FOR AN OPTI...
- Publication number 20240426700
- Publication date Dec 26, 2024
- RAM Photonics Industrial, LLC
- Joseph Lawson
- G01 - MEASURING TESTING
Information Patent Application
VIEW BLIND CHECK SYSTEM, VIEW BLIND CHECK METHOD, AND VIEW BLIND ME...
- Publication number 20240426699
- Publication date Dec 26, 2024
- Nitto Denko Corporation
- Saori Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Collimated Phase Measuring Deflectometry
- Publication number 20240426701
- Publication date Dec 26, 2024
- Brookhaven Science Associates, LLC
- Lei Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A METHOD FOR DERIVING A SURFACE PROFILE OF A FREE-FORM MASTER LENS...
- Publication number 20240427196
- Publication date Dec 26, 2024
- Universiteit Gent
- Kristiaan NEYTS
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT, OPTICAL UNIT, OPTICAL DEVICE, METHOD FOR ADJUSTING...
- Publication number 20240418599
- Publication date Dec 19, 2024
- Canon Kabushiki Kaisha
- MASATSUGU KOYAMA
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THE DEGREE OF FOULING OF A TRANSMISSIVE ELEMENT
- Publication number 20240416464
- Publication date Dec 19, 2024
- BYSTRONIC LASER AG
- Benjamin KALLEN
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR THE GEOMETRIC CHARACTERISATION OF OPTICAL LENSES
- Publication number 20240418600
- Publication date Dec 19, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RESOLUTION DETECTION DEVICE
- Publication number 20240410782
- Publication date Dec 12, 2024
- VIVOTEK INC.
- Chung-Kai Chang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD FOR MEASURING CHIP-SCALE...
- Publication number 20240410783
- Publication date Dec 12, 2024
- AimCore Technology Co., Ltd.
- Wein-Kuen Hwang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20240402039
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
- Publication number 20240401938
- Publication date Dec 5, 2024
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES, TEST CARDS AND METHODS FOR TESTING PHOTONIC INTEGRATED...
- Publication number 20240402038
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Heiner Zwickel
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES
- Publication number 20240402040
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING LENS CHARACTERISTICS USING REFLECTIONS
- Publication number 20240393207
- Publication date Nov 28, 2024
- Apple Inc.
- Zeyad ZAKY
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-BASED VALIDATION OF ORIENTATIONS OF INTERNAL FACETS
- Publication number 20240393108
- Publication date Nov 28, 2024
- LUMUS LTD.
- Ido EISENBERG
- G01 - MEASURING TESTING
Information Patent Application
LASER BEAM ASTIGMATISM EVALUATING METHOD
- Publication number 20240385431
- Publication date Nov 21, 2024
- Disco Corporation
- Atsushi MAEDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DEVICE FOR MEASURING THE PERFORMANCE OF AN OPTICAL DETECTOR, AND AS...
- Publication number 20240385073
- Publication date Nov 21, 2024
- LYNRED
- Lilian Martineau
- G01 - MEASURING TESTING
Information Patent Application
ECCENTRICITY MEASUREMENT METHOD AND ECCENTRICITY MEASUREMENT DEVICE
- Publication number 20240385074
- Publication date Nov 21, 2024
- OLYMPUS CORPORATION
- Yosuke SATO
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM FOR AR METROLOGY TOOL
- Publication number 20240385075
- Publication date Nov 21, 2024
- Applied Materials, Inc.
- Yangyang SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECTIVE LENS ARRANGEMENT, MEASURING DEVICE AND METHOD FOR MEASURI...
- Publication number 20240385077
- Publication date Nov 21, 2024
- TechnoTeam Holding GmbH
- Ingo ROTSCHOLL
- G01 - MEASURING TESTING
Information Patent Application
EQUIPMENT AND METHOD FOR MEASURING LOSS AND CROSSTALK THAT OCCUR IN...
- Publication number 20240377282
- Publication date Nov 14, 2024
- Nippon Telegraph and Telephone Corporation
- Tomokazu ODA
- G01 - MEASURING TESTING
Information Patent Application
EQUIPMENT AND METHOD FOR MEASURING CROSSTALK BETWEEN CORES OF AN OP...
- Publication number 20240377281
- Publication date Nov 14, 2024
- Nippon Telegraph and Telephone Corporation
- Tomokazu ODA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY DISTRIBUTION PATTERN MEASURING DEVICE AND METHOD
- Publication number 20240353289
- Publication date Oct 24, 2024
- Nippon Telegraph and Telephone Corporation
- Shingo ONO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING THE LIGHT SENSITIVITY OF A CAMERA
- Publication number 20240353290
- Publication date Oct 24, 2024
- The Boeing Company
- Jason S. Damazo
- G01 - MEASURING TESTING
Information Patent Application
Characterization Device for Gradient Photochromic Lens
- Publication number 20240344927
- Publication date Oct 17, 2024
- Transitions Optical, Ltd.
- Forrest R. Blackburn
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TESTING OF OPTICAL ASSEMBLIES
- Publication number 20240344926
- Publication date Oct 17, 2024
- IonQ, Inc.
- Jonathan Albert MIZRAHI
- G01 - MEASURING TESTING
Information Patent Application
LENS LOOSENING TEST DEVICE AND LENS LOOSENING TEST METHOD
- Publication number 20240337557
- Publication date Oct 10, 2024
- AAC Optics (Suzhou) Co., Ltd.
- Nan Qiao
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION CUVETTE AND SYSTEM FOR USE IN THE OPTICAL INSPECTION OF...
- Publication number 20240319073
- Publication date Sep 26, 2024
- Alcon Inc.
- Felix Brinckmann
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CONFIGURABLE WAVEFRONT TESTER
- Publication number 20240319041
- Publication date Sep 26, 2024
- MLOptic Corp
- Pengfei Wu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...
- Publication number 20240319110
- Publication date Sep 26, 2024
- SAMSUNG DISPLAY CO., LTD.
- Gil Yeong PARK
- G01 - MEASURING TESTING

Testing of optical properties of lenses

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Refractive periscope for extended-pupil parallelism and virtual ima...

Processing device, measurement device, and measurement method

Loopback waveguide

Camera module manufacturing device

Optical apparatus evaluating method

Apparatus, system and method of determining one or more optical par...

Fiber laser with optical feedback for contaminant detection and oth...

Loopback waveguide

Inundation detection system and inundation detection method

Ocular aberrometry recovery systems and methods

Method to measure light loss of optical films and optical substrates

Evaluation system for an optical device

Method and apparatus for reducing non-normal incidence distortion i...

Wave front sensor for wave aberration compensation in an optical sy...

Method for centering an optical element in an optical system for an...

Laser apparatus

Active alignment of optical die to optical substrates

Method and device for detecting absolute or relative temperature an...

Surface metrology systems and methods thereof

Lens ordering system, lens ordering method, program, and data struc...

Device and method for evaluating a performance of a visual equipmen...

Portable optic metrology thermal chamber module and method therefor

Device for pulling out optical fiber, method for pulling out optica...

Pre-conditioning interferometer

Method for evaluating spectacle lens, and spectacle lens

Combination detector for detecting visual and optical properties of...

Deflectometry devices, systems and methods

Optical-based validation of orientations of internal facets

Resolution measurement apparatus and resolution measurement method...

Collimator

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR PERFORMING CLEAVE ANGLE METROLOGY FOR AN OPTI...

VIEW BLIND CHECK SYSTEM, VIEW BLIND CHECK METHOD, AND VIEW BLIND ME...

Collimated Phase Measuring Deflectometry

A METHOD FOR DERIVING A SURFACE PROFILE OF A FREE-FORM MASTER LENS...

OPTICAL ELEMENT, OPTICAL UNIT, OPTICAL DEVICE, METHOD FOR ADJUSTING...

DETERMINING THE DEGREE OF FOULING OF A TRANSMISSIVE ELEMENT

METHOD FOR THE GEOMETRIC CHARACTERISATION OF OPTICAL LENSES

RESOLUTION DETECTION DEVICE

MEASUREMENT SYSTEM AND MEASUREMENT METHOD FOR MEASURING CHIP-SCALE...

METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF

APPARATUSES, TEST CARDS AND METHODS FOR TESTING PHOTONIC INTEGRATED...

METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES

IDENTIFYING LENS CHARACTERISTICS USING REFLECTIONS

OPTICAL-BASED VALIDATION OF ORIENTATIONS OF INTERNAL FACETS

LASER BEAM ASTIGMATISM EVALUATING METHOD

DEVICE FOR MEASURING THE PERFORMANCE OF AN OPTICAL DETECTOR, AND AS...

ECCENTRICITY MEASUREMENT METHOD AND ECCENTRICITY MEASUREMENT DEVICE

ILLUMINATION SYSTEM FOR AR METROLOGY TOOL

OBJECTIVE LENS ARRANGEMENT, MEASURING DEVICE AND METHOD FOR MEASURI...

EQUIPMENT AND METHOD FOR MEASURING LOSS AND CROSSTALK THAT OCCUR IN...

EQUIPMENT AND METHOD FOR MEASURING CROSSTALK BETWEEN CORES OF AN OP...

LIGHT INTENSITY DISTRIBUTION PATTERN MEASURING DEVICE AND METHOD

SYSTEM AND METHOD FOR CALIBRATING THE LIGHT SENSITIVITY OF A CAMERA

Characterization Device for Gradient Photochromic Lens

AUTOMATED TESTING OF OPTICAL ASSEMBLIES

LENS LOOSENING TEST DEVICE AND LENS LOOSENING TEST METHOD

INSPECTION CUVETTE AND SYSTEM FOR USE IN THE OPTICAL INSPECTION OF...

MULTI-CONFIGURABLE WAVEFRONT TESTER

OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...