Testing of optical properties of lenses

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GPHYSICS G01Measuring instruments G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR G01M11/00Testing of optical apparatus Testing structures by optical methods not otherwise provided for

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G01M11/02Testing of optical properties of lenses

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Aberrometer with a dynamically adjustable video fixation target
- Patent number 12,220,170
- Issue date Feb 11, 2025
- WaveFront Dynamics, Inc.
- Daniel R. Neal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test fixture for aligning center of lens
- Patent number 12,222,258
- Issue date Feb 11, 2025
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
- Wei Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Lighting system inspection using an unmanned aerial vehicle
- Patent number 12,221,232
- Issue date Feb 11, 2025
- The Boeing Company
- Gregory James Sweers
- G01 - MEASURING TESTING
Information Patent Grant
Photonic wafer level testing systems, devices, and methods of opera...
- Patent number 12,216,020
- Issue date Feb 4, 2025
- STMicroelectronics S.r.l.
- Marco Piazza
- G01 - MEASURING TESTING
Information Patent Grant
Demonstration device for photochromic lenses
- Patent number 12,217,623
- Issue date Feb 4, 2025
- Transitions Optical, Ltd.
- William D. Carpenter
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Using multiple target distances to determine long-term quality and/...
- Patent number 12,219,124
- Issue date Feb 4, 2025
- Aptiv Technologies AG
- Morgan D. Murphy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses for testing the lateral and axial confocality of a scan...
- Patent number 12,216,019
- Issue date Feb 4, 2025
- Abberior Instruments GmbH
- Joachim Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Non-spatial measurement calibration methods and associated systems...
- Patent number 12,209,953
- Issue date Jan 28, 2025
- Radiant Vision Systems, LLC
- Jens J. Jensen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Refractive periscope for extended-pupil parallelism and virtual ima...
- Patent number 12,188,840
- Issue date Jan 7, 2025
- MLOptic Corp.
- Pengfei Wu
- G01 - MEASURING TESTING
Information Patent Grant
Processing device, measurement device, and measurement method
- Patent number 12,183,027
- Issue date Dec 31, 2024
- Kabushiki Kaisha Toshiba
- Kiminori Toya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Loopback waveguide
- Patent number 12,174,421
- Issue date Dec 24, 2024
- POET Technologies, Inc.
- Suresh Venkatesan
- G01 - MEASURING TESTING
Information Patent Grant
Camera module manufacturing device
- Patent number 12,174,445
- Issue date Dec 24, 2024
- PFA Corporation
- Tsukasa Yamamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical apparatus evaluating method
- Patent number 12,169,154
- Issue date Dec 17, 2024
- Canon Kabushiki Kaisha
- Kunihiko Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system and method of determining one or more optical par...
- Patent number 12,169,153
- Issue date Dec 17, 2024
- 6 OVER 6 VISION LTD.
- Ofer Limon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber laser with optical feedback for contaminant detection and oth...
- Patent number 12,166,326
- Issue date Dec 10, 2024
- InnoVoyce LLC
- Richard Shaun Welches
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Loopback waveguide
- Patent number 12,164,148
- Issue date Dec 10, 2024
- POET Technologies, Inc.
- Suresh Venkatesan
- G02 - OPTICS
Information Patent Grant
Inundation detection system and inundation detection method
- Patent number 12,152,957
- Issue date Nov 26, 2024
- Nippon Telegraph and Telephone Corporation
- Atsushi Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Ocular aberrometry recovery systems and methods
- Patent number 12,150,707
- Issue date Nov 26, 2024
- Alcon Inc.
- Max Hall
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to measure light loss of optical films and optical substrates
- Patent number 12,140,494
- Issue date Nov 12, 2024
- Applied Materials, Inc.
- Jinxin Fu
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation system for an optical device
- Patent number 12,140,492
- Issue date Nov 12, 2024
- ZF ACTIVE SAFETY AND ELECTRONICS US LLC
- Matthew W. Warmuth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing non-normal incidence distortion i...
- Patent number 12,138,846
- Issue date Nov 12, 2024
- RO Technologies, LLC
- Bart E. Wilson
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Wave front sensor for wave aberration compensation in an optical sy...
- Patent number 12,140,493
- Issue date Nov 12, 2024
- University of Notre Dame Du Lac
- Justin Crepp
- G02 - OPTICS
Information Patent Grant
Method for centering an optical element in an optical system for an...
- Patent number 12,135,436
- Issue date Nov 5, 2024
- Olympus Winter & IBE GmbH
- Uwe Schoeler
- G02 - OPTICS
Information Patent Grant
Laser apparatus
- Patent number 12,130,422
- Issue date Oct 29, 2024
- NPS CO., LTD.
- Seong Ho Bae
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Active alignment of optical die to optical substrates
- Patent number 12,130,195
- Issue date Oct 29, 2024
- PSIQUANTUM, CORP.
- Bradley Snyder
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting absolute or relative temperature an...
- Patent number 12,123,800
- Issue date Oct 22, 2024
- Adtran Networks SE
- Benjamin Wohlfeil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface metrology systems and methods thereof
- Patent number 12,123,701
- Issue date Oct 22, 2024
- Optipro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Grant
Lens ordering system, lens ordering method, program, and data struc...
- Patent number 12,124,111
- Issue date Oct 22, 2024
- Mitsui Chemicals, Inc.
- Shinsuke Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for evaluating a performance of a visual equipmen...
- Patent number 12,111,223
- Issue date Oct 8, 2024
- Essilor International
- Sébastien Fricker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Portable optic metrology thermal chamber module and method therefor
- Patent number 12,104,975
- Issue date Oct 1, 2024
- Optikos Corporation
- David Imrie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CHARACTERIZING AT LEAST PART OF A LENS ELEMENT
- Publication number 20250044190
- Publication date Feb 6, 2025
- Essilor International
- Matthieu GUILLOT
- G01 - MEASURING TESTING
Information Patent Application
MTF DETECTION DEVICE FOR WAFER-LEVEL OPTICAL ELEMENT
- Publication number 20250044188
- Publication date Feb 6, 2025
- SHENZHEN METALENX TECHNOLOGY CO.,LTD
- Chengliang LAI
- G01 - MEASURING TESTING
Information Patent Application
ECCENTRICITY MEASUREMENT METHOD AND MEASUREMENT SYSTEM
- Publication number 20250044189
- Publication date Feb 6, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Tatsuya SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FIBER TEST EQUIPMENT AND OPTICAL FIBER TEST METHOD
- Publication number 20250044187
- Publication date Feb 6, 2025
- Nippon Telegraph and Telephone Corporation
- Atsushi NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Adjusting the power level of a visible light source based on a char...
- Publication number 20250035509
- Publication date Jan 30, 2025
- EXFO INC.
- Michel Leclerc
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE ADJUSTMENT METHOD AND EXAMINATION METHOD
- Publication number 20250035508
- Publication date Jan 30, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- JUN YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
DATA CORRECTION APPARATUS, OPTICAL TIME-DOMAIN REFLECTOMETER, OPTIC...
- Publication number 20250027838
- Publication date Jan 23, 2025
- YOKOGAWA ELECTRIC CORPORATION
- Yoshihisa So
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PERFORMING CLEAVE ANGLE METROLOGY FOR AN OPTI...
- Publication number 20240426700
- Publication date Dec 26, 2024
- RAM Photonics Industrial, LLC
- Joseph Lawson
- G01 - MEASURING TESTING
Information Patent Application
VIEW BLIND CHECK SYSTEM, VIEW BLIND CHECK METHOD, AND VIEW BLIND ME...
- Publication number 20240426699
- Publication date Dec 26, 2024
- Nitto Denko Corporation
- Saori Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR DERIVING A SURFACE PROFILE OF A FREE-FORM MASTER LENS...
- Publication number 20240427196
- Publication date Dec 26, 2024
- Universiteit Gent
- Kristiaan NEYTS
- G01 - MEASURING TESTING
Information Patent Application
Collimated Phase Measuring Deflectometry
- Publication number 20240426701
- Publication date Dec 26, 2024
- Brookhaven Science Associates, LLC
- Lei Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL ELEMENT, OPTICAL UNIT, OPTICAL DEVICE, METHOD FOR ADJUSTING...
- Publication number 20240418599
- Publication date Dec 19, 2024
- Canon Kabushiki Kaisha
- MASATSUGU KOYAMA
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THE DEGREE OF FOULING OF A TRANSMISSIVE ELEMENT
- Publication number 20240416464
- Publication date Dec 19, 2024
- BYSTRONIC LASER AG
- Benjamin KALLEN
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR THE GEOMETRIC CHARACTERISATION OF OPTICAL LENSES
- Publication number 20240418600
- Publication date Dec 19, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RESOLUTION DETECTION DEVICE
- Publication number 20240410782
- Publication date Dec 12, 2024
- VIVOTEK INC.
- Chung-Kai Chang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD FOR MEASURING CHIP-SCALE...
- Publication number 20240410783
- Publication date Dec 12, 2024
- AimCore Technology Co., Ltd.
- Wein-Kuen Hwang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20240402039
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
- Publication number 20240401938
- Publication date Dec 5, 2024
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES, TEST CARDS AND METHODS FOR TESTING PHOTONIC INTEGRATED...
- Publication number 20240402038
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Heiner Zwickel
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES
- Publication number 20240402040
- Publication date Dec 5, 2024
- FOGALE NANOTECH
- Eric LEGROS
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING LENS CHARACTERISTICS USING REFLECTIONS
- Publication number 20240393207
- Publication date Nov 28, 2024
- Apple Inc.
- Zeyad ZAKY
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-BASED VALIDATION OF ORIENTATIONS OF INTERNAL FACETS
- Publication number 20240393108
- Publication date Nov 28, 2024
- LUMUS LTD.
- Ido EISENBERG
- G01 - MEASURING TESTING
Information Patent Application
LASER BEAM ASTIGMATISM EVALUATING METHOD
- Publication number 20240385431
- Publication date Nov 21, 2024
- Disco Corporation
- Atsushi MAEDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DEVICE FOR MEASURING THE PERFORMANCE OF AN OPTICAL DETECTOR, AND AS...
- Publication number 20240385073
- Publication date Nov 21, 2024
- LYNRED
- Lilian Martineau
- G01 - MEASURING TESTING
Information Patent Application
ECCENTRICITY MEASUREMENT METHOD AND ECCENTRICITY MEASUREMENT DEVICE
- Publication number 20240385074
- Publication date Nov 21, 2024
- OLYMPUS CORPORATION
- Yosuke SATO
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM FOR AR METROLOGY TOOL
- Publication number 20240385075
- Publication date Nov 21, 2024
- Applied Materials, Inc.
- Yangyang SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECTIVE LENS ARRANGEMENT, MEASURING DEVICE AND METHOD FOR MEASURI...
- Publication number 20240385077
- Publication date Nov 21, 2024
- TechnoTeam Holding GmbH
- Ingo ROTSCHOLL
- G01 - MEASURING TESTING
Information Patent Application
EQUIPMENT AND METHOD FOR MEASURING LOSS AND CROSSTALK THAT OCCUR IN...
- Publication number 20240377282
- Publication date Nov 14, 2024
- Nippon Telegraph and Telephone Corporation
- Tomokazu ODA
- G01 - MEASURING TESTING
Information Patent Application
EQUIPMENT AND METHOD FOR MEASURING CROSSTALK BETWEEN CORES OF AN OP...
- Publication number 20240377281
- Publication date Nov 14, 2024
- Nippon Telegraph and Telephone Corporation
- Tomokazu ODA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY DISTRIBUTION PATTERN MEASURING DEVICE AND METHOD
- Publication number 20240353289
- Publication date Oct 24, 2024
- Nippon Telegraph and Telephone Corporation
- Shingo ONO
- G01 - MEASURING TESTING

Testing of optical properties of lenses

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Aberrometer with a dynamically adjustable video fixation target

Test fixture for aligning center of lens

Lighting system inspection using an unmanned aerial vehicle

Photonic wafer level testing systems, devices, and methods of opera...

Demonstration device for photochromic lenses

Using multiple target distances to determine long-term quality and/...

Apparatuses for testing the lateral and axial confocality of a scan...

Non-spatial measurement calibration methods and associated systems...

Refractive periscope for extended-pupil parallelism and virtual ima...

Processing device, measurement device, and measurement method

Loopback waveguide

Camera module manufacturing device

Optical apparatus evaluating method

Apparatus, system and method of determining one or more optical par...

Fiber laser with optical feedback for contaminant detection and oth...

Loopback waveguide

Inundation detection system and inundation detection method

Ocular aberrometry recovery systems and methods

Method to measure light loss of optical films and optical substrates

Evaluation system for an optical device

Method and apparatus for reducing non-normal incidence distortion i...

Wave front sensor for wave aberration compensation in an optical sy...

Method for centering an optical element in an optical system for an...

Laser apparatus

Active alignment of optical die to optical substrates

Method and device for detecting absolute or relative temperature an...

Surface metrology systems and methods thereof

Lens ordering system, lens ordering method, program, and data struc...

Device and method for evaluating a performance of a visual equipmen...

Portable optic metrology thermal chamber module and method therefor

Patents Applicationslast 30 patents

METHOD FOR CHARACTERIZING AT LEAST PART OF A LENS ELEMENT

MTF DETECTION DEVICE FOR WAFER-LEVEL OPTICAL ELEMENT

ECCENTRICITY MEASUREMENT METHOD AND MEASUREMENT SYSTEM

OPTICAL FIBER TEST EQUIPMENT AND OPTICAL FIBER TEST METHOD

Adjusting the power level of a visible light source based on a char...

OPTICAL MODULE ADJUSTMENT METHOD AND EXAMINATION METHOD

DATA CORRECTION APPARATUS, OPTICAL TIME-DOMAIN REFLECTOMETER, OPTIC...

METHOD AND SYSTEM FOR PERFORMING CLEAVE ANGLE METROLOGY FOR AN OPTI...

VIEW BLIND CHECK SYSTEM, VIEW BLIND CHECK METHOD, AND VIEW BLIND ME...

A METHOD FOR DERIVING A SURFACE PROFILE OF A FREE-FORM MASTER LENS...

Collimated Phase Measuring Deflectometry

OPTICAL ELEMENT, OPTICAL UNIT, OPTICAL DEVICE, METHOD FOR ADJUSTING...

DETERMINING THE DEGREE OF FOULING OF A TRANSMISSIVE ELEMENT

METHOD FOR THE GEOMETRIC CHARACTERISATION OF OPTICAL LENSES

RESOLUTION DETECTION DEVICE

MEASUREMENT SYSTEM AND MEASUREMENT METHOD FOR MEASURING CHIP-SCALE...

METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF

APPARATUSES, TEST CARDS AND METHODS FOR TESTING PHOTONIC INTEGRATED...

METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES

IDENTIFYING LENS CHARACTERISTICS USING REFLECTIONS

OPTICAL-BASED VALIDATION OF ORIENTATIONS OF INTERNAL FACETS

LASER BEAM ASTIGMATISM EVALUATING METHOD

DEVICE FOR MEASURING THE PERFORMANCE OF AN OPTICAL DETECTOR, AND AS...

ECCENTRICITY MEASUREMENT METHOD AND ECCENTRICITY MEASUREMENT DEVICE

ILLUMINATION SYSTEM FOR AR METROLOGY TOOL

OBJECTIVE LENS ARRANGEMENT, MEASURING DEVICE AND METHOD FOR MEASURI...

EQUIPMENT AND METHOD FOR MEASURING LOSS AND CROSSTALK THAT OCCUR IN...

EQUIPMENT AND METHOD FOR MEASURING CROSSTALK BETWEEN CORES OF AN OP...

LIGHT INTENSITY DISTRIBUTION PATTERN MEASURING DEVICE AND METHOD