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Testing of optical properties of lenses
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PHYSICS
G01
Measuring instruments
G01M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
G01M11/00
Testing of optical apparatus Testing structures by optical methods not otherwise provided for
Current Industry
G01M11/02
Testing of optical properties of lenses
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Patents Grants
last 30 patents
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Patent Grant
Method to measure light loss of optical films and optical substrates
Patent number
12,140,494
Issue date
Nov 12, 2024
Applied Materials, Inc.
Jinxin Fu
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation system for an optical device
Patent number
12,140,492
Issue date
Nov 12, 2024
ZF ACTIVE SAFETY AND ELECTRONICS US LLC
Matthew W. Warmuth
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reducing non-normal incidence distortion i...
Patent number
12,138,846
Issue date
Nov 12, 2024
RO Technologies, LLC
Bart E. Wilson
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Wave front sensor for wave aberration compensation in an optical sy...
Patent number
12,140,493
Issue date
Nov 12, 2024
University of Notre Dame Du Lac
Justin Crepp
G02 - OPTICS
Information
Patent Grant
Method for centering an optical element in an optical system for an...
Patent number
12,135,436
Issue date
Nov 5, 2024
Olympus Winter & IBE GmbH
Uwe Schoeler
G02 - OPTICS
Information
Patent Grant
Laser apparatus
Patent number
12,130,422
Issue date
Oct 29, 2024
NPS CO., LTD.
Seong Ho Bae
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Active alignment of optical die to optical substrates
Patent number
12,130,195
Issue date
Oct 29, 2024
PSIQUANTUM, CORP.
Bradley Snyder
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for detecting absolute or relative temperature an...
Patent number
12,123,800
Issue date
Oct 22, 2024
Adtran Networks SE
Benjamin Wohlfeil
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Surface metrology systems and methods thereof
Patent number
12,123,701
Issue date
Oct 22, 2024
Optipro Systems, LLC
James Fredric Munro
G01 - MEASURING TESTING
Information
Patent Grant
Lens ordering system, lens ordering method, program, and data struc...
Patent number
12,124,111
Issue date
Oct 22, 2024
Mitsui Chemicals, Inc.
Shinsuke Ito
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for evaluating a performance of a visual equipmen...
Patent number
12,111,223
Issue date
Oct 8, 2024
Essilor International
Sébastien Fricker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Portable optic metrology thermal chamber module and method therefor
Patent number
12,104,975
Issue date
Oct 1, 2024
Optikos Corporation
David Imrie
G01 - MEASURING TESTING
Information
Patent Grant
Device for pulling out optical fiber, method for pulling out optica...
Patent number
12,098,968
Issue date
Sep 24, 2024
Fujikura Ltd.
Shengyang Luo
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Pre-conditioning interferometer
Patent number
12,092,456
Issue date
Sep 17, 2024
Arizona Board of Regents on behalf of the University of Arizona
Dae Wook Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating spectacle lens, and spectacle lens
Patent number
12,092,547
Issue date
Sep 17, 2024
HOYA LENS THAILAND LTD.
Hua Qi
G01 - MEASURING TESTING
Information
Patent Grant
Combination detector for detecting visual and optical properties of...
Patent number
12,085,472
Issue date
Sep 10, 2024
Optocraft GmbH
Juergen Lamprecht
G01 - MEASURING TESTING
Information
Patent Grant
Deflectometry devices, systems and methods
Patent number
12,085,473
Issue date
Sep 10, 2024
Arizona Board of Regents on behalf of the University of Arizona
Dae Wook Kim
G01 - MEASURING TESTING
Information
Patent Grant
Optical-based validation of orientations of internal facets
Patent number
12,078,476
Issue date
Sep 3, 2024
LUMUS LTD.
Ido Eisenberg
G01 - MEASURING TESTING
Information
Patent Grant
Resolution measurement apparatus and resolution measurement method...
Patent number
12,072,259
Issue date
Aug 27, 2024
Samsung Display Co., Ltd.
Sanghui Park
G01 - MEASURING TESTING
Information
Patent Grant
Collimator
Patent number
12,066,638
Issue date
Aug 20, 2024
Konrad GmbH
Michael Konrad
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Judgment device and judgment method
Patent number
12,061,131
Issue date
Aug 13, 2024
Nippon Telegraph and Telephone Corporation
Hiroyuki Iida
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for validating parallelism between internal facets
Patent number
12,055,385
Issue date
Aug 6, 2024
LUMUS LTD.
Jonathan Gelberg
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device and analysis method
Patent number
12,050,147
Issue date
Jul 30, 2024
Nippon Telegraph and Telephone Corporation
Jun Endo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test device for lens module
Patent number
12,050,148
Issue date
Jul 30, 2024
TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
Zu-Wei Cao
G02 - OPTICS
Information
Patent Grant
System and method for detecting optical power of dry ophthalmic lenses
Patent number
12,044,592
Issue date
Jul 23, 2024
EMAGE AI PTE LTD
Jia Yaw Tan
G02 - OPTICS
Information
Patent Grant
Aberration estimating method, aberration estimating apparatus, and...
Patent number
12,031,879
Issue date
Jul 9, 2024
Canon Kabushiki Kaisha
Akira Eguchi
G01 - MEASURING TESTING
Information
Patent Grant
Sensor calibration system, display control apparatus, program, and...
Patent number
12,033,354
Issue date
Jul 9, 2024
Sony Interactive Entertainment Inc.
Hiromasa Naganuma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Camera module inspection system and method for operating the same
Patent number
12,035,047
Issue date
Jul 9, 2024
PAMTEK CO., LTD.
Jae Woong Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical inspection device for optical performance test of display d...
Patent number
12,025,571
Issue date
Jul 2, 2024
Samsung Display Co., Ltd.
Gil Yeong Park
G02 - OPTICS
Information
Patent Grant
Diffraction-limited optical target system with continuously-variabl...
Patent number
12,028,509
Issue date
Jul 2, 2024
MLOptic Corp.
Pengfei Wu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
LASER BEAM ASTIGMATISM EVALUATING METHOD
Publication number
20240385431
Publication date
Nov 21, 2024
Disco Corporation
Atsushi MAEDA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
DEVICE FOR MEASURING THE PERFORMANCE OF AN OPTICAL DETECTOR, AND AS...
Publication number
20240385073
Publication date
Nov 21, 2024
LYNRED
Lilian Martineau
G01 - MEASURING TESTING
Information
Patent Application
ECCENTRICITY MEASUREMENT METHOD AND ECCENTRICITY MEASUREMENT DEVICE
Publication number
20240385074
Publication date
Nov 21, 2024
OLYMPUS CORPORATION
Yosuke SATO
G01 - MEASURING TESTING
Information
Patent Application
ILLUMINATION SYSTEM FOR AR METROLOGY TOOL
Publication number
20240385075
Publication date
Nov 21, 2024
Applied Materials, Inc.
Yangyang SUN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OBJECTIVE LENS ARRANGEMENT, MEASURING DEVICE AND METHOD FOR MEASURI...
Publication number
20240385077
Publication date
Nov 21, 2024
TechnoTeam Holding GmbH
Ingo ROTSCHOLL
G01 - MEASURING TESTING
Information
Patent Application
EQUIPMENT AND METHOD FOR MEASURING LOSS AND CROSSTALK THAT OCCUR IN...
Publication number
20240377282
Publication date
Nov 14, 2024
Nippon Telegraph and Telephone Corporation
Tomokazu ODA
G01 - MEASURING TESTING
Information
Patent Application
EQUIPMENT AND METHOD FOR MEASURING CROSSTALK BETWEEN CORES OF AN OP...
Publication number
20240377281
Publication date
Nov 14, 2024
Nippon Telegraph and Telephone Corporation
Tomokazu ODA
G01 - MEASURING TESTING
Information
Patent Application
LIGHT INTENSITY DISTRIBUTION PATTERN MEASURING DEVICE AND METHOD
Publication number
20240353289
Publication date
Oct 24, 2024
Nippon Telegraph and Telephone Corporation
Shingo ONO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CALIBRATING THE LIGHT SENSITIVITY OF A CAMERA
Publication number
20240353290
Publication date
Oct 24, 2024
The Boeing Company
Jason S. Damazo
G01 - MEASURING TESTING
Information
Patent Application
Characterization Device for Gradient Photochromic Lens
Publication number
20240344927
Publication date
Oct 17, 2024
Transitions Optical, Ltd.
Forrest R. Blackburn
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED TESTING OF OPTICAL ASSEMBLIES
Publication number
20240344926
Publication date
Oct 17, 2024
IonQ, Inc.
Jonathan Albert MIZRAHI
G01 - MEASURING TESTING
Information
Patent Application
LENS LOOSENING TEST DEVICE AND LENS LOOSENING TEST METHOD
Publication number
20240337557
Publication date
Oct 10, 2024
AAC Optics (Suzhou) Co., Ltd.
Nan Qiao
G01 - MEASURING TESTING
Information
Patent Application
MULTI-CONFIGURABLE WAVEFRONT TESTER
Publication number
20240319041
Publication date
Sep 26, 2024
MLOptic Corp
Pengfei Wu
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION CUVETTE AND SYSTEM FOR USE IN THE OPTICAL INSPECTION OF...
Publication number
20240319073
Publication date
Sep 26, 2024
Alcon Inc.
Felix Brinckmann
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...
Publication number
20240319110
Publication date
Sep 26, 2024
SAMSUNG DISPLAY CO., LTD.
Gil Yeong PARK
G01 - MEASURING TESTING
Information
Patent Application
ARRAY LENS MODULE CALIBRATION EQUIPMENT AND CALIBRATION METHOD THEREOF
Publication number
20240310241
Publication date
Sep 19, 2024
Industrial Technology Research Institute
Chia-Jung Chang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR REDUCING NON-NORMAL INCIDENCE DISTORTION I...
Publication number
20240300159
Publication date
Sep 12, 2024
RO Technologies, LLC
Bart E. Wilson
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
METHOD AND APPARATUS FOR ALIGNING LENS ASSEMBLY OF CAMERA
Publication number
20240295462
Publication date
Sep 5, 2024
e-con Systems India Private Limited
Nandagopalan V
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR IMAGING THROUGH AN OPTICAL SYSTEM TO BE TESTED, AND SYST...
Publication number
20240295463
Publication date
Sep 5, 2024
Trioptics GmbH
Aiko RUPRECHT
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE FOR SUB-ELEMENT OF RETICLE POD
Publication number
20240295461
Publication date
Sep 5, 2024
GUDENG EQUIPMENT CO., LTD.
YIN-FENG CHAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL FIBER SENSOR AND CHANGE DETECTION METHOD
Publication number
20240288335
Publication date
Aug 29, 2024
NEC Corporation
Wataru KOHNO
G01 - MEASURING TESTING
Information
Patent Application
Lens testing equipment
Publication number
20240280434
Publication date
Aug 22, 2024
VIZIONFOCUS INC.
Chun Chen
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS
Publication number
20240280435
Publication date
Aug 22, 2024
Samsung Electronics Co., Ltd.
Seung Ryeol LEE
G01 - MEASURING TESTING
Information
Patent Application
VISUALIZATION DEVICE, VISUALIZATION METHOD, VISUALIZATION PROGRAM
Publication number
20240280436
Publication date
Aug 22, 2024
Nippon Telegraph and Telephone Corporation
Yasuhiro MOCHIDA
G01 - MEASURING TESTING
Information
Patent Application
REVERSIBLE POLAR DECOMPOSITION METHOD FOR BACKSCATTERING MUELLER MA...
Publication number
20240264036
Publication date
Aug 8, 2024
WENZHOU MEDICAL UNIVERSITY
Min XU
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FIBER TEST METHOD AND OPTICAL FIBER TEST EQUIPMENT
Publication number
20240264034
Publication date
Aug 8, 2024
Nippon Telegraph and Telephone Corporation
Tomokazu ODA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF OBSERVING AN OPTICAL DEVICE
Publication number
20240264037
Publication date
Aug 8, 2024
Politecnico Di Milano
Francesco MORICHETTI
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR VALIDATING PARALLELISM BETWEEN INTERNAL FACETS
Publication number
20240263940
Publication date
Aug 8, 2024
LUMUS LTD.
Jonathan GELBERG
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER WITH AUXILIARY LENS FOR MEASUREMENT OF A TRANSPARENT...
Publication number
20240264035
Publication date
Aug 8, 2024
ONTO INNOVATION INC.
Michael B. North Morris
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD
Publication number
20240264038
Publication date
Aug 8, 2024
SK HYNIX INC.
Sung Wook CHO
G01 - MEASURING TESTING